2012 e-catalog - STIL
2012 e-catalog - STIL
2012 e-catalog - STIL
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Non-contact «point» sensors<br />
SELECTION<br />
GUIDE<br />
SENSORS<br />
<strong>STIL</strong> Initial: Technical specifications<br />
Controllers<br />
<strong>STIL</strong> initial Series<br />
Model <strong>STIL</strong> Initial 0.4 <strong>STIL</strong> Initial E1.2 <strong>STIL</strong> Initial E1.2 /90 (1) <strong>STIL</strong> Initial 4.0 <strong>STIL</strong> Initial 12<br />
OPTICAL PEN (PROBE)<br />
Model CL2-MG140 ENDO 1.2 ENDO 1.2/90 (1) CL4-MG35 CL5-MG35<br />
Measuring Range 0.4 mm 1.2 mm 1.2 mm 4.0 mm 12.0 mm<br />
Working Distance 11.0 mm 2.4 mm 0.4 mm 16.4 mm 29 mm<br />
Spot Diameter 3.4 µm 15 µm 13 µm 7.2 µm 16.5 µm<br />
Max. Slope Angle (2) (3) +/- 28° +/- 14° +/- 9° +/- 21° +/- 14°<br />
Weight 190 g 10 g 10g 155 g 175 g<br />
Dimensions x L 27mm x 208.9mm 6 mm x 75.2 mm 6 mm x 82 mm 27 mm x 145.5 mm 27 mm x 145.5 mm<br />
Distance Measurement<br />
Axial Resoluton (4)<br />
- With no averaging<br />
- With Averaging 10<br />
22 nm<br />
8 nm<br />
100 nm<br />
35 nm<br />
160 nm<br />
60 nm<br />
130 nm<br />
50 nm<br />
400 nm<br />
180 nm<br />
Accuracy (5) 80 nm 300 nm 800 nm 300 nm 900 nm<br />
Measuring rough metalic samples (9) R NR NR NR NR<br />
Roughness measurement (10)<br />
Min. measurable Ra<br />
30nm NR NR NR NR<br />
3D SYSTEMS<br />
SPECTRO<br />
COLORIMETERS<br />
GONIO<br />
PHOTOMETERS<br />
Thickness Measurement (6)<br />
Min. Measurable Thickness (7)(8) 16 µm 75 µm NA 110 µm 450 µm<br />
Max. Measurable Thickness (7)(8) 510 µm 1600 µm NA 5700 µm 16500 µm<br />
CONTROLLER BOX<br />
Measuring Modes<br />
Measuring Rate<br />
Digital Outputs<br />
Digital Resoluton<br />
Synchronizaton<br />
Advandced Features<br />
Power supply / Consumpton<br />
Weight<br />
Dimensions W x H x D<br />
FIBER OPTICS CABLE<br />
«Distance» and «Thickness»<br />
100 Hz to 2000Hz<br />
USB 2.0 and RS232 (up to 460800 baud)<br />
In «Distance» mode: 30 bits<br />
In «Thickness» mode: 15 bits<br />
Input and Output 0V - 5V TTL synchronizaton signals<br />
Extensive trigger capacites<br />
«Double frequency» mode<br />
«Auto LED» mode<br />
«First peak» mode<br />
«Hold last value» mode<br />
«Thickness calibraton»<br />
100V to 240 V AC 50-60 Hz / 25W<br />
1920 g<br />
199 mm x 123.5 mm x 277 mm<br />
(1) Radial (90°) measuring optcal pen.<br />
(2) The maximal angular slope applies to specular (mirror-like) surfaces only. For Diffusing surfaces the maximal slope angle is higher (up to 87° for perfect diffusers).<br />
(3) Measured on a mirror at 100 Hz, with no averaging.<br />
(4) Axial resoluton is defined as the RMS Noise level measured at optmal rate on a statc sample located at the center of the measuring, with no averaging.<br />
(5) Accuracy is defined as the max. error over the entre measuring range, measured immediately after distance calibraton at the following conditons: “Auto-adaptve LED”<br />
mode, optmal rate, slope angle=0°, averaging factor= measuring rate/10.<br />
(6) For obtaining metrological performances in this mode it is recommended to carry out a calibraton on a thickness standard.<br />
(7) These values are for a refractve index of 1.5 (for measuring air gap thickness divide by 1.5).<br />
(8) Typical values, measured at the center of the measuring range at optmal rate, with no averaging.<br />
(9) R = Recommended for measuring rough metallic samples (these samples can be measured with full performances)<br />
NR = Not recommended for measuring rough metallic samples (these samples may be measured, but with reduced performances)<br />
(10) The precise value of the min measurable Ra depends on the characteristcs of the sample. The values given in the table are typical..<br />
N.B. : the values are subject to change without notce.<br />
12<br />
www.stlsa.com<br />
E1204