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Edge4717D Quad Channel, Per Pin Precision ... - Semtech

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TEST AND MEASUREMENT PRODUCTS<br />

Description<br />

The <strong>Edge4717D</strong> is a precision measurement unit designed<br />

for automated test equipment and instrumentation.<br />

Manufactured in a wide voltage CMOS process, it is a<br />

monolithic solution for a quad channel per pin PMU.<br />

Each channel of the <strong>Edge4717D</strong> features a PMU that<br />

can force or measure voltage over a typical 15V I/O range,<br />

and supports 4 current ranges: ± 3.2 µA, ± 80 µA,<br />

± 2 mA, ± 30 mA.<br />

The <strong>Edge4717D</strong> has an on-board window comparator per<br />

channel that provides two bits of information — DUT too<br />

high and DUT too low. There is also a monitor pin which<br />

provides a real time analog signal proportional to either<br />

the voltage or current measured at the DUT.<br />

The <strong>Edge4717D</strong> is designed to be a low power, low cost,<br />

small footprint solution to allow high pin count testers to<br />

support a PMU per pin.<br />

On-board voltage clamps, with over-current detection,<br />

provide protection to the DUT and 4717D.<br />

The <strong>Edge4717D</strong> also has a sample-and-hold feature<br />

available for capturing DUT current or voltage<br />

measurements.<br />

The <strong>Edge4717D</strong> is a design improvement to the Edge4717<br />

that features:<br />

– Increased FV/MV range<br />

– Improved over-current detection circuit<br />

functionality<br />

– LVTTL comparator outputs (pull-up resistors<br />

no longer required)<br />

– Improved HiZ switching characteristics<br />

– Improved Force Voltage Linearity<br />

Applications<br />

• Automated Test Equipment<br />

- Memory Testers<br />

- VLSI Testers<br />

- Mixed Signal Tester<br />

<strong>Edge4717D</strong><br />

<strong>Quad</strong> <strong>Channel</strong>, <strong>Per</strong> <strong>Pin</strong><br />

<strong>Precision</strong> Measurement Unit<br />

Features<br />

• FV / MI Capability<br />

• FI / MV Capability<br />

• FV / MV Capability<br />

• FI / MI Capability<br />

• 4 Current Ranges (± 3.2 µA, ± 80 µA, ± 2 mA,<br />

± 30 mA)<br />

• –5.5V to 9.5V Nominal Output Range (Zero Current)<br />

• –3.5 to 7.5V Nominal Output Range (Full Scale<br />

Current)<br />

• On-board Voltage Clamps<br />

• Internal Sample and Hold<br />

• 228 <strong>Pin</strong> 23 mm x 23 mm TBGA Package<br />

Functional Block Diagram<br />

SNK_MON<br />

SRC_MON<br />

HiZ<br />

VINP<br />

FV / FI*<br />

MI / MV*<br />

IVMAX<br />

IVMIN<br />

COMP_IN<br />

DISABLE<br />

SNK_MON<br />

SRC_MON<br />

HiZ<br />

VINP<br />

FV / FI*<br />

MI / MV*<br />

IVMAX<br />

IVMIN<br />

COMP_IN<br />

DISABLE<br />

SNK_MON<br />

SRC_MON<br />

HiZ<br />

VINP<br />

FV / FI*<br />

MI / MV*<br />

IVMAX<br />

IVMIN<br />

COMP_IN<br />

DISABLE<br />

SNK_MON<br />

SRC_MON<br />

HiZ<br />

VINP<br />

FV / FI*<br />

MI / MV*<br />

IVMAX<br />

IVMIN<br />

COMP_IN<br />

DISABLE<br />

CHANNEL 0<br />

COMPARATORS<br />

DETECTOR LOGIC<br />

VOLTAGE MONITOR<br />

OVER-CURRENT<br />

DETECT<br />

OVER-CURRENT<br />

DETECT<br />

DUT_GND<br />

SNK_OUT<br />

OPEN_RLY<br />

SRC_OUT<br />

FORCE<br />

REF ÷ 2.5 GUARD<br />

CHANNEL 1<br />

COMPARATORS<br />

DETECTOR LOGIC<br />

VOLTAGE MONITOR<br />

OVER-CURRENT<br />

DETECT<br />

OVER-CURRENT<br />

DETECT<br />

SENSE<br />

DUTLTH<br />

DUTGTL<br />

IVMON<br />

SNK_OUT<br />

OPEN_RLY<br />

SRC_OUT<br />

FORCE<br />

REF ÷ 2.5 GUARD<br />

CHANNEL 2<br />

COMPARATORS<br />

DETECTOR LOGIC<br />

VOLTAGE MONITOR<br />

OVER-CURRENT<br />

DETECT<br />

OVER-CURRENT<br />

DETECT<br />

SENSE<br />

DUTLTH<br />

DUTGTL<br />

IVMON<br />

SNK_OUT<br />

OPEN_RLY<br />

SRC_OUT<br />

FORCE<br />

REF ÷ 2.5 GUARD<br />

CHANNEL 3<br />

COMPARATORS<br />

DETECTOR LOGIC<br />

VOLTAGE MONITOR<br />

OVER-CURRENT<br />

DETECT<br />

OVER-CURRENT<br />

DETECT<br />

SENSE<br />

DUTLTH<br />

DUTGTL<br />

IVMON<br />

SNK_OUT<br />

OPEN_RLY<br />

SRC_OUT<br />

FORCE<br />

REF ÷ 2.5 GUARD<br />

SENSE<br />

DUTLTH<br />

DUTGTL<br />

IVMON<br />

Revision 5 / October 14, 2005<br />

1 www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

PIN Description<br />

P in Name<br />

<strong>Pin</strong><br />

#<br />

VINP[0:3]<br />

B19,<br />

H22, N21, V22<br />

REF[0:3]<br />

A19,<br />

G22, M21, U22<br />

Description<br />

Analog voltage input which forces the output<br />

output current (FI mode) (one per channel).<br />

Reference pin for divide by<br />

is typically set to 2.25V.<br />

voltage (FV mode) and the<br />

2.5 circuit for force current mode; this reference<br />

FORCE[0:3]<br />

E 2, J2, N2, U2<br />

Analog output pin which forces current or voltage.<br />

SENSE[0:3]<br />

E 3, J3, N3, U3<br />

Analog input pin which senses voltage.<br />

FV_FI*[0:3]<br />

A7,<br />

C11, A14, B17<br />

MI_MV*[0:3]<br />

C9,<br />

B11, B14, C16<br />

TTL compatible input<br />

or forcing voltage.<br />

TTL compatible input which determines<br />

current or measuring voltage.<br />

which determines whether the PMU is forcing current<br />

whether the PMU is measuring<br />

RS0[0:3]<br />

C 7, B9, C12, B15<br />

TTL compatible current range select inputs.<br />

RS1[0:3]<br />

C 6, A8, B12, A15<br />

TTL compatible current range select inputs.<br />

IVMIN[0:3]<br />

C17,<br />

H20, M20, U21<br />

IVMAX[0:3]<br />

C18,<br />

H21, N22, U20<br />

Analog input voltages which<br />

measurement comparator.<br />

Analog input voltages which<br />

measurement comparator.<br />

establish the lower threshold level for the<br />

establish the upper threshold level for the<br />

COMP_IN[0:3]<br />

D 2, H2, M2, T2<br />

Analog voltage input to measurement comparator.<br />

DUT_LTH[0:3]<br />

AA13,<br />

Y12, AA10, Y9<br />

DUT_GTL[0:3]<br />

AA14,<br />

AA12, Y11, AA9<br />

DISABLE[0:3]<br />

A6, B10, B13, B16<br />

HIZ[0:3]<br />

B7, A10, C13, A17<br />

Digital comparator output<br />

the upper threshold.<br />

Digital comparator output<br />

than the lower threshold.<br />

that indicates the DUT measurement is less than<br />

that indicates the DUT measurement is greater<br />

TTL compatible input which places IVMON output in high impedance.<br />

TTL compatible input that places the FORCE output into high impedance.<br />

RA[0:3]<br />

F 3, K3, P3, V3<br />

External resistor input corresponding to Range A.<br />

RB[0:3]<br />

F 2, K2, P2, V2<br />

External resistor input corresponding to Range B.<br />

RC[0:3]<br />

F 1, K1, P1, V1<br />

External resistor input corresponding to Range C.<br />

RD[0:3]<br />

G 3, L3, R3, W3<br />

External resistor input corresponding to Range D.<br />

SNK_MON[0:3]<br />

F 21, K22, R22, AA17<br />

Analog voltage input to sink current clamp.<br />

SRC_MON[0:3]<br />

F 22, L22, T22, Y16<br />

Analog voltage input to source current clamp.<br />

SNK_OUT[0:3]<br />

C 1, G1, L1, R1<br />

Clamp output.<br />

SRC_OUT[0:3]<br />

E 1, J1, N1, U1<br />

Clamp output.<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

2<br />

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<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

