PSPC MICRO AREA X-RAY STRESS ANALYZER - Rigaku

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$The New Standard of X-ray Diffractometer: MultiFlex - Rigaku$

3. Specifications (1) Goniometer X-ray source-to-sample distance: 205 mm Sample-to-detector distance: 280 mm Incidence slit 4, 2, 1, 0.5, 0.3, 0.1 5 mm di a. ψ measuring range: Iso-inclination method: ψ 0 =−35° ~ 50° method Side-inclination method: ψ 0 =-3° ~ 48° Tilt oscillation angle of X-ray incidence: ± l° ~ 1-°, available only for the iso-inclination method Driving: 2θ driving, with a digital motor ψ 0 driving, with a digital motor Alignment method: Microscope method or optical reflection method Arm (horizontal) length: Iso-inclination method: 150 mm or less Side-inclination method: 240 mm or less (2) Standard sample stage Sample stage dimensions: 200 x 300 mm 2 Fine adjustment direction: Front-rear, right-left, height and arc Front-rear stroke: 20 mm Right-left stroke: 20 mm Height direction: 30 mm Arc adjustment: ± 30° Between sample plane and sample stage: 20~ 50mm Max. load amount Approx.: 3 kgf (3) Software (i) Residual stress measurement program (iso-inclination method, side-inclination method) (ii) Residual stress analysis program • Peak position determination: Smoothing, background subtraction, LP correction, peak position determination (FWHM mid-point method, center of gravity method, parabolic approximation method) • Data output: 2θ peak angle, max. intensity, FWHM, integral width, integrated intensity, stress value, reliability limit of stress value, slope, 2θ-sin 2 ψ diagram (iii) Retained austenite quantitative measurement program. (iv) Retained austenite quantitative data analysis program Fig. 2 Goniometer Vol. 5 No. 2 1988 36
Fig. 3 System block diagram 4. Measurement Example (1) Test piece β-Silicone nitride (Si 3 N 4 ) and carbon steel (S45C) that were vacuum brazed by the active metal method (2) Measured portion Jointed surface (3) Measurement condition X-ray tube Cr(Kα), 30 kV, 45 mA Collimator: 0.3, 0.5, 1 mm dia. ψ angle: Side-inclination method ψ = 0, 1 5, 2 5, 30, 40° Stress constant K=-90.08kg/mm 2 /deg. (4) X-ray irradiation When stresses concentrate in an exceedingly small portion of the jointed surface as in the case of this sample, smoothing of the profile of a stress distribution curve can be made depending upon the area of X-ray irradiation. Fig. 4 shows the relations between the divergent optical system of the micro area X-ray stress analyzer and the irradiation area when the sideinclination method is applied. The collimator is referred to in terms of d, the pinhole diameter. The divergence angle ω is determined by the scatter pinhole φS and the collimator length L 1. The designed values are shown in Table 1. The irradiation area φA will extend as the incidence angle ψ is inclined. Eq. (1) represents the relationship between the irradiation area φA and the incidence angle ψ Fig. 4 X-ray optical system and irradiated area A for residual stress measurements with collimated X-rays. Table 1. The variation of X-ray irradiated area φA with collimated diameter φd and divergent angle ω. φd ω° φA(ψ=0) φA(ψ=40) 0.1 0.13 0.15 0.38 0.3 0.40 0.41 0.53 0.5 0.68 0.67 0.88 1 1.32 1.36 1.77 37 The <strong>Rigaku</strong> Journal
Page 1: The Rigaku Journal Vol. 5/ No. 2/19

PSPC MICRO AREA X-RAY STRESS ANALYZER - Rigaku

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