2012 e-catalog - STIL

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Selecton guide SELECTION GUIDE General selection guide Application See • Measure the Shape of a sample • Measure the Distance of a sample (auto-focusing) • Measure the Thickness of a sample or a coating • Measure the Roughness of a surface 3D Metrology Products Selecton Guide (on this page) SENSORS • Measure or compare the Color of a sample • Measure the Spectrum reflected, transmitted or emitted from a sample or a light source • Measure the Angular distribution of light beam reflected, transmitted or emitted from a sample (BRDF/BTDF) Non Contact spectrocolorimeter (page 44) Goniophotometers (page 48) 3D SYSTEMS 3D Metrology products selection guide STIL SA proposes a large number of products for high quality 3D metrology. For selectng the right product one should consider several criteria: • Precision class, • Applicaton type, • Measuring rate, • Scanning mode, • Mult-channel operaton, • technical specificatons, • Value-for-Cost. SPECTRO COLORIMETERS GONIO PHOTOMETERS Precision class Class Axial Resolution (1) Measuring Range Technology Products Sub-nano-Metrology from 0.3 nm up to 135 µm Nano-Metrology from 8.0 nm (1) Smallest measurable step. (2) Alone or mounted on a MICROMESURE 3D measuring system. Several measuring ranges available: from 130 µm to 42 mm CONFOCAL SPECTRAL INTERFEROMETRY (page 22) CHROMATIC CONFOCAL IMAGING (page 8) STIL-DUO controller (2) with OPILB optcal pen CCS-PRIMA, STIL-INITIAL, STIL-DUO or CHR- 150L controller (2) with a CL-MG, OP or Endo series optcal pen MPLS 180 sensor 4 www.stlsa.com E1204
SELECTION GUIDE SENSORS 3D SYSTEMS SPECTRO COLORIMETERS GONIO PHOTOMETERS Selecton guide Application type Application Products MEASURING THE SHAPE OR DISTANCE OF A SAMPLE General case • A point sensor controller (1)(2) with a CL-MG- series • MPLS 180 sensor Long working distance • CCS-Prima, STIL-Duo, CHR-150L controller (2) with a OP- series optcal pen Inside a cavity (diam. from 7 mm) • A point sensor controller (1)(2) with a miniature (Endo series) optcal pen Rough metallic samples • A point sensor controller (1)(2) with any optcal pen. Optmal performances are achieved with an optcal pen whose spot size is inferior to 7 µm • MPLS 180 sensor. Optcal performances are achieved with the Microview optcal head Mirror-like samples / Low-reflectivity samples • A point sensor controller (1)(2) with an optcal pen whose photometric efficiency is low / high respectvely • MPLS 180 sensor. Sub-Nanometrology applications (see «precision class») • STIL-DUO controller (2) with an OPILB- series distance-mode optcal pen Special requirements (3) Contact us MEASURING ROUGHNESS Measurable Ra: from 12 nm (with CL1MG210 optcal pen) from 50 nm (with CL3MG140 optcal pen) • A point sensor controller (1)(2) with a CL-MG- series or OP- series optcal pen whose spot size is inferior to 7 µm Sub-nanometric applications Measurable Ra: from 0.75 nm • STIL-DUO controller (1)(2) with a OPILB- series distance-mode optcal pen MEASURING THICKNESS • Measurable Thickness limits: 7.5 µm-175 µm (with CL1MG210 optcal pen) 0.6 mm-34 mm (with CL6MG35 optcal pen) • A point sensor controller (1)(2) with a CLMG- series or an OP- series optcal pen • Resolution: 35 nm (with CL1MG210 optcal pen) Thin films / Very high precision Measurable Thickness limits: 0.4 µm-90 µm Resolution: from 0.3 nm • STIL-DUO controller (1)(2) with a OPILB- series thickness-mode optcal pen (1) Point sensor controller = CCS-Prima, STIL-Initial, STIL-Duo or CHR-150L controller. (2) Alone or mounted on a MICROMESURE 3Dmeasuring system. (3) Measuring through a window or through a coatng, Side-looking optcal pen, Vacuum chamber, Harsh environments, Highly diffusing samples... E1204 www.stlsa.com 5
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2012 e-catalog - STIL

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