PIN Description (continued)<br />

P in Name<br />

<strong>Pin</strong><br />

#<br />

OPEN_RLY[0:3]<br />

Y14,<br />

Y13, AA11, Y10<br />

IVMON[0:3]<br />

B18,<br />

G21, M22, T21<br />

Description<br />

Open drain output that is used for opening<br />

in case of an over-current condition.<br />

Analog voltage output that provides a real time<br />

measured voltage or measured current level.<br />

relays between tester and DUT<br />

monitor of either the<br />

LTCH_MODE[0:3]<br />

B6,<br />

C10, A12, A16<br />

Controls a mux for determination of whether IVMONITOR is from sample-<br />

and-hold or not sampled.<br />

SAMPLE[0:3]<br />

C8, A9, A13, C15<br />

Used for sampling the voltage on the SENSE[0:3] voltage monitor pins.<br />

GUARD[0:3]<br />

D 1, H1, M1, T1<br />

Driven guard pin used for guard traces.<br />

TEST[0:3]<br />

B 8, A11, C14, A18<br />

Digital input control pin for mux for testing sample-and-hold.<br />

TEST_IN[0:3]<br />

C 19, J22, N20, V21<br />

Analog input for testing the sample-and-hold.<br />

COMP1[0:3]<br />

COMP2[0:3]<br />

D20, J20, P21, V20<br />

D21, J21, P20, Y19<br />

Internal compensation pins that require an external capacitor connection<br />

between the two pins.<br />

COMP3[0:3]<br />

E21,<br />

K21, R21, Y18<br />

COMP4[0:3]<br />

F20,<br />

K20, R20, Y17<br />

Internal compensation pin that<br />

between the pin and ground.<br />

Internal compensation pin that requires<br />

between the pin and FORCE output.<br />

requires an external capacitor connection<br />

an external capacitor connection<br />

DUT_GND<br />

Y 6<br />

Input reference pin that should be connected to DUT ground line.<br />

Power <strong>Pin</strong>s<br />

V CC<br />

A1, A2, A21, A22,<br />

B1, B2, B21, B22,<br />

C3, C20, Y3, Y20, AA1,<br />

AA2, AA21, AA22, AB1,<br />

AB2, AB21, AB22<br />

Positive analog power supply.<br />

VDD<br />

Y 15<br />

Positive digital supply (comparator).<br />

V EE<br />

A20, B20, C21, C22,<br />

D22, E22, G2, L2, R2,<br />

W2, W21, W22, Y21, Y22,<br />

AA15, AA18, AA19, AA20,<br />

AB13, AB14, AB15, AB16,<br />

AB17, AB18, AB19, AB20<br />

G ND<br />

A3, A4, A5, B3, B4, B5,<br />

C2, C4, C5, W1, Y1, Y2,<br />

Y4, Y5, Y7, Y8, AA3, AA4,<br />

AA5, AA6, AA7, AA8, AB3,<br />

AB4, AB5, AB6, AB7, AB8,<br />

AB9, AB10, AB11, AB12<br />

Negative analog power supply.<br />

Ground.<br />

N C<br />

D3, E20, H3, G20, L20,<br />

L21, M3, P22, T3, T20,<br />

W20, AA16<br />

No Connection.<br />

(Unused pins; leave unconnected).<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

