Ion Beam Analysis for Forensic Science - SPIRIT

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PIXE K Cl Ca Ni Sn •PIXE detects additional differences in Ni, Cl, Ca, Zn and Sn which are not detected by EDS •These differences are well above the detection limit (at% cf ppm)
Accurate Quantification of GSR particles by PIXE/RBS M J Bailey and C Jeynes, 10.1016/j.nimb.2009.03.031 (2008) • Fitted RBS spectrum • Fitted PIXE data • Fitted depth profile • Quantitative analysis possible by PIXE/RBS C substrate GSR particle
Page 1 and 2: Ion Beam Analysis for Forensic Scie
Page 3 and 4: Contents • Why use IBA techniques
Page 5 and 6: Background : IBA in forensics Court
Page 7 and 8: What Do Forensic Analysts Need •
Page 9 and 10: Particle Induced X-ray Emission •
Page 11 and 12: Rutherford Backscattering Spectrome
Page 13 and 14: Why Use Ion Beams in Forensics •
Page 17 and 18: Uniqueness of GSR LGC Forensics (UK
Page 19 and 20: SEM-EDSEDS • Technique of choice
Page 21 and 22: SEM-EDS results K Cu S Fe •Small
Page 23: PIXE and EDX spectra 100000 Cu K Pb
Page 29 and 30: Quartz Grain Texture Analysis Examp
Page 31 and 32: Can PIXE be used to identify differ
Page 33 and 34: How reproducible is the technique T
Page 35 and 36: Typical PIXE maps for Sample 3 “M
Page 37 and 38: Can we distinguish i i one source f
Page 41 and 42: PIXE in casework • The paper cont
Page 45 and 46: Example 4 : Fingerprint Analysis by
Page 47 and 48: Can We Detect Moisturiser i in Fing
Page 49 and 50: Fingerprint i Analysis Using MeV SI
Page 51 and 52: Conclusions • PIXE / PIGE / RBS /
Page 53: Thank you

Ion Beam Analysis for Forensic Science - SPIRIT

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