2012 e-catalog - STIL

NON CONTACT MEASUREMENT SOLUTIONS
SENSORS
3D SYSTEMS
SPECTROCOLORIMETERS
GONIOPHOTOMETERS
www.stilsa.com
2012 e-catalog
WORLD LEADER IN CONFOCAL CHROMATIC DISTANCE SENSORS
E1204

Coming soon
SELECTION
GUIDE
2012, A SIGNIFICANT BREAKTROUGH FOR VISION SYSTEM
• CONFOCAL CHROMATIC VISION FOR Automatc Optcal Inspecton: 3D VISION (*)
(*) 3D VISION system combines a real 3D measurement and microscopy image:
- Confocal chromatc measurement in TTL (through the lens),
- High contrast,
- High lateral resoluton,
- Perfect focus in the extended measuring range.
Table of contents
SENSORS
3D SYSTEMS
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Selecton guide
• Selecton guide.................................................................................4
• 3D Metrology products.......................................................................4
Precision class.....................................................................................4
Applicaton type..................................................................................5
Measuring rate.................................................................................6
Scanning mode.................................................................................6
Multi-channel operation......................................................................6
Optical specifications.........................................................................6
Electronic / Software specificatons...............................................................7
Mechanical specificatons.........................................................................7
Value-for-Cost..................................................................................7
Non-contact «point» sensors
• Introducing Chromatc Confocal technology..............................................8
Optcal principle...................................................................................8
Applicatons.......................................................................................9
Product Lines..................................................................................10
• «Bundle» Chromatc Confocal sensors......................................................11
STIL Inital sensor line........................................................................11
• Configurable Chromatc Confocal sensors............................................13
The CCS Controller line........................................... .........................13
The CHR Controller line..........................................................................15
Modular optcal pens (CL-MG line)..............................................................18
Classical optcal pens (OP line)...................................................................19
Miniature optcal pens (ENDO line)..............................................................20
• Introducing Spectral Confocal Interferometry technology............................22
Optcal principle...................................................................................22
The DUO controller line..........................................................................23
Interferometric optcal pens (OPILB line)........................................................25
• Fiber optc cables................................................................................26
• Accessories......................................................................................27
• Software...........................................................................................29
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SELECTION
GUIDE
SENSORS 3D SYSTEMS
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Table of contents
Non-contact «line» sensors
34
• MPLS180 «line» sensors.........................................................................34
MPLS180 optcal principle.........................................................................34
Basic sensor consttuton..........................................................................35
Optoelectronic controllers: technical specificatons..............................................35
• Optcal heads.....................................................................................36
Non-contact 3D Measurement Systems
• MICROMESURE 2 Systems...................................................................38
Applicatons......................................................................................39
Industrial and Research Laboratories Fields....................................................39
Optons & Accessories...........................................................................39
• Technical specificatons......................................................................39
Scanning system Specificatons.................................................................39
Optoelectronic Controllers Specificatons .....................................................40
Optcal Pens and video camera Specificatons.................................................40
• Software.........................................................................................41
Control and Acquisiton Software Functons....................................................41
Post Processing Software Functons............................................................. 42
38
Non-contact Spectrocolorimeter
• Introducing Colorimetry.........................................................................44
Applicatons..................................................................................... 44
• RUBY Spectrocolorimeter...................................................................44
• Technical specificatons............ ................................................... 45
• Software.......................................................................................46
DLL for RUBY controllers.......................................................................46
RUBY MANAGER software......................................................................47
Goniophotometers
• REFLET introducton and features ....................................... ............. 48
REFLET technical specificatons and applications.......................................... 49
• DIAMOND introducton and applications........................................... 50
• Optons......................................................................................... 51
44
48
Outline dimensions
• Point sensors.................................................................................. 53
• Line sensors...................................................................................68
• Goniophotometers..........................................................................71
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Selecton guide
SELECTION
GUIDE
General selection guide
Application
See
• Measure the Shape of a sample
• Measure the Distance of a sample (auto-focusing)
• Measure the Thickness of a sample or a coating
• Measure the Roughness of a surface
3D Metrology Products
Selecton Guide
(on this page)
SENSORS
• Measure or compare the Color of a sample
• Measure the Spectrum reflected,
transmitted or emitted from a sample or a light source
• Measure the Angular distribution of light beam reflected, transmitted or emitted
from a sample (BRDF/BTDF)
Non Contact spectrocolorimeter
(page 44)
Goniophotometers
(page 48)
3D SYSTEMS
3D Metrology products selection guide
STIL SA proposes a large number of products for high quality 3D metrology.
For selectng the right product one should consider several criteria:
• Precision class,
• Applicaton type,
• Measuring rate,
• Scanning mode,
• Mult-channel operaton,
• technical specificatons,
• Value-for-Cost.
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Precision class
Class Axial Resolution (1) Measuring Range Technology Products
Sub-nano-Metrology from 0.3 nm up to 135 µm
Nano-Metrology
from 8.0 nm
(1) Smallest measurable step.
(2) Alone or mounted on a MICROMESURE 3D measuring system.
Several measuring
ranges available:
from 130 µm to
42 mm
CONFOCAL
SPECTRAL
INTERFEROMETRY
(page 22)
CHROMATIC
CONFOCAL
IMAGING
(page 8)
STIL-DUO controller (2) with OPILB optcal pen
CCS-PRIMA, STIL-INITIAL, STIL-DUO or CHR-
150L controller (2) with a CL-MG, OP or Endo
series optcal pen
MPLS 180 sensor
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E1204

SELECTION
GUIDE
SENSORS 3D SYSTEMS
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Selecton guide
Application type
Application
Products
MEASURING THE SHAPE OR DISTANCE OF A SAMPLE
General case
• A point sensor controller (1)(2) with a CL-MG- series
• MPLS 180 sensor
Long working distance
• CCS-Prima, STIL-Duo, CHR-150L controller (2) with a OP- series optcal pen
Inside a cavity (diam. from 7 mm)
• A point sensor controller (1)(2) with a miniature (Endo series) optcal pen
Rough metallic samples
• A point sensor controller (1)(2) with any optcal pen. Optmal performances are achieved with an optcal pen
whose spot size is inferior to 7 µm
• MPLS 180 sensor. Optcal performances are achieved with the Microview optcal head
Mirror-like samples / Low-reflectivity samples
• A point sensor controller (1)(2) with an optcal pen whose photometric efficiency is low / high respectvely
• MPLS 180 sensor.
Sub-Nanometrology applications
(see «precision class»)
• STIL-DUO controller (2) with an OPILB- series distance-mode optcal pen
Special requirements (3)
Contact us
MEASURING ROUGHNESS
Measurable Ra:
from 12 nm (with CL1MG210 optcal pen)
from 50 nm (with CL3MG140 optcal pen)
• A point sensor controller (1)(2) with a CL-MG- series or OP- series optcal pen whose spot size is inferior to 7 µm
Sub-nanometric applications
Measurable Ra: from 0.75 nm
• STIL-DUO controller (1)(2) with a OPILB- series distance-mode optcal pen
MEASURING THICKNESS
• Measurable Thickness limits:
7.5 µm-175 µm (with CL1MG210 optcal pen)
0.6 mm-34 mm (with CL6MG35 optcal pen)
• A point sensor controller (1)(2) with a CLMG- series or an OP- series optcal pen
• Resolution: 35 nm (with CL1MG210 optcal pen)
Thin films / Very high precision
Measurable Thickness limits: 0.4 µm-90 µm
Resolution: from 0.3 nm
• STIL-DUO controller (1)(2) with a OPILB- series thickness-mode optcal pen
(1) Point sensor controller = CCS-Prima, STIL-Initial, STIL-Duo or CHR-150L controller.
(2) Alone or mounted on a MICROMESURE 3Dmeasuring system.
(3) Measuring through a window or through a coatng, Side-looking optcal pen, Vacuum chamber, Harsh environments, Highly diffusing samples...
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Selecton guide
SELECTION
GUIDE
Measuring rate
Ultra-high rate
Requirement Measuring rate Products
Up to 324,000 points/s
(1800 lines/s)
• MPLS 180 sensor
Standard rate
Up to 2,000 points/s
Up to 1,000 points/s
• CCS-Prima, STIL-Initial, STIL-Duo controllers (*)
• CHR-150L controller (*)
(*) With a suitable optcal pen, alone or mounted on a MICROMESURE 3D measuring system
SENSORS
3D SYSTEMS
Scanning mode
Measuring an area
Requirement Type Products
Measuring a linear or circular profile
Measuring a single point over time
3D
(X,Y,Z)
2D
(X,Z)
1D
(Z)
Multi-channel operation
• MICROMESURE system with any point sensor (*)
• Scanning (3D) MPLS180 sensor
• Static(2D) MPLS180 sensor with the sample on a conveyor belt
• Any point sensor (*) mounted on a user-machine which has at least 2 moton axes
• MICROMESURE system with any point sensor (*)
• Static (2D) MPLS180 sensor
• Any point sensor (*) with the sample on a conveyor belt
• Any point sensor (*) mounted on a user-machine which has at least 1 moton axis
• Any point sensor (*)
(*) Point sensors: CCS-Prima, STIL-Duo, STIL-Initial or CHR150-L controller with a suitable optcal pen.
Sensor
Multi-channel operation
CHR-150L controller 1,2 or 4 simultaneous channels (1)(2)
SPECTRO
COLORIMETERS
CSS-Prima controller 1,2 or 4 multiplexed channels (1)(3)
STIL-Duo controller
STIL-Initial controller
MPLS180 sensor
Optical specifications
1 channel for a chromatic confocal optical pen and
1 channel for a interferometric optical pen
The two channels are multiplexed (3)
Single-channel operation only
(1) The number of channels should be specified while ordering, no upgrade is possible later.
(2) Simultaneous channels: all the channels measure at the same tme.
(3) Multplexed channels: all optcal pens may be connected to the controller at the same tme, but only one of them measures.
