2012 e-catalog - STIL
2012 e-catalog - STIL
2012 e-catalog - STIL
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SELECTION<br />
GUIDE<br />
SENSORS 3D SYSTEMS<br />
SPECTRO<br />
COLORIMETERS<br />
GONIO<br />
PHOTOMETERS<br />
Selecton guide<br />
Application type<br />
Application<br />
Products<br />
MEASURING THE SHAPE OR DISTANCE OF A SAMPLE<br />
General case<br />
• A point sensor controller (1)(2) with a CL-MG- series<br />
• MPLS 180 sensor<br />
Long working distance<br />
• CCS-Prima, <strong>STIL</strong>-Duo, CHR-150L controller (2) with a OP- series optcal pen<br />
Inside a cavity (diam. from 7 mm)<br />
• A point sensor controller (1)(2) with a miniature (Endo series) optcal pen<br />
Rough metallic samples<br />
• A point sensor controller (1)(2) with any optcal pen. Optmal performances are achieved with an optcal pen<br />
whose spot size is inferior to 7 µm<br />
• MPLS 180 sensor. Optcal performances are achieved with the Microview optcal head<br />
Mirror-like samples / Low-reflectivity samples<br />
• A point sensor controller (1)(2) with an optcal pen whose photometric efficiency is low / high respectvely<br />
• MPLS 180 sensor.<br />
Sub-Nanometrology applications<br />
(see «precision class»)<br />
• <strong>STIL</strong>-DUO controller (2) with an OPILB- series distance-mode optcal pen<br />
Special requirements (3)<br />
Contact us<br />
MEASURING ROUGHNESS<br />
Measurable Ra:<br />
from 12 nm (with CL1MG210 optcal pen)<br />
from 50 nm (with CL3MG140 optcal pen)<br />
• A point sensor controller (1)(2) with a CL-MG- series or OP- series optcal pen whose spot size is inferior to 7 µm<br />
Sub-nanometric applications<br />
Measurable Ra: from 0.75 nm<br />
• <strong>STIL</strong>-DUO controller (1)(2) with a OPILB- series distance-mode optcal pen<br />
MEASURING THICKNESS<br />
• Measurable Thickness limits:<br />
7.5 µm-175 µm (with CL1MG210 optcal pen)<br />
0.6 mm-34 mm (with CL6MG35 optcal pen)<br />
• A point sensor controller (1)(2) with a CLMG- series or an OP- series optcal pen<br />
• Resolution: 35 nm (with CL1MG210 optcal pen)<br />
Thin films / Very high precision<br />
Measurable Thickness limits: 0.4 µm-90 µm<br />
Resolution: from 0.3 nm<br />
• <strong>STIL</strong>-DUO controller (1)(2) with a OPILB- series thickness-mode optcal pen<br />
(1) Point sensor controller = CCS-Prima, <strong>STIL</strong>-Initial, <strong>STIL</strong>-Duo or CHR-150L controller.<br />
(2) Alone or mounted on a MICROMESURE 3Dmeasuring system.<br />
(3) Measuring through a window or through a coatng, Side-looking optcal pen, Vacuum chamber, Harsh environments, Highly diffusing samples...<br />
E1204<br />
www.stlsa.com 5
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