NTEGRA spectra: Cutting edge of molecular sciences - NT-MDT
NTEGRA spectra: Cutting edge of molecular sciences - NT-MDT
NTEGRA spectra: Cutting edge of molecular sciences - NT-MDT
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Simultaneous imaging and AFM scanning<br />
Atomic Force Microscopy:<br />
Observe the sample surface during<br />
the scanning process<br />
The high NA objective enables<br />
sample imaging even under the probe<br />
tip<br />
Available for both standard contact<br />
and semi contact AFM modes<br />
Probe tip<br />
AFM topography and optical image <strong>of</strong> a<br />
rectangular 5 μm crater on the sample<br />
surface