GONIO
PHOTOMETERS
Optical specifications
• Measuring range
• Axial resolution and accuracy
• Lateral resolution (spot size)
• Working distance
• Maximal measurable slope (°) on specular samples
• Photometric efficiency
• Min/Max measurable thickness
• Min. measurable roughness
See:
• For CCS-Prima, STIL-DUO, STIL-Initial sensors: See Chromatc Confocal
optcal pen specificatons (Pages 18, 19, 21)
• For STIL-Duo sensor: See Interferometric optcal pen specificatons (Pages 26)
• For MPLS180 sensor: See optcal head specificatons (Page 36)
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E1204

SELECTION
GUIDE
SENSORS 3D SYSTEMS
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Selecton guide
Electronic/Software specifications
Electronic/Software specifications
• Measuring rate
• Digital output type
• Analog outputs
• Trigger options
• Available software
See:
• For Point sensors:
See controller specificatons (Pages 12, 16, 24)
• For MPLS180 sensor:
See controller specificatons (Pages 35)
Mechanical specifications
For Outline dimensions of all products, see pages (53-70).
Value-for-Cost
• The mult-channel point sensors (multplexed CCS-Prima and simultaneous-channel CHR-150L) allow significant saving
compared to 2 or 4 independent sensors.
• The STIL-Duo controller combines 2 complementary technologies (Confocal Spectral Interferometry and Chromatic
Confocal Imaging) in the same controller.
• The STIL-Initial sensor («bundle» product suitable for first-tme users and for lab applicatons) is proposed at a very attractve
price. This sensor has some limitatons when compared to the other chromatc confocal point sensors as shown
in the table below.
STIL-Initial CCS-Prima CHR-150L
Number of optical pens that are interchangeable on
the same controller
1 (1) up to 20 (2) Up to 6 (2)
Available chromatic confocal optical pen models Some models (3) All models All models
Multi-channel operation No Opton (4) Opton (4)
Output type Digital Digital & Analog Digital & Analog
External Encoder reading capability No Yes No
Controller box type Desktop Industrial Desktop
(1) The optcal pen of the STIL-Inital is selected when ordering, no replacement is possible later.
(2) Optcal pens may be connected and disconnected from the controller easily. New optcal pens may be added later to the CCS-Prima and the CHR-150L controllers,
but they should be calibrated at factory on the customer’s controller.
(3) See page (11).
(4) See «Mult-channel operaton» on this selecton guide.
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Non-contact «point» sensors
SELECTION
GUIDE
SENSORS
Introducing Confocal Chromatic technology
The fruits of more than fifteen years of research and development by
our engineers, STIL’s optcal sensors offer the best of technology in
response to the most demanding needs in terms of non contact dimensional
measurements.
Based on an innovatve optcal principle which uses the chromatc coding
of space (invented and patented by STIL), our sensors allow users
to make measurements on nearly any kind of materials, with an exceptonal
accuracy.
STIL’s sensors find applicatons in almost all sectors of industry, be it as
high precision instruments in metrology or research laboratories, or as
quality control tools on producton lines.
Designed for use in industrial environments, the different ranges of
STIL’s sensors will appeal to integrators thanks to their easy interfacing
on measurement and inspecton machines, made possible thanks to
the DLL/ dynamic link libraries provided with each instrument.
3D SYSTEMS
Optical principle
Our optcal sensors are based on the highly innovatve Confocal Chromatc Imaging principle (STIL SA’s patent).
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
An incident white light pinhole is imaged through a
chromatc objectve into a contnuum of monochromatc
images along the Z-Axis, thus providing a «color coding»
along the optcal axis.
When an object is present in this «colored» field, a
unique wavelength is perfectly focused at its surface
and then reflected into the optcal system.
This backscattered beam passes through a filtering
pinhole into a spectrograph, which determines the
wavelength has been perfectly focused on the object,
and then accurately determine its positon in the
measuring field.
The Confocal Chromatc Imaging gives access to reliable,
accurate and reproducible dimensional measurements
with extremely high resoluton.
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E1204

SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact «point» sensors
A wide range of applications
Roughness measurement
Our sensors are fully compliant with
the new ISO25178 regulaton and are
able to measure roughness values
down to a few nanometers.
They allow to acquire roughness profiles
much faster than a classical tactle
probe, and without any risk of marking
the surface.
Profilometry & Microtopography
Interfaced with 3D scanning devices, STIL’s sensors
give acess to full 2D and 3D measurements of complex
objects or assemblies with submicronic accuracy.
Thickness measurement
The very innovatve Confocal Chromatc
Imaging principle allows measurement
of the thickness of transparent materials,
with extremely high accuracy,
using one single sensor. The thickness
is directly measured from one
side of the
sample.
Autofocus
Thanks to their extended measuring range, STIL’s
sensors are the perfect soluton for an accurate
autofocus in vision systems.
Level control
Thanks to their non-contact technology,
our sensors allow detecton and measurement
of fluids’ level.
Online inspection
STIL SA’s optcal sensors allow systematc control
on producton lines thanks to their very high
measuring rates and advanced interfacing
capabilites with the manufacturing
chain or the custom inspecton machine.
Vibrometry
Thanks to very high measuring frequencies and nanometric
resoluton, our sensors allow the measurement
of vibratons in objects under test. Their
non-contact design avoids disturbance of the system
under test, and allows analysis and measurement of
difficult to access areas.
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Non-contact «point» sensors
SELECTION
GUIDE
SENSORS
3D SYSTEMS
Characteristics
High resoluton non contact optcal sensors for 3D measurement with a wide range of applicatons.
Advantages
Characteristics
Confocal setup
Coaxial setup
Chromatic coding/decoding
Optical fiber system
Measuring modes
Benefits
- Exceptonal signal-to-noise rato (SNR)
- High resoluton
- No shadowing effects
- Capability of measuring highly polished surfaces
- No Z scanning required
- High precision
- Small, light weight, passive optcal probe («optcal pen»)
connected to the controller by a fiber optcs cable
- «Distance» (Z-coordinate)
- «Thickness» measurement of transparent materials
- Measure on any type of material (metal, glass, ceramics, semiconductors, paper),
- Measure on polished surfaces (mirrors, wafers) and on rough ones,
- Insensitve to ambient lightng,
- Compatble with harsh environments (high temperature / high pressure / irradiaton),
- ISO 25178 standard compliant,
- Large choice of measuring ranges (100 µm to 42 mm ranges),
- Large choice of optcal pens for specific requirements («endoscopic» pens / radial pens / large working distance /
steep slope / small spot size / through-window measurement...),
- Free software toolkit for an easy interfacing («CCS Manager» utlity, c++ and .net DLL SDK).
Product lines
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Product lines
STIL Initial
CCS controller
+ Optical pen(s)
+ Fiber optics cable(s)
CHR controller
+ Optical pen(s)
+ Fiber optics cables(s)
Features
- «Bundle» products including everything you need
- Recent design, many advandced features
- Ideal for first-tme users and research laboratories
- Exceptonal Value-for-Price
- Configurable sensors
- Large choice of interchangeable optcal pens
- Recent design, many advandced features
- Ideal for OEM users and Industrial applicatons
- Very wide range of applicatons
- 2 & 4 selectable-channels models available
- Configurable sensors
- Large choice of interchangeable optcal pens
- 2 & 4 simultaneous-channels models available
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E1204

SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact «point» sensors
«Bundle» Chromatic Confocal sensors
These sensors measure the alttude (z coordinate) of the sample point located on their optcal axis and the thickness of
transparent samples.
Advantages
- «Bundle» products including everything required for launching a measurement immediately: a controller, an optcal pen
(probe), a fiber optc cable, electrical cables, software tools and a comprehensive user manual,
- Best choice for first-tme users and for research lab applicatons,
- High precision, high resoluton,
- Exceptonal value for price.
STIL Initial Sensor Line
STIL Inital is a new line of high-resoluton chromatc confocal sensors. 5 models are available, each with a different optcal
pen. Contact us for advice on the best model for your applicaton.
Specifications (*) STIL Initial 0.4 STIL Initial E1.2 STIL Initial E1.2/90 STIL Initial 4.0 STIL Initial 12
Optical Pen Model CL2-MG140 ENDO 1.2 ENDO 1.2/90° CL4-MG35 CL5-MG35
Measuring Range 0.4 mm 1.2 mm 1.2 mm 4.0 mm 12.0 mm
Working Distance 11.0 mm 2.4 mm 0.4 mm 16.4 mm 29 mm
Axial Resolution 22 nm 100 nm 160 nm 130 nm 400 nm
Accuracy 80 nm 300 nm 800 nm 300 nm 900 nm
(*) See detailed specificatons next page
The STIL Inital controller is highly sophistcated, it features extensive synchronizaton opton and advanced measuring modes.
Here are a few examples.
Functions
Application
«Auto-LED» : The LED brightness
adapts itself automatcally
Samples with variable slope e.g lenses
«First peak» : The sensor locks on
the first surface
Topography on transparent objects or
coated samples
«Double Frenquency» : The sensor
selects the optmal measuring rate
automatcally
Samples with high sharp reflectvity variatons,
e.g. mask for microelectronics
«Hold Last Value» : Output data
smoothing
Very difficult samples with many non
measurable points
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Non-contact «point» sensors
SELECTION
GUIDE
SENSORS
STIL Initial: Technical specifications
Controllers
STIL initial Series
Model STIL Initial 0.4 STIL Initial E1.2 STIL Initial E1.2 /90 (1) STIL Initial 4.0 STIL Initial 12
OPTICAL PEN (PROBE)
Model CL2-MG140 ENDO 1.2 ENDO 1.2/90 (1) CL4-MG35 CL5-MG35
Measuring Range 0.4 mm 1.2 mm 1.2 mm 4.0 mm 12.0 mm
Working Distance 11.0 mm 2.4 mm 0.4 mm 16.4 mm 29 mm
Spot Diameter 3.4 µm 15 µm 13 µm 7.2 µm 16.5 µm
Max. Slope Angle (2) (3) +/- 28° +/- 14° +/- 9° +/- 21° +/- 14°
Weight 190 g 10 g 10g 155 g 175 g
Dimensions x L 27mm x 208.9mm 6 mm x 75.2 mm 6 mm x 82 mm 27 mm x 145.5 mm 27 mm x 145.5 mm
Distance Measurement
Axial Resoluton (4)
- With no averaging
- With Averaging 10
22 nm
8 nm
100 nm
35 nm
160 nm
60 nm
130 nm
50 nm
400 nm
180 nm
Accuracy (5) 80 nm 300 nm 800 nm 300 nm 900 nm
Measuring rough metalic samples (9) R NR NR NR NR
Roughness measurement (10)
Min. measurable Ra
30nm NR NR NR NR
3D SYSTEMS
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Thickness Measurement (6)
Min. Measurable Thickness (7)(8) 16 µm 75 µm NA 110 µm 450 µm
Max. Measurable Thickness (7)(8) 510 µm 1600 µm NA 5700 µm 16500 µm
CONTROLLER BOX
Measuring Modes
Measuring Rate
Digital Outputs
Digital Resoluton
Synchronizaton
Advandced Features
Power supply / Consumpton
Weight
Dimensions W x H x D
FIBER OPTICS CABLE
«Distance» and «Thickness»
100 Hz to 2000Hz
USB 2.0 and RS232 (up to 460800 baud)
In «Distance» mode: 30 bits
In «Thickness» mode: 15 bits
Input and Output 0V - 5V TTL synchronizaton signals
Extensive trigger capacites
«Double frequency» mode
«Auto LED» mode
«First peak» mode
«Hold last value» mode
«Thickness calibraton»
100V to 240 V AC 50-60 Hz / 25W
1920 g
199 mm x 123.5 mm x 277 mm
(1) Radial (90°) measuring optcal pen.