3<br />

www.semtech.com


4<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

TEST AND MEASUREMENT PRODUCTS<br />

<strong>Edge4717D</strong><br />

www.semtech.com<br />

PIN Description (continued)<br />

Top View<br />

23mm x 23mm 228 <strong>Pin</strong> TBGA<br />

A1 Ball Pad<br />

Indicator<br />

E4717<br />

228 <strong>Pin</strong> TBGA<br />

23mm x 23mm<br />

SEMTECH<br />

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22<br />

A<br />

B<br />

C<br />

D<br />

E<br />

F<br />

G<br />

H<br />

J<br />

K<br />

L<br />

M<br />

N<br />

P<br />

R<br />

T<br />

U<br />

V<br />

W<br />

Y<br />

AA<br />

AB<br />

A1<br />

B1<br />

C1<br />

Y1<br />

AA1<br />

AB1<br />

D1<br />

E1<br />

F1<br />

G1<br />

H1<br />

J1<br />

K1<br />

L1<br />

M1<br />

N1<br />

P1<br />

R1<br />

T1<br />

U1<br />

V1<br />

W1<br />

VCC<br />

GUARD0<br />

SRC_OUT0<br />

RC0<br />

SNK_OUT1<br />

GUARD1<br />

SRC_OUT1<br />

RC1<br />

SNK_OUT2<br />

GUARD2<br />

SRC_OUT2<br />

RC2<br />

SNK_OUT3<br />

GUARD3<br />

SRC_OUT3<br />

RC3<br />

GND<br />

VCC<br />

SNK_OUT0<br />

GND<br />

VCC<br />

VCC<br />

A2<br />

B2<br />

C2<br />

Y2<br />

AA2<br />

AB2<br />

D2<br />

E2<br />

F2<br />

G2<br />

H2<br />

J2<br />

K2<br />

L2<br />

M2<br />

N2<br />

P2<br />

R2<br />

T2<br />

U2<br />

V2<br />

W2<br />

VCC<br />

COMP_IN0<br />

FORCE0<br />

RB0<br />

VEE<br />

COMP_IN1<br />

FORCE1<br />

RB1<br />

VEE<br />

COMP_IN2<br />

FORCE2<br />

RB2<br />

VEE<br />

COMP_IN3<br />

FORCE3<br />

RB3<br />

VEE<br />

VCC<br />

GND<br />

GND<br />

VCC<br />

VCC<br />

A3<br />

B3<br />

C3<br />

Y3<br />

AA3<br />

AB3<br />

D3<br />

E3<br />

F3<br />

G3<br />

H3<br />

J3<br />

K3<br />

L3<br />

M3<br />

N3<br />

P3<br />

R3<br />

T3<br />

U3<br />

V3<br />

W3<br />

GND<br />

NC<br />

SENSE0<br />

RA0<br />

RD0<br />

NC<br />

SENSE1<br />

RA1<br />

RD1<br />

NC<br />

SENSE2<br />

RA2<br />

RD2<br />

NC<br />

SENSE3<br />

RA3<br />

RD3<br />

GND<br />

VCC<br />

VCC<br />

GND<br />

GND<br />

A4<br />

B4<br />

C4<br />

Y4<br />

AA4<br />

AB4<br />

D4<br />

E4<br />

F4<br />

G4<br />

H4<br />

J4<br />

K4<br />

L4<br />

M4<br />

N4<br />

P4<br />

R4<br />

T4<br />

U4<br />

V4<br />

W4<br />

GND<br />

GND<br />

GND<br />

GND<br />

GND<br />

GND<br />

A5<br />

B5<br />

C5<br />

Y5<br />

AA5<br />

AB5<br />

D5<br />

E5<br />

F5<br />

G5<br />

H5<br />

J5<br />

K5<br />

L5<br />

M5<br />

N5<br />

P5<br />

R5<br />

T5<br />

U5<br />

V5<br />

W5<br />

GND<br />

GND<br />

GND<br />

GND<br />

GND<br />

GND<br />

A6<br />

B6<br />

C6<br />

Y6<br />

AA6<br />

AB6<br />

D6<br />

E6<br />

F6<br />

G6<br />

H6<br />

J6<br />

K6<br />

L6<br />

M6<br />

N6<br />

P6<br />

R6<br />

T6<br />

U6<br />

V6<br />

W6<br />

DISABLE0<br />

LTCH_MODE0<br />

RS10<br />

DUT_GND<br />

GND<br />

GND<br />

A7<br />

B7<br />

C7<br />

Y7<br />

AA7<br />

AB7<br />

D7<br />

E7<br />

F7<br />

G7<br />

H7<br />

J7<br />

K7<br />

L7<br />

M7<br />

N7<br />

P7<br />

R7<br />

T7<br />

U7<br />

V7<br />

W7<br />

FV_FIN0<br />

HIZ0<br />

RS00<br />

GND<br />

GND<br />

GND<br />

A8<br />

B8<br />

C8<br />

Y8<br />

AA8<br />

AB8<br />

D8<br />

E8<br />

F8<br />

G8<br />

H8<br />

J8<br />

K8<br />

L8<br />

M8<br />

N8<br />

P8<br />

R8<br />

T8<br />

U8<br />

V8<br />

W8<br />

RS11<br />

TEST0<br />

SAMPLE0<br />

GND<br />

GND<br />

GND<br />

A9<br />

B9<br />

C9<br />

Y9<br />

AA9<br />

AB9<br />

D9<br />

E9<br />

F9<br />

G9<br />

H9<br />

J9<br />

K9<br />

L9<br />

M9<br />

N9<br />

P9<br />

R9<br />

T9<br />

U9<br />

V9<br />

W9<br />

SAMPLE1<br />

RS01<br />

MI_MVN0<br />

DUT_LTH3<br />

DUT_GTL3<br />

GND<br />

A10<br />

B10<br />

C10<br />

Y10<br />

AA10<br />

AB10<br />

D10<br />

E10<br />

F10<br />

G10<br />

H10<br />

J10<br />

K10<br />

L10<br />

M10<br />

N10<br />

P10<br />

R10<br />

T10<br />

U10<br />

V10<br />

W10<br />

HIZ1<br />

DISABLE1<br />

LTCH_MODE1<br />

OPEN_RLY3<br />

DUT_LTH2<br />

GND<br />

A11<br />

B11<br />

C11<br />

Y11<br />

AA11<br />

AB11<br />

D11<br />

E11<br />

F11<br />

G11<br />

H11<br />

J11<br />

K11<br />

L11<br />

M11<br />

N11<br />

P11<br />

R11<br />

T11<br />

U11<br />

V11<br />

W11<br />

TEST1<br />

MI_MVN1<br />

FV_FIN1<br />

DUT_GTL2<br />

OPEN_RLY2<br />

GND<br />

A12<br />

B12<br />

C12<br />

Y12<br />

AA12<br />

AB12<br />

D12<br />

E12<br />

F12<br />

G12<br />

H12<br />

J12<br />

K12<br />

L12<br />

M12<br />

N12<br />

P12<br />

R12<br />

T12<br />

U12<br />

V12<br />

W12<br />

LTCH_MODE2<br />

RS12<br />

RS02<br />

DUT_LTH1<br />

DUT_GTL1<br />

GND<br />

A13<br />

B13<br />

C13<br />

Y13<br />

AA13<br />

AB13<br />

D13<br />

E13<br />

F13<br />

G13<br />

H13<br />

J13<br />

K13<br />

L13<br />

M13<br />

N13<br />

P13<br />

R13<br />

T13<br />

U13<br />

V13<br />

W13<br />

SAMPLE2<br />

DISABLE2<br />

HIZ2<br />

OPEN_RLY1<br />

DUT_LTH0<br />

VEE<br />

A14<br />

B14<br />

C14<br />

Y14<br />

AA14<br />

AB14<br />

D14<br />

E14<br />

F14<br />

G14<br />

H14<br />

J14<br />

K14<br />

L14<br />

M14<br />

N14<br />

P14<br />

R14<br />

T14<br />

U14<br />

V14<br />

W14<br />

FV_FIN2<br />

MI_MVN2<br />

TEST2<br />

OPEN_RLY0<br />

DUT_GTL0<br />

VEE<br />

A15<br />

B15<br />

C15<br />

Y15<br />

AA15<br />

AB15<br />

D15<br />

E15<br />

F15<br />

G15<br />

H15<br />

J15<br />

K15<br />

L15<br />

M15<br />

N15<br />

P15<br />

R15<br />

T15<br />

U15<br />

V15<br />

W15<br />

RS13<br />

RS03<br />

SAMPLE3<br />

VDD<br />

VEE<br />

VEE<br />

A16<br />

B16<br />

C16<br />

Y16<br />

AA16<br />

AB16<br />

D16<br />

E16<br />

F16<br />

G16<br />

H16<br />

J16<br />

K16<br />

L16<br />

M16<br />

N16<br />

P16<br />

R16<br />

T16<br />

U16<br />

V16<br />

W16<br />

LTCH_MODE3<br />

DISABLE3<br />

MI_MVN3<br />

SRC_MON3<br />

VEE<br />

A17<br />

B17<br />

C17<br />

Y17<br />

AA17<br />

AB17<br />

D17<br />

E17<br />

F17<br />

G17<br />

H17<br />

J17<br />

K17<br />

L17<br />

M17<br />

N17<br />

P17<br />

R17<br />

T17<br />

U17<br />

V17<br />

W17<br />

HIZ3<br />

FV_FIN3<br />

IV_MIN0<br />

COMP43<br />

SNK_MON3<br />

VEE<br />

A18<br />

B18<br />

C18<br />

Y18<br />

AA18<br />

AB18<br />

D18<br />

E18<br />

F18<br />

G18<br />

H18<br />

J18<br />

K18<br />

L18<br />

M18<br />

N18<br />

P18<br />

R18<br />

T18<br />

U18<br />

V18<br />

W18<br />

TEST3<br />

IVMON0<br />

IV_MAX0<br />

COMP33<br />

VEE<br />

VEE<br />

A19<br />

B19<br />

C19<br />

Y19<br />

AA19<br />

AB19<br />

D19<br />

E19<br />

F19<br />

G19<br />

H19<br />

J19<br />

K19<br />

L19<br />

M19<br />

N19<br />

P19<br />

R19<br />

T19<br />

U19<br />

V19<br />

W19<br />

IREF0<br />

VINP0<br />

TEST_IN0<br />

COMP23<br />

VEE<br />

VEE<br />

A20<br />

B20<br />

C20<br />

Y20<br />

AA20<br />

AB20<br />

D20<br />

E20<br />

F20<br />

G20<br />

H20<br />

J20<br />

K20<br />

L20<br />

M20<br />

N20<br />

P20<br />

R20<br />

T20<br />

U20<br />

V20<br />

W20<br />

VEE<br />

COMP10<br />

NC<br />

COMP40<br />

HLD_CAP0<br />

(NC)<br />

HLD_CAP1<br />

(NC)<br />

IV_MIN1<br />

COMP11<br />

COMP41<br />

NC<br />

IV_MIN2<br />

TEST_IN2<br />

COMP22<br />

COMP42<br />

HLD_CAP2<br />

(NC)<br />

HLD_CAP3<br />

(NC)<br />

IV_MAX3<br />

COMP13<br />

NC<br />

VEE<br />

VCC<br />

VCC<br />

VEE<br />

VEE<br />

A21<br />

B21<br />

C21<br />

Y21<br />

AA21<br />

AB21<br />

D21<br />

E21<br />

F21<br />

G21<br />

H21<br />

J21<br />

K21<br />

L21<br />

M21<br />

N21<br />

P21<br />

R21<br />

T21<br />

U21<br />

V21<br />

W21<br />

VCC<br />

COMP20<br />

COMP30<br />

SNK_MON0<br />

IVMON1<br />

IV_MAX1<br />

COMP21<br />

COMP31<br />

IREF2<br />

VINP2<br />

COMP12<br />

COMP32<br />

IVMON3<br />

IV_MIN3<br />

TEST_IN3<br />

VEE<br />

VCC<br />

VEE<br />

VEE<br />

VCC<br />

VCC<br />

A22<br />

B22<br />

C22<br />

Y22<br />

AA22<br />

AB22<br />

D22<br />

E22<br />

F22<br />

G22<br />

H22<br />

J22<br />

K22<br />

L22<br />

M22<br />

N22<br />

P22<br />

R22<br />

T22<br />

U22<br />

V22<br />

W22<br />

VCC<br />

VEE<br />

VEE<br />

SRC_MON0<br />

IREF1<br />

VINP1<br />

TEST_IN1<br />

SNK_MON1<br />

SRC_MON1<br />

IVMON2<br />

IV_MAX2<br />

NC<br />

SNK_MON2<br />

SRC_MON2<br />

IREF3<br />

VINP3<br />

VEE<br />

VCC<br />

VEE<br />

VEE<br />

VCC<br />

VCC


TEST AND MEASUREMENT PRODUCTS<br />

PIN Description (continued)<br />

Bottom View<br />

<strong>Edge4717D</strong><br />

A1 Ball Pad<br />

Indicator<br />

(see gold triangle<br />

located at the<br />

corner)<br />

23mm x 23mm 228 <strong>Pin</strong> TBGA<br />

22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1<br />

A22<br />

B22<br />

C22<br />

A21<br />

B21<br />

C21<br />

A20<br />

B20<br />

C20<br />

A19<br />

B19<br />

C19<br />

A18<br />

B18<br />

C18<br />

A17<br />

B17<br />

C17<br />

A16<br />

B16<br />

C16<br />

A15<br />

B15<br />

C15<br />

A14<br />

B14<br />

C14<br />

A13<br />

B13<br />

C13<br />

A12<br />

LTCH_MODE2 TEST1 HIZ1<br />

SAMPLE2 SAMPLE1 RS11<br />

VCC VCC VEE IREF0 TEST3 HIZ3 LTCH_MODE3 RS13 FV_FIN2 FV_FIN0 DISABLE0 GND GND GND VCC VCC<br />

B12<br />

RS12 MI_MVN1 DISABLE1<br />

