Dimensional Measurement using Vision Systems - NPL Publications ...
Dimensional Measurement using Vision Systems - NPL Publications ...
Dimensional Measurement using Vision Systems - NPL Publications ...
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<strong>Measurement</strong> Good Practice Guide No. 39<br />
Figure 28: Intensity profile of a dark line on a bright background.<br />
For high power microscopy, the true edge of a feature will be located at some point<br />
between the 25% - 50% intensity level, as the illumination will be partially coherent (see<br />
section 2.8). Under these conditions, the correct threshold may be found experimentally,<br />
by measuring the dimensions of a calibrated feature at varying thresholds within the 25% -<br />
50% range. The formula for calculating the true edge threshold is given in equation 15.<br />
t = i (b + (a – b))<br />
…..(15)<br />
Where ; t = Grey scale intensity threshold of the camera<br />
i = True edge intensity threshold, expressed as a decimal fraction, i.e. 30% = 0.3<br />
b = Mean dark level intensity<br />
a = Mean bright level intensity<br />
It is worth noting that the intensity profile in Figure 28 is of a straight edge and is the<br />
average profile over 500 pixel rows on the y-axis. Figure 29 shows the comparison of an<br />
averaged intensity profile and the profile of an edge along a single row of pixels. The<br />
difference between the two calculated 50% thresholds is only 4 grey scale values, and for<br />
most applications, is negligible. However, where possible, straight edges and averaging<br />
should be used, as the noise level on the profile is reduced and the dynamic grey scale<br />
range is more accurate.<br />
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