(2) The maximal angular slope applies to specular (mirror-like) surfaces only. For Diffusing surfaces the maximal slope angle is higher (up to 87° for perfect diffusers).
(3) Measured on a mirror at 100 Hz, with no averaging.
(4) Axial resoluton is defined as the RMS Noise level measured at optmal rate on a statc sample located at the center of the measuring, with no averaging.
(5) Accuracy is defined as the max. error over the entre measuring range, measured immediately after distance calibraton at the following conditons: “Auto-adaptve LED”
mode, optmal rate, slope angle=0°, averaging factor= measuring rate/10.
(6) For obtaining metrological performances in this mode it is recommended to carry out a calibraton on a thickness standard.
(7) These values are for a refractve index of 1.5 (for measuring air gap thickness divide by 1.5).
(8) Typical values, measured at the center of the measuring range at optmal rate, with no averaging.
(9) R = Recommended for measuring rough metallic samples (these samples can be measured with full performances)
NR = Not recommended for measuring rough metallic samples (these samples may be measured, but with reduced performances)
(10) The precise value of the min measurable Ra depends on the characteristcs of the sample. The values given in the table are typical..
N.B. : the values are subject to change without notce.
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact «point» sensors
Configurable Chromatic Confocal «point» sensors
These sensors measure the alttude (z coordinate) of the sample point located on their optcal axis.
They can also measure the thickness of transparent samples.
They consist of a controller (1), an «optcal pen» (optcal probe) (2) and a fiber optc cable (3).
2 controller lines (CCS & CHR), 3 optcal pen lines (CL-MG, OP & ENDO) and different fiber optc cable models are available.
A single controller may be ordered with several interchangeable optcal pens.
(1)
(3)
(2)
Advantages
- Select the CCS or CHR controller, as well as the optcal pen and the fiber optcs cable best suited for your applicaton.
- Large choice of measuring ranges (110 µm - 20 mm),
- Large choice of optcal pens satsfying specific requirements («endoscopic» / radial pens / large working distance / steep
slope / small spot size / through-window measurement..)
The CCS controller line
3 controllers for configurable chromatc confocal sensors featuring different number of channels are available:
- the CCS PRIMA (1 channel), CCS PRIMA 2 (2 channels) and CCS PRIMA 4 (4 channels).
Advantages
- High precision, high resoluton,
- Compatble with all chromatc confocal optcal pens,
- Up to 20 different optcal pens interchangeable on the same controller,
- Digital and analog outputs,
- Synchronized reading of external digital encoders.
CCS PRIMA controllers
- The leading chromatic confocal sensor worldwide,
- The most sophisticated chromatic confocal sensor on the market,
- Recommended for OEM User and Industrial applicatons,
- Improved performances in thickness mode thanks to a specific Thickness calibraton,
- Long lifetme light source,
- Measuring rates: 100 Hz to 2000 Hz.
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SPECTRO
COLORIMETERS
Non-contact «point» sensors
SELECTION
GUIDE
The CCS PRIMA controller is higly sophistcated, it offers extensive synchronizaton optons and advanced measuring modes.
SENSORS
Functions
«Auto-LED» : The LED brightness
adapts itself automatcally
«First peak» : The sensor locks on
the first surface
«Double Frenquency» : The sensor
selects the optmal measuring rate
automatcally
«Hold Last Value» : Output data
smoothing
Application
Samples with variable slope e.g lenses
Topography on transparent objets
Samples with high sharp reflectvity
variatons, e.g. mask for microelectronics
Very difficult samples with many non
measurable points
3D SYSTEMS
2 and 4 CCS Prima Multiplexed Channel Models
- Up to 4 optcal pens connected to a single CCS PRIMA controller
- Multplexed channels, Commutaton tme < 400ms,
- Ideal for automatc inspecton applicatons,
- Save up to 62 % compared to 4 independent controllers.
GONIO
PHOTOMETERS
4 multplexed channels
CCS PRIMA4 Controller
2 multplexed channels
CCS PRIMA2 Controller
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact «point» sensors
The CHR Controller Line
CHR150-L controllers
- High precision, high resoluton,
- Measuring rate up to 1 KHz,
- Compatble with all optcal pens,
- Long lifetme light source,
- Intergrated control panel.
CHR150 controllers
- Tungsten Halogen light source
2 and 4 CHR150 or CHR150-L simultaneous channel models
- Up to 4 optcal pens connected to a single CHR150-L controller
- All channels measure simultaneously,
- Each channel may be configured independently,
- Save up to 44% compared to 4 independent controllers.
2 Channels CHR150 Controller
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Non-contact «point» sensors
SELECTION
GUIDE
Controllers for configurable chromatic confocal point sensors:
Technical specifications
Controllers CHR Series CCS Series
Model CHR150 CHR150-L CCS-PRIMA
Measuring frequency
From 30 to 1000 points/sec
User defined
From 30 to 1000 points/sec
User defined
From 100 to 2000 points/sec
User defined
Multchannel version (1) Available (2 & 4 channels) Available (2 & 4 channels) Available (2 &4 channels)
SENSORS
Light source Halogen White LED White LED
Light source brightness setting None Manual Programmable
Advandced Features:
«Lock on first surface»
«Hold Last Value»
«Thickness calibraton»
«Auto LED» (2)
«Autodark» functon (3)
«Double frequency»
No
No
No
No
No
Up to 489 Hz
No
No
No
No
No
Up to 489 Hz
Yes
Yes
Yes
Yes
Yes
Up to 1850 Hz
Measuring modes
Distance
Thickness
Distance
Thickness
Distance
Thickness
Calibraton tables (max) 6 20
3D SYSTEMS
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Encoders input (4) No No Yes (up to 3 axes) - TTL signals input - 30 bits counters (> 1 billion steps count)
Digital outputs 15 bits resoluton 30 bits resoluton
Analog outputs 2 configurable outputs [0 – 10 V] - 12 bits resoluton 2 configurable outputs [0 - 10V] - 16 bits resoluton
Digital I/O RS232 (up to 115200 baud») serial link USB2 and RS232/RS422 (up to 46800 baud)
Synchronizaton I/O 1 Synchro input (TTL) / 1 Synchro output (TTL) 1 Synchro input (TTL) / 1 Synchro output (TTL)
Optcal fiber connector
Compatble Optcal pens
E2000 type («push-pull») with «Autoprotect» system
All chromatc confocal pen types
Power supply / consumpton From 85 to 240 V AC / 100 W From 85 to 240 V AC / 25 W 24 V DC / 20 W
Temperature in use 5°C - 40°C
Storage temperature -30°C – 70°C
Relatve humidity in use
5%-80% HR without condensaton
Protecton type IP 40
EMC
EN 61000-6-3 and EN 61000-6-2 compliant
Weight (5) 3.4 kg 1.4 Kg
Dimensions (w x h x d) 316mm x 96mm x 235mm 168mm x 138mm x 120mm
Mechanical interface Table top controller Integrated DIN rail mountng interface
(1) Multplexed channels (CCS) Vs simultaneous multple channels (CHR):
- CCS PRIMA4 multplexed sensor: 1 (out of 4) optcal pen can measure at a tme, the sensor can switch to another optcal
pen in about 400 ms.
- CHR150-2 and CHR150-4 Multple channels: All the optca l pens (2 or 4) can measure simultaneously.
(2) The «Auto Led» functon allows the CCS Prima controller to dynamically adjust the LED light power in order to permanently adapt
it according to the reflectvity of the measured object.
(3) The «Autodark» functon allows a constant and automatc regulaton of the Dark signal level of the CCS controller.
(4) The incremental encoders input port allows the acquisiton of the instant positon of the measuring system moton axes (3 axes
maximum). These measurements are synchronized with the measuring frequency of the sensor.
(5) The specified weight does not include the external light source for the CCS Ultma model.
N.B. : the values are subject to change without notce.
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Non-contact «point» sensors
3D measurement examples: chromatic confocal technology
Intra occular lens (IOL) - Z range: 750µm
3D measurement examples: confocal spectral interferometry
Through Silicon Vias (TSV) array - Via diameters: 5µm to 20µm - Z range 100µm
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Non-contact «point» sensors
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Modular optical pens (CL-MG Line)
CL-MG Line *
Model CL1 CL2 CL3 CL4 CL5 CL6
Measuring range (1) [µm] 130 400 1400 4000 12000 24000
Working distance (2) [mm] 3.3 11 12.7 16.4 29 22
Max. object slope (3) [deg] +/- 42.5° +/- 28° +/- 25° +/- 21° +/- 14° +/- 8.5°
Reference plate (4) - No Yes Yes Yes Yes No
SENSORS
Axial model (5)
-
Radial model (5) -
Standard
Optonal
Magnifier model MG210 MG140 MG210 MG140 MG70 MG140 MG70 MG35 MG20 MG35 MG20 MG35 MG20
LATERAL (XY) PROPERTIES
Spot size (diameter)
Lateral resoluton (6)
[µm]
[µm]
1.9
0.9
2.8
1.4
2.3
1.2
3.4
1.7
6.9
3.5
4
2
8
4
8
4
14
7
14
7
24.5
12.3
16
8
28
14
PHOTOMETRIC EFFICIENCY (7)
Collected energy (relatve) - 5.8 13 5.5 11.5 46 14 56 30 76 40 100 19.2 48
3D SYSTEMS
SPECTRO
COLORIMETERS
MECHANICAL INTERFACE
Length (8)
Diameter (8)
Weight
Performances (9)
DISTANCE MEASUREMENT
Axial resoluton (10)
With no averaging
With averaging 10
Accuracy (11)
Measuring rough metal surface (12)
[mm]
[mm]
[g]
[nm]
[nm]
[nm]
-
253.1
27
268
8
2.7
35
R
217.1
27
195
243.3
27
248
208.9
27
190
22
8
80
R
ROUGHNESS MEASUREMENT
Min. measurable Ra (13) [nm] 12 30 90 170 600 1100
THICKNESS MEASUREMENT (14)
Min. measurable thickness (15)
Max. measurable thickness (15)
[µm]
[µm]
7.5
175
9
175
14
510
14
510
176.1
27
189
22
510
205.9
27
215
R
38
2000
60
20
200
176.1
27
214
NR
40
2000
145.5
27
155
110
5700
130
50
300
NR
131.7
27
140
120
5700
145.5
27
175
350
16500
400
180
800
NR
131.7
27
160
550
16500
167.6
27
195
590
34000
780
300
1500
NR
151.8
27
180
725
34000
GONIO
PHOTOMETERS
N.B. : the values are subject to change without notce.
