Liquid Interface at Wafer Test - Semiconductor Wafer Test Workshop
Liquid Interface at Wafer Test - Semiconductor Wafer Test Workshop
Liquid Interface at Wafer Test - Semiconductor Wafer Test Workshop
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Speed sorting benefit from reduced thermal resistance<br />
Larger power vari<strong>at</strong>ion without sort error<br />
Temper<strong>at</strong>ure Rise<br />
80<br />
70<br />
60<br />
50<br />
40<br />
30<br />
20<br />
10<br />
0<br />
0.5 C/W<br />
0.25 C/W<br />
0 50 100 150<br />
Power<br />
10 X 10 mm powered area<br />
13 P, Diesing 6/4/05
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