2012 e-catalog - STIL
2012 e-catalog - STIL
2012 e-catalog - STIL
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
GONIO<br />
PHOTOMETERS<br />
Goniophotometers<br />
SELECTION<br />
GUIDE<br />
DIAMOND goniophotometer<br />
DIAMOND is a goniophotometer whose optcal system is specially designed for measuring light scattering from specular surfaces.<br />
SENSORS<br />
Model DIAMOND-90 DIAMOND-180<br />
Light Box<br />
Spot size on the sample surface<br />
ILLUMINATION<br />
Halogen 100W bulb<br />
Option: 6-positions filter wheel (color & ND filters)<br />
Manually selectable Ø0.5 mm, Ø1 mm or Ø1.9 mm<br />
Beam angle Manually selectable ±0.09°, ±0.18°, ±0.35° or ±0.5°<br />
Goniometer<br />
REFLECTION MODE<br />
- 0°-90° motorized<br />
- Angular resolution: 0.1°<br />
- Positioning precision: 0.5°<br />
TRANSMISSION MODE<br />
- Fixed, θ = 180°<br />
DETECTION<br />
Integrated-flux Detector Very High Dynamic range (10 9 )<br />
REFLECTION MODE<br />
- 0°-180° motorized<br />
- Angular resolution: 0.1°<br />
- Positioning precision: 0.3°<br />
TRANSMISSION MODE<br />
- 0°-180° motorized<br />
3D SYSTEMS<br />
Observed area size on the sample<br />
Manually selectable Ø0.5 mm, Ø1 mm or Ø1.9 mm<br />
Beam angle Manually selectable ±0.09°, ±0.18°, ±0.35° or ±0.5°<br />
Goniometer<br />
Polarizer/Analyzer set (option)<br />
θ: -90° to 90° motorized<br />
φ: -90° to 90° motorized<br />
Angular resolution: selectable ( 0.1° 1° )<br />
Positioning precision: 0.5°<br />
MEASURING TIME<br />
Rapid insertion<br />
0°-90° manual rotation<br />
Measuring time of one meridian 30s (one 180° full-precision θ-profile)<br />
DIAMOND optical head<br />
SPECTRO<br />
COLORIMETERS<br />
Applications<br />
Applicaton domains of residual scattering measurement are quite diversified and include ophtalmic optcs, semiconductor,<br />
space industries :<br />
- Control of polish / superpolish quality of mirrors and lenses<br />
- Control of optcal glass quality<br />
- Control of polished semiconductor surfaces (bare wafers, masks):<br />
• surface quality<br />
• presence of dust grains<br />
- Measurement of scattering losses<br />
50<br />
www.stlsa.com<br />
E1204