DISABLE2 RS01 TEST0<br />

VCC VCC VEE VINP0 IVMONITOR0 FV_FIN3 DISABLE3 RS03 MI_MVN2 HIZ0 LTCH_MODE0 GND GND GND VCC VCC<br />

C12<br />

RS02 FV_FIN1 LTCH_MODE1<br />

HIZ2 MI_MVN0 SAMPLE0<br />

VEE VEE VCC TEST_IN0 IV_MAX0 IV_MIN0 MI_MVN3 SAMPLE3 TEST2 RS00 RS10 GND GND VCC GND SNK_OUT0<br />

D22<br />

D21<br />

D20<br />

D19<br />

D18<br />

D17<br />

D16<br />

D15<br />

D14<br />

D13<br />

D12<br />

VEE COMP20 COMP10 NC COMP_IN0 GUARD0<br />

E22<br />

E21<br />

E20<br />

E19<br />

E18<br />

E17<br />

E16<br />

E15<br />

E14<br />

E13<br />

E12<br />

VEE COMP30 NC SENSE0 FORCE0 SRC_OUT0<br />

F22<br />

F21<br />

F20<br />

F19<br />

F18<br />

F17<br />

F16<br />

F15<br />

F14<br />

F13<br />

F12<br />

SRC_MON0 SNK_MON0 COMP40 RA0 RB0 RC0<br />

A11<br />

B11<br />

C11<br />

D11<br />

E11<br />

F11<br />

A10<br />

B10<br />

C10<br />

D10<br />

E10<br />

F10<br />

A9<br />

B9<br />

C9<br />

D9<br />

E9<br />

F9<br />

A8<br />

B8<br />

C8<br />

D8<br />

E8<br />

F8<br />

A7<br />

B7<br />

C7<br />

D7<br />

E7<br />

F7<br />

A6<br />

B6<br />

C6<br />

D6<br />

E6<br />

F6<br />

A5<br />

B5<br />

C5<br />

D5<br />

E5<br />

F5<br />

A4<br />

B4<br />

C4<br />

D4<br />

E4<br />

F4<br />

A3<br />

B3<br />

C3<br />

D3<br />

E3<br />

F3<br />

A2<br />

B2<br />

C2<br />

D2<br />

E2<br />

F2<br />

A1<br />

B1<br />

C1<br />

D1<br />

E1<br />

F1<br />

A<br />

B<br />

C<br />

D<br />

E<br />

F<br />

G22<br />

IREF1<br />

G21<br />

IVMON1<br />

G20<br />

HLD_CAP0<br />

(NC)<br />

G19<br />

G18<br />

G17<br />

G16<br />

G15<br />

G14<br />

G13<br />

G12<br />

G11<br />

G10<br />

G9<br />

G8<br />

G7<br />

G6<br />

G5<br />

G4<br />

G3 G2 G1<br />

RD0 VEE SNK_OUT1<br />

G<br />

H22<br />

J22<br />

Y22<br />

AA22<br />

AB22<br />

H21<br />

J21<br />

Y21<br />

AA21<br />

AB21<br />

H20<br />

J20<br />

Y20<br />

AA20<br />

AB20<br />

H19<br />

J19<br />

Y19<br />

AA19<br />

AB19<br />

H18<br />

J18<br />

Y18<br />

AA18<br />

AB18<br />

H17<br />

J17<br />

Y17<br />

AA17<br />

AB17<br />

H16<br />

J16<br />

Y16<br />

AA16<br />

AB16<br />

H15<br />

J15<br />

Y15<br />

AA15<br />

AB15<br />

H14<br />

J14<br />

Y14<br />

AA14<br />

AB14<br />

H13<br />

J13<br />

Y13<br />

AA13<br />

AB13<br />

H12<br />

VINP1 IV_MAX1 IV_MIN1 NC COMP_IN1 GUARD1<br />

J12<br />

TEST_IN1 COMP21 COMP11 SENSE1 FORCE1 SRC_OUT1<br />

K22<br />

K21<br />

K20<br />

K19<br />

K18<br />

K17<br />

K16<br />

K15<br />

K14<br />

K13<br />

K12<br />

SNK_MON1 COMP31 COMP41 RA1 RB1 RC1<br />

L22 L21 L20 L19 L18 L17 L16 L15 L14 L13 L12 L11 L10 L9 L8 L7 L6 L5 L4 L3 L2 L1<br />

HLD_CAP1<br />

SRC_MON1 (NC)<br />

NC RD1 VEE SNK_OUT2<br />

M22<br />

M21<br />

M20<br />

M19<br />

M18<br />

M17<br />

M16<br />

M15<br />

M14<br />

M13<br />

M12<br />

IVMON2 IREF2 IV_MIN2 NC COMP_IN2 GUARD2<br />

N22<br />

N21<br />

N20<br />

N19<br />

N18<br />

N17<br />

N16<br />

N15<br />

N14<br />

N13<br />

N12<br />

IV_MAX2 VINP2 TEST_IN2 SENSE2 FORCE2 SRC_OUT2<br />

P22<br />

P21<br />

P20<br />

P19<br />

P18<br />

P17<br />

P16<br />

P15<br />

P14<br />

P13<br />

P12<br />

NC COMP12 COMP22 RA2 RB2 RC2<br />

R22<br />

R21<br />

R20<br />

R19<br />

R18<br />

R17<br />

R16<br />

R15<br />

R14<br />

R13<br />

R12<br />

SNK_MON2 COMP32 COMP42 RD2 VEE SNK_OUT3<br />

T22<br />

T21<br />

T20<br />

T19<br />

T18<br />

T17<br />

T16<br />

T15<br />

T14<br />

T13<br />

T12<br />

SRC_MON2 IVMON3<br />

HLD_CAP2<br />

(NC)<br />

NC COMP_IN3 GUARD3<br />

U22<br />

U21<br />

U20<br />

U19<br />

U18<br />

U17<br />

U16<br />

U15<br />

U14<br />

U13<br />

U12<br />

IREF3 IV_MIN3 IV_MAX3 SENSE3 FORCE3 SRC_OUT3<br />

V22<br />

V21<br />

V20<br />

V19<br />

V18<br />

V17<br />

V16<br />

V15<br />

V14<br />

V13<br />

V12<br />

VINP3 TEST_IN3 COMP13 RA3 RB3 RC3<br />

W22<br />

W21<br />

W20<br />

W19<br />

W18<br />

W17<br />

W16<br />

W15<br />

W14<br />

W13<br />

W12<br />

VEE VEE NC RD3 VEE GND<br />

Y12<br />

DUT_LTH1 DUT_GTL2 OPEN_RLY3<br />

OPEN_RLY1 DUT_LTH3 GND<br />

VEE VEE VCC COMP23 COMP33 COMP43 SRC_MON3 VDD OPEN_RLY0 GND DUT_GND GND GND VCC GND GND<br />

AA12<br />

HLD_CAP3<br />

DUT_GTL1 OPEN_RLY2 DUT_LTH2<br />

DUT_LTH0 DUT_GTL3 GND<br />

VCC VCC VEE VEE VEE SNK_MON3 VEE DUT_GTL0 GND GND GND GND GND VCC VCC<br />

(NC)<br />

AB12<br />

GND GND GND<br />

VEE GND GND<br />

VCC VCC VEE VEE VEE VEE VEE VEE VEE GND GND GND GND GND VCC VCC<br />

H11<br />

J11<br />

K11<br />

M11<br />

N11<br />

P11<br />

R11<br />

T11<br />

U11<br />

V11<br />

W11<br />

Y11<br />

AA11<br />

AB11<br />

H10<br />

J10<br />

K10<br />

M10<br />

N10<br />

P10<br />

R10<br />

T10<br />

U10<br />

V10<br />

W10<br />

Y10<br />

AA10<br />

AB10<br />

H9<br />

J9<br />

K9<br />

M9<br />

N9<br />

P9<br />

R9<br />

T9<br />

U9<br />

V9<br />

W9<br />

Y9<br />

AA9<br />

AB9<br />

H8<br />

J8<br />

K8<br />

M8<br />

N8<br />

P8<br />

R8<br />

T8<br />

U8<br />

V8<br />

W8<br />

Y8<br />

AA8<br />

AB8<br />

H7<br />

J7<br />

K7<br />

M7<br />

N7<br />

P7<br />

R7<br />

T7<br />

U7<br />

V7<br />

W7<br />

Y7<br />

AA7<br />

AB7<br />

H6<br />

J6<br />

K6<br />

M6<br />

N6<br />

P6<br />

R6<br />

T6<br />

U6<br />

V6<br />

W6<br />

Y6<br />

AA6<br />

AB6<br />

H5<br />

J5<br />

K5<br />

M5<br />

N5<br />

P5<br />

R5<br />

T5<br />

U5<br />

V5<br />

W5<br />

Y5<br />

AA5<br />

AB5<br />

H4<br />

J4<br />

K4<br />

M4<br />

N4<br />

P4<br />

R4<br />

T4<br />

U4<br />

V4<br />

W4<br />

Y4<br />

AA4<br />

AB4<br />

H3<br />

J3<br />

K3<br />

M3<br />

N3<br />

P3<br />

R3<br />

T3<br />

U3<br />

V3<br />

W3<br />

Y3<br />

AA3<br />

AB3<br />

H2<br />

J2<br />

K2<br />

M2<br />

N2<br />

P2<br />

R2<br />

T2<br />

U2<br />

V2<br />

W2<br />

Y2<br />

AA2<br />

AB2<br />

H1<br />

J1<br />

K1<br />

M1<br />

N1<br />

P1<br />

R1<br />

T1<br />

U1<br />

V1<br />

W1<br />

Y1<br />

AA1<br />

AB1<br />

H<br />

J<br />

K<br />

L<br />

M<br />

N<br />

P<br />

R<br />

T<br />

U<br />

V<br />

W<br />

Y<br />

AA<br />

AB<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

5<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Circuit Description<br />

Circuit Overview<br />

The <strong>Edge4717D</strong> is a quad channel parametric test and<br />

measurement unit that can :<br />

• Force Voltage / Measure Current<br />

• Force Current / Measure Voltage<br />

• Force Voltage / Measure Voltage<br />

• Force Current / Measure Current<br />

• Measure Voltage / Force Disable<br />

The <strong>Edge4717D</strong> features a PMU (per channel) that can<br />

force or measure voltage over a 15V range and force or<br />

measure current over four distinct ranges:<br />

• ± 3.2 µA<br />

• ± 80 µA<br />

• ± 2 mA<br />

• ± 30 mA<br />

The <strong>Edge4717D</strong> features an on-board window comparator<br />

(per channel) that provides two bit measurement range<br />

classification.<br />

Also, a monitor pin, IVMON, is capable of outputting either<br />

a real time analog voltage signal which tracks the measured<br />

parameter, or a sampled value of the measurement<br />

parameter captured using the sample and hold circuitry.<br />

PMU Functionality<br />

The trapezoid in Figure 1 describes the current-voltage<br />

functionality of the PMU with VCC = 12V and VEE =<br />

–8V, in Range D.<br />

Control Inputs<br />

FV / FI* is a TTL compatible input which determines whether<br />

the PMU forces current or voltage, and MI/MV* is a TTL<br />

compatible input which determines whether the PMU<br />

measures current or voltage. FV/FI* and MI/MV* are<br />

independent for each channel of the <strong>Edge4717D</strong>. HIZ is<br />

a TTL compatible input which can be used to place the<br />

PMU’s force amp into a high impedance state. Tables 1<br />

and 2 describe the modes of operation related to these<br />

three input pins.<br />

H IZ F V / FI*<br />

MI/MV*<br />

Table 1.<br />

Mode of Operation<br />

1 X X High Impedance<br />

0 0 0 Force Current, Measure Voltage<br />

0 0 1 Force Current, Measure Current<br />

0 1 0 Force Voltage, Measure Voltage<br />

0 1 1 Force Voltage, Measure Current<br />

RS0 and RS1 are TTL compatible inputs to an internal<br />

analog MUX which selects an external resistor<br />

corresponding to a desired current range. The truth table<br />

for RS0 and RS1, along with the associated external<br />

resistor values and current ranges, is shown in Table 2.<br />

RS0 and RS1 are independent for each channel of the<br />

<strong>Edge4717D</strong>.<br />

V<br />

V OUT (@ I = 0) = 9.25V<br />

No restrictions<br />

V CC = 12<br />

V OUT (@ 30 mA) = 9V<br />

RS1<br />

RS0<br />

Range<br />

Current<br />

Range<br />

"Nominal" Ext. R<br />

0 0 A 3.2<br />

µ A RA<br />

= 625KΩ<br />

0 1 B 80<br />

µ A RB<br />

= 25KΩ<br />

1 0 C 2 mA<br />

RC = 1KΩ<br />

I MIN (–30 mA)<br />

I MAX (30 mA)<br />

1 1 D 30<br />

mA<br />

RD<br />

= 40Ω<br />

Table 2.<br />

V OUT (@ –30 mA) = –2.5V<br />

V OUT (@ –10 mA) = –5.1 (in Range D)<br />

V OUT (@ I = 0) = –5.5V<br />

V EE = –8V<br />

NOTE: Negative current is defined as current flowing into PMU from DUT.<br />

Figure 1. PMU Functionality<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

6<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Circuit Description (continued)<br />

