AppNano Probes Catalog - Applied NanoStructures

More documents

Recommendations

Info

Probe Model: ACCESS-CContact Mode—Tip View ProbesACCESS-C Probes are sharp silicon probes designed to allow a direct opticalview of the AFM tip when imaging. ACCESS-C is intended for use in contactmode.Cantilever ParameterNominal ValueSpring Constant (N/m) 0.3ACCESS Tip ViewProbesFrequency (kHz) 16Length (µm) 450Width (µm) 49.5Thickness (µm) 2.5ROC (nm)
Probe Model: ACCESS-NCTapping Mode—Tip View ProbesACCESS-NC Probes are sharp silicon probes designed to allow a direct opticalview of the AFM tip when imaging. ACCESS-NC is intended for use intapping/non-contact mode.Cantilever ParameterNominal ValueSpring Constant (N/m) 78Frequency (kHz) 300Length (µm) 150Width (µm) 54Thickness (µm) 5.2ROC (nm)
Page 1 and 2: 2 Hz 40 Hz 80 HzCatalog of SPM Prob
Page 3 and 4: AppNano Patented Wafer FormAppNano
Page 5 and 6: Standard Silicon ProbesMaterial - A
Page 7 and 8: Probe Option: Super Sharp (SS)AppNa
Page 9 and 10: Probe Model: ACL SeriesACL Series P
Page 11 and 12: Silicon Force Modulation Mode Probe
Page 13: Silicon Contact Mode ProbesProbe Mo
Page 17 and 18: Conductive—Tip View ProbesConduct
Page 19 and 20: HYDRA Probe SeriesThe HYDRA Series
Page 21 and 22: Probe Model: HYDRA V-Shaped SeriesT
Page 23 and 24: Probe Model: VScan SeriesThe VScan
Page 25 and 26: Silicon Plateau (Blunt Radius) Prob
Page 27 and 28: Probe Model: COLLOIDAL ProbesColloi
Page 29 and 30: Probe Model: HART SeriesHigh Aspect
Page 31 and 32: Probe Model: Doped Diamond SeriesDo
Page 33 and 34: Probe Model: MAGT SeriesMagnetic Co
Page 35 and 36: Standards Model: SHS-1, SHS-0.1Step
Page 37 and 38: Membrane Model: POREAppNano PORE pr
Page 39 and 40: STM Tip EtcherProduct: STM Tip Etch
Page 41 and 42: Application Probe Model Description
Page 43 and 44: Application Probe Model Description

AppNano Probes Catalog - Applied NanoStructures

Create successful ePaper yourself

Delete template?

Save as template?