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SENSORS 3D SYSTEMS
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Non-contact «point» sensors
Classical optical pens (OP Line)
OP Line
Model OP300VM OP6000 OP8000 OP10000 OP24000 OP42000
Measuring range (1) [µm] 300 6 000 8000 10 000 24 000 42 000
Working distance (2) [mm] 5 28.8 37.2 66.9 223 518
Max object slope (3) [deg] +/- 25° +/- 22° +/- 16° +/- 12° +/- 5° +/- 2.5°
Reference plate (4) - No No Yes Yes Yes No
Axial model (5)
Radial model (5) -
Standard
Optonal
Standard
No
Standard
No
Standard
Optonal
Standard
Optonal
Standard
No
LATERAL (XY) PROPERTIES
Spot size (diameter)
Lateral resoluton (6)
[µm]
[µm]
8
4
12.5
6.25
34
17
51
25.5
100
50
110
55
MECHANICAL INTERFACE
Length (8)
Diameter (8)
Weight
[mm]
[mm]
[g]
127
15
25
205.5
60
727
150
40
400
189
50
640
172.5
59
360
287.2
85
1700
Performances (9)
DISTANCE MEASUREMENT
Axial resoluton (10)
Accuracy (11)
[nm]
[nm]
10
90
250
600
400
800
450
900
1500
3000
4000
40000
Min. measurable thickness (15) [µm] 25 200 300 425 1570 2500
(1) The measuring range depends on the controller model. The numerical values in this table are nominal values for a CCS Prima controller.
(2) The working distance depends on the controller model. The numerical values given in this table are typical values for a CCS-Prima controller.
(3) The max measurable slope angle applies to specular (mirror-like) surfaces only. For scattering surfaces the maximal slope angle is higher (up to 87° for perfect diffusers); however
the intensity of the collected signal decreases with increasing slope angle. The values given in this table were measured on a mirror at a rate of 100 Hz, with no averaging.
(4) The reference plate is a glass window that can be either located inside the optcal pen, or fixed on the same surface.
(5) For “axial” optcal pens the measuring range is parallel to the mechanical axis of the pen.
For “radial” optcal pens the measuring range is normal to the mechanical axis, allowing to measure inside holes.
(6) The lateral resoluton is defined as half the spot diameter.
(7) The photometric efficiency is the amount of energy collected by different optcal pens when measuring the same sample, in relatve units. The numerical values in this table are
typical, they are given only as a guide for selectng the magnifier model: For measuring a highly-reflectng sample, select a model with low photometric efficiency in order to avoid
saturaton. For measuring diffusive or low-reflectng samples, select a model with high photometric efficiency in order to avoid a poor signal-to-noise rato.
(8) Length and weight excluding the fiber optcs cable. The values given here are for the “axial” model.
(9) The performances given in this table were measured for a CCS Prima controller.
(10) Axial resoluton is defined as the RMS noise level measured on a statc sample. Measurement is performed at optmal rate on a sample located at the center of the measuring
range. Two values are given, with internal averaging set to 1 and to 10, respectvely. This parameter is measured immediately after distance calibraton and is specified on the
calibraton certficate which is delivered with each sensor.
(11) The accuracy is the max error observed in the entre measuring range when comparing the distance measured by the sensor with sample positon determined by a 1-nm
accurate encoder. This parameter is measured with the following settings: “Auto-adaptve LED” mode, optmal rate, slope angle=0°, internal averaging = measuring rate/10.
This parameter is measured immediately after distance calibraton and is specified on the calibraton certficate which is delivered with each sensor.
(12) R = Recommended for measuring rough metallic samples (these samples can be measured with full performances)
NR = Not recommended for measuring rough metallic samples (these samples may be measured, but with reduced performances)
(13) The precise value of the min measurable Ra depends on the characteristcs of the sample. The values given in the table are typical.
(14) Performances in thickness mode, and in partcular the accuracy of thickness measurement, depend on the characteristcs of the sample as well as on a procedure of “Thickness
calibraton” that should be performed by the user. For more informaton contact us.
(15) Typical values measured at the center of the measuring range at optmal rate, with no averaging.
These values are for a sample with a refractve index = 1.5 (When measuring the thickness of an air-gap they should be divided by 1.5)
N.B. : the values are subject to change without notce.
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Non-contact «point» sensors
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Miniature optical pens (ENDO Line)
SENSORS
3D SYSTEMS
STIL introduce ENDO, a new line of confocal chromatc pens providing an amazing tny size.
The ENDO optcal pens are ideal for non-contact measurements applicaton in reduced space environnements.
These miniature pens are very useful fot the measurement of holes or cavites with small diameter.
Thanks to their small size (6 mm diameter), their integraton in inspecton machines in the producton line is made easier.
SPECTRO
COLORIMETERS
Working with any STIL optoelectronic controllers, the ENDO series allow performing a precise measurement with submicron resoluton.
GONIO
PHOTOMETERS
Axial measuring directon configuraton
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SENSORS 3D SYSTEMS
Non-contact «point» sensors
Miniature Series
Model ENDO0.1 ENDO0.3/90 ENDO1.2 ENDO1.2/90 ENDO1.5 ENDO1.5/90
Nominal measuring range (1) [µm] 100 300 1200 1200 1500 1500
Working distance [mm] 1.1 0.8 2.3 0.4 2.1 0.5
Minimum radius measurable (2) [mm] - 3.8 - 3.4 - 3.5
Axial resoluton in distance mode [µm] 0.02 * 0.1 0.15 0.1 *
Axial accuracy in distance mode [µm] 0.05 * 0.2 0.25 0.2 *
Max object slope (3) [deg] +/-24° +/-10° +/- 13° +/- 11° +/- 13° +/- 10°
Spot size diameter [µm] 6.2 6 15 15 7.1 20
Lateral resoluton [µm] 3.1 3 7.5 7.5 3.5 10
Length (4) [mm] 58.9 69.8 75.2 82 100.6 90
Weight (4) [g] 10 * 10 10 12 12
Mechanical diameter [mm] 6 6 6 6 6 6
Measuring directon - Axial Radial Axial Radial Axial Radial
(1) The precise values of the measuring range, the resoluton and the working distance depend on the controller type. The values in these tables are for the
CCS PRIMA controller.
(2) The minimum radius measurable is the distance from the axial axis to the beginning of the measuring range for radial configuraton.
(3) The values in these tables are for specular samples, for diffusive samples, the maximum slope can be much higher. The values are theoretcal.
(4) The length and weight do not include the optcal fiber.
(*) These parameters will be soon available, contact us.
Radial measuring directon configuraton (zoom)
N.B. : the values are subject to change without notce.
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PHOTOMETERS
Non-contact «point» sensors
SELECTION
GUIDE
SENSORS
Introducing Spectral Confocal Interferometry technology
The measurement accuracy in non contact profilometric techniques is generally limited by mechanical vibratons and by positonal
inaccuracies of the micro-scanning table. In order to free the measurement from these environnemental perturbatons, STIL has
developed a new vibraton insensitve interferometric method. With this new type of interferometric system, the potental subnanometric
accuracy of interferometric microscopy is effectve.
Moreover this new sensor can be used for measuring transparent films that are too thin to allow the “Chromatc Confocal” technique
to be used. The minimum measurable thickness is 0.4 µm.
3D SYSTEMS
SPECTRO
COLORIMETERS
Confocal Spectral Interferometry principle
The STIL interferometric method is based on Spectroscopic Analysis of White Light Interferograms (SAWLI). It consists in analysing
the interference signal observed on a spectrometer in order to measure the air gap thickness between the reference plate and the
sample. The originality of the developed system lies in the fixaton of the reference plate on the inspected object. As reference
plate and sample are fixed together, the mechanical vibratons do not affect the measurements.
The interferometric signal is a channelled spectrum. From this signal, the spectral phase is calculated using a numerical seven
points phase shifting algorithm allowing the measurement of the local height of the analyzed surface with a subnanometric
resoluton.
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Non-contact «point» sensors
The STIL DUO controller line
The new sensor STIL DUO double technology, a new standard in the world of dimensional measurement.
The sensor STIL DUO is the first system in the world that offers two simultaneous measurement technologies: the Confocal
Chromatc and the White Light Spectral Interferometry with an original confocal setup.
By associatng these two technologies (two STIL processes) the sensor STIL DUO creates a new standard in the world of dimensional
measurement because it allows the user to get the very best out of these two operatng principles:
- STIL’s Confocal Chromatc principle makes it possible to work with a large measurement scale going from 130 µm
to 42 mm. This characteristc is perfect for rugosity and surface topography measurements, which give very high
precision results on any type of material, be it reflectve or diffusing. The measurement is in compliance with the
new ISO 25178 standard.