FORCE/SENSE<br />

FORCE is an analog output which either forces a current<br />

or forces a voltage, depending on which operating mode<br />

is selected. In FV mode, the voltage forced is equivalent<br />

to the voltage applied to the VINP pin. In FI mode, the<br />

current forced is mapped to the input as described in the<br />

Force Current section. FORCE can be placed in a highimpedance<br />

state through the setting of the HIZ input pin.<br />

When the HIZ input pin is set to logical “0”, the <strong>Edge4717D</strong><br />

FORCE output will be controlled by the internal driver<br />

amplifier, and the <strong>Edge4717D</strong> will force a user-defined<br />

current or voltage (depending upon the setting of FV/FI*)<br />

at the FORCE pin. When HIZ is set to logical “1”, the<br />

FORCE output is placed into a low-leakage, high impedance<br />

state.<br />

SENSE is a high impedance analog input which measures<br />

the DUT voltage in the MV operating mode.<br />

(FORCE and SENSE are brought out to separate pins to<br />

allow remote sensing.)<br />

IVMON<br />

IVMON is a real time analog voltage output which tracks<br />

the sensed parameter.<br />

In the MV mode (MI/MV* = 0), the output voltage<br />

displayed at IVMON is a 1:1 mapping of the SENSE voltage.<br />

In the MI mode (MI/MV* = 1), IVMON follows the equation:<br />

IVMON = I(measured) * REXT<br />

Using nominal values for the external resistors (RA, RB,<br />

and RC), a voltage at IVMON of +2V corresponds to Imax,<br />

and –2V corresponds to Imin of the selected current range.<br />

For Range D, +1.2V corresponds to Imax and –1.2V<br />

corresponds to Imin.<br />

The IVMON pin can also be placed into a high impedance<br />

state by using the DISABLE input (see Table 3).<br />

D isable MI<br />

/ MV*<br />

Sample and Hold<br />

Table 3.<br />

The <strong>Edge4717D</strong> features a sample and hold circuit (per<br />

channel) which can be used to capture the corresponding<br />

voltage value of the sensed parameter (MI or MV) to be<br />

displayed at IVMON.<br />

The output of the sample and hold is internally connected<br />

to IVMON through a latch controlled by LTCH_MODE. The<br />

setting of LTCH_MODE determines whether the data at<br />

IVMON comes from the sample and hold circuit or directly<br />

from the sensed parameter (see Table 4).<br />

LTCH_MODE<br />

Table 4.<br />

Note: No update is performed on the sample-and-hold.<br />

Sample and Hold Testing<br />

Sensed Parameter<br />

1 X High Impedance<br />

0 0 Measured Voltage<br />

0 1 Measured Current<br />

Sample<br />

Sample-and_Hold State<br />

0 X Transparent<br />

1 ( Falling Edge)<br />

Sample Data<br />

1 0 Hold Data<br />

1 1 Transparent<br />

An analog MUX in the 4717D allows for testing of the<br />

sample-and-hold circuit.<br />

The MUX control pin, TEST, is a TTL compatible input<br />

whose operation is described in Table 5. To test the sample<br />

and hold circuitry, an analog signal can be applied to the<br />

TEST_IN pin and sampled.<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

7<br />

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<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Circuit Description (continued)<br />

VINP<br />

Corresponding Forced Current<br />

TEST<br />

Table 5.<br />

Test Head Ground Reference<br />

The <strong>Edge4717D</strong> features a test head ground referencing<br />

feature which allows the force voltage function to be<br />

referenced to a separate ground reference other than the<br />

ground (GND) power used for the device. The test head<br />

ground should be connected to the DUT_GND pin of the<br />

<strong>Edge4717D</strong>. The maximum allowed variation between<br />

DUT_GND and GND is ± 250 mV.<br />

Force Voltage Mode<br />

In the FV mode (FV/FI* = 1), VINP is a high impedance,<br />

analog voltage input that maps directly to the voltage forced<br />

at the FORCE pin.<br />

Measure Current Mode<br />

In the MI mode (MI/MV* = 1), a current monitor is<br />

connected in series with the PMU forcing amplifier. This<br />

monitor generates a voltage that is proportional to the<br />

current passing through it, and is brought out to IVMON.<br />

This voltage (corresponding to the measured current) can<br />

also be tested by the on-board window comparator.<br />

Force Current Mode<br />

In the FI mode (FV/FI* = 0), VINP is a high impedance,<br />

analog voltage input that is converted into a current at<br />

the FORCE pin (see Figure 1) using the following<br />

relationship:<br />

Forced Current =<br />

Function<br />

0 Normal Operation<br />

1<br />

TEST_IN used for sample-<br />

and-hold testing<br />

VINP – VREF<br />

(REXT * 2.5)<br />

where VREF is the reference voltage input at the REF pin<br />

which is nominally set at 2.25V. (Positive current is defined<br />

as current flowing out of the PMU.) Table 6 describes<br />

the relationship between the voltage applied to<br />

VINP and the current at FORCE for Ranges A, B, and C.<br />

Table 6.<br />

In the Force Current mode, the voltage at VINP is divided<br />

by 2.5 internally on the chip, so that a ± 2V range is used<br />

internally for forcing currents on Ranges A, B, and C. Range<br />

D uses a ± 1.2V range across REXT for forcing currents.<br />

Measure Voltage Mode<br />

In the MV mode (MI/MV* = 0), DUT voltage is measured<br />

via the SENSE input pin. This measured voltage can be<br />

displayed on the IVMON pin and tested using the internal<br />

window comparator.<br />

Comparator<br />

VREF<br />

+ 5.5V ≥ Imax (Full-Scale, Ranges A, B, C)<br />

VREF<br />

+ 3.5V<br />

≥ Imax (Full-Scale, Range D)<br />

VREF<br />

0<br />

VREF<br />

– 3.5V<br />

≤ Imin (Full-Scale, Range D)<br />

VREF<br />

– 5.5V ≤ Imin (Full-Scale, Ranges A, B, C)<br />

The <strong>Edge4717D</strong> features an on-board window comparator<br />

which provides two-bit measurement range classification.<br />

IVMAX and IVMIN are high impedance analog inputs<br />

that establish the upper and lower thresholds for the window<br />

comparator. COMP_IN is the window comparator input<br />

pin. COMP_IN should be connected to IVMON on<br />

each channel if it is desired to use the comparator to<br />

indicate PMU measurements.<br />

In the MI mode, an I/V MAX input of +2V will set the<br />

upper threshold of the window comparator to a voltage<br />

corresponding to +FSC (full-scale current), and an I/V MIN<br />

input of –2V will set the lower threshold to a voltage<br />

corresponding to –FSC for Ranges A, B, and C. Similarly<br />

for Range D, –1.2V corresponds to sinking full-scale<br />

current, and +1.2V corresponds to sourcing full-scale<br />

current (positive current is defined as current flowing out<br />

of the PMU).<br />

DUTGTL the DUTLTH are LVTTL compatible outputs which<br />

indicate the range of the measured parameter in relation<br />

to IVMIN and IVMAX. Comparator functionality is summarized<br />

in Table 7.<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

8<br />

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<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Circuit Description (continued)<br />

TEST<br />

CONDITION<br />

DUT<br />

LTH<br />

DUT GTL<br />

Clamp Condition<br />

Clamp Diode<br />

Current<br />

OPEN_RLY<br />

COMP_IN > IVMAX<br />

COMP_IN < IVMAX<br />

COMP_IN > IVMIN<br />

COMP_IN < IVMIN<br />

COMP_IN < IVMAX<br />

and<br />

COMP_IN > IVMIN<br />

0<br />

1<br />

N/A<br />

N/A<br />

1<br />

0<br />

1 1<br />

SRC_OUT<br />

SRC_OUT<br />

SNK_OUT<br />

SNK_OUT<br />

< FORCE–Vd<br />

iode<br />

> FORCE–Vdiode<br />

< FORCE+Vdiode<br />

> FORCE+Vd<br />

iode<br />

N/<br />

A<br />

1<br />

ICLAMP<br />

> 55 mA<br />

ICLAMP<br />

< 55 mA<br />

ICLAMP<br />

> 55 mA<br />

ICLAMP<br />

< 55 mA<br />

0<br />

1<br />

0<br />

1<br />

N/<br />

A<br />

1<br />

REXT Selection<br />

Table 7. Comparator Truth Table<br />

The <strong>Edge4717D</strong> is designed such that the maximum<br />

voltage drop across REXT (RA, RB, RC, or RD depending<br />

on range selected using RS0 and RS1 inputs) is ≤ 2V.<br />

Resistor values can be chosen to operate the PMU at any<br />

current range up to ± 50 mA in accordance with the<br />

following equation:<br />

REXT[Ω] =<br />

2 [V]<br />

IMAX[A]<br />

, IMAX ≤ 50 mA for Range D<br />

IMAX ≤ 2 mA for Range C<br />

IMAX ≤ 80 µA for Range B<br />

IMAX ≤ 3.2 mA for Range A<br />

Voltage Clamps/Over-Current Detection<br />

The <strong>Edge4717D</strong> features four pairs of on-board clamps<br />

(one pair per channel), which can be used to clamp the<br />

voltage of pins connected to SRC_OUT and SNK_OUT<br />

between limits set by the voltages applied to SRC_MON<br />

and SNK_MON. SNK_MON is a high impedance input<br />

that establishes the upper clamping limit, while SRC_MON<br />

is a high impedance analog input that establishes the lower<br />

clamping limit. In addition to voltage clamping functionality,<br />

the clamp circuitry of the <strong>Edge4717D</strong> also features overcurrent<br />

detection capability. Over-current detection is only<br />

enabled when one of the voltage clamping thresholds is<br />

exceeded (FORCE + V diode > SNK_MON or FORCE –<br />

V diode < SRC_MON). When enabled, an over-current<br />

condition is signaled via the OPEN-RLY pin. OPEN_RLY is<br />

an open drain output pin that pulls down when an overcurrent<br />

condition is detected. OPEN_RLY functionality is<br />

depicted in Table 8.<br />

Table 8. Over-Current Detection Circuit Functionality<br />

(V diode is the forward voltage of the<br />

external clamp diode).<br />

For applications that require the use of external resistors<br />

that are much smaller in Ohmic value than those that are<br />

outlined in Table 2, one will need to account for the<br />

variation in switch resistance vs. common mode voltage<br />

of the range selection switches (A-D in Figure 3) when<br />

specifying the overall accuracy of the application.<br />

Common Mode Error/Calibration<br />

In order to attain a high degree of accuracy in a typical<br />

ATE application, offset and gain errors are accounted for<br />

through software calibration. When operating the<br />

<strong>Edge4717D</strong> in the Measure Current (MI) or Force Current<br />

(FI) modes, an additional source of error, common mode<br />

error, should be accounted for. Common mode error is a<br />

measure of how the common mode voltage, V CM , at the<br />

input of the current sense amplifier affects the forced or<br />

measured current values (see Figure 2). Since this error<br />

is created by internal resistors in the current sense<br />

amplifier, it is very linear in nature.<br />

Using the common mode error and common mode linearity<br />

specifications, one can see that with a small number of<br />

calibration steps (see Applications note PMU-A1), the<br />

effect of this error can be significantly reduced.<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

