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<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong><strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong>Measurement- Second EditionBy James G. Pierson090103Pierson & Associates © LLCi


Revision Date: September 1, 1999Copyright © 1992 by Pierson & Associates LLC. All rightsreserved. Printed in the United States <strong>of</strong> America, Canada <strong>and</strong> theUnited Kingdom. Except as permitted under the United StatesCopyright Act <strong>of</strong> 1976, no part <strong>of</strong> this publication may bereproduced or distributed in any form or by any means, or stored ina database retrieval system, without the written permission <strong>of</strong> thepublisher.ISBN 1-895976-00-6Disclaimer: <strong>The</strong> enclosed <strong>info</strong>rmation is given to the user as correctto the best <strong>of</strong> the authorÕs knowledge. <strong>The</strong> use <strong>of</strong> any or all <strong>of</strong> the<strong>info</strong>rmation enclosed herein is entirely at the risk <strong>of</strong> the user. Inacceptance <strong>of</strong> this publication, the user hereby idemnifies PiersonAssociates with regards to the <strong>info</strong>rmation <strong>and</strong> use <strong>of</strong> any <strong>and</strong> all<strong>info</strong>rmation contained herein. This work has been prepared byJames G. Pierson <strong>of</strong> Pierson & Associates LLC. <strong>and</strong> is continuouslyrevised <strong>and</strong> updated. Any <strong>and</strong> all comments <strong>and</strong> suggestions aremost welcome <strong>and</strong> appreciated. With your input, the cause <strong>of</strong>precision measurement can continuously evolve <strong>and</strong> improve! Mr.Pierson may be contacted at the following address:Attention: James PiersonPierson & Associates LLC7A S<strong>and</strong>ers RoadRockaway, NJ07866-2008INTERNET: http://www.PiersonOnline.comDial: 800-565-6075 USA <strong>and</strong> Canadaii


Special Credits:Mrs. Helen Pierson, my wife, cheerleader <strong>and</strong> best friend.Mr. Michael Coope, President Copidate, U.K. (For encouragement<strong>and</strong> support above <strong>and</strong> beyond the call <strong>of</strong> duty!)Mr. Jim Lally, President PCB, Piezotronics. (No request for<strong>info</strong>rmation was too much to ask!)Mr. Craig Rockafellow, General Motors Proving Grounds, MilfordMichigan. (For encouraging me to undertake this effort)Mr. Terry Smith, former President <strong>of</strong> Sentech Systems Inc. MountJoy PA.Mr. Richard Talmadge, Chief Engineer <strong>of</strong> the Structural DynamicsResearch Branch, Wright Patterson Air Force Base, Dayton, Ohio.(For agreeing to the arduous task <strong>of</strong> editing!)Mr. Andrejs Zeltkalns, a brilliant expatriated Latvian load-celldesigner <strong>and</strong> friend (For discussions, insight, <strong>and</strong> support that Icould never have found elsewhere!)+ Several hundred others from whom I have learned <strong>and</strong> I wish thatI had the space to separately thank. This is no slight!iii


Preface to Second Edition:Given a perfectionist disposition, a project like this h<strong>and</strong>book is anever-ending task, a source <strong>of</strong> happiness <strong>and</strong> a source <strong>of</strong> frustrationall wrapped up in 850 pages <strong>of</strong> type. Reviewing material that onewrote years prior can be a frightening experience, the usual reactionto a passage being ÒI actually wrote that?Ó ÒClunkyÓ is being far tookind a way <strong>of</strong> describing some passages. As time passes <strong>and</strong> wegrow in many different ways, maturity brings new insights that wesimply couldnÕt see during the first pass. <strong>The</strong> second edition rightsa bunch <strong>of</strong> wrongs, adds concepts that should have existed allalong, clarifies clunky wording, <strong>of</strong>fers new insights <strong>and</strong> revisesother concepts to reflect current thinking in the measurementsciences.We have heard it stated that the world is changing to a knowledgebased economy. We have also heard it stated that knowledge ispower. Knowledge regarding the performance <strong>of</strong> the machines orproducts that our companies fabricate empowers us to make correctengineering <strong>and</strong> business decisions to best our competition. <strong>The</strong>real danger in physical measurement occurs when we mistakeperception for knowledge (truth) <strong>and</strong> make decisions based uponwhat we perceive to be true. Acting upon perceptions, not basedupon the truth; we chase ghosts with success always eluding us.When perceptions equate to the truth we have earned the power tosucceed.Without you the reader, <strong>of</strong> what value is any written work? I thankyou in advance for the time you spend with this material. I sincerelyhope that you will gain a deeper underst<strong>and</strong>ing <strong>of</strong> the necessity,value <strong>and</strong> process <strong>of</strong> precision physical measurement.(PS: Did I mention this effort is never ending? Look for the 3rdEdition in 2005!) - Jim Pierson September 1, 1999iv


Table <strong>of</strong> ContentsBy James G. Pierson090103 Pierson & Associates LLC<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999i


ContentsCHAPTER 1<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Applications Note 1-1: Introduction 1-1Applications Note 1-2:What is Applications Engineering? 1-6Applications Note 1-3<strong>The</strong> Measuring System Source <strong>of</strong> Information: <strong>The</strong> Sensor 1-8Applications Note 1-4:Linear versus Nonlinear Sensors 1-12Applications Note 1-5:<strong>The</strong> <strong>Strain</strong>-<strong>Based</strong> Sensor DeÞnition 1-16Applications Note 1-6:<strong>The</strong> Measurement System Transfer Function 1-19Applications Note 1-7:<strong>The</strong> Fourier Series 1-40Applications Note 1-8:Zeroth-, First-, <strong>and</strong> Second-Order System DeÞnitions 1-46Applications Note 1-9:<strong>The</strong> Second Order System 1-51Applications Note 1-10:Fluidic-, Gas-, <strong>and</strong> Structural-Damping <strong>of</strong> Second-Order Sensor Structures 1-58Applications Note 1-11:<strong>The</strong> <strong>Strain</strong>-Gaged Cantilevered Beam 1-67Applications Note 1-12:Pressure References 1-73Applications Note 1-13:<strong>The</strong> Diaphragm <strong>Strain</strong>-Gaged Pressure SensorGeneral Discussion: 1-80CHAPTER 2Data Quality, <strong>The</strong> Environment <strong>and</strong> Physical ConstraintsApplications Note 2-1:Introduction to <strong>The</strong> Statement <strong>of</strong> Objectives 2-1Applications Note 2-2:<strong>The</strong> Environment Assessment 2-17Applications Note 2-3:<strong>The</strong> ÒMicroÓ <strong>and</strong> ÒMacroÓ Perspectives 2-25Applications Note 2-4:<strong>The</strong> DeÞnition <strong>of</strong>, <strong>and</strong> Sources <strong>of</strong>, Noise 2-29Applications Note 2-5:<strong>The</strong> Statement <strong>of</strong> Physical Constraints 2-37Applications Note 2-6:Static <strong>and</strong> Dynamic Measurement Environments 2-46ii <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


ContentsApplications Note 4-10:Lead-Wire Conductors 4-71Applications Note 4-11:Lead-Wire Insulations 4-57Applications Note 4-12:<strong>Strain</strong> Bridge Wiring <strong>and</strong> Lead Wire Effects 4-80Applications Note 4-13:Fatigue <strong>and</strong> the Metal-Foil <strong>Strain</strong> Gage 4-95Applications Note 4-14:Fatigue <strong>and</strong> the Piezoresistive <strong>Strain</strong> Gage 4-97Applications Note 4-15:<strong>The</strong> Metallic-Foil Comparison To the Piezoresistive <strong>Strain</strong> Gage 4-101Applications Note 4-16:<strong>The</strong> Implications <strong>of</strong> Sensor Size <strong>and</strong> Mass 4-103Applications Note 4-17:Real Versus Pseudo Calibration 4-111Applications Note 4-18:Resistance Calibration General Discussion 4-112Applications Note 4-19:<strong>The</strong> Piezoresistive <strong>Strain</strong>-Gaged Sensor <strong>and</strong> Resistance Calibration 4-121CHAPTER 5Error ComponentsApplications Note 5-1:Zero or Null-Bias Stability 5-1Applications Note 5-2:Creep 5-12Applications Note 5-3:Hysteresis DeÞnition 5-18Applications Note 5-4:Linearity DeÞnition 5-27Applications Note 5-5:Combined Nonlinearity <strong>and</strong> Hysteresis 5-30Applications Note 5-6:Resolution 5-33Applications Note 5-7:Nonrepeatability <strong>and</strong> Reproducibility 5-34Applications Note 5-8:Acceleration Sensitivity <strong>of</strong> <strong>Strain</strong>-<strong>Based</strong> Pressure Sensors 5-38Applications Note 5-9:Transverse Sensitivity Considerations for the Cantilevered-Beam Accelerometer 5-40Applications Note 5-10:Uncertainty 5-47iv <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


ContentsApplications Note 5-11:Performance Parameter Distributions 5-87Applications Note 5-12:Cost Relationships 5-93CHAPTER 6Mechanical Considerations in Sensor DesignApplications Note 6-1:Sensor Spring Member Materials <strong>and</strong> Mechanical Design 6-1Applications Note 6-2:Mounting-<strong>Strain</strong> Effects on Transducers 6-49Applications Note 6-3:Loading Surface Geometry 6-53Applications Note 6-4:<strong>The</strong> Nature <strong>of</strong> Epoxies 6-56CHAPTER 7<strong>The</strong>rmal CompensationApplications Note 7-1:Piezoresistive <strong>Strain</strong>-Bridge <strong>The</strong>rmal-Sensitivity Compensation 7-1Applications Note 7-2:Piezoresistive <strong>Strain</strong>-Gage Active <strong>The</strong>rmal-Sensitivity Compensation 7-13Applications Note 7-3:Piezoresistive Semiconductor <strong>Strain</strong>-Gaged Wheatstone Bridge <strong>The</strong>rmal-Zero Shift 7-16Applications Note 7-4:Considerations for the Quarter, Half <strong>and</strong> Fully-Active Piezoresistive Bridge 7-28Applications Note 7-5:Constant-Current Excitation for Piezoresistive <strong>Strain</strong>-Gaged Sensors (Simple) 7-31Applications Note 7-6:Dual-Tracking Constant-Current Excitation for Piezoresistive Sensors 7-36Applications Note 7-7:General Notes Regarding Piezoresistive <strong>Strain</strong>-Gaged Sensor <strong>The</strong>rmal Performance 7-39Applications Note 7-8:Metallic <strong>Strain</strong>-Gage <strong>The</strong>rmal-Sensitivity Compensation 7-42Applications Note 7-9:Metallic-<strong>Strain</strong>-Gage <strong>The</strong>rmal-Zero Compensation 7-50Applications Note 7-10:Transient <strong>The</strong>rmal Compensation 7-54Applications Note 7-11:<strong>The</strong>rmal Isolation, Cooling <strong>and</strong> Control <strong>of</strong> Sensor Structures for Minimized <strong>The</strong>rmal Error 7-58Applications Note 7-12:<strong>The</strong>rmal Design Considerations 7-66<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999v


ContentsCHAPTER 8Electrical ConsiderationsApplications Note 8-1:AmpliÞcation 8-1Applications Note 8-2:Zero-Trim Methods for the Wheatstone Bridge 8-27Applications Note 8-3:Dynamic <strong>and</strong> Static Excitation 8-32Applications Note 8-4:Grounding <strong>and</strong> Shielding Techniques for <strong>Strain</strong>-Gaged Sensors 8-38Applications Note 8-5:Failure-Mode Analysis <strong>of</strong> the Wheatstone Bridge 8-54Applications Note 8-6:Aliasing 8-72Applications Note 8-7:<strong>The</strong> Electrical-, Mechanical-, <strong>and</strong> <strong>The</strong>rmal-Time Domains 8-75CHAPTER 9PerformanceApplications Note 9-1:Knowledge-<strong>Based</strong> Error Correction 9-1Applications Note 9-2:Sensor Performance SpeciÞcation 9-11Applications Note 9-3:SpeciÞcation Considerations 9-25CHAPTER 10Calibration <strong>and</strong> TestApplications Note 10-1:<strong>Strain</strong> Gaged Accelerometer Calibration 10-1Applications Note 10-2:Gravimetric Calibration Methods, Acceleration <strong>and</strong> Force: 10-17Applications Note 10-3:Impulse-Hammer Test Methods (Piezoelectric) 10-24Applications Note 10-4:QualiÞcation <strong>and</strong> Acceptance Testing 10-27Applications Note 10-5:Military SpeciÞcation Environmental Test 10-29Applications Note 10-6:QualiÞcation Test: Acceleration 10-31Applications Note 10-7:<strong>Strain</strong>-Gaged Pressure Transducer Calibration 10-39vi <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Contentsviii <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


CHAPTER 1<strong>Strain</strong>-<strong>Based</strong>MeasurementIntroduction:Applications Note 1-1: Introduction<strong>The</strong> Wheatstone Bridge strain-gaged sensor type is, by a large margin,the most popular transducer element in use. Unfortunately, thestrain-based sensor is also the most misapplied sensor type. By someestimates, as much as 80% <strong>of</strong> all new sensor purchases are made inthe act <strong>of</strong> replacing a prior sensor technology or type. This representsa massive waste <strong>of</strong> human effort as well as financial resources. Historically,the costs <strong>of</strong> these errors in judgement have been buriedwithin research <strong>and</strong> development budgets. <strong>The</strong> objective <strong>of</strong> this workis to show how we can work smarter, rather than harder, by gaininginsight into the simple physics <strong>of</strong> the strain-based sensor so thaterrors in physical measurement are minimized. When a measurementis made we are attempting to underst<strong>and</strong> our product or process underspecific operating conditions. <strong>Based</strong> upon our measurements we perceivespecific values when the true value <strong>of</strong> a parameter may be quitedifferent. <strong>The</strong> difference between the truth <strong>and</strong> the perception is error.A ten percent error in the magnitude <strong>of</strong> peak strain experienced by acomponent in use implies two consequences; the fatigue life expect-<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-1


