AppNano Probes Catalog - Applied NanoStructures

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Application Probe Model DescriptionElectric ForceMicroscopyMagneticForceMicroscopyTip ViewDopedDiamondChart of ProbesCantileverLength (µm)Spring Constant(N/m)Resonance Frequency(kHz)ANSCM-PA High Spring Constant EFM Probe 125 37 300 N/AANSCM-PT Medium Spring Constant EFM Probe 225 1.6 61 N/AANSCM-PC Low Spring Constant EFM Probe 450 0.29 15 N/AMAGT-LM Low Moment MFM Probes 225 1.6 61 N/AMAGT Medium Moment MFM Probes 225 1.6 61 N/AMAGT-HM High Moment MFM Probes 225 1.6 61 N/AOptionsACCESS-NC Non-Contact/Tapping Mode Probes 150 78 300 A, GGACCESS-FM Force Modulation Probes 245 2.7 60 AACCESS-EFM Electric Force Mode Probes 245 2.7 60 GG, PtIrACCESS-C Contact Mode Probes 450 0.30 16 ADD-ACTA Tapping Mode or Hard Contact Mode 125 37 300 N/ADD-FORTA Force Modulation Mode 225 1.6 61 N/ADD-SICONA Contact Mode Probe 450 0.29 15 N/AHigh AspectRatioHART0 No Tilt Compensation, 1, 2, 4 µm spike 125 37 300 A, CHART3 3° Tilt Compensation, 1, 2, 4 µm spike 125 37 300 A, CHART12 12° Tilt Compensation, 2, 4, 6 µm spike 125 37 300 A, COption Definitions: A = Aluminum Reflex Coating; C = Custom Tilt & Spike Length; G = Gold Reflex Coating; TL = TiplessApplied NanoStructures, Inc. 2013 Page 42
Application Probe Model DescriptionNon-Contact /TappingModeContactModeForce CurveLiquid4 in 1 ProbesChart of ProbesCantileverLength (µm)Spring Constant(N/m)Resonance Frequency(kHz)OptionsACT Silicon Tapping Mode Probe 125 37 300 A, G, GG, TLACL Long Cantilever Tapping Mode Probe 225 58 190 A, G, GG, TLFORT Force Modulation Mode Probe 225 1.6 61 A, G, GG, TLACST Silicon Soft Tapping/Contact Mode Probe 150 7.8 150 A, G, GG, TLHYDRA6R-100N Silicon Nitride Probe, Rectangular CantileverHYDRA6V-100N Silicon Nitride Probe, V-Shape, NarrowCantileverHYDRA6V-100W Silicon Nitride Probe, V- Shape, Wide Cantilever100 0.284 66 G, GG, TL100 0.292 66 G, GG, TL100 0.405 67 G, GG, TLSICON Silicon Contact Mode Probe 450 0.29 15 A, G, GG, TLSHOCON Short Cantilever Contact Mode Probe 225 0.14 21 A, G, GG, TLHYDRA6R-200N Silicon Nitride, Rectangular Cantilever 200 0.035 17 G, GG, TLHYDRA6V-200N Silicon Nitride, V- Shape, Narrow Cantilever 200 0.045 17 G, GG, TLHYDRA6V-200W Silicon Nitride, V-Shape, Wide Cantilever 200 0.081 17 G, GG, TLHYDRA2R-100N Nitride Probe, Rectangular Cantilever 100 0.011 21 G, GG, TLHYDRA2R-50N Nitride Probe, Rectangular Cantilever 50 0.084 77 G, GG, TLVScan-Air Silicon Nitride Probe, V-Shape 100 0.292 66 AVScan-Liquid Silicon Nitride Probe, V-Shape 65 0.59 150 GHydra-All Four Silicon Nitride Probes on One Chip: HYDRA6V-100N, 100W, 200N, 200W GNitra-All Four Probes with Silicon Nitride Cantilevers and Silicon Nitride Tips on One Chip: HYDRA6V N/A-100N, 100W, 200N, 200WOption Definitions: A = Aluminum Reflex Coating; C = Custom Tilt Compensation & Spike Length; G = Gold Reflex Coating; GG = GoldReflex & Tip Coating; TL = Tiplesswww.appnano.com | Tel: 408-567-0115 | sales@appnano.com Page 43
Page 1 and 2: 2 Hz 40 Hz 80 HzCatalog of SPM Prob
Page 3 and 4: AppNano Patented Wafer FormAppNano
Page 5 and 6: Standard Silicon ProbesMaterial - A
Page 7 and 8: Probe Option: Super Sharp (SS)AppNa
Page 9 and 10: Probe Model: ACL SeriesACL Series P
Page 11 and 12: Silicon Force Modulation Mode Probe
Page 13 and 14: Silicon Contact Mode ProbesProbe Mo
Page 15 and 16: Probe Model: ACCESS-NCTapping Mode
Page 17 and 18: Conductive—Tip View ProbesConduct
Page 19 and 20: HYDRA Probe SeriesThe HYDRA Series
Page 21 and 22: Probe Model: HYDRA V-Shaped SeriesT
Page 23 and 24: Probe Model: VScan SeriesThe VScan
Page 25 and 26: Silicon Plateau (Blunt Radius) Prob
Page 27 and 28: Probe Model: COLLOIDAL ProbesColloi
Page 29 and 30: Probe Model: HART SeriesHigh Aspect
Page 31 and 32: Probe Model: Doped Diamond SeriesDo
Page 33 and 34: Probe Model: MAGT SeriesMagnetic Co
Page 35 and 36: Standards Model: SHS-1, SHS-0.1Step
Page 37 and 38: Membrane Model: POREAppNano PORE pr
Page 39 and 40: STM Tip EtcherProduct: STM Tip Etch
Page 41: Application Probe Model Description

AppNano Probes Catalog - Applied NanoStructures

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