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Department of Physics annual report 2000 - Fysiikan laitos - Helsinki.fi

Department of Physics annual report 2000 - Fysiikan laitos - Helsinki.fi

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mospheric particle formation, growth<br />

have had close collaboration especially<br />

ics and electronics combined. An in-<br />

and hygroscopic properties.<br />

with the <strong>Department</strong> <strong>of</strong> Forest Ecology<br />

frared imaging system for the Techni-<br />

The main output <strong>of</strong> our experimen-<br />

and the <strong>Department</strong> <strong>of</strong> Chemistry, both<br />

cal Research Centre <strong>of</strong> Finland (VTT)<br />

tal laboratory work has been the devel-<br />

in the University <strong>of</strong> <strong>Helsinki</strong>, and with<br />

was completed and delivered as part <strong>of</strong><br />

opment <strong>of</strong> tools for investigating nuclea-<br />

the Air Quality <strong>Department</strong> <strong>of</strong> the<br />

an EU project which VTT is adminis-<br />

tion phenomena and cloud condensa-<br />

Finnish Meteorological Institute.<br />

trating. With the IR camera system<br />

tion nucleus activation. We have also<br />

The international postgraduate<br />

developed in our laboratory an infrared<br />

carried out measurements <strong>of</strong> aerosol<br />

training programme for aerosol and<br />

image <strong>of</strong> wooden planks can be ob-<br />

particle size distributions in a variety <strong>of</strong><br />

environmental physics (started at the<br />

tained on-line from a moving conveyer.<br />

laboratory systems as well as in atmos-<br />

beginning <strong>of</strong> the autumn semester<br />

On-line quality control <strong>of</strong> wooden<br />

pheric conditions. Our special interest<br />

1994) was continued during <strong>2000</strong>.<br />

planks has become more and more<br />

has been targeted on the nanometer size<br />

Financial support from the Acade-<br />

important as better surface <strong>fi</strong>nish is<br />

range using recently developed aerosol<br />

my <strong>of</strong> Finland, the Environment and<br />

demanded.<br />

instrumentation such as electrical mo-<br />

Climate Research Programme (The<br />

We have completed the design <strong>of</strong> a<br />

bility spectrometry and the diffusion<br />

European Commission), the Nessling<br />

prototype coherence microscope. The<br />

battery technique, whereas for micron-<br />

Foundation and Tekes is gratefully<br />

coherence microscope utilizes the so-<br />

sized particles optical counting <strong>of</strong> parti-<br />

acknowledged.<br />

called white-light interference phe-<br />

cles is typically used.<br />

nomenon. With the table-top prototype<br />

8<br />

International cooperation has had<br />

a signi<strong>fi</strong>cant role in both the theoretical<br />

and the experimental activities <strong>of</strong><br />

the group. During <strong>2000</strong> various projects<br />

(including <strong>fi</strong>ve EU projects) continued<br />

▼ Electronics and Industrial<br />

<strong>Physics</strong> Research Laboratory<br />

(www.physics.helsinki.<strong>fi</strong>/~etlab/)<br />

M a u r i L u u k k a l a<br />

we can take high-resolution surface<br />

pr<strong>of</strong>ile microscopy pictures <strong>of</strong> various<br />

samples such as micromechanical<br />

parts, milled surfaces and even biological<br />

samples, as the microscope can be<br />

in cooperation with research groups<br />

In our laboratory we continue develop-<br />

scaled for different resolutions. The<br />

from Austria, Canada, the Czech Re-<br />

ing various novel measurement meth-<br />

illumination for the coherence micro-<br />

public, Estonia, Germany, Ireland,<br />

ods and sensors using optics, ultrason-<br />

scope can be created either with a<br />

Italy, Japan, the Netherlands, Russia,<br />

Sweden, the United Kingdom and the<br />

United States. On the national level we<br />

3D presentation <strong>of</strong> a pr<strong>of</strong>ile <strong>of</strong> a wafer<br />

sensor measured using white-light<br />

interferometer

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