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:ancy <strong>of</strong> the component could be reduced by a factor <strong>of</strong> up to two times, possiblydoubling warranty costs when the strain is underestimated, or we areshipping much more material than is necessary to support the design lifeexpectancy when the peak strain is overestimated. When strain is overestimated,vehicles become much more massive than is necessary to meet orexceed the design life for an intended use pr<strong>of</strong>ile increasing vehicle mass,decreasing vehicle fuel efficiency, increasing the cost <strong>of</strong> vehicle structures <strong>and</strong>braking systems, requiring higher capacity propulsive systems <strong>and</strong> increasingthe cost <strong>of</strong> safety systems in the event <strong>of</strong> collision. It has been estimated thatgreater than half <strong>of</strong> all measurements made show peak errors greater than 15%.If warranty costs can double at a peak error <strong>of</strong> 10%, just imagine what happensat 15% or more error. We live in the so called Ò<strong>info</strong>rmation ageÓ. It is impliedby this statement that we make engineering <strong>and</strong> business decisions based uponcorrect <strong>info</strong>rmation. <strong>The</strong> business <strong>of</strong> measurement is to gain underst<strong>and</strong>ing <strong>of</strong> aproduct or a process not simply to collect numbers. Our mission is to minimizethe difference between the perception <strong>and</strong> the truth.<strong>Strain</strong> gages are configured within the sensor to provide a differential outputthat is in proportion to the applied physical parameter, whether this parameteris force, pressure, acceleration, or strain. This work is a generalized treatment<strong>of</strong> the thermal, mechanical, <strong>and</strong> electrical behavior <strong>of</strong> real-world sensors <strong>and</strong>refers, in most cases, to the physical input as the input parameter without constraintto any particular sensor type.Many exhaustive works are available that mathematically model virtually anysensor in the frequency domain <strong>and</strong> time domain. It is the authorÕs opinionthat, as engineers, we are capable <strong>of</strong> mathematically complicating any issuethat we choose, <strong>and</strong>, if complex models are required, we are able to researchthe required theory <strong>and</strong> assemble these models. <strong>The</strong> models used herein areentirely based upon the two principal relationships <strong>of</strong> OhmÕs Law (V = IR) <strong>and</strong>NewtonÕs Law (F = MA). In many instances, these simple relationships can beused to create mathematical representations <strong>of</strong> surprising fidelity even whencompared to the more complex mathematical models.CHAPTER 1-2 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-1: IntroductionEvery effort has been made in this work to avoid math-intensive models <strong>of</strong> sensorperformance. When possible, simpler <strong>and</strong> more underst<strong>and</strong>able mathematicalmodels have been used rather than the more rigorous models in the interest <strong>of</strong> clarity.<strong>The</strong> focus <strong>of</strong> this work is the thermomechanical behavior <strong>of</strong> the generalizedsensor. <strong>The</strong> material discussed in the following pages is an ÒApplications CompendiumÓdetailing many <strong>of</strong> the very simple phenomena that have frustrated many anengineer. To an instrument engineer, the embarrassment <strong>of</strong> not having consideredthis or that phenomenon in a particular measurement environment, is a familiarfeeling. We are spared this embarrassment when the ÒtruthÓ remains unknown.Indeed, in the mind <strong>of</strong> the purist measurement statistician, the ÒtruthÓ remains foreverunknowable as even national reference st<strong>and</strong>ards possess finite uncertaintylimitations.Much <strong>of</strong> the <strong>info</strong>rmation contained in this work will appear to be <strong>of</strong> the simple ÒIknew thatÓ kind. It is written to be so. After having been frustrated by poor dataquality in the past, how many times have you slapped your forehead <strong>and</strong> exclaimedÒI should have known better!Ó? <strong>The</strong> parameter that very likely was the source <strong>of</strong>frustration, was either not properly specified, absent altogether, or specified in anambiguous way. In many cases, the manufacturers themselves truly have no ideahow their devices will or wonÕt function in specialized environments or in uniquecombinations <strong>of</strong> environments. In the end, as engineers, it is our responsibility todefine to the sensor manufacturer, our assessment <strong>of</strong> the measurement environment,<strong>and</strong> to work with the manufacturer to achieve mutual success.Much <strong>of</strong> the <strong>info</strong>rmation contained in these pages has not previously been in printor has been buried within written works intended more to impress colleagues thanto instruct others. <strong>The</strong> material contained herein is common-sense physics. Youwill also note that some repetition <strong>of</strong> material exists within these pages. This repetitionis necessary to link associated concepts together <strong>and</strong> to provide a writtenwork that, in the end, can be used as a quick, st<strong>and</strong> alone reference manual.<strong>The</strong> two primary strain gage types discussed are the piezoresistive <strong>and</strong> metallicfoil-basedstrain gage. <strong>The</strong> very high intrinsic strain sensitivity <strong>of</strong> the piezoresistivedevice makes visible phenomena that are typically low-level error sources forthe metallic-foil-gaged sensor but are, none-the-less, sources <strong>of</strong> error that may<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-3


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:make the difference between success <strong>and</strong> failure in measurement. Piezoresistivesensors, by a large margin, are manufactured in greater quantities for dedicatedvehicular use than all other strain-based sensors combined. For thisreason, the piezoresistive-based sensor is a primary focus <strong>of</strong> discussion.This book is organized as a reference manual containing a selection <strong>of</strong> ÒApplicationsNotesÓ that pertain to specific sensor parameters, considerations, mediaconcerns, lead-wire considerations, <strong>and</strong> a host <strong>of</strong> others. You are encouraged toreview the Introductory section to lay a firm foundation for the applicationnotes that follow.Sensors are epidemically misapplied to various measurements. In some situationsit is the fact that the engineer has achieved a Òcomfort levelÓ in the use <strong>of</strong>a particular sensor technology <strong>and</strong> is unwilling to risk the use <strong>of</strong> a potentiallymore-appropriate technology. Knowledge <strong>of</strong> other technologies is the key thatunlocks the door to move beyond the comfort zone. In other instances, it issimply ignorance <strong>of</strong> the intricacies <strong>of</strong> the sensor that lead to the Òround peg inthe square holeÓ situations that occur frequently in measurement.Why are there hundreds <strong>of</strong> different sensor types commercially available? Simply,each sensor type is appropriate for use in specific environments <strong>and</strong> is lesswell-suited for use in others. Each measurement environment is unique <strong>and</strong><strong>of</strong>ten ÒgreyÓ areas are encountered where the performance <strong>of</strong> the sensor is notwell-defined by the manufacturerÕs specifications. This book breaks with traditionin attempting to define attributes <strong>of</strong> the sensor that the reader can utilize toqualify a sensor geometry <strong>and</strong> performance for the measurement environmentthat he or she faces.I firmly believe that any reader, who has been Òdown in the trenchesÓ makingreal-world measurements, will find some gems contained herein that have beenÒGotchasÓ in prior measurement efforts. As oneÕs experience level grows in thefield <strong>of</strong> measurement, it becomes clear that no ÒminusculeÓ errors exist. <strong>The</strong>complete treatment <strong>of</strong> sensor error components may seem to dwell upon smallerror contributors yet, all too <strong>of</strong>ten, engineers find themselves in a court-<strong>of</strong>-lawarguing over ÒminuteÓ errors that, due to the nature <strong>of</strong> the measurement, havebecome major error drivers. In short, the Òminute errorÓ can, all too easily,CHAPTER 1-4 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-1: Introductionbecome the bone <strong>of</strong> contention when a major program has been delayed or expensiveretesting must be conducted due to poor-quality data.In closing, I would leave you with the thought that, the instrumentation engineer isperhaps one <strong>of</strong> the worldÕs great unsung heroes when one considers that all that weknow <strong>of</strong> materials, our bodies, our universe, subatomic as well as chemical <strong>and</strong>macroscopic phenomena, we have learned through the science <strong>of</strong> observation <strong>and</strong>measurement. <strong>The</strong> human biological sensor system, including our senses <strong>of</strong> sight,smell, touch, temperature sensitivity, sound, <strong>and</strong> the like, functions as a group <strong>of</strong>transducers providing <strong>info</strong>rmation to us about our world. In instrument engineering,separate sensors, specifically fabricated to be sensitive to one or another phenomenon,are used to provide <strong>info</strong>rmation to us concerning the inner workings <strong>of</strong>our creations, whether they be machines or processes. In summary, the knowledgethat we possess about our world is provided to us by observation <strong>and</strong> measurementwhere the validity <strong>of</strong> this knowledge is dependent upon the quality <strong>of</strong> the observationor measurement.I sincerely hope that the you will enjoy this work as much as I have enjoyed creatingit.James PiersonPierson Associates IncorporatedFirst Edition: 19922nd Edition: September 1999<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-5


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Applications Note 1-2:What is Applications Engineering?<strong>The</strong> simple Funk <strong>and</strong> WagnallÕs definition <strong>of</strong> the meaning <strong>of</strong> ÒApplicationÓ isas follows: 1. Ò<strong>The</strong> act <strong>of</strong> applyingÓ 2. ÒCapacity <strong>of</strong> being used; relevance, as<strong>of</strong> a theoryÓ 3. ÒClose AttentionÓ; as in application to oneÕs bookÓ.<strong>The</strong> definition <strong>of</strong> ÒEngineeringÓ: Ò<strong>The</strong> art <strong>and</strong> science concerned with the practicalapplication <strong>of</strong> scientific knowledge, as in the design, construction, <strong>and</strong>operation <strong>of</strong> roads, bridges, harbors, buildings, machinery, lighting, <strong>and</strong> communicationssystems etc.Ó<strong>The</strong> additional definition <strong>of</strong> the meaning <strong>of</strong> the word Ò<strong>Art</strong>Ó is also appropriateas: ÒAny system <strong>of</strong> rules <strong>and</strong> principles that facilitates skilled human accomplishment:also the application <strong>of</strong> these rules <strong>and</strong> principles.Ó<strong>The</strong> above definitions are not comprehensive but are a subset <strong>of</strong> the definitionsmost suited to this discussion. Applications Engineering is the Òdown in thetrenchesÓ real-world application <strong>of</strong> a technology for practical purposes.Applications Engineering is an art, consistent with the above definition, in thatit is the assimilation <strong>and</strong> distillation <strong>of</strong> a multitude <strong>of</strong> realities regarding thelimitations <strong>and</strong> physics <strong>of</strong> the world around us <strong>and</strong> the use <strong>of</strong> imperfect materials<strong>and</strong> processes to effect the practical <strong>and</strong> useful implementation <strong>of</strong> a technology.All that we know <strong>of</strong> the machines <strong>and</strong> processes that we create is provided by means<strong>of</strong> sensors that are subject to the imperfections <strong>and</strong> physical limitations <strong>of</strong> the worldwe live in. This knowledge is imperfect where the difference between the truth <strong>and</strong>perception is error. - JP<strong>The</strong> objective <strong>of</strong> Applications Engineering, with respect to sensors, is to minimizethe difference between the perception <strong>and</strong> the truth, given the physicalconstraints <strong>and</strong> the environmental conditions within which the sensor mustoperate.CHAPTER 1-6 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-2:<strong>The</strong> <strong>Art</strong> <strong>of</strong> Applications Engineering, as described in the ensuing text, is the result<strong>of</strong> a collection <strong>of</strong> experiences in measurement over many years <strong>and</strong> for many variedmeasurement environments. A preliminary review <strong>of</strong> the entire text will familiarizethe reader with many <strong>of</strong> the concepts contained herein, where the details canbe studied in depth on an as-required basis for various measurements <strong>and</strong> environmentsas they are encountered in practice.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-7


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Applications Note 1-3<strong>The</strong> Measuring System Source <strong>of</strong> Information: <strong>The</strong>SensorMany component parts comprise the measurement system where all parts mustfunction in unison to produce valid <strong>info</strong>rmation regarding the measured parameteror measur<strong>and</strong>. Of all <strong>of</strong> these subcomponent parts, the sensor is most criticalas the source <strong>of</strong> <strong>info</strong>rmation upon which the balance <strong>of</strong> the system depends.<strong>The</strong> output <strong>of</strong> any sensor is organized energy where some deterministic relationshipexists between a quality or quantity <strong>of</strong> this energy <strong>and</strong> the present state<strong>of</strong> the measur<strong>and</strong>. All sensor output signals are comprised <strong>of</strong> a r<strong>and</strong>om component<strong>and</strong> a predictable component <strong>of</strong> signal. <strong>The</strong> ratio <strong>of</strong> the predictable componentto the r<strong>and</strong>om component is a measure <strong>of</strong> the signal-to-noise ratiowhich can be used to quantify the useful measurement range <strong>of</strong> the sensor.<strong>The</strong> Funk <strong>and</strong> WagnallÕs definition <strong>of</strong> the transducer, as ÒAny device wherebyenergy may be transmitted from one system to another system whether <strong>of</strong> thesame type or different typeÓ, is most appropriate when a sensor is viewed as aform <strong>of</strong> energy translation device. <strong>The</strong> definition <strong>of</strong> the sensor as ÒThat whichreceives <strong>and</strong> responds to a stimulus or signal; especially, an instrument ordevice, as an antenna, gyroscope, or photoelectric cell etc., designed to detect<strong>and</strong> respond to some force, change, or radiation for purposes <strong>of</strong> <strong>info</strong>rmation orcontrolÓ, is equally appropriate. Some use the term ÒsensorÓ to refer to the Òasproduced but not yet finishedÓ transducer, as would be the case with an uncompensatedstrain-gaged device, in contrast with the term ÒtransducerÓ referringto the finished <strong>and</strong> fully specification-controlled device. Rather than attempt todelineate between the two terms, they are used herein interchangeably inaccordance with the above definitions.Several facts may be stated that are applicable to all <strong>of</strong> the many types <strong>of</strong> sensorsthat exist or, in fact, will exist. <strong>The</strong>se facts derive from fundamental laws<strong>of</strong> mechanics <strong>and</strong> thermodynamics <strong>and</strong> are stated as follows:CHAPTER 1-8 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-31. <strong>The</strong> presence <strong>of</strong> any physical sensor inserted into any mechanical or thermodynamic systemwill alter, to some extent, the system itself. This phenomenon can be visualized by consideringthat the addition <strong>of</strong> an accelerometer to a structure, for the purpose <strong>of</strong> determining the dynamicbehavior <strong>of</strong> the structure, implies the addition <strong>of</strong> the accelerometerÕs mass, thereby changing thestructureÕs dynamic characteristics. This fact is very similar to the Heisenberg Uncertainty Principle<strong>of</strong> nuclear physics, in that, the act <strong>of</strong> observation changes the system being observed. Asanother example, the flush-diaphragm pressure sensor must experience bending to produce outputas we shall see. <strong>The</strong> bending <strong>of</strong> such a diaphragm implies that the volume <strong>of</strong> the measuredcavity must increase with increasing pressure, thereby altering the measur<strong>and</strong>.2. All sensors that are capable <strong>of</strong> providing <strong>info</strong>rmation at zero hertz or ÒDCÓ, when the measur<strong>and</strong>is static or very slowly changing with respect to time, must shed energy in order to provide<strong>info</strong>rmation regarding the measur<strong>and</strong>. Sensors that do not dissipate heat or energy by someother mechanism, are not capable <strong>of</strong> providing <strong>info</strong>rmation (organized energy) as an outputwhen the input is static <strong>and</strong> unchanging (invariant) with respect to time. It is important to notethat the piezoelectric sensor is <strong>of</strong> the nondissipative variety <strong>and</strong> cannot provide <strong>info</strong>rmationconcerning time invariant parameters. It is equally important to realize that energy must be subtractedfrom the measur<strong>and</strong> by the piezoelectric sensor, for any <strong>info</strong>rmation in the form <strong>of</strong> anoutput to be realized, regardless <strong>of</strong> the time rate <strong>of</strong> change <strong>of</strong> the measur<strong>and</strong>. This situation isvisualized best by considering the piezoelectric accelerometer mounted to a vibrating structure.Since the accelerometer possesses mass <strong>and</strong> Newtons Law states that force will equal the product<strong>of</strong> mass <strong>and</strong> acceleration (F = ma), the accelerometer will therefore require a given forceinput to be displaced. Since work energy is equal to the product <strong>of</strong> force <strong>and</strong> displacement (E=Fd), the energy required to cause the cyclic displacement <strong>of</strong> the sensor is equal to the product <strong>of</strong>mass, acceleration <strong>and</strong> displacement (E =mad), where this energy is supplied to the accelerometerby the structure to which it is mounted.3. <strong>The</strong> presence <strong>of</strong> a physical sensor inserted into any mechanical or thermodynamic system willexchange energy in many different forms with the measured system <strong>and</strong> the measurement systemto which it communicates. This statement means that the mere presence <strong>of</strong> the sensor massin a small chemical reaction vessel will imply that calories will flow, either from the sensor intothe vessel or from the measur<strong>and</strong> to the sensor mass, <strong>and</strong> thus could influence the behavior <strong>of</strong>the measur<strong>and</strong>. In the case <strong>of</strong> the static-capable (zero hertz) sensor, a portion <strong>of</strong> the energyrequired to be shed, in the provision <strong>of</strong> <strong>info</strong>rmation regarding the measur<strong>and</strong>, will be absorbedby the measur<strong>and</strong> thereby altering its state. Additionally, the energy state existing at the output<strong>of</strong> a sensor is changed when the sensor is connected to any other element <strong>of</strong> the measurementsystem.Just as the product <strong>of</strong> force <strong>and</strong> distance equals mechanical energy, the product <strong>of</strong> charge ßowper unit time (current) <strong>and</strong> voltage equal energy per unit time or power. Since all elements <strong>of</strong> themeasurement system possess some Þnite input impedance, it follows that, when a voltage differenceexists between these elements, some current must ßow between them for each element toperform itÕs intended function. At close to zero hertz, impedance becomes simply resistance <strong>and</strong><strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-9


