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IRF5305S/L - International Rectifier

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l Advanced Process Technology<br />

l Surface Mount (<strong>IRF5305S</strong>)<br />

l Low-profile through-hole (IRF5305L)<br />

l 175°C Operating Temperature<br />

l Fast Switching<br />

l P-Channel<br />

l Fully Avalanche Rated<br />

Description<br />

Fifth Generation HEXFETs from <strong>International</strong> <strong>Rectifier</strong><br />

utilize advanced processing techniques to achieve<br />

extremely low on-resistance per silicon area. This<br />

benefit, combined with the fast switching speed and<br />

ruggedized device design that HEXFET Power MOSFETs<br />

are well known for, provides the designer with an extremely<br />

efficient and reliable device for use in a wide variety of<br />

applications.<br />

The D 2 Pak is a surface mount power package capable of<br />

accommodating die sizes up to HEX-4. It provides the<br />

highest power capability and the lowest possible onresistance<br />

in any existing surface mount package. The<br />

D 2 Pak is suitable for high current applications because of<br />

its low internal connection resistance and can dissipate<br />

up to 2.0W in a typical surface mount application.<br />

The through-hole version (IRF5305L) is available for lowprofile<br />

applications.<br />

G<br />

PD - 91386C<br />

<strong>IRF5305S</strong>/L<br />

HEXFET ® Power MOSFET<br />

D<br />

S<br />

2 D Pak TO-262<br />

V DSS = -55V<br />

R DS(on) = 0.06Ω<br />

I D = -31A<br />

Absolute Maximum Ratings<br />

Parameter Max. Units<br />

I D @ T C = 25°C Continuous Drain Current, V GS @ -10V… -31<br />

I D @ T C = 100°C Continuous Drain Current, V GS @ -10V… -22 A<br />

I DM Pulsed Drain Current … -110<br />

P D @T A = 25°C Power Dissipation 3.8 W<br />

P D @T C = 25°C Power Dissipation 110 W<br />

Linear Derating Factor 0.71 W/°C<br />

V GS Gate-to-Source Voltage ± 20 V<br />

E AS Single Pulse Avalanche Energy‚… 280 mJ<br />

I AR Avalanche Current -16 A<br />

E AR Repetitive Avalanche Energy 11 mJ<br />

dv/dt Peak Diode Recovery dv/dt ƒ… -5.8 V/ns<br />

T J Operating Junction and -55 to + 175<br />

T STG<br />

Storage Temperature Range<br />

°C<br />

Soldering Temperature, for 10 seconds 300 (1.6mm from case )<br />

Thermal Resistance<br />

Parameter Typ. Max. Units<br />

R θJC Junction-to-Case ––– 1.4<br />

R θJA Junction-to-Ambient ( PCB Mounted,steady-state)** ––– 40<br />

°C/W<br />

4/1/99


<strong>IRF5305S</strong>/L<br />

Electrical Characteristics @ T J = 25°C (unless otherwise specified)<br />

Parameter Min. Typ. Max. Units Conditions<br />

V (BR)DSS Drain-to-Source Breakdown Voltage -55 ––– ––– V V GS = 0V, I D = -250µA<br />

∆V (BR)DSS/∆T J Breakdown Voltage Temp. Coefficient ––– -0.034 ––– V/°C Reference to 25°C, I D = -1mA…<br />

R DS(on) Static Drain-to-Source On-Resistance ––– ––– 0.06 Ω V GS = -10V, I D = -16A „<br />

