2012 e-catalog - STIL

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Non-contact «point» sensors SELECTION GUIDE SENSORS Introducing Confocal Chromatic technology The fruits of more than fifteen years of research and development by our engineers, STIL’s optcal sensors offer the best of technology in response to the most demanding needs in terms of non contact dimensional measurements. Based on an innovatve optcal principle which uses the chromatc coding of space (invented and patented by STIL), our sensors allow users to make measurements on nearly any kind of materials, with an exceptonal accuracy. STIL’s sensors find applicatons in almost all sectors of industry, be it as high precision instruments in metrology or research laboratories, or as quality control tools on producton lines. Designed for use in industrial environments, the different ranges of STIL’s sensors will appeal to integrators thanks to their easy interfacing on measurement and inspecton machines, made possible thanks to the DLL/ dynamic link libraries provided with each instrument. 3D SYSTEMS Optical principle Our optcal sensors are based on the highly innovatve Confocal Chromatc Imaging principle (STIL SA’s patent). SPECTRO COLORIMETERS GONIO PHOTOMETERS An incident white light pinhole is imaged through a chromatc objectve into a contnuum of monochromatc images along the Z-Axis, thus providing a «color coding» along the optcal axis. When an object is present in this «colored» field, a unique wavelength is perfectly focused at its surface and then reflected into the optcal system. This backscattered beam passes through a filtering pinhole into a spectrograph, which determines the wavelength has been perfectly focused on the object, and then accurately determine its positon in the measuring field. The Confocal Chromatc Imaging gives access to reliable, accurate and reproducible dimensional measurements with extremely high resoluton. 8 www.stlsa.com E1204
SELECTION GUIDE SPECTRO COLORIMETERS GONIO PHOTOMETERS SENSORS 3D SYSTEMS Non-contact «point» sensors A wide range of applications Roughness measurement Our sensors are fully compliant with the new ISO25178 regulaton and are able to measure roughness values down to a few nanometers. They allow to acquire roughness profiles much faster than a classical tactle probe, and without any risk of marking the surface. Profilometry & Microtopography Interfaced with 3D scanning devices, STIL’s sensors give acess to full 2D and 3D measurements of complex objects or assemblies with submicronic accuracy. Thickness measurement The very innovatve Confocal Chromatc Imaging principle allows measurement of the thickness of transparent materials, with extremely high accuracy, using one single sensor. The thickness is directly measured from one side of the sample. Autofocus Thanks to their extended measuring range, STIL’s sensors are the perfect soluton for an accurate autofocus in vision systems. Level control Thanks to their non-contact technology, our sensors allow detecton and measurement of fluids’ level. Online inspection STIL SA’s optcal sensors allow systematc control on producton lines thanks to their very high measuring rates and advanced interfacing capabilites with the manufacturing chain or the custom inspecton machine. Vibrometry Thanks to very high measuring frequencies and nanometric resoluton, our sensors allow the measurement of vibratons in objects under test. Their non-contact design avoids disturbance of the system under test, and allows analysis and measurement of difficult to access areas. E1204 www.stlsa.com 9
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2012 e-catalog - STIL

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