AppNano Probes Catalog - Applied NanoStructures

Probe Model: ANSCM SeriesANSCM Series Probes are coated with PtIr on both sides for EFM applications.ANSCM-PT probes are for force modulation, ANSCM-PC probes arefor contact mode applications, and ANSCM-PA probes are for tappingmode. ANSCM-PA5 probes are designed for CAFM applications and have athicker PtIr coating to extend the probe’slifetime.ApplicationsConductive (PtIr) Coated ProbesElectrical Force MicroscopyConducting Atomic Force MicroscopyKelvin Force MicroscopyPiezo Force MicroscopyScanning Capacitance MicroscopyShape: PyramidalHeight (µm): 14-16Coating: PtIrProbe TypeParameterANSCM-PA5ANSCM-PAANSCM-PTANSCM-PCSpring Constant (N/m) 37 37 2.7 0.29Frequency (kHz) 300 300 60 12Length (µm) 125 125 225 450Width (µm) 30 30 27 49Thickness (µm) 4.0 4.0 2.7 2.5Tip ROC (nm) 50 30 30 30PtIr Coated ProbesPt/Ir Thickness (nm) 50 25 25 25Ordering InformationStandard Package Size: 10, 20, 50, 200 and Wafer (410+)probesKey to Order Part Number: (Probe type) - (Package size)Example: (i) Part number to order 10 Force ModulationEFM Probes is: ANSCM-PT-10(ii) Part number to order 50 contact mode EFM probes:ANSCM-PC-50Applied NanoStructures, Inc. 2013 Page 32