Cu-Pillar Bump Probing: Utilizing a 50Âµm Pitch Fine Pitch Vertical ...

08.09.2014 • Views

Share Embed Flag

Cu-Pillar Bump Probing: Utilizing a 50Âµm Pitch Fine Pitch Vertical ...

Cu-Pillar Bump Probing: Utilizing a 50Âµm Pitch Fine Pitch Vertical ...

DOWNLOAD ePAPER

swtest.org

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

START NOW

Resistance on Gold<br />

• Max Total Resistance is 3.2 Ohms (includes Cres<br />

& Path Resistance through PH, ST & PCB)<br />

19

1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24

Probe-tip Clean on Demand - Semiconductor Wafer Test Workshop

VLSIresearch - Semiconductor Wafer Test Workshop

Probing Lead Free Solder Bumps in Final Wafer Test

Tutorial - Semiconductor Wafer Test Workshop

Preliminary Program (PDF) - Semiconductor Wafer Test Workshop

July, 2002 Issue - Semiconductor Wafer Test Workshop

Very Low Cost Probe Cards - Semiconductor Wafer Test Workshop

Impact of Vibration on Contact Resistance

Probe Card Cleaning Media Survey - Semiconductor Wafer Test ...

Standard Probe Head Interface for Cobra Space Transformer

IntelÂ® Sort-Interface-Unit (SIU) Design Methods for Reducing Burn ...

Effect of Ground Return Path on Timing Accuracy

C4 Probe Card Space Transformer Technology Overview

with Pyramid Probe Cards - Semiconductor Wafer Test Workshop

Vertical Probing Goes Power

Planarity • Probe Planarity < 0.5 mil (12µm) 18

Resistance on Gold • Max Total Resistance is 3.2 Ohms (includes Cres & Path Resistance through PH, ST & PCB) 19

Page 1 and 2: Cu‐Pillar Bump Probing: Utilizing
Page 3 and 4: Introduction • Next Generation Fl
Page 5 and 6: Testing/Probing challenges • Prob
Page 7 and 8: Prober Equipment Utilized Tester Do
Page 9 and 10: Cu‐Pillar Structure 25µm Side Vi
Page 11 and 12: PROBE CARD CHALLENGES 11
Page 13 and 14: Scalability Challenges • Guide Pl
Page 15 and 16: PROBE CARD DATA 15
Page 17: Tip Alignment • Probe Tip Alignme
Page 21 and 22: Test Method In Out 25µm 25 µm 25
Page 23 and 24: • Electrical Tests Tests in Proce