ieee transactions on very large scale integration (vlsi) - Computer ...

776 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 14, NO. 7, JULY 2006
Paul Thadikaran (M’00) received the Ph.D. degree
in computer science from the State University of New
York (SUNY), Buffalo.
He is currently a Principal Engineer with the Enterprise
Microprocessor Development Group, Intel Corporation,
Hillsboro, OR. He is also an Adjunct Professor
with the Oregon Health Sciences and Engineering
University and SUNY Stonybrook. He has
been involved with various aspects of design and test
of previous three generations of Intel’s IA-32 CPU.
He has managed CAD tool development and standard
cell library development targeted for CPU designs for the past six years. His
areas of interest include CAD tools and algorithms for test generation, power estimation,
functional verification, and diagnosis. He has published several papers
in IEEE/Intel conferences and journals. He has also coauthored the book, Introduction
to I Testing (Springer, 1997). He has served as a reviewer for several
IEEE and ACM journals, such as the IEEE TRANSACTIONS ON COMPUTER-
AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS and ACM Transactions
on Design Automation in Electronic Systems.
Srikanth Venkataraman (S’93–M’97) received the
Ph.D. degree in electrical engineering from the University
of Illinois at Urbana-Champaign, Urbana.
He is a Manager and Principal Engineer with
Intel Corporation, Hillsboro, OR. He is involved
in the areas of DFT, test tools and methodologies,
diagnosis, and debug technologies in the Design and
Technology Solutions Group. His research interests
include VLSI test, CAD and software engineering.
He has authored or coauthored over 50 publications,
holds one patent, and has three patents pending, and
he has presented tutorials at several conferences.
Dr. Venkataraman was the recipient of the Best Paper Award at IEEE Vehicular
Technology Symposium (VTS) 2000, a Top 10 Papers at ITC 2000, and Best
Panel at IEEE VTS 1999. Intel awards include the Intel Achievement Award
(2005), the Divisional Recognition Awards (2000, 2002, and 2004), the Technical
Recognition Award (2002), the Excellence Award (2001), and Best Paper
Awards at the Design and Test Conference (2002 and 2003).