9<br />

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<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Circuit Description (continued)<br />

VOS@IVMON<br />

Power Supply Sequencing<br />

CM Linearity<br />

In order to avoid the possibility of latch-up, the following<br />

power-up requirements must be satisified:<br />

CM Error = Slope<br />

2 mV<br />

–3.5V –2 mV<br />

9.5V<br />

VCM@FORCE<br />

1. VEE ≤ GND ≤ VDD ≤ VCC at all times<br />

2. VEE ≤ All inputs ≤ VCC<br />

The following power supply sequencing can be used as a<br />

guideline when operating the <strong>Edge4717D</strong>:<br />

Power Up Sequence<br />

1. VCC (substrate)<br />

2. VEE/VDD<br />

3. Digital Inputs<br />

4. Analog Inputs<br />

(Note: Slope may be negative)<br />

Figure 2. Graphical Representation of<br />

Common Mode Error<br />

Transient Clamps<br />

Power Down Sequence<br />

1. Analog Inputs<br />

2. Digital Inputs<br />

3. VEE/VDD<br />

4. VCC (substrate)<br />

The <strong>Edge4717D</strong> has on-board transient clamps to limit<br />

the voltage and current spikes that might result from either<br />

changing the current range or changing the operating<br />

mode.<br />

Driven Guard <strong>Pin</strong><br />

The <strong>Edge4717D</strong> features a pin (per channel), GUARD,<br />

which can be used to drive the guard traces of a FORCE/<br />

SENSE pair. By surrounding FORCE and SENSE traces<br />

with guard traces which connect to the GUARD pin, an<br />

effective method to achieve minimal leakage can be<br />

achieved.<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

10<br />

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<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Circuit Description (continued)<br />

IVMON<br />

+<br />

–<br />

OPEN_RLY<br />

0<br />

1 0<br />

1<br />

+<br />

–<br />

DUT_LTH<br />

DUT_GTL<br />

S&H<br />

0<br />

TEST_IN<br />

1<br />

TEST<br />

SAMPLE<br />

LTCH_MODE<br />

DISABLE<br />

+<br />

–<br />

SNK Over-Current Detection<br />

SRC Over-Current Detection<br />

FORCE<br />

–<br />

INST.<br />

+<br />

MI*<br />

MI<br />

MI<br />

MI*<br />

IV_MAX<br />

COMP_IN<br />

IV_MIN<br />

Current limiting resistors on the SRC_MON and SNK_MON<br />

inputs ensure that the <strong>Edge4717D</strong><br />

is not damaged when SRC_MON > SNK_MON.<br />

~500Ω ~<br />

SNK_MON<br />

–<br />

Positive Clamp<br />

SNK_OUT +<br />

–<br />

Vdiode<br />

+<br />

SNK_OUT > (FORCE+Vdiode)<br />

SNK_OUT < (FORCE+Vdiode)<br />

Negative Clamp<br />

–<br />

Vdiode<br />

+<br />

SRC_OUT<br />

+<br />

SRC_OUT < (FORCE–V diode )<br />

SRC_OUT > (FORCE–V diode )<br />

SRC_MON<br />

–<br />

~500Ω ~<br />

~1KΩ<br />

.4X<br />

+<br />

–<br />

FV*<br />

FV<br />

FV<br />

40KΩ<br />

FV* FV<br />

FV*<br />

40KΩ<br />

CEXT<br />

COMP3<br />

COMP1<br />

+<br />

DRIVER<br />

–<br />

CEXT<br />

COMP2<br />

D*<br />

RD<br />

D<br />

A* A RA<br />

C* C<br />

RC<br />

B* B<br />

RB<br />

D<br />

D*<br />

C<br />

C*<br />

B<br />

B*<br />

A<br />

A*<br />

FV<br />

FV*<br />

FV*<br />

FV<br />

COMP4<br />

CEXT<br />

MI ⇒ MI/MV* = 1<br />

MI* ⇒ MI/MV* = 0<br />

FV ⇒ FV/FI* = 1<br />

FV* ⇒ FV/FI* = 0<br />

D SRC = External Diode<br />

D SNK = External Diode<br />

C EXT = External Capacitors<br />

VINP<br />

REF<br />

GUARD<br />

SENSE<br />

DUT_GND<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

Figure 3. Functional Schematic<br />

11<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Application Information<br />

120 pF<br />

COMP1<br />

COMP2<br />

RPU<br />

VDD<br />

OPEN_RLY<br />

COMP4<br />

120 pF<br />

<strong>Edge4717D</strong><br />

RA<br />

625 KΩ<br />

To LVTTL Gate<br />

DUT LTH<br />

RB<br />

RC<br />

25 KΩ<br />

1 KΩ<br />

To LVTTL Gate<br />

DUT GTL<br />

RD<br />

40 Ω<br />

FORCE<br />

To DUT<br />

SENSE<br />

+ Vdiode –<br />

100 pF to 1 nF<br />

(exact value<br />

is TBD)<br />

COMP3<br />

VCC<br />

VDD<br />

.1 µF .01 µF<br />

.01 µF .1 µF<br />

.01 µF<br />

VEE<br />

SRC_OUT<br />

SNK_OUT<br />

DUT_GND<br />

– Vdiode +<br />

Use of diodes with a low<br />

reverse leakage current,<br />

such as the Zetex<br />

FLLD261 or equivalent<br />

are recommended.<br />

VCC<br />

VDD<br />

VEE<br />

Test Head Ground<br />

Actual decoupling capacitor values depend<br />

on the actual system environment.<br />

Figure 4. Required External Components (<strong>Per</strong> <strong>Channel</strong>)<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

12<br />

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<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Package Information<br />

0.10<br />

D<br />

–A–<br />

PIN Descriptions<br />

11<br />

Corner<br />

–B–<br />

The entire top-side of the<br />

E4717D package is constructed<br />

of copper, which offers a path<br />

of high thermal conductivity for<br />

cooling.<br />

E<br />

45 degree 0.5 mm Chamfer (4 PLCS)<br />

Top View<br />

10<br />

22<br />

21<br />

20<br />

19<br />

18<br />

17<br />

16<br />

15<br />

14<br />

13<br />

12<br />

11<br />

10<br />

9<br />

8<br />

7<br />

6<br />

5<br />

4<br />

3<br />

2<br />

1<br />

E1<br />

e<br />

A<br />

B<br />

C<br />

D<br />

E<br />

F<br />

G<br />

H<br />

J<br />

K<br />

L<br />

M<br />

N<br />

P<br />

R<br />

T<br />

U<br />

V<br />

W<br />

Y<br />

AA<br />

AB<br />

e<br />

Detail B<br />

D1<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

Bottom View<br />

13<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Package Information (continued)<br />

Side View<br />

Detail A<br />

g<br />

P<br />

c<br />

A1<br />

A<br />

/ / ccc C<br />

g<br />

–C–<br />

5<br />

aaa C<br />

6<br />

b<br />

0.30 S C A S B S<br />

0.10 S C<br />

4<br />

Detail A<br />

Detail B<br />

NOTES:<br />

1. All dimensions are in millimeters.<br />

2. “e” represents the basic solder ball grid pitch.<br />

3. “M” represents the basic solder ball matrix size, and<br />

symbol “N” is the maximum allowable number of<br />

balls after depopulating.<br />

4. “b” is measured at the maximum solder ball diameter<br />

(after reflow) parallel to primary datum –C– .<br />

5. Dimension “aaa” is measured parallel to primary datum –C– .<br />

6. Primary datum –C– and seating plane are defined by the<br />

spherical crowns of the solder balls.<br />

7. Package surface shall be black oxide.<br />

8. Cavity depth varies with die thickness.<br />

9. Substrate material base is copper.<br />

10. Bilateral tolerance zone is applied to each side of package body.<br />

11. 45 degree 0.5 mm Chamfer corner and white dot for <strong>Pin</strong> 1<br />

identification.<br />

Dimensional References<br />

R EF. M IN.<br />

N OM.<br />

MAX.<br />

A 1.25<br />

1.<br />

4 1.55<br />

A1<br />

0.40<br />

0.50<br />

0.60<br />

D 22.80<br />

23.00<br />

23.20<br />

D1<br />

21.00 BSC<br />

E 22.80<br />

23.00<br />

23.20<br />

E1<br />

21.00 BSC<br />

b 0.525<br />

0.65<br />

0.775<br />

c 0.85<br />

0.90<br />

0.95<br />

M 22<br />

N 228<br />

aaa<br />

0.15<br />

ccc<br />

0.25<br />

e<br />

g 0.35<br />

P 0.15<br />

1.00 TYP<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

14<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Recommended Operating Conditions<br />