V GS(th) Gate Threshold Voltage -2.0 ––– -4.0 V V DS = V GS , I D = -250µA<br />

g fs Forward Transconductance 8.0 ––– ––– S V DS = -25V, I D = -16A…<br />

I DSS Drain-to-Source Leakage Current<br />

––– ––– -25 V<br />

µA DS = -55V, V GS = 0V<br />

––– ––– -250 V DS = -44V, V GS = 0V, T J = 150°C<br />

I GSS<br />

Gate-to-Source Forward Leakage ––– ––– 100 V GS = 20V<br />

nA<br />

Gate-to-Source Reverse Leakage ––– ––– -100 V GS = -20V<br />

Q g Total Gate Charge ––– ––– 63 I D = -16A<br />

Q gs Gate-to-Source Charge ––– ––– 13 nC V DS = -44V<br />

Q gd Gate-to-Drain ("Miller") Charge ––– ––– 29 V GS = -10V, See Fig. 6 and 13 „…<br />

t d(on) Turn-On Delay Time ––– 14 ––– V DD = -28V<br />

t r Rise Time ––– 66 ––– I D = -16A<br />

ns<br />

t d(off) Turn-Off Delay Time ––– 39 ––– R G = 6.8Ω<br />

t f Fall Time ––– 63 ––– R D = 1.6Ω, See Fig. 10 „…<br />

L S Internal Source Inductance<br />

––– 7.5 ––– nH<br />

Between lead,<br />

and center of die contact<br />

C iss Input Capacitance ––– 1200 ––– V GS = 0V<br />

C oss Output Capacitance ––– 520 ––– pF V DS = -25V<br />

C rss Reverse Transfer Capacitance ––– 250 ––– ƒ = 1.0MHz, See Fig. 5…<br />

Source-Drain Ratings and Characteristics<br />

Parameter Min. Typ. Max. Units Conditions<br />

D<br />

I S Continuous Source Current MOSFET symbol<br />

––– ––– -31<br />

(Body Diode)<br />

showing the<br />

A<br />

I SM Pulsed Source Current integral reverse<br />

G<br />

––– ––– -110<br />

(Body Diode)<br />

p-n junction diode.<br />

S<br />

V SD Diode Forward Voltage ––– ––– -1.3 V T J = 25°C, I S = -16A, V GS = 0V „<br />

t rr Reverse Recovery Time ––– 71 110 ns T J = 25°C, I F = -16A<br />

Q rr Reverse Recovery Charge ––– 170 250 nC di/dt = -100A/µs „…<br />

t on Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by L S +L D )<br />

Notes:<br />

Repetitive rating; pulse width limited by<br />

max. junction temperature. ( See fig. 11 )<br />

„ Pulse width ≤ 300µs; duty cycle ≤ 2%.<br />

‚ V DD = -25V, Starting T J = 25°C, L = 2.1mH … Uses IRF5305 data and test conditions<br />

R G = 25Ω, I AS = -16A. (See Figure 12)<br />

ƒ I SD ≤ -16A, di/dt ≤ -280A/µs, V DD ≤ V (BR)DSS ,<br />

T J ≤ 175°C<br />

** When mounted on 1" square PCB (FR-4 or G-10 Material ).<br />

For recommended footprint and soldering techniques refer to application note #AN-994.<br />