- STIL’s Confocal Spectral Interferometry process gives access to sub-nanometric resolutons (

GONIO
PHOTOMETERS
Non-contact «point» sensors
SELECTION
GUIDE
SENSORS
Advantages
- Vibraton insensitve (OPILB-RP optcal pen),
- High signal to noise rato (OPILB-RP optcal pen),
- No vertcal scanning required,
- Minimum measurable thickness 0.4 µm,
- Subnanometric resoluton inherent to the optcal principle,
- No cross talk between neighbouring points, thanks to confocality,
- Exceptonnal performances in thickness measurement (0.3 nm resoluton, 10 nm accuracy)
Configurations
The sensor consists of:
- A STIL DUO controller,
- One or more interference optcal pen(s),
- One or more chromatc confocal optcal pen(s) (optonal),
- a fiber optc cable for each optcal pen.
3D SYSTEMS
STIL-DUO controller: technical specifications
DUO
Measuring frequency
up to 2000 Hz
Wavelength range
400-900 nm
Spectral resoluton
0.6 nm / pixel
SPECTRO
COLORIMETERS
Light Source
Digital outputs
Synchronizaton I/O
Optcal fiber connectors
Humidity limits
Temperature in use
Dimensions
Weigth
Measuring mode:
Distance/Thickness
Tungsten halogen lamp and White LED
Ethernet / RS232
1 input (TTL) / 1 output (TTL)
E2000
5%-80% HR without condensaton
5 - 50° C
376mm x 363mm x 114mm
6 Kg
1- Confocal Chromatc
2- Confocal spectral Interferometry
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Non-contact «point» sensors
Interferometric optical pens (OPILB line)
OPILB Line
Model OPILB-RP OPILB-LWD-D OPILB-LWD-T OPILB
Measuring mode - Distance Distance Thickness Thickness
Measuring range [µm] 135 135 - -
Working distance [mm] 5.3 5.3 5.3 42
Max. object slope [deg] +/- 7° +/- 7° +/- 7° +/- 7°
Reference plate (1) - Yes No No No
Magnifier model MG210 MG140 MG210 MG140 MG70 MG35 MG20 -
LATERAL (XY) PROPERTIES
Spot size (diameter)
Lateral resoluton (2)
[µm]
[µm]
3.8
1.9
5.6
2.8
3.8
1.9
5.6
2.8
11.4
5.7
22.8
11.4
40
20
40
20
MECHANICAL INTERFACE
Length (4)
Diameter (4)
Weight
[mm]
[mm]
[g]
200
27
200
164
27
127
200
27
200
164
27
127
131
27
126
100
27
67
84
27
52
145.5
27
155
Performances
DISTANCE MEASUREMENT
Axial resoluton (5)
Accuracy (6)
Measuring rough metal surface (7)
[nm]
[nm]
-
0.5
10
NR
2
10
NR
- -
ROUGHNESS MEASUREMENT
Min. measurable Ra (8) [nm] 0.5 3 - -
THICKNESS MEASUREMENT
Min. measurable thickness (9)
Max. measurable thickness (9)
Axial resoluton (5)
Accuracy (6)
[µm]
[µm]
[nm]
[nm]
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
0.4
90
0.3
10
0.4
90
0.3
10
0.4
90
0.3
10
0.4
90
0.3
10
(1) The reference plate is placed directly on the sample. The reference plate of the OPILB-RP acts as an absolute reference. It compensates for the mechanical imperfectons
of the scanning system.
(2) The lateral resoluton is defined as half the spot diameter.
(3) The photometric efficiency is the amount of energy collected by different optcal pens when measuring the same sample, in relatve units. The numerical values in this
table are typical, they are given only as a guide for selectng the magnifier model: For measuring a highly-reflectng sample, select a magnifier model with low photometric
efficiency in order to avoid saturaton. For measuring diffusive or low-reflectng samples, select a magnifier with high photometric efficiency in order to avoid a poor
signal-to-noise rato.
(4) Length and weight excluding the fiber optcs cable.
(5) Axial resoluton is defined as the RMS noise level measured on a statc sample. Measurement is performed at optmal rate on a sample located at the optmal poston.
(6) The accuracy is the max error observed in the entre measuring range when comparing the distance measured by the sensor with sample positon determined by a
1-nm accurate encoder.
(7) R = Recommended for measuring metallic samples (these samples can be measured with full performances)
NR = Not recommended for measuring metallic samples (these samples may be measured, but with reduced performances)
(8) The precise value of the min measurable Ra depends on the characteristcs of the sample. The values given in the table are typical.
(9) These values are for a sample with a refractve index = 1.5 (When measuring the thickness of an air-gap they should be multplied by 1.5)
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SENSORS
Fiber optic cables
E2000 «push/pull» connector
Model Length Core Ø Ø max Sheath Connector type
E50-3 3 m 50/125 µm 2.8 mm Standard E2000
E50-5 5 m 50/125 µm 2.8 mm Standard E2000
E50-10 10 m 50/125 µm 2.8 mm Standard E2000
E20-2 2 m 10/20 µm 1.9 mm Standard E2000
E50-3-M 3 m 50/125 µm 5 mm Metal armored E2000
E50-5-M 5 m 50/125 µm 5 mm Metal armored E2000
E50-10-M 10 m 50/125 µm 5 mm Metal armored E2000
E50-20-M 20 m 50/125 µm 5 mm Metal armored E2000
3D SYSTEMS
SPECTRO
COLORIMETERS
Standard E2000 connector optcal fiber
Metallic armored E2000 connector optcal fiber
FC/APC connector
Model Length Core Ø Ø max Sheath Connector type
F50-3 3 m 50/125 µm 2.8 mm Standard FC/APC
F50-4 4 m 50/125 µm 2.8 mm Standard FC/APC
F50-10 10 m 50/125 µm 2.8 mm Standard FC/APC
F20-2 2 m 10/20 µm 1.9 mm Standard FC/APC
F50-3-M 3 m 50/125 µm 5 mm Metal armored FC/APC
F50-4-M 4 m 50/125 µm 5 mm Metal armored FC/APC
F50-10-M 10 m 50/125 µm 5 mm Metal armored FC/APC
F20-4-M 4 m 10/20 µm 5 mm Metal armored FC/APC
F20-10-M 10 m 10/20 µm 5 mm Metal armored FC/APC
F50-5-M 5 m 10/20 µm 5 mm Metal armored FC/APC
F50-10-M 10 m 10/20 µm 5 mm Metal armored FC/APC
GONIO
PHOTOMETERS
Standard FC/APC connector optcal fiber
Metallic armored FC/APC connector optcal fiber
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Non-contact «point» sensors
Accessories
Mechanical accessories
Model
ST3
DT3x3
Description
Single turreti
Mechanical assembly allowing to combine one magnifier with three different chromatc lenses.
Double turreti
Mechanical assembly allowing to combine three magnifiers with three different chromatc lenses.
The new concept of Modular Optcal Pen (consistng of the combinaton of a
chromatc objectve and an achromatc magnifier) offers the major opportunity
to design a more flexible combinaton : the MULTIPEN which can be available in
two different configuratons : ST and DT.
Based on a microscope turret, the MULTIPEN ST consists of the combinaton of
one achromatc magnifier with three different chromatc lenses, thus offering
three different depths of field in one single mechanical assembly.
The MULTIPEN DT (for double turret) comprises a second turret equipped with
three different magnifiers, thus offering three different spot sizes for each of
the three chromatc objectves. This corresponds to nine different Modular
Optcal Pens in one single mechanical assembly.
Light source and exchange bulbs
Model
XS300
LED300
LED100
XE-300
HL50W
Description
300 Watts Xenon Arc Generatori
External light source for CCS and CHR controllers
Multchannel illuminator: 18 LEDS (5W, white light) including a bundle of fibers, lightng area:
11 mm x 0.2 mm. External light source for MPLS and vision system.
Multuichannel illuminator: 9 LEDS (5W, white light) including a bundle of fibers, lightng area:
4.8 mm x 0.2 mm. External light source for MPLS and vision system.
300 W exchange Xenon Arc bulb
Pack of 5 exchange Halogen lamps of 50 W (for CHR150 controllers)
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GONIO
PHOTOMETERS
Non-contact «point» sensors
SELECTION
GUIDE
XS300 Light source
SENSORS
3D SYSTEMS
LED300 Light source
SPECTRO
COLORIMETERS
Measurement standards
Model
Description
GS10 10 µm depth groove (non calibrated, optonal DKD calibraton certficate)
RS08 Roughness standard, Ra~0.8µm (optonal DKD calibraton certficate)
FS140 140 mm diameter optical flat (ZERODUR uncoated)
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Non-contact «point» sensors
Softwares
Model
Description
CCSMAN CCS Manager software
CHRMON CHR Monitor software
CHRSET CHR Setup Software
STILDLL STILDLL (Dynamic Link Library) for CHR 150 and CCS controllers
OPTMIMAX Min/Max software for CHR 150
OPTLVDT LVDT-type output for CHR 150
DLL for STIL point sensors:
The “STILDLL” provides a powerful high-level software development toolkit enabling an easy interfacing of STIL’s sensors to
custom applicatons.
It may be used with all STIL point sensors
DLL Compatbility
- ANSI-C programs
- Microsoft Visual C++ Tm (versions 6, 2005, 2010)
- .NET (framework 3.5) languages
The main features of the DLL are:
- Initalize and connect to the sensor through RS232, Ethernet or USB2;
- Get/Set the sensor settings, e.g.:
• Sampling rate,
• Measuring mode (Distance/Thickness),
• Optcal pen selecton,
• Digital output settings (data selecton, ascii/binary mode, baud rate...)
• Analog output settings (data selecton, scaling of the data on the 0-5V range),
- Measure the sensor «Dark» signal,
- Enable/disable hardware trigger mode,
- Launch measurement with other processes,
- Synchronize the measurement with other processes,
- Get the sensor status and the «last error» parameter.
The “STILDLL” is delivered with a detailed User Manual and a large number of code samples.
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SPECTRO
COLORIMETERS
Non-contact «point» sensors
SELECTION
GUIDE
CHR Setup Software
CHR Setup is a useful software utlity to configure the CCS and the CHR sensors, to display and save the measured data.
The CHR Setup Software offers a full palette of advanced features, including real
tme visualizaton of the signals delivered by the sensor on-board spectrometer.
The user-friendly interface enables the operator to view and to modify all the
sensor’s settings:
SENSORS
- Acquisiton rate and temporal averaging,
- Optcal pen selecton,
- Measuring mode (distance or thickness measurement),
- Digital output configuraton,
- Analog output configuraton.