Parameter<br />

Symbol<br />

Min<br />

Typ<br />

Max<br />

Units<br />

Positive<br />

Negative<br />

Total<br />

Digital<br />

Case<br />

Analog Power Supply<br />

Analog Power Supply<br />

Analog Power Supply<br />

Power Supply<br />

Temperature<br />

Thermal Resistance of Package<br />

(Junction to Case)<br />

VCC<br />

11.<br />

5 12<br />

12.<br />

5 V<br />

VEE<br />

– 8. 5 – 8 – 7. 5 V<br />

VCC – VEE<br />

19<br />

20<br />

21<br />

V<br />

VDD<br />

3.<br />

0 3.<br />

3 5.25<br />

V<br />

TC<br />

25<br />

+ 65<br />

˚C<br />

θjc<br />

0.<br />

3<br />

˚C/ W<br />

Absolute Maximum Ratings<br />

Parameter<br />

Symbol<br />

Min<br />

Typ<br />

Max<br />

Units<br />

Positive<br />

Negative<br />

Total<br />

Digital<br />

Power Supply<br />

Power Supply<br />

Power Supply<br />

Power Supply<br />

VCC<br />

+ 15<br />

V<br />

VEE<br />

– 15<br />

V<br />

VCC – VEE<br />

0 22<br />

V<br />

VDD<br />

0 + 7 V<br />

Digital<br />

Inputs<br />

–.<br />

5<br />

7.<br />

0 V<br />

Analog<br />

Inputs<br />

VEE<br />

– . 5<br />

VCC + . 5<br />

V<br />

Storage<br />

Temperature<br />

– 55<br />

+ 125<br />

˚C<br />

Case<br />

Temperature<br />

100<br />

˚C<br />

Soldering<br />

Temperature<br />

260<br />

˚C<br />

Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a<br />

stress rating only and functional operation of the device at these or any other conditions above those listed in the<br />

operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for<br />

extended periods may affect device reliability.<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

15<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

DC Characteristics<br />

Parameter<br />

Symbol<br />

Min<br />

Typ<br />

Max<br />

Units<br />

Power Supplies<br />

Power Supply Consumption (No-Load)<br />

Positive Supply<br />

Negative Supply<br />

"Digital" Supply<br />

ICC<br />

IEE<br />

IDD<br />

35<br />

35<br />

72<br />

72<br />

5<br />

mA<br />

mA<br />

mA<br />

Power Supply Rejection Ratio<br />

VCC to any Analog Output (except in Hold mode)<br />

1 MHz<br />

500 kHz<br />

100 kHz<br />

PSRR<br />

20<br />

20<br />

25<br />

dB<br />

dB<br />

dB<br />

VEE to any Analog Output (except in Hold mode)<br />

1 MHz<br />

500 kHz<br />

100 kHz<br />

16<br />

18<br />

25<br />

dB<br />

dB<br />

dB<br />

VDD to any Analog Output (except in Hold mode)<br />

< 1 MHz<br />

60<br />

dB<br />

VCC to IVMON (Hold Mode)<br />

1 MHz<br />

500 kHz<br />

100 kHz<br />

200 Hz<br />

VEE to IVMON (Hold Mode)<br />

1 MHz<br />

500 kHz<br />

100 kHz<br />

200 Hz<br />

0.6<br />

6<br />

20<br />

30<br />

1.7<br />

7<br />

21<br />

30<br />

dB<br />

dB<br />

dB<br />

dB<br />

dB<br />

dB<br />

dB<br />

dB<br />

VDD to IVMON (Hold Mode)<br />

< 1 MHz<br />

60<br />

dB<br />

Force Voltage Mode<br />

Input Voltage Range<br />

Input Leakage Current<br />

VINP<br />

Ileak<br />

VEE + 2.0<br />

– 1<br />

0<br />

VCC –<br />

1<br />

2.0<br />

V<br />

µA<br />

Output Forcing Voltage (Positive Full-Scale Current<br />

through<br />

RE XT)<br />

VFORCE<br />

VEE<br />

+ 2. 5<br />

VCC – 4. 5<br />

V<br />

Output<br />

Forcing Voltage (0 Current through RE XT) VFORCE<br />

VEE<br />

+ 2. 5<br />

VCC – 2. 5<br />

V<br />

Output Forcing Voltage (Negative Full-Scale Current<br />

through<br />

RE XT)<br />

VFORCE<br />

VEE<br />

+ 4. 5<br />

VCC – 2. 5<br />

V<br />

Voltage Accuracy<br />

Offset<br />

Gain<br />

Linearity<br />

VOS<br />

Gain<br />

FV INL<br />

–200<br />

.985<br />

– 0.025 .01<br />

200<br />

1.015<br />

+0.025<br />

mV<br />

V/V<br />

% FSVR<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

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<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

