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NTEGRA spectra: Cutting edge of molecular sciences - NT-MDT

NTEGRA spectra: Cutting edge of molecular sciences - NT-MDT

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Simultaneous imaging and AFM scanning<br />

Atomic Force Microscopy:<br />

Observe the sample surface during<br />

the scanning process<br />

The high NA objective enables<br />

sample imaging even under the probe<br />

tip<br />

Available for both standard contact<br />

and semi contact AFM modes<br />

Probe tip<br />

AFM topography and optical image <strong>of</strong> a<br />

rectangular 5 μm crater on the sample<br />

surface

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