These signals may be captured, saved and compared with reference signals.
This feature is very useful for adjustng the positon of the optcal pen relatvely to the sample, or for analyzing the sensor
performance in partcularly difficult measuring conditons ( very low signal to noise rato, sample located at the very end of the
measuring range, measuring the thickness of thin layers,…).
3D SYSTEMS
This interface comprises a dedicated Command Terminal allowing to send ASCII commands to the sensor and to view its response.
Example: by typing in “$TRG”, the operator may implement and test the triggered operaton mode.
Thanks to this software, measurements may be easily configured (sensor rate, number of points to measure, trigger mode) and
launched. The operator may select the data for display: Distance, Thickness, Intensity… This data is displayed in real tme in the
graphic window. Moreover, it may be saved on the hard disk or sent to the printer.
At the end of the measurement, statstcal informaton (minimum, maximum, average, standard deviaton) is automatcally
displayed.
This utlity facilitates maintenance tasks, by a single mouse click the operator may interrogate the sensor for its serial number
or send a new firmware version.
GONIO
PHOTOMETERS
Minimal computer configuraton
Windows XP TM
512 MB RAM, 1 GHz
RS232, Ethernet or USB port (depending on the sensor type)
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SENSORS 3D SYSTEMS
Non-contact «point» sensors
CHR Monitor Software
The CHR Monitor software allows to display, to print and to save the signal delivered by CHR sensors.
A simple mouse click offers the possibility to:
- Launch the Dark Signal acquisiton;
- Select:
• The optcal pen connected to the CHR sensor,
• The parameters to be displayed (alttude, intensity…),
• The Acquisiton and sampling rates,
• The temporal averaging factor.
Available operatng modes
Contnuous visualizaton
Acquisiton (N measurements) at a constant sampling rate
Acquisiton in CMM mode (alttude statement)
Licence
The program requires a “dongle” (hardware) to be installed on the parallel port. A printer or any other parallel port device
may stll be connected to the parallel port through the “dongle”.
Minimal computer configuraton
Windows 2000 / NT
256 MB RAM, 1 GHz
Serial port
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SPECTRO
COLORIMETERS
Non-contact «point» sensors
SELECTION
GUIDE
CCS Manager Software
The CCS Manager software is a powerful software which allows to start measuring with your new CCS-Prima sensor, STIL-Inital
or STIL-Duo in minutes.
Thanks to its very user-frendly interface, the CCS Manager software
is the simplest way to get accurate measurements from the sensor
and to have a full control over all the settings of your CCS sensor.
Moreover, CCS Manager provides advanced maintenance functons :
SENSORS
- Update of the sensor’s firmware to take advantage of the latest
enhancements and the new functons developped by STIL’s engineers.
- In situ calibraton of your controller.
- Download to the sensor’s memory of additonal calibraton tables
allowing to use more optcal pens with your CCS controller.
- Unique «Diagnostcs» functon, allowing to record the current status of the sensor into a file, which can be directly sent
by email to STIL’s Applicaton and Support department. Thanks to these detailed informaton, our engineers are able to
give help and advice in minutes, even if the product is used thousands of kilometers away from our premises.
GONIO
PHOTOMETERS
3D SYSTEMS
Minimal computer configuraton
Window XP TM ,Windows 7 TM -32 bits, 7 TM -64 bits
512 MB RAM, 1 GHz
RS232 or USB port (depending on the sensor type)
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COLORIMETERS
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PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact «point» sensors
3D measurement examples: chromatic confocal technology
Human Skin measurement
Surface microtopography of a TF insert
3D measurement examples: confocal spectral interferometry
Commercial gratng
Solar cells
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Non-contact «line» sensors
SELECTION
GUIDE
SENSORS
MPLS180 «line» sensors
The MPLS180 is the first «line» chromatc confocal sensor in the world.
It pushes one step forward the amazing non-contact sensing technology
based on STIL’s patented confocal chromatc imaging.
The MPLS180 offers an ultra-high measuring frequency of up to 1800
lines per second (each line being made of 180 discrete points) providing
up to 324 000 measured points per second.
This outstanding performance is the result of a high level of technological
integraton, made possible thanks to STIL’s know-how design and
advanced manufacturing processes.
The MPLS180 sensor has received the «Silver Photon» Innovaton Award
at the Opto 2008 fair in Paris.
3D SYSTEMS
MPLS180 optical principle
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Each of the 180 white light source pinholes is imaged through a common
chromatc objectve, into a contnuum of monochromatc images
along the optcal axis, thus providing a series of «color coded»
optcal axes.
When an object is placed in these colored fields, a unique wavelength
is perfectly focused at its surface for each point, and then
efficiently reflected into the objectve. These monochromatc light
beams go through a series of filtering pinholes into an array of spectrographs.
The analysis of the wavelengths that have passed through the filtering
pinholes allow for each point to accurately determine its positon
in the measuring field.
The MPLS180 sensor then provides instant profile measurements,
each profile being made of 180 points simultaneously acquired.
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PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact «line» sensors
Basic sensor constitution
The MPLS180 Chromatic Confocal sensor comprises:
- An Optoelectronic controller including the light source, the spectrographs arrays, the acquisiton and processing
electronic unit,
- An optical fiber bundle linking the controller with the optcal head,
- A Chromatic Confocal Optical head generatng the Mult-Point Line.
Optionally, it can be equipped with a scanning mirror to generate a full field measurement.
MPLS 180 sensors with a scanning mirror opton.
Optoelectronic controller : technical specifications
Model
MPLS180
Number of measured points along the line 180
Maximum measuring rate 1.800 lines per second x 180 points per line = 324.000 measured points per second
Data transmission
USB 2.0 link
Software package
Dedicated DLL for Windows XP SP2
Measurement Synchronizaton
Input and output TTL trigger signals
Power supply
Consumpton
Optonal field scanning functon
Field scan duraton
Mechanical interface
100 - 240 Vac
100W with standard LED light source / 150W with optonal 12V/50W halogen bulbs
180 x 230 points acquired per field
0.13 second (at a line frequency of 1800 lines/sec)
Table top controller
Advantages
- Ultra fast non-contact measurement
- Confocal chromatc sensor
- High accuracy measurements
- Passive optcal head
- Works on any kind of material
- Insensitve to ambient lightng
- Perfect for online inspecton
- Scanning mirror (optonal) for direct 3D acquisitons
- Easy interfacing thanks to the DLL toolkit
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Non-contact «line» sensors
SELECTION
GUIDE
SENSORS
Optical heads
Model Wavy Cobra DeepView Microview
Line length (x axis) mm 44.75 14 4 1.8
Number of points along the line - 180 180 180 180
Spot size diameter (for each point) µm 41 38 15 4.8
Pitch (distance between 2 points) µm 250 78 22 10
Maximum slope angle deg 11 6.5 20 30
Working distance mm 40 1 46 10
Measuring range mm 1.6 15 5 0.5
Axial resolution µm 0.5 2.5 1.5 0.125
Accuracy µm 2.5 8 5 0.5
Field scanning (x,y)
mm
44.75 x 45.8
(optonal)
14 x 17
(standard)
-
1.8 x 1.8
(optonal)
3D SYSTEMS
SPECTRO
COLORIMETERS
MICROVIEW
(x,z) = 1.8x0.5 mm 2
DEEPVIEW
(x,z) = 4x5 mm 2
GONIO
PHOTOMETERS
COBRA
(x,y,z) = 14x17x15 mm 3
WAVY
(x,z) = 44.75x1.6 mm 2
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PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact «line» sensors
Measurement examples
Warpage measurement of Printed Circuit Board (measured with WAVY optcal head)
3D view
Alttude measurement
Dental measurements (measured with COBRA optcal head)
3D views
Mechanical measurements (measured with MICROVIEW optcal head)
Alttude measurement
3D view
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Non-contact 3D Measurement Systems
SELECTION
SENSORS
GUIDE
3D SENSORS SYSTEMS
MICROMESURE 2 Systems
The MICROMESURE 2 system, equipped with CCS-Prima, CHR or STIL-DUO Confocal
or Chromatc CHR150 Sensors sensors is the ideal tool for non contact surface measurement,
including 3D roughness, shape metrology and 3D microtopography.
Designed BY the Confocal Chromatc Sensor creators, FOR the Confocal
Chromatc Sensor use, the MICROMESURE 2 system fully exploits
The MICROMESURE 2 system fully exploits the extraordinary performances
of STIL’s non contact sensors in various applicatons and
the extraordinary performances of STIL’s non contact sensors in various
applicatons and fields.
fields.
Delivered with all the necessary control & acquisiton hardware and
software, the MICROMESURE 2 system is a «turn key» device that is
immediately operatonal after its installaton.
Advantages
SPECTRO
3D SYSTEMS
COLORIMETERS
Due to Confocal Chromatic sensors
- Non contact dimensional measurement
- Nanometric and Micrometric resolutons
- White light sensor (no speckle, wide measuring range)
- Coaxial measurement (no shadowing)
- High local slopes on specular (reflectve) surfaces
- Insensitve to ambient light
- Insensitve to object’s reflectvity: allows working on any
type of surface
- Thickness & Form Measurement of transparent objects
- Wide measuring ranges capabilites (from 20 µm to 24 mm)
Due to high quality scanning system
- Point scanning system allows to define scans dimensions and
resoluton without hardware constraints
- Real metrology on each measured points thanks to linear
encoders
- Flatness and orthogonality correctons
- Equipped with double turret
- User friendly Software
- Modular design (1, 2 or 3 axes) to adapt the configuraton to
the exact needs of the user
OPTICAL GONIO
PHOTOMETERS
COMPONENTS
SPECTRO GONIO
COLORIMETERS
PHOTOMETERS
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PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact 3D Measurement Systems
Applications
- Shape and texture analysis
- Fine mechanics inspecton
- Surface characterizaton
- 3D alttude and thickness topography / profilometry
- Roughness measurement
- Dimensional metrology
Industrial and Research Laboratories Fields
- Mechanics (roughness, tribology, 3D metrology, corrosion analysis …)
- Glass industry (float glass on line thickness control, 3D metrology …)
- Microelectronics (roughness, 3D metrology, defects analysis …)
- Optcs (roughness, 3D metrology...)
