AppNano Probes Catalog - Applied NanoStructures

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Probe Model: FCL SeriesForce Calibration ProbesApplied NanoStructures' FCL Probe is a tipless force calibration probe withfive cantilevers. These probes are designed for the spring constant calibrationof SPM probes. The reflex side can optionally be coated with aluminum.Cantilever SpecificationsMaterial: SiShape: RectangularThickness (µm): 2.0Width (µm): 32Reflex Coating: None or AlHandle Chip SpecificationsLength (mm): 3.4Width (mm): 1.6Thickness (µm): 300ABCDECantileverFrequency(kHz)Spring Constant(N/m)Length (µm)A 14 0.12442B 60 0.98218Force ModulationMode ProbesC 300 1296D 550 3069E 1000 7750Ordering InformationFCL-5 5FCL-10 10FCLA-5 5FCLA-10 10Applied NanoStructures, Inc. 2013 Page 30
Probe Model: Doped Diamond SeriesDoped Diamond (DD) Probes offers a unique combination of hardness andconducting tip. The tip side of these probes is coated with polycrystallinediamond. The diamond film is doped with boron to make it highly conducting.Tip SpecificationsShape: PyramidalHeight (µm): 14-16Aspect Ratio: 1.5-3.0ROC* (nm): 100-300Coating: 100nm Doped Diamond*Nominal specificationCantilever SpecificationsMaterial: SiShape: RectangularReflex Coating: AlParameterProbe TypeDD-ACTA DD-FORTA DD-SICONASpring Constant (N/m) 37 1.6 0.29Frequency (kHz) 300 61 15Length (µm) 125 225 450Width (µm) 30 27 49Thickness (µm) 4.0 2.7 2.5Ordering InformationDurable Conductive ProbesNC FM EFM ProbesDD-ACTA-10 DD-FORTA-10 DD-SICONA-10 10DD-ACTA-20 DD-FORTA-20 DD-SICONA-20 20DD-ACTA-50 DD-FORTA-50 DD-SICONA-50 50Doped DiamondProbesDD-ACTA-200 DD-FORTA-200 DD-SICONA-200 200DD-ACTA-W DD-FORTA-W DD-SICONA-W 410+www.appnano.com | Tel: 408-567-0115 | sales@appnano.com Page 31
Page 1 and 2: 2 Hz 40 Hz 80 HzCatalog of SPM Prob
Page 3 and 4: AppNano Patented Wafer FormAppNano
Page 5 and 6: Standard Silicon ProbesMaterial - A
Page 7 and 8: Probe Option: Super Sharp (SS)AppNa
Page 9 and 10: Probe Model: ACL SeriesACL Series P
Page 11 and 12: Silicon Force Modulation Mode Probe
Page 13 and 14: Silicon Contact Mode ProbesProbe Mo
Page 15 and 16: Probe Model: ACCESS-NCTapping Mode
Page 17 and 18: Conductive—Tip View ProbesConduct
Page 19 and 20: HYDRA Probe SeriesThe HYDRA Series
Page 21 and 22: Probe Model: HYDRA V-Shaped SeriesT
Page 23 and 24: Probe Model: VScan SeriesThe VScan
Page 25 and 26: Silicon Plateau (Blunt Radius) Prob
Page 27 and 28: Probe Model: COLLOIDAL ProbesColloi
Page 29: Probe Model: HART SeriesHigh Aspect
Page 33 and 34: Probe Model: MAGT SeriesMagnetic Co
Page 35 and 36: Standards Model: SHS-1, SHS-0.1Step
Page 37 and 38: Membrane Model: POREAppNano PORE pr
Page 39 and 40: STM Tip EtcherProduct: STM Tip Etch
Page 41 and 42: Application Probe Model Description
Page 43 and 44: Application Probe Model Description

AppNano Probes Catalog - Applied NanoStructures

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