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2012 e-catalog - STIL

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GONIO<br />

PHOTOMETERS<br />

Goniophotometers<br />

SELECTION<br />

GUIDE<br />

DIAMOND goniophotometer<br />

DIAMOND is a goniophotometer whose optcal system is specially designed for measuring light scattering from specular surfaces.<br />

SENSORS<br />

Model DIAMOND-90 DIAMOND-180<br />

Light Box<br />

Spot size on the sample surface<br />

ILLUMINATION<br />

Halogen 100W bulb<br />

Option: 6-positions filter wheel (color & ND filters)<br />

Manually selectable Ø0.5 mm, Ø1 mm or Ø1.9 mm<br />

Beam angle Manually selectable ±0.09°, ±0.18°, ±0.35° or ±0.5°<br />

Goniometer<br />

REFLECTION MODE<br />

- 0°-90° motorized<br />

- Angular resolution: 0.1°<br />

- Positioning precision: 0.5°<br />

TRANSMISSION MODE<br />

- Fixed, θ = 180°<br />

DETECTION<br />

Integrated-flux Detector Very High Dynamic range (10 9 )<br />

REFLECTION MODE<br />

- 0°-180° motorized<br />

- Angular resolution: 0.1°<br />

- Positioning precision: 0.3°<br />

TRANSMISSION MODE<br />

- 0°-180° motorized<br />

3D SYSTEMS<br />

Observed area size on the sample<br />

Manually selectable Ø0.5 mm, Ø1 mm or Ø1.9 mm<br />

Beam angle Manually selectable ±0.09°, ±0.18°, ±0.35° or ±0.5°<br />

Goniometer<br />

Polarizer/Analyzer set (option)<br />

θ: -90° to 90° motorized<br />

φ: -90° to 90° motorized<br />

Angular resolution: selectable ( 0.1° 1° )<br />

Positioning precision: 0.5°<br />

MEASURING TIME<br />

Rapid insertion<br />

0°-90° manual rotation<br />

Measuring time of one meridian 30s (one 180° full-precision θ-profile)<br />

DIAMOND optical head<br />

SPECTRO<br />

COLORIMETERS<br />

Applications<br />

Applicaton domains of residual scattering measurement are quite diversified and include ophtalmic optcs, semiconductor,<br />

space industries :<br />

- Control of polish / superpolish quality of mirrors and lenses<br />

- Control of optcal glass quality<br />

- Control of polished semiconductor surfaces (bare wafers, masks):<br />

• surface quality<br />

• presence of dust grains<br />

- Measurement of scattering losses<br />

50<br />

www.stlsa.com<br />

E1204

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