Liquid Interface at Wafer Test - Semiconductor Wafer Test Workshop
Liquid Interface at Wafer Test - Semiconductor Wafer Test Workshop
Liquid Interface at Wafer Test - Semiconductor Wafer Test Workshop
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Leakage Current Roadmap<br />
High Performance Microprocessor<br />
Ampere<br />
180 130 90 65 45<br />
Technology node (nm)<br />
7 P, Diesing 6/4/05
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