Ion Beam Analysis for Forensic Science - SPIRIT
Ion Beam Analysis for Forensic Science - SPIRIT
Ion Beam Analysis for Forensic Science - SPIRIT
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<strong>Ion</strong> <strong>Beam</strong> Induced Luminescence<br />
• Analogous to cathodoluminescence on SEM (CL)<br />
• Visible light emitted under ion impact<br />
• Yields chemical in<strong>for</strong>mation :<br />
– Impurities<br />
– Structural defects<br />
– Valence states<br />
Malquvist et al: NIMB 109/110 (1996) 337-233<br />
Courtesy of S. Calusi, INFN Firenze, Florence, Italy