Sales policy for domestic USA customers.
Sales policy for domestic USA customers.
Sales policy for domestic USA customers.
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
Buehler Education Schedule<br />
CALCE (Center <strong>for</strong> Advanced Life Cycle Engineering - University of Maryland) / Buehler<br />
Failure Analysis of Electronic Components<br />
CALCE / BUEHLER FAILURE<br />
ANALYSIS OF ELECTRONIC<br />
COMPONENTS<br />
Failure analysis is an important tool in the<br />
ef<strong>for</strong>t to ensure reliability of electronic<br />
products and systems throughout their<br />
product lifecycle. Significant<br />
improvements in the reliability of<br />
electronics can be achieved by retrieving<br />
products and examining them to<br />
determine the root cause of any failures<br />
and the extent of degradation which has<br />
occurred over time. Root cause failure<br />
analysis employs a sequence of<br />
non-destructive and destructive<br />
analytical techniques to characterize the<br />
modes by which failure is manifested, the<br />
sites where failure is localized, the<br />
fundamental mechanical, electrical,<br />
chemical and electrochemical<br />
mechanisms by which failure has<br />
occurred, and the factors which<br />
precipitated the activation of those<br />
mechanisms.<br />
Un<strong>for</strong>tunately, failure analysis is often<br />
per<strong>for</strong>med incorrectly or incompletely,<br />
leading to a poor understanding of failure<br />
mechanisms and causes, and loss of<br />
money, <strong>customers</strong>, and possibly lives due<br />
to recurrence of failures. The first half of<br />
the short course will present a<br />
methodology <strong>for</strong> identifying potential<br />
failure mechanisms in electronic<br />
components based on the failure history.<br />
Systematic approaches to root cause<br />
analysis will be provided. Failure analysis<br />
techniques geared towards various failure<br />
mechanisms will be discussed, with an<br />
emphasis on cross-sectioning techniques<br />
and analysis.<br />
Cross-sectional analysis is a valuable tool<br />
<strong>for</strong> failure analysis of electronic devices<br />
along with quality evaluation, research<br />
and process monitoring. Successful use of<br />
this technique is often complicated by the<br />
highly dissimilar properties of the<br />
component materials under investigation<br />
and their susceptibility to damage.<br />
Emphasis will be placed on how to deal<br />
with these differences through an<br />
understanding of the component<br />
materials to be prepared and the basic<br />
principles of abrasive grinding and<br />
polishing. Techniques <strong>for</strong> low-damage<br />
sectioning and the procedures required to<br />
prevent preparation induced damage are<br />
discussed.<br />
The second half of this short course<br />
provides guidance on how to choose<br />
preparation sequences depending on the<br />
materials, the configuration of the<br />
specimens and the ultimate purpose of<br />
the investigation. The short course stresses<br />
the need to understand the basic<br />
principles rather than simply following<br />
'“recipes". The goal of specimen<br />
preparation is to produce a damage-free<br />
surface that can be imaged and analyzed<br />
through the use of microscopy. Methods<br />
<strong>for</strong> capturing images and quantifying<br />
features through the use of image analysis<br />
will be discussed and demonstrated. This<br />
course is recommended <strong>for</strong> persons who<br />
wish to conduct failure analysis on<br />
electronic products such as PWBs, wafers,<br />
solid state devices and components.<br />
This course will be taught jointly by Center<br />
<strong>for</strong> Advanced Life Cycle Engineering<br />
(CALCE) and Buehler.<br />
April 26-29, 2011<br />
(CALCE - University of Maryland)<br />
September 13-16, 2011<br />
(CALCE - University of Maryland)<br />
COST:<br />
4-day course:<br />
$2500<br />
Consortium Members &<br />
Government Institutions:<br />
$2000<br />
Each attendee is invited to submit one<br />
sample to CALCE at least three weeks<br />
be<strong>for</strong>e the start date. Several of the<br />
submitted samples will be prepared and<br />
analyzed in advance, <strong>for</strong> use during the<br />
demonstrations. Other samples will be<br />
used <strong>for</strong> hands-on training to illustrate<br />
specimen preparation procedures and<br />
analysis techniques. However, no<br />
guarantee can be offered that any specific<br />
sample will be used. All unused samples<br />
will be returned.<br />
For course registration in<strong>for</strong>mation<br />
please contact Bhanu Sood by phone at<br />
301-405-3498 or by email at<br />
bpsood@calce.umd.edu.<br />
52 Effective 2011