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:the current that will ßow from a sensor into the balance <strong>of</strong> the measurement system willequal I=V/R in accordance with OhmÕs Law, where V is the voltage state at the input to themeasurement system <strong>and</strong> R is the input resistance <strong>of</strong> the measurement system. Clearly, thehighest value <strong>of</strong> R yields the lowest value <strong>of</strong> I for any voltage state existing at the measurementsystem input. Another implication <strong>of</strong> this energy exchange is realized when one considersthat the sensor can be modeled, in accordance with <strong>The</strong>veninÕs <strong>The</strong>orem, as a voltagesource (V signal ) in series with an equivalent output resistance (R output ) where V signal is theopen circuit output <strong>of</strong> the sensor.FIGURE 1-1. Energy must flow from the sensor into the MeasurementSystem:Energy Flow(Closed circuit)++R outputVV inputsignalR instrument--Since no measurement system possesses an inÞnite input resistance, but rather some Þnitevalue (R instrument ) <strong>of</strong> input resistance, then the voltage state at the input to the measurementsystem is calculated by the simple voltage divider:VV signal ´ R instrumentinput = --------------------------------------------------R o + R instrumentwhere the true sensor output is decreased by:V signal Ð V inputV-------------------------------------- ´ 100 1 inputR= Ð ---------------- ´ 100 = 1 Ð ---------------------------------------instrument´ 100V signalV signalR o + R instrument(EQ 1-1)<strong>The</strong>refore, the input voltage to the measurement system must always be less than V signal .Only when R instrument equals an inÞnitely high value does V input equal V signal . In accordancewith equation 1-1, at close to zero hertz, a strain bridge possessing an output resistance<strong>of</strong> 350 ohms operating into a voltmeter with an input resistance <strong>of</strong> 10 K ohm willCHAPTER 1-10 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-3result in a perceived signal 3.38% less than the true open circuit voltage the strain bridge wouldotherwise provide. Although the zero hertz case is useful to consider, most measurement systemsare required to measure dynamically changing inputs. In this case, equation 1-1 isextended to encompass the dynamic case by replacing resistances with impedances Z output <strong>and</strong>Z instrument .It is equally important to be aware that energy will be exchanged between the sensor <strong>and</strong> theenvironment in many different forms <strong>and</strong> via many different paths where all forms <strong>and</strong> paths <strong>of</strong>energy ßow must be considered for valid <strong>info</strong>rmation to result.4. All sensors respond to all inputs; it is simply a matter <strong>of</strong> the degree <strong>of</strong> the response. If our goalis to design an accelerometer, we would, <strong>of</strong> course, set out to design the device so that it is notinfluenced by temperature, pressure, rate <strong>of</strong> temperature change, humidity, substrate strain, radiation,transverse acceleration inputs, <strong>and</strong> a host <strong>of</strong> other possible characteristics <strong>of</strong> the environment.In reality, this is not achievable. <strong>The</strong> physical constraints <strong>of</strong> having to fabricate sensorstructures with imperfect materials, having imperfectly-toleranced subcomponent parts <strong>and</strong> inusing less-than-perfect transduction methods, means that we must carefully design the sensorwith these shortcomings in mind.5. As the <strong>info</strong>rmation provided by a sensor is conducted, conveyed, transformed into other energyforms, or interpreted, it is degraded at every opportunity. <strong>The</strong> r<strong>and</strong>om content <strong>of</strong> any organizedform <strong>of</strong> energy will increase at any <strong>and</strong> all opportunities. <strong>The</strong> act <strong>of</strong> amplifying a sensor signalwill undoubtedly increase the magnitude <strong>of</strong> the perceived signal but will likewise increase thepercentage <strong>of</strong> r<strong>and</strong>omness or noise that is present in the amplified signal. In many ways, the tendencytowards r<strong>and</strong>omness may be likened to the thermodynamic property <strong>of</strong> entropy which isthe irreversible tendency <strong>of</strong> a system or the universe toward increasing disorder.<strong>The</strong> focus <strong>of</strong> the instrument engineer is to be aware <strong>of</strong> the consequences <strong>of</strong> thepresence <strong>of</strong> the sensor within a system, to minimize the influence that the sensorwill have on the measured phenomena as well as being aware <strong>of</strong> the influence <strong>of</strong>other aspects <strong>of</strong> the environment on the quality <strong>of</strong> the <strong>info</strong>rmation that the sensorprovides.It is the sensor that is the source <strong>of</strong> <strong>info</strong>rmation upon which aerodynamicists makedesign modifications, how an old bridge is buttressed, or whether the air bag in ourautomobile should initiate. It is the quality <strong>of</strong> this <strong>info</strong>rmation that will establishour success, or in some cases, our very survivability. <strong>The</strong> strain-based sensor, themost prevalent sensor type in the world today, is the focus <strong>of</strong> the following dissertation.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-11


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Applications Note 1-4:Linear versus Nonlinear SensorsOur preference for sensors that produce a linear output with respect to a linearly-appliedinput arises out <strong>of</strong> expediency rather than necessity. Many sensortypes will produce nonlinear outputs similar to the output produced by a thermistor,for example (Figure 1-2). <strong>The</strong> highly nonlinear output <strong>of</strong> the commonthermistor is typically linearized by the addition <strong>of</strong> a low-TCR (thermal coefficient<strong>of</strong> resistance) resistor, installed in parallel with the thermistor.FIGURE 1-2. <strong>The</strong> Linearized Response.Figure 1-1Resistance(Ohms)TOhmsT Low-TCR ResistanceIdeal Linear ResponseActual ResponseTemperature<strong>The</strong>rmistor ResponseTemperatureLinearized <strong>The</strong>rmistor Response<strong>The</strong> desire to work with linear output sensors is underst<strong>and</strong>able as the need forcomputational linearization <strong>of</strong> the resultant data is eliminated. In the case <strong>of</strong>sensors used for high-frequency measurement, inadequate time may existbetween data points to execute a linearization algorithm if the sampling rate isto support a useful b<strong>and</strong>width in close to real time. <strong>The</strong> methods used for outputlinearization require prior knowledge <strong>of</strong> the sensor output with respect tothe physical input.CHAPTER 1-12 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-4:<strong>The</strong> measurement <strong>of</strong> the output <strong>of</strong> a nonlinear sensor may be linearized by measuringthe output <strong>of</strong> the sensor at 0%, 20%, 40%, 60%, 80%, <strong>and</strong> 100% <strong>of</strong> the fullscaleinput <strong>of</strong> the sensor (Figure 1-3). This data may be used to form a piece-wiselinear curve that closely approximates the nonlinear output function but willrequire significant computational time for each data point collected <strong>and</strong> will, therefore,limit the maximum practical output b<strong>and</strong>width.FIGURE 1-3. Piece-wise LinearizationM4M5M2M3OutputY5Y4Y3Y2Y1M1Where:Output = Mi (Input) + Yi(For each <strong>of</strong> the appropriatecurve sections)0% 20% 40% 60% 80% 100%InputPiece-wise linearization <strong>of</strong> a nonlinear line<strong>The</strong> measurement <strong>of</strong> the output function used for piece-wise data linearization canalso be used as an input to a polynomial curve-fit program wherein the measurementsystem either computes the curve-fit in real time for each data point collectedor creates a Òlook-upÓ map <strong>of</strong> output versus input parameters in memory. <strong>The</strong> use<strong>of</strong> an internal look-up map <strong>of</strong> the sensor output with respect to its input will greatlyincrease the potential output frequency response, as simple decision algorithmsmay be used rather than complex real time computations. <strong>The</strong> implementation <strong>of</strong><strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-13


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:polynomial curve fit routines is easily accomplished with spreadsheet programssuch as Micros<strong>of</strong>tÕs Excel by using the ÒTrendlineÓ menu selection.Curve fit routines make non-obvious underlying assumptions <strong>and</strong> typicallyprocess the supplied data to yield curve fit coefficients that minimize the leastsquares error between the computed curve <strong>and</strong> the data provided. <strong>The</strong> assumptionsmade with respect to a least squares fit are that the data is continuous inthe region <strong>of</strong> interest, the rate <strong>of</strong> change <strong>of</strong> data within the region <strong>of</strong> interest iscontinuous <strong>and</strong> the scatter <strong>of</strong> data within the region <strong>of</strong> interest is bounded <strong>and</strong>symmetrically distributed. In some cases there can exist a wider scatter <strong>of</strong> dataat one end <strong>of</strong> the region <strong>of</strong> interest than at the other. In such cases, any leastsquares fit is <strong>of</strong> questionable value. Superior curve fits, providing uniformscatter on either side <strong>of</strong> the computed response, always result when the form <strong>of</strong>the curve fit relationship <strong>and</strong> the theoretical relationship defining the sensorbehavior are the same. If the sensor responds in an exponential fashion withrespect to the input, then the exponential relationship used in a curve fit to thedata will produce superior results. <strong>Strain</strong> based sensors tend to provide outputresponses that are closely approximated by polynomial relationships <strong>of</strong> theform:y = ax 2 + bx + c(EQ 1-2)Where a, b <strong>and</strong> c are quadratic coefficients, y is the output <strong>and</strong> x is the physicalinput to the sensor. Calculation <strong>of</strong> the physical input creating the output, y, isachieved by finding the real root <strong>of</strong> the quadratic equation given by computing:Ð b ± b 2 Ð 4acx = --------------------------------------2a(EQ 1-3)It is the nature <strong>of</strong> quadratic relationships that two roots will result with one rootyielding a nonsensical result. Although Excel curve fit routines allow the userto specify virtually any number <strong>of</strong> polynomial coefficients, it is seldom beneficialto specify more than three coefficients. Keep in mind that an 11-coefficientcurve fit to an 11-point data set will result in a perfect fit as the computedresponse is forced through each data point. This appears to be desirable, however,the computed curve fit will make some rather wild gyrations betweendata points producing sometimes large errors! When we discuss measurementCHAPTER 1-14 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-4:uncertainty in Chapter 5we learn that it is desirable to maximize the Òdegrees <strong>of</strong>freedomÓ to minimize measurement uncertainty. When an eleven-coefficient fit isapplied to an eleven-point data set, where each computed coefficient effectivelynegates one degree <strong>of</strong> freedom, zero degrees <strong>of</strong> freedom results! To produce superiorresults, the order <strong>of</strong> the curve fit used must be much less than the number <strong>of</strong>data points to which the curve fit is being applied. With reference to equation 1-4,N-K equals the number <strong>of</strong> degrees <strong>of</strong> freedom for the curve fit. Even when plenty<strong>of</strong> data points exist, higher order polynomial coefficients tend to become exceedinglysmall in magnitude <strong>and</strong> calculations utilizing more than three coefficientsbecome cumbersome <strong>and</strong> processor-intensive therefore limiting the rate at whichdata can be processed. In all cases, the computed curve fit should be printed overlyingthe collected data so that the quality <strong>of</strong> the fit as well as the scatter around thecomputed response can be assessed. Another measure <strong>of</strong> the quality <strong>of</strong> a curve fitutilizes the ÒSt<strong>and</strong>ard Estimate <strong>of</strong> ErrorÓ or ÒSEEÓ method computed as follows:SEE =å ( Y i Ð Y-------------------------------- ci( N Ð K) Where: N= Number <strong>of</strong> data pointsK= Number <strong>of</strong> curve fit coefficientsY i = ith measurementY ci = computed value <strong>of</strong> fit at the ith data point(EQ 1-4)<strong>The</strong> most rapid method <strong>of</strong> sensor output linearization involves the use <strong>of</strong> analograther than digital correction <strong>of</strong> the output data. By using amplifiers in the signalpath that possess nonlinear gains that effectively compensate for the nonlinear output<strong>of</strong> the sensor, the effective b<strong>and</strong>width <strong>of</strong> the collected data is limited only bythe b<strong>and</strong>width <strong>of</strong> the linear <strong>and</strong> nonlinear amplifiers employed.With present computational capabilities, computational-corrected nonlinear outputsensors are best suited to lower-frequency applications <strong>of</strong> less than 1 KHz. <strong>The</strong>majority <strong>of</strong> pressure sensor uses fall into this frequency b<strong>and</strong>. <strong>The</strong> implementation<strong>of</strong> nonlinear analog amplifiers, or the computational methods described above,implies prior knowledge <strong>of</strong> the sensor output characteristic. <strong>The</strong> collection <strong>of</strong> thisknowledge, as well as the implementation <strong>of</strong> the required s<strong>of</strong>tware implies thatadditional cost per data channel will be incurred.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-15


