Ion Beam Analysis for Forensic Science - SPIRIT

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PIXE 2.5 MeV protons, SiLi 50mm 2 detector with 130um Be filter • Particles studied by EDS were located using a Cu finder grid • Backscattered particle image and Pb signal was used to image particles • 10 minute point spectra (on average) were recorded d BSE image analogue
PIXE and EDX spectra 100000 Cu K Pb L 10000 1000 Sn K 100 Sb K 10 Fe K 1 0 500 1000 1500 2000 2500 3000 M J Bailey, K Kirkby and C Jeynes, J. X Ray Spec, accepted Dec 2008, DOI 10.1002/xrs.1142
Page 1 and 2: Ion Beam Analysis for Forensic Scie
Page 3 and 4: Contents • Why use IBA techniques
Page 5 and 6: Background : IBA in forensics Court
Page 7 and 8: What Do Forensic Analysts Need •
Page 9 and 10: Particle Induced X-ray Emission •
Page 11 and 12: Rutherford Backscattering Spectrome
Page 13 and 14: Why Use Ion Beams in Forensics •
Page 17 and 18: Uniqueness of GSR LGC Forensics (UK
Page 19 and 20: SEM-EDSEDS • Technique of choice
Page 21: SEM-EDS results K Cu S Fe •Small
Page 25 and 26: Accurate Quantification of GSR part
Page 29 and 30: Quartz Grain Texture Analysis Examp
Page 31 and 32: Can PIXE be used to identify differ
Page 33 and 34: How reproducible is the technique T
Page 35 and 36: Typical PIXE maps for Sample 3 “M
Page 37 and 38: Can we distinguish i i one source f
Page 41 and 42: PIXE in casework • The paper cont
Page 45 and 46: Example 4 : Fingerprint Analysis by
Page 47 and 48: Can We Detect Moisturiser i in Fing
Page 49 and 50: Fingerprint i Analysis Using MeV SI
Page 51 and 52: Conclusions • PIXE / PIGE / RBS /
Page 53: Thank you

Ion Beam Analysis for Forensic Science - SPIRIT

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