2 www.irf.com


<strong>IRF5305S</strong>/L<br />

-I<br />

D<br />

, Drain-to-Source Current (A)<br />

1000<br />

100<br />

10<br />

VGS<br />

TOP - 15V<br />

- 10V<br />

- 8.0V<br />

- 7.0V<br />

- 6.0V<br />

- 5.5V<br />

- 5.0V<br />

BOTTOM - 4.5V<br />

-4.5V<br />

-I D , Drain-to-Source Current (A)<br />

1000<br />

100<br />

10<br />

VGS<br />

TOP - 15V<br />

- 10V<br />

- 8.0V<br />

- 7.0V<br />

- 6.0V<br />

- 5.5V<br />

- 5.0V<br />

BOTTOM - 4.5V<br />

-4.5V<br />

20µs PULSE WIDTH<br />

20µs PULSE WIDTH<br />

T J c= 25°C T<br />

1<br />

A<br />

1<br />

C J = 175°C<br />

A<br />

0.1 1 10 100<br />

0.1 1 10 100<br />

-V<br />

DS<br />

, Drain-to-Source Voltage (V)<br />

-V DS , Drain-to-Source Voltage (V)<br />

Fig 1. Typical Output Characteristics<br />

Fig 2. Typical Output Characteristics<br />

-I D , Drain-to-Source Current (A)<br />

100<br />

10<br />

T = 25°C<br />

J<br />

T = 175°C<br />

J<br />

V DS= -25V<br />

20µs PULSE W IDTH<br />

1<br />

A<br />

4 5 6 7 8 9 10<br />

-V GS , Gate-to-Source Voltage (V)<br />

Fig 3. Typical Transfer Characteristics<br />

R DS(on) , D rain-to-Source O n R esistance<br />

(Normalized)<br />

2.0<br />

1.5<br />

1.0<br />

0.5<br />

I D = -27A<br />

V GS= -10V<br />

0.0<br />

A<br />

-60 -40 -20 0 20 40 60 80 100 120 140 160 180<br />

T J , Junction Temperature (°C)<br />

Fig 4. Normalized On-Resistance<br />

Vs. Temperature<br />

www.irf.com 3


<strong>IRF5305S</strong>/L<br />

C, Capacitance (pF)<br />

2500<br />

2000<br />

1500<br />

1000<br />

500<br />

V GS = 0V, f = 1MHz<br />

C iss = C gs + C gd , C ds SHORTED<br />

C rss = C gd<br />

C oss = C ds + C gd<br />

C iss<br />

C oss<br />

C rss<br />

-V DS , Drain-to-Source Voltage (V)<br />

-V , Gate-to-Source Voltage (V)<br />

GS<br />

20<br />

16<br />

12<br />

8<br />

4<br />

I D = -16A<br />

V DS = -44V<br />

V DS = -28V<br />

0<br />

A<br />

1 10 100<br />

Fig 5. Typical Capacitance Vs.<br />

Drain-to-Source Voltage<br />

FOR TEST CIRCUIT<br />

0<br />

SEE FIGURE 13<br />

A<br />

0 10 20 30 40 50 60<br />

Q G , Total Gate Charge (nC)<br />

Fig 6. Typical Gate Charge Vs.<br />

Gate-to-Source Voltage<br />

-I SD , Reverse Drain Current (A)<br />

1000<br />

100<br />

T = 175°C<br />

J<br />

T = 25°C<br />

J<br />

V GS = 0V<br />

10<br />

A<br />

0.4 0.8 1.2 1.6 2.0<br />

-V SD , Source-to-Drain Voltage (V)<br />

Fig 7. Typical Source-Drain Diode<br />

Forward Voltage<br />

-I<br />

D<br />

, Drain Current (A)<br />

1000<br />

100<br />

10<br />

OPERATION IN THIS AREA LIMITED<br />

BY R DS(on)<br />

100µs<br />

1ms<br />

T 10ms<br />

C = 25°C<br />

T J = 175°C<br />

Single P u lse<br />

1<br />

A<br />

1 10 100<br />

-V DS , Drain-to-Source Voltage (V)<br />

Fig 8. Maximum Safe Operating Area<br />

4 www.irf.com


<strong>IRF5305S</strong>/L<br />

V DS<br />

R D<br />

35<br />

30<br />

R G<br />

V GS<br />

D.U.T.<br />

-<br />

V DD<br />

-I D , Drain Current (A)<br />

25<br />

20<br />

15<br />

10<br />

5<br />

+<br />

-10V<br />

Pulse Width ≤ 1 µs<br />

Duty Factor ≤ 0.1 %<br />

