2012 e-catalog - STIL

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Non-contact 3D Measurement Systems SELECTION SENSORS GUIDE 3D SENSORS SYSTEMS MICROMESURE 2 Systems The MICROMESURE 2 system, equipped with CCS-Prima, CHR or STIL-DUO Confocal or Chromatc CHR150 Sensors sensors is the ideal tool for non contact surface measurement, including 3D roughness, shape metrology and 3D microtopography. Designed BY the Confocal Chromatc Sensor creators, FOR the Confocal Chromatc Sensor use, the MICROMESURE 2 system fully exploits The MICROMESURE 2 system fully exploits the extraordinary performances of STIL’s non contact sensors in various applicatons and the extraordinary performances of STIL’s non contact sensors in various applicatons and fields. fields. Delivered with all the necessary control & acquisiton hardware and software, the MICROMESURE 2 system is a «turn key» device that is immediately operatonal after its installaton. Advantages SPECTRO 3D SYSTEMS COLORIMETERS Due to Confocal Chromatic sensors - Non contact dimensional measurement - Nanometric and Micrometric resolutons - White light sensor (no speckle, wide measuring range) - Coaxial measurement (no shadowing) - High local slopes on specular (reflectve) surfaces - Insensitve to ambient light - Insensitve to object’s reflectvity: allows working on any type of surface - Thickness & Form Measurement of transparent objects - Wide measuring ranges capabilites (from 20 µm to 24 mm) Due to high quality scanning system - Point scanning system allows to define scans dimensions and resoluton without hardware constraints - Real metrology on each measured points thanks to linear encoders - Flatness and orthogonality correctons - Equipped with double turret - User friendly Software - Modular design (1, 2 or 3 axes) to adapt the configuraton to the exact needs of the user OPTICAL GONIO PHOTOMETERS COMPONENTS SPECTRO GONIO COLORIMETERS PHOTOMETERS 38 44 www.stlsa.com E1204 E1104
SELECTION GUIDE SPECTRO COLORIMETERS GONIO PHOTOMETERS SENSORS 3D SYSTEMS Non-contact 3D Measurement Systems Applications - Shape and texture analysis - Fine mechanics inspecton - Surface characterizaton - 3D alttude and thickness topography / profilometry - Roughness measurement - Dimensional metrology Industrial and Research Laboratories Fields - Mechanics (roughness, tribology, 3D metrology, corrosion analysis …) - Glass industry (float glass on line thickness control, 3D metrology …) - Microelectronics (roughness, 3D metrology, defects analysis …) - Optcs (roughness, 3D metrology...) - Cosmetcs (tribology, 3D metrology …) - Road & tres (tribology, 3D metrology …) - Nuclear fuel industry (roughness, tribology, 3D metrology, corrosion analysis …) - Textle (3D metrology, thickness topography …) Options & Accessories - Linear encoders on X & Y axes - Video Camera - Double turret - Vibraton damping stand - Metrology artfacts: • Calibrated groove (depth 10 µm) • Roughness standard (Ra=0.8µm) • Optcal flat (140 mm diameter) • Offset setting retcle - Post processing software: SPIP from Image Metrology Technical specifications Scanning system Specifications Translations Units X Axis Y Axis Z Axis Remarks Travel mm 100 100 50 Up to 300mm on request Positioning accuracy (max) µm/100mm 10 10 - without encoder Positioning accuracy (max) µm/100mm 1 1 1 with encoder Positioning resolution µm 0.1 0.1 0.1 Flatness (with correction) µm/100mm 1 1 - Maximum speed mm/s 20 20 5 E1204 www.stlsa.com 39
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2012 e-catalog - STIL

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