Ion Beam Analysis for Forensic Science - SPIRIT

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Secondary <strong>Ion</strong> Mass Spectrometry • Primary ion beam (KeV or MeV) is used to sputter target material • Secondary ions are analysed in mass spectrometer • Surface mass spectrometry • High sensitivity– ppb • Molecular specificity • Quantification difficult
Example 4 : Fingerprint <strong>Analysis</strong> by SIMS (secondary ion mass spectrometry) Thames Valley Police, Scotland Yard + Steve e Hinder and John Watts – University of Surrey
Page 1 and 2: Ion Beam Analysis for Forensic Scie
Page 3 and 4: Contents • Why use IBA techniques
Page 5 and 6: Background : IBA in forensics Court
Page 7 and 8: What Do Forensic Analysts Need •
Page 9 and 10: Particle Induced X-ray Emission •
Page 11 and 12: Rutherford Backscattering Spectrome
Page 13 and 14: Why Use Ion Beams in Forensics •
Page 17 and 18: Uniqueness of GSR LGC Forensics (UK
Page 19 and 20: SEM-EDSEDS • Technique of choice
Page 21 and 22: SEM-EDS results K Cu S Fe •Small
Page 23 and 24: PIXE and EDX spectra 100000 Cu K Pb
Page 25 and 26: Accurate Quantification of GSR part
Page 29 and 30: Quartz Grain Texture Analysis Examp
Page 31 and 32: Can PIXE be used to identify differ
Page 33 and 34: How reproducible is the technique T
Page 35 and 36: Typical PIXE maps for Sample 3 “M
Page 37 and 38: Can we distinguish i i one source f
Page 41 and 42: PIXE in casework • The paper cont
Page 43: Contents • Why use IBA techniques
Page 47 and 48: Can We Detect Moisturiser i in Fing
Page 49 and 50: Fingerprint i Analysis Using MeV SI
Page 51 and 52: Conclusions • PIXE / PIGE / RBS /
Page 53: Thank you

Ion Beam Analysis for Forensic Science - SPIRIT

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