Fig 10a. Switching Time Test Circuit<br />

t d(on) t r t d(off) t f<br />

V GS<br />

10%<br />

0<br />

25 50 75 100 125 150 175<br />

T C, Case Temperature ( ° C)<br />

90%<br />

V DS<br />

Fig 9. Maximum Drain Current Vs.<br />

Case Temperature<br />

Fig 10b. Switching Time Waveforms<br />

10<br />

Thermal Response (Z thJC )<br />

1<br />

0.1<br />

D = 0.50<br />

0.20<br />

0.10<br />

0.05<br />

0.02<br />

0.01<br />

SINGLE PULSE<br />

(THERMAL RESPONSE)<br />

Notes:<br />

1. Duty factor D = t 1 / t 2<br />

2. Peak T J = P DM x Z thJC + TC<br />

0.01<br />

0.00001 0.0001 0.001 0.01 0.1<br />

t 1, Rectangular Pulse Duration (sec)<br />

PDM<br />

t1<br />

t2<br />

Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case<br />

www.irf.com 5


<strong>IRF5305S</strong>/L<br />

V L<br />

DS<br />

R G<br />

D.U.T<br />

IAS<br />

-20V<br />

tp 0.01Ω<br />

I AS<br />

V DD<br />

A<br />

DRIVER<br />

15V<br />

Fig 12a. Unclamped Inductive Test Circuit<br />

E AS , Single Pulse Avalanche Energy (mJ)<br />

700<br />

600<br />

500<br />

400<br />

300<br />

200<br />

100<br />

ID<br />

TOP -6.6A<br />

-11A<br />

BOTTOM -16A<br />

V DD = -25V<br />

0<br />

A<br />

25 50 75 100 125 150 175<br />

Starting T J , Junction Temperature (°C)<br />

Fig 12c. Maximum Avalanche Energy<br />

Vs. Drain Current<br />

tp<br />

V (BR)DSS<br />

Fig 12b. Unclamped Inductive Waveforms<br />

Current Regulator<br />

Same Type as D.U.T.<br />

-10V<br />

Q G<br />

12V<br />

.2µF<br />

50KΩ<br />

.3µF<br />

Q GS<br />

Q GD<br />

D.U.T.<br />

V + DS<br />

-<br />

V G<br />

V GS<br />

-3mA<br />

Charge<br />

I G I D<br />

Current Sampling Resistors<br />

Fig 13a. Basic Gate Charge Waveform<br />

Fig 13b. Gate Charge Test Circuit<br />

6 www.irf.com


Peak Diode Recovery dv/dt Test Circuit<br />

<strong>IRF5305S</strong>/L<br />

D.U.T*<br />

+<br />

ƒ<br />

-<br />

Circuit Layout Considerations<br />

• Low Stray Inductance<br />

• Ground Plane<br />

• Low Leakage Inductance<br />

Current Transformer<br />

+<br />

‚<br />

-<br />

-<br />

„<br />

+<br />

R G<br />

• dv/dt controlled by R G<br />

• I SD controlled by Duty Factor "D"<br />

• D.U.T. - Device Under Test<br />

+<br />

-<br />

V DD<br />

V GS<br />

[ ]<br />

* Reverse Polarity of D.U.T for P-Channel<br />

Driver Gate Drive<br />

Period<br />

P.W.<br />

D =<br />

P.W.<br />

Period<br />

[ V GS =10V ] ***<br />

D.U.T. I SD Waveform<br />

Reverse<br />

Recovery<br />

Current<br />

Body Diode Forward<br />

Current<br />

di/dt<br />

D.U.T. V DS Waveform<br />

Diode Recovery<br />

dv/dt<br />

V DD<br />

Re-Applied<br />

Voltage<br />

Inductor Curent<br />

Body Diode<br />

Forward Drop<br />

Ripple ≤ 5%<br />

[ ]<br />

I SD<br />

*** V GS = 5.0V for Logic Level and 3V Drive Devices<br />

Fig 14. For P-Channel HEXFETS<br />

www.irf.com 7


<strong>IRF5305S</strong>/L<br />

D 2 Pak Package Outline<br />

1.40 (.055)<br />

M AX.<br />

10.54 (.415)<br />

10.29 (.405)<br />

- A -<br />

2<br />

4.69 (.185)<br />

4.20 (.165)<br />

- B -<br />

1.32 (.052)<br />

1.22 (.048)<br />

10.16 (.400)<br />

REF.<br />

