AppNano Probes Catalog - Applied NanoStructures

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Table of ContentsProbe Info &Selection GuideSilicon ProbesCoated Probes Special/Custom Silicon Nitride Tip View ProbesProbes (ACCESS)Membranes /StandardsSTM ProbesGeneral Information 3-7ACT Tapping 8ACL Long Tapping 9ACST Soft Tapping 10FORT Force 11SHOCON Short Contact 12SICON Contact 13ACCESS Tip View 14-17Ultra-High Frequency (UHF) Probes Fast Scanning 18Hydra (Silicon Nitride) Probes Soft & Liquid 19-21Hydra-All Soft & Liquid 22VScan Soft Tapping 23Nitra-All Soft & Liquid 24Plateau Probes Force 25Ball Probes/Colloidal Probes Force 26-27High Aspect Ratio Tilted (HART) Probes Deep Features 28-29FCL Calibration 30Doped Diamond Probes Conducting 31ANSCM (Electrical/EFM) Probes EFM 32Magnetic (MAGT) Probes MFM 33Step-Height Standards 35Membranes & Nanopores 36-37STM Probes & Etcher STM 38-39Custom Fabrication 40Quick Reference Chart 41-43Cover images: (top) SRAM sample. 50μm scan – Topography. Images acquired with a Nano-Observer AFM and ResiScope II. Courtesy of CSInstruments.eu and ScienTec, acquired with aDoped Diamond DD-ACTA probe.(bottom) Phase images of SEBS Block Copolymer sample, courtesy of Brian D. Huey and VarunVyas of the Huey AFM Lab at the University of Connecticut. Acquired using an ACCESS-UHFprobe using a scan rate of 2 Hz, 40 Hz, and 80 Hz and a drive frequency of 850 kHz.Applied NanoStructures, Inc. 2013 Page 2
AppNano Patented Wafer FormAppNano developed a patentedwafer form with major improvements.This new form allowsfor open tweezers accessto the bottom half of the AFMprobe chip. Open access makesremoval easy without damagingthe cantilever or tip. Thin 50 μmhorizontal silicon beams holdthe chip in place while remainingeasy to break when force isapplied for removal.The “old-style” wafer form, offered by most manufacturers,makes the removal of chips difficult andtedious. The use of tweezers is impaired by thickbeams leaving little area for tweezers. Additionally,horizontal beams tend to be nearly 250 µm thick.Removal of tips requires more force which oftencauses beams to shatter. The resulting fragments area serious problem as they can destroy the tip apex ofother probes on the wafer. The traditional waferform has often been a problem and reduces thebenefits of bulk purchasing.AppNano WaferFormThe chip holding beams arestrategically positioned. Theyallow for maximum access tothe probes while utilizingtweezers. The beam placementalso maintains a sturdy holdingstructure for the probes.www.appnano.com | Tel: 408-567-0115 | sales@appnano.com Page 3
Page 1: 2 Hz 40 Hz 80 HzCatalog of SPM Prob
Page 5 and 6: Standard Silicon ProbesMaterial - A
Page 7 and 8: Probe Option: Super Sharp (SS)AppNa
Page 9 and 10: Probe Model: ACL SeriesACL Series P
Page 11 and 12: Silicon Force Modulation Mode Probe
Page 13 and 14: Silicon Contact Mode ProbesProbe Mo
Page 15 and 16: Probe Model: ACCESS-NCTapping Mode
Page 17 and 18: Conductive—Tip View ProbesConduct
Page 19 and 20: HYDRA Probe SeriesThe HYDRA Series
Page 21 and 22: Probe Model: HYDRA V-Shaped SeriesT
Page 23 and 24: Probe Model: VScan SeriesThe VScan
Page 25 and 26: Silicon Plateau (Blunt Radius) Prob
Page 27 and 28: Probe Model: COLLOIDAL ProbesColloi
Page 29 and 30: Probe Model: HART SeriesHigh Aspect
Page 31 and 32: Probe Model: Doped Diamond SeriesDo
Page 33 and 34: Probe Model: MAGT SeriesMagnetic Co
Page 35 and 36: Standards Model: SHS-1, SHS-0.1Step
Page 37 and 38: Membrane Model: POREAppNano PORE pr
Page 39 and 40: STM Tip EtcherProduct: STM Tip Etch
Page 41 and 42: Application Probe Model Description
Page 43 and 44: Application Probe Model Description

AppNano Probes Catalog - Applied NanoStructures

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