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:<strong>The</strong> key to success in the use <strong>of</strong> nonlinear sensors is dependent upon themechanical <strong>and</strong> electrical repeatability <strong>of</strong> the nonlinear output with respect toits input from cycle to cycle <strong>and</strong> over time. For the most part, zero instabilitiescan be normalized out <strong>of</strong> the data as long as the zero output is updated withrespect to time, or Òautomatic-null-on-power-upÓ amplifiers are implemented,where the sensor is at some known physical input reference at the time thatpower is applied.Applications Note 1-5:<strong>The</strong> <strong>Strain</strong>-<strong>Based</strong> Sensor DeÞnition<strong>The</strong> strain-based sensor is any sensor structure that produces output directly asa result <strong>of</strong> the strain induced within the sensor spring member as result <strong>of</strong> aparameter input such as force, strain, pressure, acceleration, <strong>and</strong> many otherforms <strong>of</strong> input. <strong>The</strong> strain-based sensor family includes passive as well asactive or self-generating sensor types where the passive group is dominated bythe strain gage sensor type <strong>and</strong> the active group is dominated by the piezoelectricclass <strong>of</strong> sensors.FIGURE 1-4. <strong>The</strong> Cantilever Beam Accelerometer:Figure 1-3<strong>Strain</strong> gages2 on top2 underneathMassCantilever BeamMassAccelerationCHAPTER 1-16 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-5:All strain-based sensor structures possess an internal spring member upon whichthe parameter acts to produce output. In the case <strong>of</strong> the cantilevered-beam accelerometer<strong>of</strong> Figure 1-4, the seismic mass will produce an inertial force acting on thebeam as a function <strong>of</strong> the acceleration <strong>of</strong> the device. <strong>The</strong> bending strain createdmay be measured by a variety <strong>of</strong> means, the most common being by means <strong>of</strong>strain gages bonded to the bending beam. In the case <strong>of</strong> the cantilevered-beamaccelerometer, the sensor spring member is the beam itself, as it is the beam thatprovides the elastic restoring forces that act in opposition to the applied inertialloads. In the case <strong>of</strong> the flush-diaphragm pressure sensor <strong>of</strong> Figure 1-5, unequalpressures acting upon the diaphragm structure results in a force imbalance producingbending <strong>and</strong> resultant strain. In all cases, the strain-based sensor possesses aninternal spring member that is configured to respond mechanically to a specificparameter input. <strong>The</strong> shape <strong>of</strong> the spring member will vary widely as a function <strong>of</strong>the parameter to which the sensor has been designed to respond.FIGURE 1-5. <strong>The</strong> <strong>Strain</strong>-<strong>Based</strong> Pressure Sensor:<strong>Strain</strong> gagesPressure Loading (P applied )P referenceDiaphragm bending whereP applied > P reference<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-17


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:<strong>The</strong> piezoelectric class <strong>of</strong> sensors utilizes the charge-generating characteristics<strong>of</strong> the piezoelectric class <strong>of</strong> materials as a function <strong>of</strong> applied stress <strong>and</strong> resultantstrain to produce charge outputs as a function <strong>of</strong> the applied parameterinput. <strong>The</strong> spring member in a piezoelectric sensor structure is generally thepiezoelectric material itself.<strong>The</strong> performance <strong>of</strong> any strain-based sensor technology relates directly to themechanical, thermal, <strong>and</strong> electrical qualities <strong>of</strong> the internal spring member <strong>and</strong>strain-sensing mechanism utilized.Other selected non-strain-based sensor technologies are discussed with theobjective <strong>of</strong> providing you with a fuller <strong>and</strong> more complete perspective <strong>of</strong> theworld <strong>of</strong> measurement in general.<strong>The</strong> measurement environment <strong>and</strong> the parameter to be measured as well as thetime-varying nature <strong>of</strong> both will impose constraints upon the shape, position,mass, stiffness, structural support, thermal inertia, thermal impedance, allowablematerials, <strong>and</strong> processes that can be used with present technology to fabricatethe sensor. <strong>The</strong> <strong>Art</strong> <strong>of</strong> Applications Engineering is the study <strong>of</strong> theimplications <strong>of</strong> these constraints, relative to the many varied measurementenvironments, with the objective <strong>of</strong> maximizing the validity <strong>of</strong> the <strong>info</strong>rmationoutput that the sensor provides.CHAPTER 1-18 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:Applications Note 1-6:<strong>The</strong> Measurement System Transfer Function<strong>The</strong> transfer function is the complete relationship defining the output <strong>of</strong> a sensorfor any set <strong>of</strong> measur<strong>and</strong> inputs. <strong>The</strong> transfer function is also the relationship bywhich the time-varying input measur<strong>and</strong> is related to the resulting time-varyingoutput <strong>of</strong> a sensor. <strong>The</strong> transfer function is generally accepted as:F outH(f) where:( f ) = H( f)F in ( f )F out = the output function <strong>of</strong> the sensor.F in = the input measur<strong>and</strong> function.Note that each element <strong>of</strong> the signal-processing system will also possess a uniquetransfer function as well.<strong>The</strong> Concept <strong>of</strong> Spatial Independence:<strong>The</strong> concept <strong>of</strong> spatial independence means that a variable measur<strong>and</strong> is spatiallyuniform <strong>and</strong> that the value <strong>of</strong> the measur<strong>and</strong> is constant <strong>and</strong> independent <strong>of</strong> position,relative to the size <strong>of</strong> the sensorÕs active member. <strong>The</strong> statically-pressurizedvessel meets the requirements <strong>of</strong> spatial independence. Tight turbulent flow fields,as may be encountered around an antenna mounted to a high-performance fighteraircraft, will show high-level pressure variations over small linear distances,implying that the value <strong>of</strong> the measur<strong>and</strong> may not be constant over the sensitivearea <strong>of</strong> the sensor. In cases such as this, the requirement for spatial independencemay not be met. Figure 1-6 graphically shows the concept <strong>of</strong> spatial independence.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-19


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:FIGURE 1-6. Spatial Independence:Static Pressure<strong>The</strong> requirement for spatialindependence is satisfiedPressure Sensor<strong>The</strong> requirement for spatialindependence is NOT satisfiedConstant Pressure linePressure SensorTurbulent Flow FieldSensor active diameterConstant Pressure line<strong>The</strong> requirement for spatialindependence is satisfied Pressure Sensor Turbulent Flow FieldSensor active diameter<strong>The</strong> concept <strong>of</strong> spatial independence implies that the transfer function <strong>of</strong> anygiven sensor is only valid within a specific frequency b<strong>and</strong> related to the phys-CHAPTER 1-20 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:ical size <strong>of</strong> the sensorÕs active member. For the measurement <strong>of</strong> higher frequencies,spatial independence will require that smaller <strong>and</strong> smaller sensors beemployed in any given medium.<strong>The</strong> Nature <strong>of</strong> the Measur<strong>and</strong>:Measur<strong>and</strong>s may be scalar quantities such as voltage, current, or temperature,meaning that they can be completely specified by magnitude alone. Other measur<strong>and</strong>smay be vector quantities such as velocity, acceleration, <strong>and</strong> force, requiring adirection <strong>and</strong> magnitude to define the measur<strong>and</strong>.<strong>The</strong> effectiveness <strong>of</strong> the flush-diaphragm pressure sensor in sensing a pressureshock wave is a good example in that the wave has magnitude as well as direction<strong>and</strong> the sensor will not respond with equal outputs depending upon the angle <strong>of</strong> thewave relative to the sensor surface. In cases such as this, the sensor would alsorequire a Òfield responsivityÓ calibration in order to define the sensitivity <strong>of</strong> thedevice as a function <strong>of</strong> angle relative to a measur<strong>and</strong> input.Microphones are typically calibrated to show the field responsivity <strong>of</strong> this sensortype to measur<strong>and</strong> inputs at various angles to the sensor active member.<strong>The</strong> System Transfer Function:Bearing in mind the requirements <strong>of</strong> spatial independence, <strong>and</strong> the fact that thedefinition <strong>of</strong> the field responsivity <strong>of</strong> a sensor may also be necessary in order todefine the total response <strong>of</strong> the sensor, the transfer function <strong>of</strong> the measurementsystem is as shown in Figure 1-7.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-21


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:FIGURE 1-7. <strong>The</strong> Transfer Function:Qw(t) X H(w) = Q o (w)InputQ i (t)H 1 (w)H 2 (w)H 3 (w)H n (w)Outputf 1+ f 2 + f 2 =f nMagnitude H(w) = H 1 (w) X H 2 (w)........H n (w)And where the Phase Response is given by:Phase j(w) = j 1 (w) + j 2 (w) +........... j n (w)<strong>The</strong> total output <strong>of</strong> the measuring system is therefore:F out ( w) = H( w)F in ( w)(EQ 1-5)<strong>and</strong> the total Phase Response is given by:j out ( w) = j( w) + j in ( w)(EQ 1-6)Although convolution defines a specific mathematical operation in time <strong>and</strong>frequency domain analysis, equation 1-5 (Figure 1-8) can be thought <strong>of</strong> as theconvolution <strong>of</strong> the input signal with the transfer function <strong>of</strong> the sensor system.<strong>The</strong> reverse process, where the output function <strong>of</strong> the system is divided by thetransfer function, can be thought <strong>of</strong> as deconvolution <strong>and</strong> is expressed as:F in (w) = F out (w)/ H(w)CHAPTER 1-22 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:<strong>and</strong> where:j in (w) = j out (w) - j(w)FIGURE 1-8. Convolution <strong>and</strong> Deconvolution:F in(w)H(w)F out (w)CONVOLUTION:F out(w) = H(w) X F in (w)DECONVOLUTION:(Data Reduction)F in (w)=F out (w)H(w)Convolution occurs during the process <strong>of</strong> measurement <strong>and</strong> deconvolution is theprocess <strong>of</strong> the data reduction. Most data reduction difficulties come from thedeconvolution <strong>of</strong> collected data with the defined transfer function <strong>of</strong> the measurementsystem.<strong>The</strong> convolution function applied to spectral analysis <strong>of</strong> data is a very well-definedcomplex mathematical process where convolution in the time domain is equivalentto multiplication in the frequency domain. <strong>The</strong> relationship between convolution<strong>and</strong> multiplication in the two domains allows the use <strong>of</strong> the convolution function tocompute transfer functions <strong>and</strong> time domain outputs <strong>of</strong> digitally-implemented signalfiltering routines.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-23


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:<strong>The</strong> Sensor Transfer Function Measurement:<strong>The</strong> measurement <strong>of</strong> the sensor transfer function is the determination <strong>of</strong> themagnitude <strong>and</strong> phase response <strong>of</strong> the sensor when it is presented with a knownparameter input function. In the determination <strong>of</strong> the transfer function <strong>of</strong> anysensor, it is necessary that a dynamic parameter input be provided in order thatthe frequency-domain response <strong>of</strong> the device can be established. In the case <strong>of</strong>both load cells <strong>and</strong> strain-gaged pressure sensors, it is most common that thesedevices are calibrated using static or deadweight methods that will provideonly zero-hertz <strong>info</strong>rmation <strong>and</strong> provide inadequate <strong>info</strong>rmation to establishthe entire transfer function <strong>of</strong> the sensor. In measurement environments wheredynamic inputs are expected, choose a sensor having a flat frequency responsethat is at least equal to or greater than the highest expected frequency present inthe measur<strong>and</strong>. Dynamic calibration methods are implemented in the calibration<strong>of</strong> the self-generating class <strong>of</strong> sensors, piezoelectrics for instance, due tothe difficulties <strong>and</strong> inaccuracies that arise when attempting high precisionstatic calibrations <strong>of</strong> inherently dynamic devices. In this case high precisionmeans calibrations performed to better than ±1% full scale output (FSO) nonlinearity<strong>and</strong> hysteresis.<strong>The</strong> objective in calibrating any sensor is to establish the ÒsensitivityÓ <strong>of</strong> thesensor to a physical input. <strong>The</strong> problem with this is that this sensitivity numb erchanges depending upon the frequency <strong>of</strong> the input. In the simplest case, wewould prefer to model the output <strong>of</strong> a sensor as a linear line or y=mx + b relationshipwhere y is the output, m is the sensitivity, x is the input <strong>and</strong> b is whatyou get out with no input. When the linear model would allow excessive uncertaintyto result, we are forced to use more complex <strong>and</strong> typically polynomialrelationships to model the sensor output. <strong>The</strong> sensitivity <strong>of</strong> any sensor may bequoted in a number <strong>of</strong> different ways as follows:1. millivolts per unit <strong>of</strong> input ie: mV/microstrain at some defined excitation (What you get outper unit <strong>of</strong> input)2. millivolts per Volt <strong>of</strong> input ie: mV/V (What you get as a full scale per unit <strong>of</strong> excitation)3. millivolts per Volt <strong>of</strong> excitation per unit <strong>of</strong> input ie: mV/V/lbf (output per unit <strong>of</strong> excitationper unit <strong>of</strong> input)4. millivolts per milliamp ie: mV/ma (Common with constant -current driven sensors)CHAPTER 1-24 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:5. millivolts per milliwatt ie: mV/mW (Common with optically-based sensors)Be aware that transducers with sensitivities quoted as full scale values in mV/Vmay meet all other specifications at only one calibrated excitation level. You donot necessarily have the latitude to select any arbitrary level <strong>of</strong> excitation. This isparticularly true with resistance based sensors where thermal specifications mayonly be valid at some defined level <strong>of</strong> input excitation. For instance, in the case <strong>of</strong>strain gage based sensors, a doubling <strong>of</strong> the input excitation implies a 400%increase in the power dissipation. This results from the fact that power, in the voltage-excitedcase, is equal to V 2 /R <strong>and</strong> in the current-excited case, equals I 2 R.Additionally, sensitivities quoted in mV/V/unit <strong>of</strong> input can result in extremelysmall numbers where significant digits can mean a great deal. For example a50,000 lbf load cell at 2mV/V <strong>of</strong> input results in .00004 mV/V/lbf as a sensitivity.<strong>The</strong> various test methods that are listed in the following text briefly describe sometechniques by which the transfer function <strong>of</strong> a sensor may be defined, where themost common methods in use are described in detail in following chapters:Accelerometers:<strong>The</strong> calibration <strong>of</strong> strain-based accelerometers is performed to determine the transferfunction <strong>of</strong> the device <strong>and</strong> is usually made by one <strong>of</strong> the following techniques.Sinusoidal Discrete Frequency:To perform discrete-frequency sinusoidal calibrations, the sensor ismounted to an electrodynamic shaker system <strong>and</strong> is driven to vibrate at aselection <strong>of</strong> discrete frequencies at a calibrated <strong>and</strong> known peak accelerationlevel. <strong>The</strong> output <strong>of</strong> the device is then compared to the output <strong>of</strong> a calibratedreference accelerometer mounted inside the shaker armature. <strong>The</strong>phase difference between the reference accelerometer <strong>and</strong> the accelerometerbeing tested can also be measured <strong>and</strong> reported during this process<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-25