DC Characteristics (continued)<br />

Parameter<br />

Symbol<br />

Min<br />

Typ<br />

Max<br />

Units<br />

Measure Current Mode<br />

Current Measurement Range<br />

Range A<br />

Range B<br />

Range C<br />

Range D<br />

IM E A S U R E<br />

–3.2<br />

–80<br />

–2<br />

–30<br />

3.2<br />

80<br />

2<br />

30<br />

µA<br />

µA<br />

mA<br />

mA<br />

Current Measurement Accuracy<br />

Offset (@ IVMON)<br />

Gain (Note 1)<br />

Linearity<br />

Ranges A, B, C<br />

Range D<br />

VOS<br />

Gain<br />

MI INL<br />

–150<br />

.985<br />

–.08<br />

–80<br />

150<br />

1.015<br />

.08<br />

+80<br />

mV<br />

V/V<br />

% FSCR<br />

µA<br />

Common Mode Error<br />

Common Mode Linearity<br />

FORCE = VEE + 4.5V to VCC – 4.75V<br />

IVMON Output Impedance<br />

IVMON Leakage Current<br />

(IVMON = VEE+2.5V TO VCC–2.5V)<br />

CM Error<br />

CM INL<br />

RO U T<br />

ILE A K<br />

–5.5<br />

–.05<br />

–100<br />

500<br />

5.5<br />

.05<br />

100<br />

mV/V<br />

%FSCR<br />

Ω<br />

nA<br />

Force Current Mode<br />

Input Voltage Range<br />

Input Leakage Current<br />

REF Input Voltage Range<br />

REF Leakage Current<br />

VINP<br />

ILE A K<br />

V R E F<br />

ILE A K<br />

VREF – 5.5<br />

–1<br />

0<br />

– 1<br />

0<br />

VREF + 5.5<br />

1<br />

2.5<br />

–1<br />

V<br />

µA<br />

V<br />

µA<br />

Output Forcing Current<br />

Range A<br />

Range B<br />

Range C<br />

Range D<br />

IF O R C E<br />

–3.2<br />

–80<br />

–2<br />

–30<br />

3.2<br />

80<br />

2<br />

30<br />

µA<br />

µA<br />

mA<br />

mA<br />

Compliance Voltage Range<br />

Positive Full-Scale Current<br />

0 Current<br />

Negative Full-Scale Current<br />

VFORCE<br />

VEE + 2.5<br />

VEE + 2.5<br />

VEE + 3.0<br />

VCC – 3.0<br />

VCC – 2.5<br />

VCC – 2.5<br />

V<br />

V<br />

V<br />

Current Accuracy<br />

Offset<br />

Gain (Note 2)<br />

Linearity<br />

Ranges A, B, C<br />

Range D<br />

IOS<br />

Gain<br />

FI INL<br />

–3.6<br />

.385<br />

–.08<br />

–80<br />

.4<br />

3.6<br />

.415<br />

.08<br />

+80<br />

% FSCR<br />

V/V<br />

% FSCR<br />

µA<br />

Common Mode Error<br />

Common Mode Linearity<br />

FORCE = VEE + 4.5V to VCC – 4.5V<br />

CM Error<br />

CM INL<br />

–5.5<br />

–.05<br />

5.5<br />

.05<br />

mV/V<br />

% FSCR<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

17<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

DC Characteristics (continued)<br />

Parameter<br />

Symbol<br />

Min<br />

Typ<br />

Max<br />

Units<br />

Measure Voltage Mode<br />

Voltage<br />

Measurement Range<br />

VSENSE<br />

VEE<br />

+ 2. 5<br />

VCC – 2. 5<br />

V<br />

Voltage Measurement Accuracy<br />

Offset<br />

Gain<br />

Linearity<br />

FORCE/SENSE Combined Leakage Current in HiZ<br />

(FV/FI*=0, FORCE/SENSE = VEE+2.5V to VCC–2.5V)<br />

IVMON Output Impedance<br />

IVMON Leakage Current<br />

(IVMON = VEE+2.5V to VCC–2.5V)<br />

VOS<br />

Gain<br />

MV INL<br />

ILE A K<br />

RO U T<br />

ILE A K<br />

–200<br />

.985<br />

–.025<br />

–10<br />

–100<br />

±.01<br />

500<br />

200<br />

1.015<br />

.025<br />

10<br />

100<br />

mV<br />

V/V<br />

%FSVR<br />

nA<br />

Ω<br />

nA<br />

Digital Inputs (FV/FI*, MI/MV*, RS0, RS1,<br />

DISABLE, TEST, HiZ, LTCH_MODE, SAMPLE)<br />

Input<br />

Input<br />

Input<br />

Low Level<br />

High Level<br />

Leakage Current<br />

VIL<br />

0.<br />

8 V<br />

VIH<br />

2.<br />

0<br />

V<br />

Ileak<br />

– 1<br />

0 1 µ A<br />

Voltage Clamps<br />

R ange<br />

SNK_MON – . 5<br />

16.<br />

0 V<br />

SRC_MON<br />

Effective<br />

Output Impedance of Clamps<br />

RO U T<br />

10<br />

Ω<br />

Sink<br />

Source<br />

Clamp Voltage Range<br />

Clamp Voltage Range<br />

SNK_MON<br />

VEE<br />

+ 2. 5<br />

VCC – 2. 0<br />

SRC_MON<br />

VEE<br />

+ 2. 0<br />

VCC – 2. 5<br />

V<br />

V<br />

SRC_MON Leakage Current<br />

ILE A K<br />

– 1<br />

1 µ A<br />

SNK_MON Leakage Current<br />

ILE A K<br />

– 1<br />

1 µ A<br />

Linearity<br />

Offset<br />

@ 5 mA Constant Current<br />

@ 5 mA Constant Current<br />

PPMU Voltage Clamps<br />

Current Interrupt Limit (OPEN_RLY Trigger Current)<br />

CLAMP<br />

INL<br />

–.400<br />

+ .400<br />

% FSVR<br />

VOS<br />

– 150<br />

+ 150<br />

mV<br />

IC LA M P 35<br />

95<br />

mA<br />

PPMU Voltage Clamps Current Limiting Range<br />

ILIM IT<br />

35<br />

95<br />

mA<br />

Output<br />

Low Voltage for OPEN_RLY <strong>Pin</strong> @ 1 mA<br />

V O L<br />

500<br />

mV<br />

TEST_IN Leakage Current<br />

ILE A K<br />

– 1<br />

1 µ A<br />

OPEN_RLY<br />

Leakage Current @ 5V<br />

ILE A K<br />

– 1<br />

1 µ A<br />

Sample and Hold Circuit<br />

Linearity<br />

Error<br />

S&H INL<br />

–.025<br />

. 01<br />

. 025<br />

% FSVR<br />

Hold<br />

Step<br />

TempCo<br />

of Hold Step (Note 3)<br />

∆ V /<br />

V H S<br />

16<br />

20<br />

mV<br />

∆˚C<br />

50<br />

µV/˚C<br />

Output<br />

Impedance of IVMON (Note 3)<br />

RO U T<br />

500<br />

Ω<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

18<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

DC Characteristics (continued)<br />

Parameter<br />

Symbol<br />

Min<br />

Typ<br />

Max<br />

Units<br />

Short Circuit Protection<br />

Forcing<br />

Op-Amp Current Limit (Note 3)<br />

IM A X<br />

35<br />

75<br />

mA<br />

Driven Guard / Test Head Ground<br />

GUARD – SENSE<br />

@ DUT_GND = 0<br />

SENSE = 5V<br />

DUT_GND to<br />

GND Voltage Range<br />

VD IF F – 100<br />

+ 100<br />

mV<br />

V O S – 250<br />

+ 250<br />

mV<br />

DUT_GND Leakage Current<br />

ILE A K<br />

– 1<br />

1 µ A<br />

Comparator<br />

IVMAX<br />

Voltage Range<br />

IVMIN Voltage<br />

Range<br />

IVMAX<br />

VEE<br />

+ 1.75<br />

VCC – 1.75<br />

IVMIN<br />

VEE<br />

+ 1.75<br />

VCC – 1.75<br />

V<br />

V<br />

Comparator<br />

Offset (IVMIN, IVMAX)<br />

V O S – 100<br />

+ 100<br />

mV<br />

Input<br />

Bias Current at (IVMIN, IVMAX, COMP_IN)<br />

Ib ia s<br />

– 1<br />

+ 1 µ A<br />

Digital Outputs (DUTLTH, DUTGTL)<br />

Output<br />

Low Level (TBD load)<br />

V O L<br />

400<br />

mV<br />

Output<br />

High Level (TBD load)<br />

V O H<br />

2.<br />

4<br />

VDD<br />

V<br />

IVMON<br />

Note 1: Gain = , where V EXT is the voltage across R EXT , which corresponds to measured current.<br />

V EXT<br />

V<br />

Note 2: Gain = EXT , REF = 2.25V nominal, V EXT is the voltage across R EXT , which corresponds to<br />

VINP – REF<br />

forced current.<br />

Note 3: Guaranteed by design and characterization. Not production tested.<br />

Unit Definitions:<br />

FSCR = Full Scale Current Range<br />

Range A, ± 3.2 µA<br />

Range B, ± 80 µA<br />

Range C, ± 2 mA<br />

Range D, ± 30 mA<br />

FSVR = Full Scale Voltage Range<br />

FV mode, no current = 14V minimum<br />

FV mode, current load = 12V minimum<br />

MV mode = 14V minimum<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

19<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

AC Characteristics<br />

Parameter<br />

Symbol<br />

Min<br />

Typ<br />

Max<br />

Units<br />

Force Voltage / Measure Current<br />

FORCE Output Voltage Settling Time (Note 1)<br />

(To 0.1% of 10V step)<br />

RANGE A<br />

RANGES B, C, D<br />

tse ttle<br />

2<br />

300<br />

ms<br />

µs<br />

Measured Current Settling Time (Note 1)<br />

(To 0.1% of FSCR step)<br />

RANGE A<br />

RANGES B, C, D<br />

tse ttle<br />

4<br />

300<br />

ms<br />

µs<br />

Stability (Note 1)<br />

Capacitive<br />

Loading Range for Stable Operation<br />

CLO A D 0 10<br />

nF<br />

Force Amp<br />

Saturation Recovery Time<br />

HiZ True to FORCE Disable Time<br />

HiZ False to FORCE Enable Time<br />

t sr<br />

25<br />

t z<br />

t o e<br />

1<br />

15<br />

µs<br />

µs<br />

µs<br />

Force Current / Measure Voltage<br />

FORCE Output Current Settling Time (Note 1)<br />

(To 0.1% of FSCR step)<br />

RANGE A<br />

RANGES B, C, D<br />

tse ttle<br />

4<br />

300<br />

ms<br />

µs<br />

SENSE (Measure) Voltage Settling Time (Note 1)<br />

(To 0.1% of 10V step)<br />

RANGE A<br />

RANGES B, C, D<br />

tse ttle<br />

4<br />

300<br />

ms<br />

µs<br />

Stability (Note 1)<br />

Capacitive<br />

Loading Range for Stable Operation<br />

CLO A D 0 10<br />

nF<br />

Force Amp<br />

Saturation Recovery Time<br />

HiZ True to FORCE Disable Time<br />

HiZ False to FORCE Enable Time<br />

t sr<br />

25<br />

t z<br />

t o e<br />

1<br />

15<br />

µs<br />

µs<br />

µs<br />

I/V Monitor<br />

Enable<br />

Time<br />

t o e<br />

500<br />

ns<br />

Disable<br />

Time<br />

t z 500<br />

ns<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

20<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

AC Characteristics (continued)<br />

Parameter<br />

Symbol<br />

Min<br />

Typ<br />

Max<br />

Units<br />

Sample and Hold Circuit<br />

Droop<br />

Rate<br />

∆ V/<br />

∆t 40<br />

mV/ s<br />

Acquisition<br />

Time (to 0.025% of Sampled Value)<br />

t A Q<br />

1 10<br />

µ s<br />

Hold Mode Settling Time (Notes 1, 2)<br />

Measure Voltage Mode<br />

To 0.1% of 10V Step<br />

To 0.025% of 10V Step<br />

tH S E TTLE<br />

0.8<br />

1.4<br />

1.5<br />

2<br />

µs<br />

µs<br />

Measure Current Mode (Notes 1, 2)<br />

To 0.1% of 4V Step<br />

To 0.025% of 4V Step<br />

tHSETTLE<br />

1.3<br />

1.8<br />

2<br />

3<br />

µs<br />

µsf<br />

Comparators<br />

Propagation<br />

Delay<br />

tpd<br />

25<br />

µ s<br />

AC Test Conditions: COMP3 = 120 pF to Ground; COMP4 = 120 pF to FORCE; Capacitor between COMP1<br />

and<br />

COMP2 = 120 pF; Load at FORCE/SENSE combined output = 100 pF.<br />

Note 1:<br />

Note 2:<br />

Guaranteed by design and characterization. Not production tested.<br />

Sample and Hold Circuit Acquisition Time (t AQ<br />

) and Settling Time (t HSETTLE<br />

) are described below:<br />

1<br />

t AQ<br />

t HSETTLE<br />

VCC – 4.5<br />

SAMPLE<br />

0<br />

IVMON<br />

V HS<br />

VEE + 4.5<br />

CONDITIONS:<br />

LTCH_MODE = 1<br />

IVMON = 100 pF to GND<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

21<br />

www.semtech.com


<strong>Edge4717D</strong><br />

TEST AND MEASUREMENT PRODUCTS<br />

Ordering Information<br />

Model<br />

Number<br />

Package<br />

E4717DBG<br />

228 <strong>Pin</strong> 23 mm x 23 mm TBGA<br />

EVM4717DBG<br />

<strong>Edge4717D</strong> Evaluation Board<br />

This device is ESD sensitive. Care should be taken when handling<br />

and installing this device to avoid damaging it.<br />

Contact Information for <strong>Semtech</strong> International AG<br />

Taiwan Branch<br />

Tel: 886-2-2748-3380<br />

Fax: 886-2-2748-3390<br />

<strong>Semtech</strong> Switzerland GmbH<br />

Japan Branch<br />

Tel: 81-3-6408-0950<br />

Fax: 81-3-6408-0951<br />

Korea Branch<br />

Tel: 82-2-527-4377<br />

Fax: 82-2-527-4376<br />

<strong>Semtech</strong> Limited (U.K.)<br />

Tel: 44-1794-527-600<br />

Fax: 44-1794-527-601<br />

Shanghai Office<br />

Tel: 86-21-6391-0830<br />

Fax: 86-21-6391-0831<br />

<strong>Semtech</strong> France SARL<br />

Tel: 33-(0)169-28-22-00<br />

Fax: 33-(0)169-28-12-98<br />

<strong>Semtech</strong> International AG is a wholly-owned subsidiary of<br />

<strong>Semtech</strong> Corporation, which has its headquarters in the U.S.A.<br />

<strong>Semtech</strong> Germany GmbH<br />

Tel: 49-(0)8161-140-123<br />

Fax: 49-(0)8161-140-124<br />

© 2005 <strong>Semtech</strong> Corp. / Rev. 5, 10/14/05<br />

22<br />

www.semtech.com

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