6.47 (.255)<br />

6.18 (.243)<br />

1.78 (.070)<br />

1.27 (.050)<br />

1 3<br />

15.49 (.610)<br />

14.73 (.580)<br />

2.79 (.110)<br />

2.29 (.090)<br />

5.28 (.208)<br />

4.78 (.188)<br />

2.61 (.103)<br />

2.32 (.091)<br />

3X<br />

1.40 (.055)<br />

1.14 (.045)<br />

5.08 (.200)<br />

3X<br />

0.93 (.037)<br />

0.69 (.027)<br />

0.55 (.022)<br />

0.46 (.018)<br />

1.39 (.055)<br />

1.14 (.045)<br />

8.89 (.350)<br />

REF.<br />

0.25 (.010) M B A M MINIMUM RECOMMENDED FOOTPRINT<br />

11.43 (.450)<br />

NOTES:<br />

1 DIMENSIONS AFTER SOLDER DIP.<br />

2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.<br />

3 CONTROLLING DIMENSION : INCH.<br />

4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.<br />

LEAD ASSIGNMENTS<br />

1 - GATE<br />

2 - DRAIN<br />

3 - SOURCE<br />

8.89 (.350)<br />

3.81 (.150)<br />

17.78 (.700)<br />

2.08 (.082)<br />

2X<br />

2.54 (.100)<br />

2X<br />

Part Marking Information<br />

D 2 Pak<br />

INTERNATIONAL<br />

RECTIFIER<br />

LOGO<br />

ASSEMBLY<br />

LOT CODE<br />

F530S<br />

9246<br />

9B 1M<br />

PART NUMBER<br />

DATE CODE<br />

(YYW W )<br />

YY = YEAR<br />

WW = WEEK<br />

A<br />

8 www.irf.com


<strong>IRF5305S</strong>/L<br />

Package Outline<br />

TO-262 Outline<br />

Part Marking Information<br />

TO-262<br />

www.irf.com 9


<strong>IRF5305S</strong>/L<br />

Tape & Reel Information<br />

D 2 Pak<br />

TRR<br />

1.60 (.063)<br />

1.50 (.059)<br />

4.10 (.161)<br />

3.90 (.153)<br />

1.60 (.063)<br />

1.50 (.059)<br />

0.368 (.0145)<br />

0.342 (.0135)<br />

FEED DIRECTION<br />

1.85 (.073)<br />

1.65 (.065)<br />

11.60 (.457)<br />

11.40 (.449)<br />

15.42 (.609)<br />

15.22 (.601)<br />

24.30 (.957)<br />

23.90 (.941)<br />

TRL<br />

10.90 (.429)<br />

10.70 (.421)<br />

16.10 (.634)<br />

15.90 (.626)<br />

1.75 (.069)<br />

1.25 (.049)<br />

4.72 (.136)<br />

4.52 (.178)<br />

FEED DIRECTION<br />

13.50 (.532)<br />

12.80 (.504)<br />

27.40 (1.079)<br />

23.90 (.941)<br />

4<br />

330.00<br />

(14.173)<br />

MAX.<br />

60.00 (2.362)<br />

MIN.<br />

NOTES :<br />

1. COMFORMS TO EIA-418.<br />

2. CONTROLLING DIMENSION: MILLIMETER.<br />

3. DIMENSION MEASURED @ HUB.<br />

4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.<br />

26.40 (1.039)<br />

24.40 (.961)<br />

3<br />

30.40 (1.197)<br />

MAX.<br />

4<br />

WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331<br />

IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020<br />

IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200<br />

IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590<br />

IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111<br />

IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086<br />

IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630<br />

IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936<br />

http://www.irf.com/ Data and specifications subject to change without notice. 4/99<br />

10 www.irf.com


Note: For the most current drawings please refer to the IR website at:<br />

http://www.irf.com/package/

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