2012 e-catalog - STIL
2012 e-catalog - STIL
2012 e-catalog - STIL
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Non-contact 3D Measurement Systems<br />
SELECTION<br />
GUIDE<br />
SENSORS<br />
3D SYSTEMS<br />
SPECTRO<br />
COLORIMETERS<br />
GONIO<br />
PHOTOMETERS<br />
Post Processing Software Functions<br />
Basic Module<br />
SPIP Post processing<br />
Main Functons<br />
4 modules<br />
Version<br />
8 modules<br />
Version<br />
Plane correcton / Flattening yes yes<br />
Cross secton & Profiling yes yes<br />
Alttude Histogram yes yes<br />
Fourier Transform yes yes<br />
Correlaton functons yes yes<br />
Image Substracton & Additon yes yes<br />
Color coding yes yes<br />
Zoom yes yes<br />
Transformaton : Mirrors, rotatons yes yes<br />
Plug-in interface yes yes<br />
Copy, print & save functons yes yes<br />
Roughness Analysis (ISO 25178 + ANSI B46.1) yes yes<br />
3D Visualization Studio yes yes<br />
Filter Module yes yes<br />
Extended Fourier Analysis<br />
Grain Analysis<br />
Batch processing<br />
ImageMet Explorer<br />
Scanning Probe Image Processor SPIP<br />
Image Metrology was founded as a world-wide leading supplier of software for nano and microscale image processing.<br />
Over the years, the Scanning Probe Image Processor, SPIP, has become the de-facto standard for image processing at<br />
nanoscale.<br />
SPIP provides customers with state-ofthe-art<br />
image processing software for<br />
microscopy, including:<br />
• Correcton tools for creatng the most<br />
accurate presentaton of the “true” surface,<br />
• Automated analysis techniques ensuring<br />
high accuracy, quality and cost efficiency,<br />
• Visualizaton and reportng tools enabling<br />
convincing and impressive communicaton<br />
of results.<br />
yes<br />
yes<br />
yes<br />
yes<br />
42<br />
www.stlsa.com<br />
E1204
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