- Cosmetcs (tribology, 3D metrology …)
- Road & tres (tribology, 3D metrology …)
- Nuclear fuel industry (roughness, tribology, 3D metrology, corrosion analysis …)
- Textle (3D metrology, thickness topography …)
Options & Accessories
- Linear encoders on X & Y axes
- Video Camera
- Double turret
- Vibraton damping stand
- Metrology artfacts:
• Calibrated groove (depth 10 µm)
• Roughness standard (Ra=0.8µm)
• Optcal flat (140 mm diameter)
• Offset setting retcle
- Post processing software: SPIP from Image Metrology
Technical specifications
Scanning system Specifications
Translations Units X Axis Y Axis Z Axis Remarks
Travel mm 100 100 50 Up to 300mm on request
Positioning accuracy (max) µm/100mm 10 10 - without encoder
Positioning accuracy (max) µm/100mm 1 1 1 with encoder
Positioning resolution µm 0.1 0.1 0.1
Flatness (with correction) µm/100mm 1 1 -
Maximum speed mm/s 20 20 5
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Non-contact 3D Measurement Systems
SELECTION
GUIDE
Optoelectronic Controllers Specifications
The MICROMESURE2 system can be used with almost any of the STIL point sensors
controllers:
For detailed specificatons about controllers, refer to the following pages:
SENSORS
- CCS-PRIMA........Page 16
- CHR150..............Page 16
- STIL-DUO...........Page 24
Optical Pens Specifications
3D SYSTEMS
SPECTRO
COLORIMETERS
The MICROMESURE2 system can accept all the range of STIL’s confocal
chromatc and white light interferometry optcal pens :
For detailed specificatons about single point optcal pens, refer to the
following pages:
- CL-MG series....... Page 18
- OP series............. Page 19
- ENDO series.........Page 21
- OPILB series.........Page 25
GONIO
PHOTOMETERS
Video Camera Specifications
Video Camera (Optional) Units VCX50 VCX250
Type - Color CCD
Resolution [pixels] - 752 x 582
Gain - Automatc
Field of view mm² 5.2 x 4.1 1 x 0.8
Pixel size on object µm² 7 x 7 1.4 x 1.4
Lighting - 4 quadrants LED
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SENSORS 3D SYSTEMS
Non-contact 3D Measurement Systems
Control and Acquisition Software Functions
SurfaceMap Control & Acquisition Software
Main Functions
Profile Scanning (X, Y, Oblique)
Surface Scanning
Points series acquisiton
Type of acquisition
Repettve Measurements
Mult acquisiton sequence
Video image (if camera opton)
Dimensions
Scanning parameters setting
Step along each axis
Alttude Mode
Thickness Mode
Sensor parameters setting
Optcal pen choice
Averaging
Double frequency (if available)
Constant speed (with backlash compensaton)
Constant speed (back & forth)
Scanning type
Step by step
Z following
Folder selecton
Data saving
Format selecton (binary, csv)
Measurement Progress
User’s Supervision
X, Y & Z Coordinates
Sensor Status
Hardware homing
Leveling
Automatic Procedures
Autofocus
Recentering
Preview
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Non-contact 3D Measurement Systems
SELECTION
GUIDE
SENSORS
3D SYSTEMS
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Post Processing Software Functions
Basic Module
SPIP Post processing
Main Functons
4 modules
Version
8 modules
Version
Plane correcton / Flattening yes yes
Cross secton & Profiling yes yes
Alttude Histogram yes yes
Fourier Transform yes yes
Correlaton functons yes yes
Image Substracton & Additon yes yes
Color coding yes yes
Zoom yes yes
Transformaton : Mirrors, rotatons yes yes
Plug-in interface yes yes
Copy, print & save functons yes yes
Roughness Analysis (ISO 25178 + ANSI B46.1) yes yes
3D Visualization Studio yes yes
Filter Module yes yes
Extended Fourier Analysis
Grain Analysis
Batch processing
ImageMet Explorer
Scanning Probe Image Processor SPIP
Image Metrology was founded as a world-wide leading supplier of software for nano and microscale image processing.
Over the years, the Scanning Probe Image Processor, SPIP, has become the de-facto standard for image processing at
nanoscale.
SPIP provides customers with state-ofthe-art
image processing software for
microscopy, including:
• Correcton tools for creatng the most
accurate presentaton of the “true” surface,
• Automated analysis techniques ensuring
high accuracy, quality and cost efficiency,
• Visualizaton and reportng tools enabling
convincing and impressive communicaton
of results.
yes
yes
yes
yes
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Non-contact 3D Measurement Systems
Measurement examples
Porosity in brake lining material
3D view
Color filters for LCD display panels
3D view
Tribology – metallic part wearing test
3D view
Laser impacts on a metal plate
Height measurement
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Non-contact Spectrocolorimeter
SELECTION
GUIDE
SENSORS
Introducing Colorimetry
Color only exists through the combinaton of three elements: a light source, an object and an observer. Color becomes a subjectve
sensaton, which can be described with a color name. The Internatonal Commission on Illuminaton defined some standards
allowing us to quantfy colors. In consequence, colorimetric spaces are defined for different pairs of illuminant/observer and the
color is identfied by three coordinates, for example CIELAB, CIELUV…
Two categories of instrument are used for characterizing the color of an object: the colorimeters and the spectrocolorimeters. A
colorimeter is a very simple system proposing a series of colored filters in order to simulate the normalized curves of a standard
observer. The measurement is not very accurate and it does not allow users to detect differences that are invisible for some illuminants
and visible for others (metameric colors). In contrast, a spectrocolorimeter includes a dispersive component (gratng,
prism) allowing the measurement of the light reflected by the object in a much more precise manner, for the whole range of visible
wavelengths.
RUBY spectrocolorimeter
RUBY is a perfect soluton for real tme measurement of color. The fast detecton of color
drifts and servo-controlling producton tools possibilites allow a cost reducton for a low
level of investment.
3D SYSTEMS
SPECTRO
COLORIMETERS
• High acquisiton speed,
• Non contact measurement,
• Synchronizaton with custom machines,
• Stand-alone use.
In additon to color monitoring, different kinds of applicaton are available:
Whiteness measurement, formulaton, counter-typing, characterizaton
of the effects of materials and light stability measurement (artficial
or natural ageing).
Applications
Spectroscopic and colorimetric measurements are used for analyzing: Reflectance of diffusing materials and samples, Intensity
and color of light sources and displays, transmittance of filters and liquids.
Plastc Paper Cosmetcs Paints Inks
GONIO
PHOTOMETERS
Food Drugs Fabrics Wood Ceramics
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COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Non-contact Spectrocolorimeter
Advantages
- Real tme measurements for spectroscopy,
- Internal light source,
- Selectable spot size on the sample,
- Long working distance,
- Ergonomic and removable grip,
- Color and irradiance measurements,
- Metameric sample detecton,
- Automatc color sortng,
- Integrated software soluton
- Portable system allowing in situ measurements.
Technical specifications
Power Supply
Consumption
Light Source
RUBY CONTROLLER
85 to 240 V (50 / 60 Hz)
200 Watts
Tungsten halogen lamp
Measuring frequency
Data processing
Analog outputs
Digital outputs
Synchronization I/O
Optical fiber connectors
Wavelength range
Spectral resolution
Humidity limits
Temperature in use
Dimensions
Weight
up to 2000 Hz
Embedded FPGA board
2 outputs 0 - 10V
Ethernet / RS232
1 input (TTL) / 1 output (TTL)
SMA905 and FC/PC
400-800 nm
(other ranges on request)
0.6 nm / pixel
5%-80% HR without condensation
5 - 50° C
376mm x 363mm x 114mm
6 Kg
Optical head
Spot size
RUBY OPTICAL HEAD
1 / 2 / 4 / 7 mm
Working distance
Depth of field
80 mm
10 mm
Fastening thread 1/4’’
Accessories thread
30.5 mm
Accessories
Contact tip, pods
Dimensions 60 mm diam. / 178 mm length
Weight
0.5 Kg
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Non-contact Spectrocolorimeter
SELECTION
SENSORS
GUIDE
Software
Model
LRM
Descripton
RUBY Manager software
RUBYDLL
DLL (Dynamic Link Library) for RUBY controller
3D SENSORS SYSTEMS
SPECTRO
3D SYSTEMS
COLORIMETERS
SPECTRO GONIO
COLORIMETERS
PHOTOMETERS
DLL for RUBY controllers
The “RUBYDLL” provides a powerful high-level interface enabling user’s-programs written in C/C++ language to communicate
with RUBY controllers.
DLL compatbility
ANSI-C programs
Microsoft Visual C++ TM compilers (6, 7, 8 and .net versions)
Microsoft Visual C++ TM MFC
The main features of the DLL are:
- Initalize and connect to the controller through RS232 or Ethernet;
- Get/Set the sensor settings, e.g:
• Color coordinates,
• Color difference,
• Spectral difference,
• Colorimetry settings (observers, illuminants),
• Spectral sampling,
• Analog output settings,
• Digital output settings,
- Calibrate Black,
- Calibrate White,
- Acquire a target to compare with the current measurement,
- Enable / Disable hardware trigger mode,
- Launch the measurement with other processes,
- Synchronize the measurement,
with other processes,
- Get the controller status and the “last error” parameter,
OPTICAL GONIO
PHOTOMETERS
COMPONENTS
The “RUBYDLL” is delivered with a detailed User Manual and a large number of samples.
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SENSORS 3D SYSTEMS
Non-contact Spectrocolorimeter
RUBY MANAGER Software
Data processing is performed inside the RUBY controller.
A desktop or notebook PC and the RUBY Manager software could complete
the system in order to perform sophistcated measurements and analysis.
RUBY Manager is a powerful sofware which allows you to start measuring
color with your new RUBY controller in minutes.
Thanks to its user-friendly interface, RUBY Manager software is the simplest
way to gain complete control over all the settings of your RUBY controller.
The interface offers two different display modes:
The measurement mode dedicated to color conformity control, and the spectrum mode, dedicated to curve display
and comparison.
All the data is displayed in real tme and allows the visualizaton of the historic of producton process or chemical kinetc
experiment monitoring.
Morever, RUBY manager provides advanced maintenance functons:
- Update of the controller’s firmware to take advantage of the latest enhancements and the new
functon developed by STIL’s engineers.
- Unique “Diagnostcs” functon, allowing to record the current status of the controller into a file,
wich can be directly sent by email to STIL’s applicaton and support department.