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:FIGURE 1-9. <strong>The</strong> Electrodynamic Shaker System:Absolute Position Detector (for absolutecalibrations)Ch ACh BOscilloscopeAccelerometer undertestReference OutputNormalizingAmplifierElectrodynamicShakerVarious Methods:- Vibrating Wedge- Interferometry- Retroreflective- Ronchi RulingsShaker headReferenceAccelerometerShaker ArmatureShaker Drive PowerSinusoidal SweepGenerator:Discrete or SweepPower AmplifierFrequency ReferenceLogarithmic RatioAmplifierdB RatioPlotter/ RecorderdB versus FrequencySinusoidal Swept Frequency:<strong>The</strong> sinusoidal-swept frequency test is performed by mounting anaccelerometer to an electrodynamic shaker system <strong>and</strong> smoothlysweeping the input excitation from a low to high frequency at a constantpeak acceleration level. <strong>The</strong> output <strong>of</strong> the test accelerometer iscontinuously compared to the output <strong>of</strong> the calibrated st<strong>and</strong>ard accelerometermounted in the shaker armature with the difference usually plottedin decibels. <strong>The</strong> high end <strong>of</strong> the frequency sweep is generallyadequate to clearly identify the resonant response peak <strong>of</strong> the accelerometer.As in the sinusoidal-discrete frequency test method, the phase<strong>info</strong>rmation may also be measured.CHAPTER 1-26 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:.Electrodynamic Shaker Pseudo-R<strong>and</strong>om Input:In the pseudo-r<strong>and</strong>om shaker method <strong>of</strong> transfer function determination,the accelerometer is mounted to an electrodynamic shaker system <strong>and</strong> apseudo-r<strong>and</strong>om input (broad-b<strong>and</strong> noise) is presented to the sensor <strong>and</strong> thesensor response to this input is recorded. <strong>The</strong> pseudo-r<strong>and</strong>om input is thesummation <strong>of</strong> a large number <strong>of</strong> sinusoids <strong>of</strong> arbitrary frequency, phase,<strong>and</strong> having a defined a RMS (root-mean-square) amplitude. This calibrationis performed by plotting the power spectral density <strong>of</strong> the output <strong>of</strong> thesensor as a function <strong>of</strong> frequency.Shock Machine <strong>and</strong> Hopkinson BarShort-duration transient inputs are usually made by mounting the accelerometerto a shock machine or structural Òwave-guideÓ (Hopkinson Bar)<strong>and</strong> applying inputs that approximate the unit-impulse function. <strong>The</strong> Hopkinsonbar is a freely-suspended, simple cylindrical bar that is impacted atone end where the compression wave travels through the bar to the free endwhere the wave is converted to motion <strong>of</strong> the end plane to which the accelerometeris mounted. A reference accelerometer is generally mounted tothe free end <strong>of</strong> the bar to monitor the end-plane motion. In most cases, astrain gage, affixed to the side <strong>of</strong> the bar, is used to provide a trigger signalto a digital storage oscilloscope to allow capture <strong>of</strong> the wave form. <strong>The</strong>unit-impulse function is not easily physically approximated due to theimpossibility <strong>of</strong> generating a pulse <strong>of</strong> unit amplitude <strong>and</strong> areaCentrifuge:Static zero-hertz input calibrations are generally performed using a centrifugesystem where the accelerometer to be tested is mounted at a knownradius on the centrifuge disc <strong>and</strong> the disc is rotated at a known speed. <strong>The</strong>known radius <strong>and</strong> rotational speed produce a primary centripetal accelerationloading that is directly traceable <strong>and</strong> is given by:<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-27


Applications Note 1-6:Deadweight test apparatus possess the important inherent ability <strong>of</strong> applyingexactly the same loads to the sensor being calibrated regardless <strong>of</strong>whether loads are increasing or decreasing. Insight into the value <strong>of</strong> thisinherent advantage <strong>of</strong> deadweight calibration systems follows in the discussion<strong>of</strong> hydraulic test systems.HydraulicIn higher-load-range calibrations, a reference load cell is installed into theload path in series with the device to be calibrated where the assembly ishydraulically loaded <strong>and</strong> the output <strong>of</strong> the test load cell is compared to theoutput <strong>of</strong> the reference load cell. Calibrations <strong>of</strong> this type are known ascomparison calibrations as the sensor under test is being compared to thereference load cell. Moorehouse Instruments <strong>of</strong> Pennsylvania manufacturesload frames <strong>of</strong> this type. As one might suspect, the precision <strong>of</strong> this type <strong>of</strong>calibration is limited by the precision <strong>of</strong> the reference load cell otherwiseknown as the Òtransfer st<strong>and</strong>ardÓ. A calibration showing zero nonlinearity<strong>and</strong> hysteresis simply means that no substantial difference exists betweenthe load cell being calibrated <strong>and</strong> the reference load cell. Such results donot imply zero error. Typically, the reference load cell is chosen to showbetween three <strong>and</strong> ten times lower nonlinearity <strong>and</strong> hysteresis errors thanthe sensor being calibrated. Accordingly, to calibrate a load cell to ±.1% <strong>of</strong>full scale output (FSO) nonlinearity <strong>and</strong> hysteresis, the reference load cellshould show between ±.03% <strong>and</strong> ±.01% FSO nonlinearity <strong>and</strong> hysteresis.To achieve traceable high performance results with this type <strong>of</strong> apparatus,one must consider that the loads applied will decay with respect to time dueto seal leakage around the hydraulic cylinder piston seal. High pressurehydraulic lines provided with this type <strong>of</strong> system are <strong>of</strong>ten elastomeric innature <strong>and</strong> it is common to change to stainless steel tubing thereby reducingthe applied force decay rate due to hydraulic line expansion. Often,high speed digital data acquisition systems are used to collect many samples<strong>of</strong> both the transfer st<strong>and</strong>ard <strong>and</strong> the sensor under test at each inputload level where this data is averaged. This has the effect <strong>of</strong> averagingnoise to zero <strong>and</strong> reducing the uncertainty due to load decay.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-31


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:<strong>The</strong> hysteresis in the output <strong>of</strong> any sensor is the difference between theoutput <strong>of</strong> the sensor when inputs are monotonically increased <strong>and</strong> theoutput <strong>of</strong> the sensor when inputs are monotonically decreased. Industryst<strong>and</strong>ard procedures typically require that loads be applied in 11, 20%<strong>of</strong> full scale input increments/decrements ie: 0%, 20%, 40%, 60%,80%, 100%, 80%, 60%, 40%, 20%, 0% <strong>of</strong> input. <strong>The</strong> objective in determininghysteresis loss is to find the magnitude <strong>of</strong> input where the maximumdifference exists between the Òup-loadÓ response <strong>and</strong> the ÒdownloadÓresponse. This is not trivial in the case <strong>of</strong> high performance calibrationsperformed on comparison calibration systems due to theimpossibility <strong>of</strong> exactly repeating the up-load points on the unload portion<strong>of</strong> the test. To alleviate this problem it is recommended that the unloadresponse be characterized with a three-coefficient polynomialcurve fit <strong>and</strong> the outputs then computed for the average inputs achievedon the up-load line. In this way, true hysteresis can be measured.FIGURE 1-11b: <strong>The</strong> Hydraulic Tester, Transfer Calibration: or Transfer St<strong>and</strong>ard) Changeable Spacerto accommodatevarious sensor styles Reference Sensor (Proving RingHydraulic PumpHydraulic RamLocation <strong>of</strong> Sensor forCompression LoadingLocation <strong>of</strong> Sensor forTension LoadingCHAPTER 1-32 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:Phase <strong>info</strong>rmation is not available in this type <strong>of</strong> static testing. In the case<strong>of</strong> the piezoelectric load cell, very long time constants <strong>of</strong> the output do permitstatic calibration within defined precision limits.Gravimetric<strong>The</strong> ÒdrivenÓ gravimetric method <strong>of</strong> calibration utilizes an inertial massmounted to the load cell <strong>and</strong> driven by a shaker system where the frequencyis either set to discrete points or swept over a defined frequencyb<strong>and</strong> <strong>and</strong> the magnitude <strong>and</strong> phase data are recorded. By measuring theapplied acceleration with an internally-mounted reference accelerometer,<strong>and</strong> in knowing the mass <strong>of</strong> the inertial weight, the applied force may becalculated by the relationship F = MA. <strong>The</strong> free-fall gravimetric methoduses a load cell as the reference sensor to calibrate an accelerometermounted on the opposite side <strong>of</strong> the inertial mass. <strong>The</strong> gravimetric methodis reciprocal in nature, as will be discussed, but is normally limited to ± 1%precision which is generally adequate for transfer function determinationbut inadequate for high-precision calibration. Both the free-fall gravimetric<strong>and</strong> driven systems are depicted in Figure 1-13.FIGURE 1-13. <strong>The</strong> Gravimetric Test System: Load Cell M Test Mass Accelerometer Elastic Suspension:Manually Deflectedto create momentary Free-FallconditionsPostGuide TubeBeamDamperBaseTie rodsMassElectrodynamicShakerLoad CellReference AccelerometerF = MAFoam<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-33


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:As in accelerometer calibration, the gravimetric method may be usedwith broadb<strong>and</strong> noise inputs, sinusoidal or discrete-frequency inputsgenerated by an electrodynamic shaker to determine the load cell transferfunction.Pressure Transducers:Pressure sensors may be calibrated by many different methods for the purpose<strong>of</strong> determining the sensor transfer function where some <strong>of</strong> these methods arediscussed as follows:Deadweight PressurePressure transducers are statically calibrated by means <strong>of</strong> the deadweighttester where calibrated masses are sequentially added to a platformthat is supported by a precision piston. <strong>The</strong> pressure is increasedmanually or automatically, by either a ram or controlled-pressure regulator,to the point where the pressure, generated by the calibratedweights acting over the area <strong>of</strong> the precision piston, is balanced <strong>and</strong> thepiston is free-floating. <strong>The</strong> precision <strong>of</strong> this type <strong>of</strong> calibration systemrelates to the area difference between the piston <strong>and</strong> bore within whichit moves. Traceable uncertainties <strong>of</strong> as low as .0004% <strong>of</strong> applied pressureare achievable with deadweight calibrators where the piston <strong>and</strong>bore are precision lapped to minimize area differences. As the area differencebetween the piston <strong>and</strong> bore results in a leakage path, it is commonfor the piston to slowly settle where the pressure will ultimatelydecay to zero. Operating procedures for deadweight pressure calibratorswill <strong>of</strong>ten specify that the weights be manually rotated to distributethe fluid film <strong>and</strong> minimize friction while data is collected at each inputlevel. <strong>The</strong> sensor to be calibrated is in communication with the balancedpressure reservoir <strong>and</strong> the sensor output is recorded. As with allstatic-calibration methods, phase data is not available.CHAPTER 1-34 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:FIGURE 1-14. <strong>The</strong> Deadweight Pressure Test System:When the Free-floatingpiston is supported bythe hydraulic column.the pressure = W/APneumatic Shock Tube:CalibratedWeightsFree-floating pistonArea = A inches 2Sensor under testPressurizing Ram Pressure sensors may be dynamically calibrated by means <strong>of</strong> the shocktube where a pressurized reservoir <strong>of</strong> gas is maintained at a known pre-setlevel <strong>and</strong> is separated from a long tubular section maintained at anotherknown pressure by a rapid-acting valve or diaphragm. When the valve isopened or the diaphragm is deliberately punctured, the reservoir vents intothe shock tube tubular section very rapidly. A very high-frequency-capablereference piezoelectric pressure sensor is normally mounted close to thesensor under test <strong>and</strong> the outputs are compared to determine the response<strong>of</strong> the sensor to the pressure shock wave. It is important that the referencesensor have a frequency response that is much higher than that <strong>of</strong> the testsensor <strong>and</strong> sufficiently high to prevent resonant ringing. <strong>The</strong> shock tubeapparatus can be used with various gases <strong>and</strong> Prichard pressure levels toachieve microsecond rise times <strong>and</strong> high pressure impulse loadings. Electrically-drivenshock tubes produce a high pressure shock wave resultingfrom an electrical spark discharged across a gap between electrodes. Pressureamplitudes <strong>of</strong> 1,000 psi or more are not uncommon. <strong>The</strong> impulseresponse <strong>of</strong> the sensor under such dynamic conditions may be used todetermine the transfer function <strong>of</strong> the sensor including phase data.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-35


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:FIGURE 1-15. <strong>The</strong> High-Pressure Shock Tube:Driver SectionPiercing MechanismHigh PressureAluminum DiaphragmShock PulseTest SectionSensor Under TestTime-<strong>of</strong>-arrival sensorLow PressureHelium SupplyAcoustic Horn:<strong>The</strong> transfer function <strong>of</strong> low-pressure range sensors may also be determinedby use <strong>of</strong> the acoustic horn method where an acoustic generator(horn) is mounted into a procreated chamber <strong>and</strong> the horn output isswept over the frequency range <strong>of</strong> interest. <strong>The</strong> maximum pressuresgenerated by the acoustic horn system are generally less than 1 psi(approximately 170-dB sound pressure level).FIGURE 1-16. <strong>The</strong> Acoustic Horn:AcousticGeneratorPower AmplifierReference SensorSweep GeneratorOscillatorSensor under TestPressure SourceRapidly-Valved Systems:CHAPTER 1-36 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:Rapid-opening valve systems such as the Aronson shockless pressure calibratorin which two chambers, at different pressure pre-charge levels, areseparated by a low-mass poppet valve supported by a spring <strong>and</strong> providedwith a long slender actuating rod. <strong>The</strong> actuating force rod is provided witha platen, upon which weights are dropped, rapidly opening the poppetvalve. Once opened, the larger <strong>and</strong> higher pressure chamber rapidly equilibrateswith the smaller volume test chamber. To facilitate observation <strong>of</strong>the generated output <strong>of</strong> the sensor, a piezoelectric accelerometer or loadcell is normally used to detect the shock <strong>of</strong> impact <strong>of</strong> the weight against theplaten where this output is used for oscilloscope-triggering purposes. <strong>The</strong>pressure sensor under test is mounted into the smaller <strong>of</strong> the two chambersin order that the larger chamber can pressurize the smaller volume rapidly.Chamber volume ratios <strong>of</strong> 2/1000 are common for very rapid rise-time testing.<strong>The</strong> rapid-acting valve systems are able to generate single positive- ornegative-going pressure steps that are useful in transfer function <strong>and</strong> phasemeasurement.FIGURE 1-17. <strong>The</strong> Aronson Shockless Pressure Step Generator:P PoppetSensor under testPoppet Volume(P Poppet )O-ring sealMassPoppet Valve HeadPoppet Valve StemCompression SpringHousing SupportPressure Reservoir(P reservoir )Poppet lifter <strong>and</strong>lockdown tabGuide TubeImpact PlateAccelerometer trigger<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-37


