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Ion Beam Analysis for Forensic Science - SPIRIT

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<strong>Ion</strong> <strong>Beam</strong> <strong>Analysis</strong><br />

RBS<br />

Energy of scattered protons or He give<br />

light element composition and elemental<br />

depth profiles<br />

MeV protons<br />

or He<br />

Sample<br />

PIXE<br />

Characteristic i X-ray emission<br />

i<br />

Simultaneous part-per-million<br />

detection of trace elements from<br />

Na to U<br />

PIGE/NRA<br />

Nuclear reactions give characteristic<br />

gamma rays and/or particles from light<br />

nuclei (e.g. Li, B, F)<br />

IBIL<br />

<strong>Ion</strong> beam induced<br />

luminescence

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