The last version of RUBY Manager includes two new functons:
- Management of a database of reference colors, - Monitoring of the quality of a producton.
The first functon allows the user to create a reference colors library that can be used for the online control of a varied
producton. In spectroscopy applicatons, the comparison with reference spectra enables the possible recogniton of characteristc
signatures.
The second functon (Save in Regular Intervals) allows the user to save these data at a determined interval. This functon
is important for controling the quality of a producton over a long period.
Minimal computer configuraton
Windows XP
512 MB RAM, 1 GHz
RS232 (exported data: color coordinantes) or Ethernet (exported data: all)
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GONIO
PHOTOMETERS
Goniophotometers
SELECTION
GUIDE
SENSORS
3D SYSTEMS
SPECTRO
COLORIMETERS
REFLET goniophotometer
“REFLET” is a general purpose goniospectrophotometer for measuring back-scattering and forward scattering from diffusing
samples or specular surfaces.
A goniophotometer is an instrument for measuring light scattering in the visible spectral band, through a photopic filter V(λ)
or in the near infrared range.
Characterizaton of backscattering lobes (angular reflectance) and forward scattering
lobes (angular transmittance) of samples reveals the optcal propertes of materials
and serves as a useful tool in industrial and scientfic research of light scattering
and light emission mechanisms and of surface propertes (texture, roughness, polish
quality…).
Goniophotometry is fundamental to the understanding of visual percepton of objects:
in our daily experience the observer, the objects and the natural lightng (sun)
are always in moton, so that illuminaton and observaton angles are constantly varying.
CAD/CAM Software uses data based on goniophotometric measurements for
providing a realistc representaton of complex scenes.
The spectrograph opton allows analysis of the scattered light; at each angular configuraton
they provide an entre spectrum, so that the reflectance (or transmittance)
of the sample can be measured independently at each individual wavelength. Goniocolorimetry
is fundamental to study effect materials (automotve paintng, fabrics).
Features
- Real BRDF / BTDF measurement
- Full hemisphere (2π sr)
- Visible or near infrared range,
- Selectable spot size
- Very high dynamic range (1:10 9 )
- High angular resoluton (0.1°)
- Operates in ambient light conditons
- Compact, portable system
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SENSORS 3D SYSTEMS
Goniophotometers
REFLET technical specifications
Model REFLET-90 REFLET-180
Light Box
Spot size on the sample surface
Illuminance on the sample
Goniometer
ILLUMINATION
Halogen 100W bulb
Option: 6-positions filter wheel (color & ND filters)
Manually adjustable from Ø1 mm to Ø13 mm
Manually selectable from 100 lux to 25000 lux
REFLECTION MODE
- 0°-90° motorized
- Angular resolution: 0.1°
- Positioning precision: 0.5°
TRANSMISSION MODE
- Fixed, θ = 180°
DETECTION
Integrated-flux Detector Very High Dynamic range (10 9 )
REFLECTION MODE
- 0°-180° motorized
- Angular resolution: 0.1°
- Positioning precision: 0.3°
TRANSMISSION MODE
- 0°-180° motorized
Spectrometer
Optical system
Goniometer
Polarizer/Analyzer set (option)
Useful range: 400-900 nm
Spectral resolution : selectable (0.6, 1, 5 or 10 nm)
3 manually interchangeable optical blocs:
Optical bloc 1 2 3
Angular acceptance ± 2° ± 1.1° ± 0.04°
Observed area size Ø14mm Ø8mm Ø6mm
θ: -90° to 90° motorized
φ: -90° to 90° motorized
Angular resolution: selectable ( 0.1° 1° )
Positioning precision: 0.5°
MEASURING TIME
Rapid insertion
0°-90° manual rotation
180° θ-profile “Integrated flux” mode: 30 s
“Spectrometer” mode: 10 s
REFLET optical head
Applications
- Optcal surface characterizaton:
• Reflectors for luminaries
• Automotve headlights reflectors
• Scattering losses of lenses
- Light source characterizaton:
• LCD backlightng
- Visual appearence:
• Database for realistc rendering software
- Paints and inks:
• automotve metal paints
• angular-effect colored inks
• Countertyping
- Security:
• Watermarking
- Surface characterizaton of:
• metals, powders, paper, ceramics, plastc automotve
angular-effect colored inks
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GONIO
PHOTOMETERS
Goniophotometers
SELECTION
GUIDE
DIAMOND goniophotometer
DIAMOND is a goniophotometer whose optcal system is specially designed for measuring light scattering from specular surfaces.
SENSORS
Model DIAMOND-90 DIAMOND-180
Light Box
Spot size on the sample surface
ILLUMINATION
Halogen 100W bulb
Option: 6-positions filter wheel (color & ND filters)
Manually selectable Ø0.5 mm, Ø1 mm or Ø1.9 mm
Beam angle Manually selectable ±0.09°, ±0.18°, ±0.35° or ±0.5°
Goniometer
REFLECTION MODE
- 0°-90° motorized
- Angular resolution: 0.1°
- Positioning precision: 0.5°
TRANSMISSION MODE
- Fixed, θ = 180°
DETECTION
Integrated-flux Detector Very High Dynamic range (10 9 )
REFLECTION MODE
- 0°-180° motorized
- Angular resolution: 0.1°
- Positioning precision: 0.3°
TRANSMISSION MODE
- 0°-180° motorized
3D SYSTEMS
Observed area size on the sample
Manually selectable Ø0.5 mm, Ø1 mm or Ø1.9 mm
Beam angle Manually selectable ±0.09°, ±0.18°, ±0.35° or ±0.5°
Goniometer
Polarizer/Analyzer set (option)
θ: -90° to 90° motorized
φ: -90° to 90° motorized
Angular resolution: selectable ( 0.1° 1° )
Positioning precision: 0.5°
MEASURING TIME
Rapid insertion
0°-90° manual rotation
Measuring time of one meridian 30s (one 180° full-precision θ-profile)
DIAMOND optical head
SPECTRO
COLORIMETERS
Applications
Applicaton domains of residual scattering measurement are quite diversified and include ophtalmic optcs, semiconductor,
space industries :
- Control of polish / superpolish quality of mirrors and lenses
- Control of optcal glass quality
- Control of polished semiconductor surfaces (bare wafers, masks):
• surface quality
• presence of dust grains
- Measurement of scattering losses
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
REFLET & DIAMOND Goniophotometers
Goniophotometer - 180
Goniophotometer - 90
Options
- Detecton in the near infrared range, intensity mode (0.9 - 1.7 µm)
- Detecton in the near infrared range, spectral mode (1 - 1.7 µm)
- Filter wheel (color and ND filters)
- Sample holder with adjustable tlt plate
- Polarizer/analyser set (easy mountng)
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Appendix: outline dimensions of all products
3D SYSTEMS
SENSORS
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
Optoelectronic controllers: outline dimensions
STIL Inital controllers
- STIL Duo
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SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Appendix: outline dimensions of all products
SELECTION
GUIDE
CHR controllers
3D SYSTEMS
SENSORS
CHR-4 controllers
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
- CCS PRIMA & PRIMA2 controllers
CCS PRIMA4 controllers
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Appendix: outline dimensions of all products
SELECTION
GUIDE
CL1 MG210
CL1 MG140
3D SYSTEMS
SPECTRO
COLORIMETERS
SENSORS
CL2 MG210
GONIO
PHOTOMETERS
(*) The working distance and the measurement range are given as minimum values.
Please refer to the table page.
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
CL2 MG140
CL2 MG70
CL3 MG140
(*) The working distance and the measurement range are given as minimum values.
Please refer to the table page.
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Appendix: outline dimensions of all products
SELECTION
GUIDE
CL3 MG70
CL4 MG35
3D SYSTEMS
SPECTRO
COLORIMETERS
SENSORS
CL4 MG20
GONIO
PHOTOMETERS
(*) The working distance and the measurement range are given as minimum values.
Please refer to the table page.
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
CL5 MG35
CL5 MG20
CL6 MG35
CL6 MG20
(*) The working distance and the measurement range are given as minimum values.
Please refer to the table page.
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GONIO
PHOTOMETERS
Appendix: outline dimensions of all products
SELECTION
GUIDE
CL6 MG20
OP300VM
3D SYSTEMS
SPECTRO
COLORIMETERS
SENSORS
OP300VM 90°
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
OP3000N
OP6000
OP10000
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SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Appendix: outline dimensions of all products
SELECTION
GUIDE
OP10000 90°
3D SYSTEMS
SENSORS
OP24000
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
OP42000
OPILB LWD-T MG 70
OPILB LWD-T MG 35
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GONIO
PHOTOMETERS
Appendix: outline dimensions of all products
SELECTION
GUIDE
OPILB LWD-T MG 20
OPILB LWD-D MG140
3D SYSTEMS
SPECTRO
COLORIMETERS
SENSORS
OPILB RP MG140
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
OPILB RP MG140
OPILB RP MG70
OPILB RP MG35
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GONIO
PHOTOMETERS
Appendix: outline dimensions of all products
SELECTION
GUIDE
OPILB
ENDO0.1
3D SYSTEMS
SPECTRO
COLORIMETERS
SENSORS
ENDO0.3 90°
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
ENDO1.2
ENDO1.2 90°
ENDO1.5
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SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Appendix: outline dimensions of all products
SELECTION
GUIDE
MPLS 180 controllers
3D SYSTEMS
SENSORS
Microview
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
DeepView
Wavy
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SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
Appendix: outline dimensions of all products
SELECTION
GUIDE
Microview-F
3D SYSTEMS
SENSORS
Wavy-F
70
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SELECTION
GUIDE
SPECTRO
COLORIMETERS
GONIO
PHOTOMETERS
SENSORS 3D SYSTEMS
Appendix: outline dimensions of all products
REFLET-90 / DIAMOND-90
REFLET-180 / DIAMOND-180
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STIL SA - 595, rue Pierre Berthier
Domaine de Saint Hilaire
13855 Aix en Provence Cedex 3 - FRANCE
Tel: +33.(0)4.42.39.66.51
Fax: +33.(0)4.42.24.38.05
email : contact@stlsa.com
Countries with a local distributor:
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Malaysia
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i i i i i i i China
Europe / Middle East
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Find our local distributor on our website:
NON CONTACT MEASUREMENT SOLUTIONS
E1204
www.stlsa.com