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Hydraulic Impulse:<strong>The</strong> hydraulic impulse systems in common use involve the dropping <strong>of</strong>a calibrated weight from a controlled height onto a moveable precisionpiston which compresses a column <strong>of</strong> hydraulic fluid. Two forms <strong>of</strong>this calibrator are in use; one utilizes a reference pressure sensor usually<strong>of</strong> the tourmaline piezoelectric type; the other computes the generatedpressure based upon the mass <strong>of</strong> the weight, local gravity, velocity,<strong>and</strong> piston area. Peak pressure magnitudes <strong>of</strong> between 100 <strong>and</strong> 20,000psi are achievable with rise times on the order <strong>of</strong> 3 milliseconds <strong>and</strong>showing pulse durations on the order <strong>of</strong> 6 milliseconds.FIGURE 1-18. <strong>The</strong> Hydraulic Impulse Test System:Drop Tube9-lb massImpact Pad:Modifies Pulse durationPistonTypical Range:0 to 20,000 psiRise Time:3 millisecondsPulse Duration:6-8 millisecondsTest sensor Reference Sensor(Piezoelectric tourmaline)Hydraulic ReservoirOther Methods:Other methods, not so commonly used for the determination <strong>of</strong> thedynamic response <strong>of</strong> sensors, are many <strong>and</strong> varied. Modified air com-CHAPTER 1-38 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-6:pressors (Figure 1-19) can be used to generate repeatable sinusoidal pressurewaves where the test pressure sensor output is compared with output<strong>of</strong> a reference sensor. <strong>The</strong> modified air compressor method is typicallyused at a fixed frequency depending upon the design <strong>of</strong> the compressormotor.<strong>The</strong> vibrating fluidic-column method (Figure 1-20) is also based upon thecomparison <strong>of</strong> outputs between a reference sensor <strong>and</strong> the sensor undertest. This method involves the use <strong>of</strong> a fluidic column that supports amoveable piston/mass that is then mounted to an electrodynamic shakersystem <strong>and</strong> is driven to vibrate at a selection <strong>of</strong> frequencies.FIGURE 1-19. <strong>The</strong> Sinusoidal Pressure Source:Pressure sensorunder testPressure Relief ValvePressure Transfer St<strong>and</strong>ardCompressorFIGURE 1-20. <strong>The</strong> Hydraulic-Column Pressure Source:Free MassSensor underTestHydraulic columnPressure TransferSt<strong>and</strong>ardShaker<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-39


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Applications Note 1-7:<strong>The</strong> Fourier Series<strong>The</strong> Fourier series is a mathematical expression that is used to define any timevaryingfunction as an infinite sum <strong>of</strong> the multiples <strong>of</strong> the fundamental frequencythat comprise the time function. <strong>The</strong> Fourier series is given by:qt ()=¥a---- 0+ a2 å ( k coskw 1 t + b k sinkw 1 t)k = 1(EQ 1-7)<strong>The</strong> Fourier series is not just the mathematical expression <strong>of</strong> a time function, itis the time function. Another way <strong>of</strong> regarding the Fourier Series is to considerthat every frequency component required to define a specific time function canbe regarded as a physically real subcomponent <strong>of</strong> the time function. <strong>The</strong> value<strong>of</strong> k in the above expression is equal to the number <strong>of</strong> sinusoids, or harmonics,summed together to approximate the time function that is being modeled,where higher values <strong>of</strong> k yield closer approximations to the time function.<strong>The</strong> key issue concerning the Fourier Series expression <strong>of</strong> a time-varying signalis that the transfer function <strong>of</strong> the sensor <strong>and</strong> measurement system will acton each <strong>of</strong> the harmonic components as if these had been input separately. <strong>The</strong>result <strong>of</strong> this logic is that the resultant time-varying output is the summation, orsuperposition, <strong>of</strong> each <strong>of</strong> the outputs from the sensor or measurement systemcorresponding to each <strong>of</strong> the Fourier input components. Figure 1-21 shows thewaveform that will result if three simple Fourier components are summed. Itcan be seen intuitively that any complex waveform can be created by the successivesumming <strong>of</strong> the Fourier subcomponents. Correspondingly, each <strong>of</strong> theFourier components <strong>of</strong> the input will be phase-shifted by a different phaseangle depending upon the phase relationship <strong>of</strong> the measurement system transferfunction. <strong>The</strong> end result is that the output from the measurement system canbe both amplitude- <strong>and</strong> phase-distorted unless care is taken to assess the frequency<strong>of</strong> the highest expected frequency component, <strong>and</strong> then to assess theCHAPTER 1-40 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-7:amplitude <strong>and</strong> phase characteristics <strong>of</strong> the measurement system transfer function.An infinitely-sharp discontinuity in the input waveform implies that the measur<strong>and</strong>contains an infinite sum <strong>of</strong> Fourier components. <strong>The</strong> square-wave or triangularpulseinput wave forms, therefore, contain an infinite series <strong>of</strong> Fourier components.<strong>The</strong> existence <strong>of</strong> a large number <strong>of</strong> Fourier input components implies thatthere will exist, with a high probability, frequency inputs at or near the resonancefrequency <strong>of</strong> the sensor. In the undamped sensor case, these inputs can result inoverhanging <strong>of</strong> the sensor <strong>and</strong>/or resonant ringing <strong>of</strong> the output. In general, verylittle energy usually exists in the frequency components <strong>of</strong> the input that are at, orgreater than, the tenth harmonic or tenth Fourier component.FIGURE 1-21. A Complex Input Waveform:Magnitude Fourier Component 11Fourier Component 2.5Fourier Component 30Time-.5-121.5Fourier Sum = Component 1 + Component 2 + Component 31.5Net Waveform0Time<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-41


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Figures 1-22 <strong>and</strong> 1-23 illustrate how even small parameter inputs, at or nearresonance, can produce high-level ringing <strong>of</strong> the sensor output.FIGURE 1-22. A Complex Input to the Sensor Transfer Function:Magnitude+1g0g-1g+10 gComponent 1: ± 10g at 100 HzComponent 2: ± 1g at 1000 HzTime-10 g+11 gPhysical Input toAccelerometerSummed WaveformTime-11 gMagnitudedB+40 dBCalibration FrequencyResonant Peak0 dB100 HzComponent 11000 HzComponent 2Sensor Transfer Function (Magnitude)Resonance Frequency = 1000HzCalibration at 100 Hz = 1mV/gSensor Range = 10 gSensor Overrange = 100gLog FrequencyCHAPTER 1-42 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-7:<strong>The</strong> 100-Hz (±10 g peak) input may be the input <strong>of</strong> interest where the 1,000-Hz(±1g peak) input is <strong>of</strong> secondary interest <strong>and</strong> may be due to bearing chatter or gearmeshingcomponents. In this case, the 10-g range accelerometer shows a sensitivity<strong>of</strong> 1 mV/g, as calibrated at 100 Hz, with an undamped resonant frequency <strong>of</strong>1,000 Hz showing a maximum response <strong>of</strong> +40 db (= 20 log V o /V cal , where V cal isthe calibrated sensitivity <strong>of</strong> the sensor at a much lower frequency within the ÒflatÓfrequency response range <strong>of</strong> the sensor). It would be reasonable for the accelerometerto show a maximum overhang tolerance <strong>of</strong> ±100 g before mechanical damageis suffered. <strong>The</strong> net accelerometer output is as shown in Figure 1-23.As shown, the 10-g input component will produce a ±10 millivolt output componentat 100 Hz, however, the situation is dramatically different for the ±1g, 1000-Hz component. Since the 1,000-Hz component exists at the resonant frequency <strong>of</strong>the device, the accelerometer will mechanically amplify the ±1g input by the +40dB mechanical gain at resonance, which, when multiplied by the 1mV/g sensitivity,will result in a ±10 mV output component at 1,000 Hz as shown. <strong>The</strong> net outputwaveform shows massive ringing at 1000 Hz where the <strong>info</strong>rmation <strong>of</strong> interestis marginally evident as the modulated envelope <strong>of</strong> the response shown. Frequencyfiltering <strong>of</strong> the output <strong>of</strong> the sensor would help to filter out the 1,000-Hz component,however, the 100-g maximum over-range <strong>of</strong> the accelerometer means that thesubject sensor is, in all likelihood, broken! If the maximum allowable overrange is100 g, this figure is given as being valid within the useful frequency range <strong>of</strong> thesensor <strong>and</strong> not at resonance. <strong>The</strong> ±1 g input at resonance could, therefore, be quitesufficient to cause overrange destruction <strong>of</strong> the device. <strong>The</strong> moral <strong>of</strong> this story isthat we must be aware <strong>of</strong> all components present within an input signal <strong>and</strong> assessthe potential impact <strong>of</strong> each component with respect to the transfer function <strong>of</strong> thesensor.<strong>The</strong> Fourier Series is not just a Òmathematically-elegantÓ method <strong>of</strong> expressing the inputwaveform but, more importantly, a valuable means <strong>of</strong> determining the power spectral density(the energy that exists within each <strong>of</strong> the Fourier components), <strong>and</strong> <strong>of</strong> visualizing thecomponents <strong>of</strong> the input <strong>and</strong> output separately. -JP<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-43


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:FIGURE 1-23. <strong>The</strong> Net Accelerometer Output:mV+10 mV-10 mVAccelerometer Output Component at 100HzPeak Magnitude = 1mV/g X 10 g = ± 10 mVTimemV+100 mVAccelerometer Output Component at 1,000HzPeak Magnitude = 1mV/g X 1g X 100 = ± 100mV0 mVTime-100 mV+110 mVNet Accelerometer Output+100 mV+90 mV0 mVTime- 90 mV-100 mV-110 mV<strong>The</strong> Fast Fourier Transform algorithm (FFT) is a method by which the number<strong>of</strong> computations required to compute the Fourier series is dramatically reducedfrom N 2 calculations to Nlog 2 N calculations, allowing high-speed computersto rapidly compute the Fourier Spectrum <strong>and</strong> plot it as the power spectral density.<strong>The</strong> power spectral density is the plot <strong>of</strong> the relative magnitudes <strong>of</strong> each <strong>of</strong>the Fourier components as a function <strong>of</strong> frequency.CHAPTER 1-44 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-8:Applications Note 1-8:Zeroth-, First-, <strong>and</strong> Second-Order System DeÞnitions<strong>The</strong> definition <strong>of</strong> the order <strong>of</strong> a sensor is basically the generalized classification <strong>of</strong>the transfer function <strong>of</strong> the sensor.<strong>The</strong> Zero-Order Sensor:<strong>The</strong> zero-order sensor is sometimes referred to as the ÒZerothÓ order system,where the output <strong>of</strong> the sensor is a linear function <strong>of</strong> the input where,in theory at least, this relationship remains valid at all frequencies. <strong>The</strong>zero-order sensor structure is not realizable in practice; however, some sensorswill behave very much like zero-order sensors over limited b<strong>and</strong>widthsin frequency. <strong>The</strong> zero-order system is shown in Figure 1-22 <strong>and</strong>characterized as follows:F out (t) = K F in (t) (EQ 1-8)Where: F out (t) = <strong>The</strong> output function with respect to time.F in (t) = <strong>The</strong> input function with respect to time.K = <strong>The</strong> proportionality constant.FIGURE 1-24. <strong>The</strong> Zero-Order Response:.Input/OutputMagnitudeInputOutput(LVDTResponse)Time<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-45


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:<strong>The</strong> Linear-Variable-Differential Transformer (LVDT)-based sensorclosely approximates the zeroth-order sensor at low-to-moderate frequencies<strong>The</strong> First-Order Sensor:A first-order system response is the solution to the first-order differential equationas follows:dF outk 1dT+ k 0 F out = b 0 F in(EQ 1-9)ordF outtæ ö + FèdTø out = KF in(EQ 1-10)Where: t = k 1 /k 0 , <strong>The</strong> sensor time constantK = b 0 /k 0 , <strong>The</strong> static sensitivity.If d /dT is replaced by the differential operator ÒDÓ, equation 1-10 becomes:KF in = ( 1 + tD)F outSince F out /F in is defined as the Transfer Function (H):HK= -------------------- =( 1 + tD)F--------- outF in(EQ 1-11)Implies:H( w)( jw)K= --------------------- = -----------------------( jw)( 1 + jwt)F outF in(EQ 1-12)Where the magnitude <strong>of</strong> this transfer function will equal:CHAPTER 1-46 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-8:H( w)=K------------------------1 + w 2 t 2(EQ 1-13)And where the phase response is given by:jw ( ) = atan( wt)(EQ 1-14)An example <strong>of</strong> the first-order response is the response <strong>of</strong> a thermocouple asshown in Figure 1-25. <strong>The</strong> maximum phase shift <strong>of</strong> the first-order sensoris -90 degrees as w approaches infinity. <strong>The</strong> first-order response is alsoreferred as the Òsingle-poleÓ response.FIGURE 1-25. <strong>The</strong> First-Order Step-Input Response:Input/OutputMagnitudeInputOutputt =Final Valuee(<strong>The</strong>rmocoupleResponse)1/eWhere e = 2.71828tTime<strong>The</strong> Second-Order Sensor:<strong>The</strong> second-order system response that is the solution to the second-order differentialequation:2dF out dF outk 2 + k2 1 + kd t dt0 F out = b 0 F in(EQ 1-15)If w 0 is defined as:<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-47


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:k 0k 2---- <strong>and</strong> z=k 1-----------------2 k 0 k 2(EQ 1-16)where: w 0 is the natural frequency <strong>and</strong> z is the damping factor.Equation 1-15 becomes:1 dk----- 0 2z+ -------------- + k2 20 = KF inw 0 d t dk 0w 0dt(EQ 1-17)Where: K = <strong>The</strong> static sensitivity <strong>of</strong> the sensor.<strong>The</strong> second order transfer function in the frequency domain can be shown toequal:H( w)=K--------------------------------------------------------æ w1 Ð æ-----ö 2 + 2 jzæ-----w ööè èw 0ø èw 0øø(EQ 1-18)Where the magnitude <strong>of</strong> this function will equal:H( w)=K-----------------------------------------------------------w1 -----èæ Ð èæ øö2øö 2 + 2zw ----------èæ øö2w 0w 0(EQ 1-19)<strong>and</strong> where the phase response is given by:zjw ( ) = atan2------------------------æ w w----- Ð ----- 0 öè w øw 0(EQ 1-20)Examples <strong>of</strong> the second-order response, Figure 1-26, are abundant. Allspring-member-based sensors will show a second-order response, up tothe first resonance frequency, with varying degrees <strong>of</strong> damping. NoteCHAPTER 1-48 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-8:that the phase variation with frequency will equal -90 degrees at the naturalfrequency (w n ) <strong>and</strong> will approach -180 degrees as the frequencyapproaches infinity. <strong>The</strong> second-order response is sometimes also referredto as the Ò2-poleÓ response or the simple Òspring/mass/damperÓ systemresponse.FIGURE 1-26. <strong>The</strong> Second-Order System Step-Input Response:Input/OutputAmplitudeInputOutputw n decreasingDamping Factor ( z ) = .7Time<strong>The</strong> Second-Order Response to a Step-Input(<strong>The</strong> effect <strong>of</strong> Natural Frequency)Input/ OutputMagnitude21.5z = .1z = .3z = .5Damping Factor IncreasingOutput1Input.50 secondsTime<strong>The</strong> Second-Order Response to a Step-Input(<strong>The</strong> effect <strong>of</strong> Increasing Damping Factor)<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-49


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Applications Note 1-9:<strong>The</strong> Second-Order SystemAn accelerometer having an internal spring member that responded to accelerationinputs in two or more dimensions simultaneously would be <strong>of</strong> little use aswe would be unable to define a dimension that produced any given response.This is why an accelerometer spring member is designed to be flexible(responsive) in one dimension <strong>and</strong> stiff (unresponsive) in all other dimensions.Our goal would be to define the measurement axis precisely to produce a single-degree-<strong>of</strong>-freedomstructure. <strong>The</strong> single-degree-<strong>of</strong>-freedom spring-member-basedsensor class invariably show second-order responses.It should be noted that no mechanical system is able to perfectly imitatethe single-degree-<strong>of</strong>-freedom system <strong>and</strong> will simultaneously supportmotion, to some extent, in other dimensions. Even well-designed sensorstructures will show some degree <strong>of</strong> ÒtransverseÓ responsivity. <strong>The</strong>second-order system is defined as a system where the transfer functionis the solution to a second-order differential equation. <strong>The</strong> second-orderresponse defines the response <strong>of</strong> any mechanical system possessingmass, where the restoring forces acting upon this mass are provided bya spring constant, <strong>and</strong> resistance to motion is provided by mechanicaldamping. <strong>The</strong> spring constant is quantified by the stiffness <strong>of</strong> the springmember. <strong>The</strong> damping forces acting upon the mass may result from theintrinsic structural damping <strong>of</strong> the material that comprises the springmember, or may derive from fluidic- or gas-damping provided in thesensor design. In the case <strong>of</strong> the piezoelectric element, the spring rate<strong>of</strong> the piezoelectric element is high <strong>and</strong> the internal structural damping<strong>of</strong> the element is low yielding a close-to-zero-damped second-orderresponse. In the case <strong>of</strong> the seismometer, the spring restoring forces aregenerally provided by discrete spring elements <strong>of</strong> relatively low springrate, yielding fundamentally low resonance frequencies.CHAPTER 1-50 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-9:Seismic Instruments:<strong>The</strong> term ÒSeismic InstrumentsÓ is used to refer to the entire class <strong>of</strong> instruments,the dynamic behavior <strong>of</strong> which can be derived from the sum <strong>of</strong> theforces acting upon the internal seismic element, where the seismic elementis constrained to move primarily in one dimension (single-degree-<strong>of</strong>-freedomsystem). <strong>The</strong> seismic mass in low g range cantilever beam accelerometersmay consist <strong>of</strong> a concentrated mass at one end <strong>of</strong> the beam or can bethe distributed mass <strong>of</strong> the beam alone in very high range devices. In thecase <strong>of</strong> the pressure sensor diaphragm, the seismic mass is the distributedmass <strong>of</strong> the diaphragm, <strong>and</strong> the restoring spring force is provided by thespring constant <strong>of</strong> the diaphragm material. Load transducers are identical tothe diaphragm pressure sensor from the seismic viewpoint, with the springmember configured to produce bending in response to direct-force loading,as opposed, to the distributed-force loading that pressure environmentspresent to the diaphragm pressure sensor.NewtonÕs Law, F = MA, is the fundamental relationship which all seismicinstruments obey, in that, the net force exerted on a mass will result in theacceleration or deceleration <strong>of</strong> the mass with resulting displacement. Allseismic instruments show primarily second-order responses. It should alsobe noted that all sensor structures will show multiple higher-order resonancesas the various internal structures within the sensor possess differentmasses, geometries, <strong>and</strong> stiffness, <strong>and</strong> will support resonances at differentfrequencies. <strong>The</strong> objective <strong>of</strong> good sensor design is to ensure that theseinternal structures do not support resonant responses within the useful frequencyresponse range <strong>of</strong> the sensor.Referencing Figure 1-27, a seismic system is modeled showing the seismicmass <strong>and</strong> the spring as well as damping forces that will act upon this mass.This mechanical model is excited by the forcing function q i acting upon themass where the resulting displacement <strong>of</strong> the mass is defined as q o .<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-51


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:FIGURE 1-27. <strong>The</strong> Second-Order System Mechanical Model:q i InputMassq o OutputSpringK Lbf/InRDamper Lbf/ft/secR proportional to velocityFoundation<strong>The</strong> electrical output <strong>of</strong> the strain-based sensor is a direct <strong>and</strong> proportionalfunction <strong>of</strong> the spring member displacement. For this reason, thefunction q o (t) is taken as being proportional to the output that wouldresult from the second-order sensor structure. <strong>The</strong> velocity <strong>of</strong> the massis defined as dq o (t)/dt <strong>and</strong> the acceleration <strong>of</strong> the mass is defined asd 2 q o (t)/dt 2 . <strong>The</strong> force that the spring will exert upon on the mass will beopposite to the forcing input <strong>and</strong> will equal -K q o (t), where K is thespring constant having units <strong>of</strong> force-per-unit-displacement. <strong>The</strong>mechanical damper will also provide a force that is opposite to the forcinginput as a function <strong>of</strong> the mass velocity <strong>and</strong> will equal -Rdq o (t)/dt,where, R is in units <strong>of</strong> force-per-unit <strong>of</strong> mass velocity.Since Force = mass X acceleration or F = MA, then:MA = S <strong>of</strong> all forces acting upon the massMA = Input force - Spring force - Damping forcedMA = q i () t Ð Kq 0 () t Ð R q0 () t dt(EQ 1-21)CHAPTER 1-52 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-9:Where:dMA = M q0 () t = F2d t2(EQ 1-22)Substituting (1-22) for MA in (1-21) <strong>and</strong> solving for q i (t) yields:2d dq i () t = M q0 () t + R q0 () t + Kq2d t dt0 () t(EQ 1-23)Converting from the time domain into the frequency domain using the relationshipq i (t) = e jwt as representative <strong>of</strong> a sinusoidal input, <strong>and</strong> knowingthat the output will equal:q 0 () t = H( w)q i () t(EQ 1-24)(where H(w) is the system transfer function)<strong>The</strong>n, the output must be <strong>of</strong> the form:q 0 () t = H( w)e jwt(EQ 1-25)H(w) also represents phase as well as magnitude <strong>of</strong> response. Havingestablished this equality, differentiation <strong>of</strong> equation (1-25) yields the furtherequalities:d q0 () t = H( w)jwe jwtdt(EQ 1-26)<strong>and</strong>2d q0 () t = ÐH( w)w 2 e jwtdt 2(EQ 1-27)Substitution <strong>of</strong> equations (1-24), (1-25), (1-26), <strong>and</strong> (1-27) into equation(1-23) <strong>and</strong> solving for H(w) yields:<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-53


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:H( w)=1--------------------------------------------------------------æ w1 -----èÐ èæ w 0øö2 ö 2 2z w ø+ -----èæ w 0øö2(EQ 1-28)<strong>and</strong>jw ( )=2zatan------------------------æ w w----- Ð ----- 0 öè w øw 0(EQ 1-29)Where:j(w) = <strong>The</strong> phase relationship between the output <strong>and</strong> the input forcingfunction.w 0=K----MRadians/SecondWhere: w 0 = 2p f 0(EQ 1-30)RMz = ----------------2 MK(EQ 1-31)<strong>The</strong> implications <strong>of</strong> equations (1-28) <strong>and</strong> (1-29) are shown graphicallyin Figure 1-28 <strong>and</strong> are stated as follows:1. As w approaches zero radians/second: <strong>The</strong> second-order system is stiffness-dominated orÒspring-controlledÓ where the transfer function H(w) approaches unity in value.2. As w approaches infinity radians/second: <strong>The</strong> second-order system is mass-dominatedwhere the reaction <strong>of</strong> the mass to the input approaches zero, or the value <strong>of</strong> the transferfunction value itself approaches zero.3. As w approaches infinity: <strong>The</strong> phase angle between the input <strong>and</strong> the output approaches180 degrees.4. When the phase angle between the input <strong>and</strong> the output equals 90 degrees, w = w 0 which istermed the natural frequency <strong>of</strong> the system.5. If this system possessed zero damping (an impossibility), the value <strong>of</strong> the transfer functionwill approach infinity at the natural frequency <strong>of</strong> the system.CHAPTER 1-54 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-9:6. When the phase angle between the input <strong>and</strong> the output equals 90 degrees, the natural frequency<strong>of</strong> the system may be determined <strong>and</strong> from this quantity, the stiffness <strong>and</strong> mass-ratio <strong>of</strong> the systemcan be directly determined by means <strong>of</strong> equation (1-30)FIGURE 1-28. <strong>The</strong> Second-Order System Magnitude <strong>and</strong> Phase Response:4z = .1Magnitude <strong>of</strong>Response32z = .31z = .5z = 5z = 2z = 1z = .7.5.125.2.5 1 2 3w/w 0log<strong>The</strong> Second-Order Magnitude ResponsePhaseAngle0-30-60-90-120z = 5-150z = .1z = .7z = 2-180If the second-order system possessed a damping factor that approacheszero in value, the flat frequency response range <strong>of</strong> the second-order sensor<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-55


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:can be determined by finding the frequency, at which the value <strong>of</strong> thetransfer function H(w) is equal to unity plus 5%, or numerically equalto 1.05 as follows:If z = 0 (theoretically), then equation (1-28) simplifies to:1.05 = 1/[1-w 2 /w 0 2 )yielding:w = .218 w oInstrument designers <strong>and</strong> salespersons alike have, for many years,stated that the undamped second-order sensor has a flat frequencyresponse range <strong>of</strong> up to 20% <strong>of</strong> the primary resonance frequency <strong>of</strong> thesensor without really knowing why this is so. <strong>The</strong> above relationshipshows that the undamped second-order system will provide a theoreticaloutput that is within 5% <strong>of</strong> the low-frequency sensitivity <strong>of</strong> the sensorat up to 21.8% <strong>of</strong> the resonance frequency. Although all sensorstructures will possess intrinsic structural damping to some extent, renderingthe 21.8% figure as a theoretical maximum, the industryacceptedflat response range <strong>of</strong> 20% <strong>of</strong> resonance is a reasonable usefulflat b<strong>and</strong>width.CHAPTER 1-56 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-10:Applications Note 1-10:Fluidic-, Gas-, <strong>and</strong> Structural-Damping <strong>of</strong> Second-OrderSensor StructuresThis discussion relates to the damping mechanisms used in accelerometer structuresto absorb energy that would otherwise result in over-response or ringing <strong>of</strong>the accelerometer at its natural frequency.Damping <strong>of</strong> an accelerometer structure is the provision <strong>of</strong> an energyabsorptionsystem. Just as the shock absorbers <strong>of</strong> the family automobilewill become warm when driving over a rough road surface, the mediumused to absorb energy from the accelerometerÕs seismic system will alsoheat. With reference to the discussion <strong>of</strong> the second-order mechanical system,the resistance to motion that the damping medium exerts upon theseismic system is a function <strong>of</strong> the velocity <strong>of</strong> the seismic mass <strong>and</strong>, in general,relatively large displacements <strong>of</strong> the seismic system are required toachieve significant damping factors. <strong>The</strong> piezoelectric accelerometers arenot normally damped due to the extreme stiffness <strong>of</strong> the seismic systemresulting in low total deflections relative to the cantilevered-beam accelerometerstructures. Three basic damping mechanisms are discussed as follows:Fluidic Viscous Damping:Fluidic damping is generally achieved by filling the internal cavity <strong>of</strong> theaccelerometer with a silicone oil fill fluid. <strong>The</strong> silicone oil absorbs energyfrom the seismic system by one <strong>of</strong> two mechanisms. <strong>The</strong> first mechanism<strong>of</strong> energy absorption involves the bulk displacement <strong>of</strong> the silicone oil fillfluid from side to side as the seismic system moves. This bulk displacement<strong>of</strong> oil results in a damping factor contribution that is related to thebulk viscosity <strong>of</strong> the oil. <strong>The</strong> second mechanism relates to the film viscosity<strong>of</strong> the oil. Seismic systems are generally provided with overrange-limitingstops to impede the motion <strong>of</strong> the seismic assembly. <strong>The</strong> presence <strong>of</strong><strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-57


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:the stops effectively forms a damping gap or squeeze film that alsocontributes to the damping factor that results as shown in Figure 1-29.FIGURE 1-29. Fluidic Damping:Beam<strong>Strain</strong> Gages MassAccelerationFoundationFilm Damping ContributionBulk DampingCurvilinear Motion <strong>of</strong> Seismic MassDamping Fluid<strong>The</strong> damping factor ultimately achieved is highly controllable by precisionmixing <strong>of</strong> the damping fluids, in some cases even while the sensoris being dynamically excited. Usually a known high-viscosity value issolvent-diluted down to the desired damping factor. Due to the highvariation in damping fluid viscosity with changing temperature, theresulting sensor will show a strong damping-factor dependency withrespect to temperature. Typically the second-order response willchange by +5dB/100 degrees F due to this damping factor variation.Another implication <strong>of</strong> the damping-factor variation with temperatureis that the input <strong>and</strong> output phase response becomes a strong function<strong>of</strong> temperature as well. Both effects are as shown in Figure 1-30.CHAPTER 1-58 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-10:FIGURE 1-30. Fluidic Damping, <strong>The</strong>rmal Effects:Magnitude <strong>of</strong>Response21.5.125DecreasingTemperaturez = 1z = .3z = .5z = .7Increasing Temperature.2 .5 1 2 3w/w 0<strong>The</strong> Second-Order Magnitude Response(Effect <strong>of</strong> Temperature on Fluidic Damping)logPhaseAngle0-30-60-90-120DecreasingTemperaturez = 5-150-180IncreasingTemperaturez = .1z = .7z = 2logIn fluid-damped systems, the presence <strong>of</strong> entrained air bubbles within theaccelerometer would cause large variations in damping factor as the bubblesmigrate around inside the accelerometer. <strong>The</strong> objective <strong>of</strong> fluidicdampingprocesses is to eliminate all internal air bubbles. <strong>The</strong>se devicesare normally vacuum-filled by immersing the device to be damped in a volume<strong>of</strong> silicone oil, pulling a vacuum over the oil <strong>and</strong> holding the vacuumuntil all <strong>of</strong> the air entrained within the device is removed <strong>and</strong> replaced bythe fill fluid. <strong>The</strong> vacuum-filling method also serves to effectively degas<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-59


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:the fill fluid. Gases dissolved within the fill fluid can result in cavitationunder certain operating conditions. <strong>The</strong> implication <strong>of</strong> having acompletely oil-filled rigidly-confined volume is that the oil, whenheated, will tend to exp<strong>and</strong>, but cannot. <strong>The</strong> internal pressure will risedramatically with increasing temperature producing large case strain,as shown in Figure 1-31.FIGURE 1-31. Fluidic Damping, <strong>The</strong>rmal Implications:Housing Distortion created by internal pressure risewith increasing temperature MassAcceleration FoundationSeals:Highly-Stressed atHigh TemperaureDamping Fluid<strong>The</strong> inclusion <strong>of</strong> an internal gas-filled expansion-absorbing bladder toaccommodate the fluid volumetric expansion is workable in the largeraccelerometer designs but is difficult to implement with the more miniaturizeddesigns. In completely fluid-filled designs, the pressure mayrise by as much as 2,000 psi per 100 degrees F. As a consequence, thisinternal pressure will act upon the available internal area producingforces that will stress the integrity <strong>of</strong> the sensor seals <strong>and</strong> will mechanicallystress the structure <strong>of</strong> the accelerometer. <strong>The</strong> loss <strong>of</strong> dampingfluid cannot be confirmed by visual inspection due to the small volume<strong>of</strong> fluid present internally <strong>and</strong> the high possibility <strong>of</strong> the fluid beingexternally sourced. To detect the loss <strong>of</strong> damping fluid, an initial fre-CHAPTER 1-60 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Magnitude<strong>of</strong>ResponseMagnitude<strong>of</strong>ResponseApplications Note 1-10:quency-sweep <strong>of</strong> the accelerometer is performed to establish the maximumresponse peak at a known <strong>and</strong> controlled temperature.FIGURE 1-32. Detection <strong>of</strong> Damping Fluid Leakage:Magnitude Response Plot Before<strong>The</strong>rmal Cyling1z = .7<strong>The</strong>rmalCycling1w/w 0logHot/ ColdIncreased Peak is evidence <strong>of</strong> leakage1z = .51logw/w 0Magnitude Response Plot After<strong>The</strong>rmal Cycling Showing Evidence<strong>of</strong> Damping Fluid Leakage<strong>The</strong> accelerometer is then thermally cycled several times from low to hightemperature <strong>and</strong> the frequency sweep is repeated. By comparing the initialfrequency sweep to the post thermal-cycling sweep, any increase in themaximum response peak is a direct indication <strong>of</strong> damping-fluid loss (Ref-<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-61


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:erence Figure 1-32). It is critically important that the pre- <strong>and</strong> post-thermalcycling sweeps be performed at close to the same laboratorytemperature due to the strong dependency <strong>of</strong> damping factor withrespect to temperature.Regardless <strong>of</strong> the type <strong>of</strong> damping used, the flat frequency responseb<strong>and</strong>width <strong>of</strong> the accelerometer will be greater in the damped case thanin the undamped. In the undamped case the frequency response will beflat, ± 5%, to approximately 20% <strong>of</strong> the resonant frequency. In the critically-dampedcase (z =.7), the accelerometer will be flat to as much as60% <strong>of</strong> the resonant frequency at one temperature as shown in Figure1-33.FIGURE 1-33. <strong>The</strong> Effect <strong>of</strong> Damping on the Second-Order SystemResponse:Critically-Damped:Flat (± 5%) to 60%<strong>of</strong> Resonant FrequencyMagnitude <strong>of</strong>Response432Undamped:Flat (±5%) to 20%<strong>of</strong> ResonantFrequencyz = .11.5z = .7.125.2 .5 1 2 3w/w 0<strong>The</strong> Second-Order Magnitude ResponselogIn flight test environments it is not uncommon for the flight test accelerometersto experience very different temperatures at different pointson the air-frame. Some accelerometers may be mounted out in a coldCHAPTER 1-62 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-10:wing tip <strong>and</strong> others mounted next to hot propulsion systems. This variationin temperature implies that the damping factor will vary from unit-to-unitwith the associated loss <strong>of</strong> phase data from channel to channel. It is for thisreason that the piezoelectric-based undamped accelerometer is most <strong>of</strong>tenused for this type <strong>of</strong> modal analysis. If damped accelerometers are mountedinto thermal controller <strong>and</strong> heater assemblies, the accelerometers can beprecisely phased from unit-to-unit.Just as an automotive shock absorber will become warm when absorbingenergy, the damping fluid will also heat in measurement environments thatcontinuously present repetitive high-level inputs. <strong>The</strong> mechanical energyabsorbed will be converted into heat in the damping fluid causing thedamping fluid viscosity to decrease, reducing the fluidÕs ability to absorbadditional energy. It has been observed in this type <strong>of</strong> measurement environmentthat the damping factors can be reduced to such a low level thatthe accelerometer is <strong>of</strong>ten over-ranged after having operated successfullyfor several minutes under high-level input conditions.Gas damping:Gas damping is used to achieve the same end result as fluidic damping buttends to be much less sensitive to temperature variations. Gas damping isachieved by pre-charging the interior <strong>of</strong> the accelerometer with a dry puregas to a predetermined pressure. <strong>The</strong> technique <strong>of</strong> gas damping is most<strong>of</strong>ten used with the micro-machined silicon piezoresistive accelerometer.<strong>The</strong> relatively-low density <strong>of</strong> the silicon seismic mass results in a largeseismic-massarea in order to achieve significant damping factors. Gasdamping is achieved by forming the accelerometer structure such that precisiongaps <strong>and</strong> orifices are formed between the moving seismic element<strong>and</strong> the outer housing <strong>of</strong> the device. <strong>The</strong> motion <strong>of</strong> the seismic elementcombined with the precision-damping gaps <strong>and</strong> orifices result in the gasbeing squeezed into a film as shown in Figure 1-34.<strong>The</strong> internal pressure will increase as temperature is increased but not tothe extent found in the fluid-damped versions. Although the internal pres-<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-63


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:sure will increase by the ratio <strong>of</strong> P 1 /T 1 = P 2 /T 2 , assuming that the internalvolume is fixed, the gas density remains largely unchanged. <strong>The</strong>relatively small changes in gas density with temperature change contributeto the small changes observed in damping factor with respect totemperature. <strong>The</strong> damping factor is predetermined to a large extent bythe dimensions <strong>of</strong> the gap between the seismic assembly <strong>and</strong> the outerhousing <strong>and</strong> is, therefore, a strong function <strong>of</strong> the fabrication tolerances<strong>and</strong> is not easily modified as in the case <strong>of</strong> the fluid-damped devices.FIGURE 1-34. Gas Damping (Micro-machined Silicon):Piezo resistors (8)Bonding PadsSilicon Cap / Acceleration StopSilicon Seismic MassSilicon Base /Acceleration StopMallory BondsTop view <strong>of</strong> Seismic Element:Gaseous DampingPiezo ResistorsSeismic MassTabsCHAPTER 1-64 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-10:Structural or Solid Damping:It has been established that cyclically-stressed materials dissipate energywithin the material itself. This is the reason that the response <strong>of</strong> a cantileverbeam accelerometer or piezoelectric accelerometer is not infinite at the resonancefrequency due to the internal damping <strong>of</strong> the beam material itself.It has also been found that most structural materials such as steel <strong>and</strong> aluminumwill dissipate energy per stress cycle that is predominantly independent<strong>of</strong> frequency <strong>and</strong> is proportional to the square <strong>of</strong> the amplitude <strong>of</strong>vibration. With the energy dissipated per cycle proportional to the square <strong>of</strong>the vibration amplitude, the loss coefficient is constant <strong>and</strong> the shape <strong>of</strong> thehysteresis curve remains independent <strong>of</strong> amplitude <strong>and</strong> strain rate. In concertwith the intrinsic structural damping afforded by the materials thatcomprise the sensor structure, external or extrinsic materials can be used t<strong>of</strong>urther aid in the structural damping <strong>of</strong> the sensor.FIGURE 1-35. Structural-Damping Model:AccelerationAccelerometerFoundationDamping MaterialKRFoundationSolid materials used for structural damping are generally mounted underthe accelerometer structure as shown in Figure 1-35 <strong>and</strong> therefore presentan additional spring <strong>and</strong> damper suspension which must be considered inthe determination <strong>of</strong> the total transfer function <strong>of</strong> the accelerometer. Soliddamping is not generally useful at low frequencies but can be <strong>of</strong> use in theexplosives <strong>and</strong> ordinance testing fields to mitigate the high-frequency componentsthat are induced in explosively-driven structures such as armorplating. It should be realized that structural damping is a form <strong>of</strong> frequency<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-65


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:filtering. It is <strong>of</strong>ten used for this purpose although great care must betaken in assessing the effects that the structural-damping materials mayhave on the frequency- <strong>and</strong> phase-response <strong>of</strong> the sensor.Applications Note 1-11:<strong>The</strong> <strong>Strain</strong>-Gaged Cantilevered Beam<strong>The</strong> cantilevered beam is a fundamentally-simple mechanical structure asshown in Figures 1-36 <strong>and</strong> 1-37. Figure1-36 shows the metal-beam accelerometerstructure <strong>and</strong> Figure 1-37 shows the all-silicon design configuration.FIGURE 1-36. Cantilevered-Beam Accelerometer (Steel-Spring Member):<strong>Strain</strong> GagesAccelerationClampBeamMass<strong>The</strong> Cantilever-Beam Accelerometer (Steel Beam)Center <strong>of</strong> Seismic MassCurvilinear Motion <strong>of</strong> Seismic MassDamping FluidIn the case <strong>of</strong> the silicon design, location <strong>of</strong> the strain gages as far as possiblefrom the bending axis <strong>of</strong> the beam results in significant strain multiplicationCHAPTER 1-66 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-11:<strong>and</strong> correspondingly high output sensitivities at low beam deflections. <strong>The</strong> highoutput,all-silicon designs are not typically damped as the low beam deflections donot appreciably displace a damping medium. <strong>The</strong> cantilevered beam, in general, isa high-strain low-force structure where the strain developed at the surface <strong>of</strong> thebeam is inversely proportional to the square <strong>of</strong> the beam thickness <strong>and</strong> is directlyproportional to the beam length. <strong>The</strong> strain developed in the beam surface is alsoinversely proportional to the beam width <strong>and</strong> the beam stiffness (YoungÕs Modulus).Most <strong>of</strong> the beam length serves only to generate moment loads at the straingage locations while significantly adding mass <strong>and</strong> contributing to beam deflection.<strong>The</strong> highest moments exist at the clamp, but continuously <strong>and</strong> linearly varyalong the entire length <strong>of</strong> the constant cross-section simple beam. Modified beamsections can be used to linearize the strain field at the strain gage locations butsuch modifications will contribute significantly to the cost <strong>of</strong> machining.FIGURE 1-37. Cantilevered-Beam Accelerometer (All-Silicon Discrete Gages):<strong>Strain</strong> GagesDisplacement from NeutralAxis Multiplies <strong>Strain</strong> at the<strong>Strain</strong> Gage Locations.ClampSeismicMass (Silicon)Acceleration-induced deflectionExtremely-high natural frequencydue to short effective beam lengths<strong>and</strong> small deflections due to strainmulitiplication.This style <strong>of</strong> accelerometer is notnormally damped due to theextremely-small mass deflections.<strong>The</strong> cantilevered beam allows strain-sensitive elements to be bonded to both surfaces<strong>of</strong> the beam where the strain elements will be exposed to equal <strong>and</strong> opposite<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-67


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:strains. This characteristic allows high-output fully-active strain bridges to beimplemented.Other mechanical considerations <strong>of</strong> the cantilevered beam, used for eitherforce or acceleration measurement, relate to the resonant frequency <strong>of</strong> suchstructures. <strong>The</strong> cantilevered beam, used in the fabrication <strong>of</strong> the strain-gagedaccelerometer, will be designed to minimize the beam length. <strong>The</strong> resonant frequency<strong>of</strong> the seismically-loaded beam, having negligible beam mass, is proportionalto the root <strong>of</strong> 1/L 3 . This means that the shorter beam lengths willyield much higher resonant frequencies than longer beam lengths. <strong>The</strong> piezoresistivestrain gages <strong>of</strong> the ÒUÓ type will provide minimum gage lengths thereforepermitting minimum beam lengths.<strong>The</strong> curvilinear motion <strong>of</strong> the loading point implies reduced perpendicularity atthe point <strong>of</strong> load application to the cantilevered beam at high acceleration inputlevels. Although small strains, on the order <strong>of</strong> 500 microstrain, are required bythe piezoresistive strain gage accelerometers, the curvilinear motion <strong>of</strong> the loadpoint will typically limit the nonlinearity performance <strong>of</strong> the device to between±.5 to ±1% <strong>of</strong> the full-rated output <strong>of</strong> the device. Additionally, the mechanicalstiffness <strong>and</strong> symmetry <strong>of</strong> the clamp structure will directly impact the symmetry<strong>of</strong> the strain field in positive- versus-negative bending <strong>of</strong> the beam. <strong>The</strong>integrally-machined clamp <strong>of</strong> Figure 1-36 will provide mechanical performancesuperior to that <strong>of</strong> the assembled clamp structure. <strong>The</strong> multi-componentclamp assemblies will contribute friction or hysteretic loss as well as assemblytolerances influencing the effective length dimension <strong>of</strong> the beam.CHAPTER 1-68 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-11:FIGURE 1-38. Integral versus Assembled Clamp Structures:Integrally-MachinedClampAccelerationAssembledClampStructureMechanical FrictionDeteriorates HysteresisPerformanceWith reference to Figure 1-37, the location <strong>of</strong> the strain-sensitive elements oneither side <strong>of</strong> the transverse neutral axis will result in low differential strains due totransverse bending <strong>of</strong> the beam, thereby minimizing the transverse sensitivity <strong>of</strong>the beam to transverse inputs. Additionally, the transverse strains that are inducedtend to be self-canceling with proper bridge wiring.<strong>The</strong>rmal Considerations:Mass MassIf the beam thickness is thin, the thermal tracking from strain gage to straingage is good. When the beam is exceptionally thin, the axial thermalimpedance <strong>of</strong> the beam is high <strong>and</strong> a mutual self-heating phenomenon canoccur. <strong>The</strong> operating heat shed by one strain gage will heat the adjacent <strong>and</strong>opposite strain gages, contributing to potential thermal instability. In thecase <strong>of</strong> the fluidically-damped cantilevered-beam accelerometers, thedamping fluid <strong>of</strong>fers a well-coupled <strong>and</strong> low-thermal-impedance heat-sinkthat reduces self-heating. <strong>The</strong> self-heating phenomenon, shown in very thinbeam sections, most <strong>of</strong>ten occurs in piezoresistive strain-gage installations.<strong>The</strong> high operating power density <strong>and</strong> high thermal coefficients <strong>of</strong> gageresistance (TCR) tend to exacerbate the condition.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-69


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Beam Stress <strong>and</strong> <strong>Strain</strong> Relationships:With reference to Figure 1-39, a beam length <strong>of</strong> L to the strain gagelocations, having a width <strong>of</strong> d, thickness <strong>of</strong> b <strong>and</strong> where the load W isapplied at distance <strong>of</strong> L-a inches from the end <strong>of</strong> the beam, the maximumstress s is given as:s=Mb-------2I(EQ 1-32)Where M = MomentAnd where I = <strong>The</strong> Polar Moment <strong>of</strong> Inertia=b 3 d--------12(EQ 1-33)Substituting the Polar Moment <strong>of</strong> Inertia, I <strong>of</strong> (1-33) into (1-32) yields:s=6M--------b 2 d(EQ 1-34)And since e = s/E (where E = YoungÕs Modulus)<strong>and</strong> M = -W(L-a), therefore:6W( L Ð a)e = -------------------------Eb 2 d(EQ 1-35)<strong>The</strong> above calculations are valid for straight uniform-section beamsshowing small deflections where the width-to-thickness ratio is nominallybetween 8 <strong>and</strong> 15. <strong>The</strong> calculations given should be used asapproximations where the actual strains are determined by test 1 .1. Ref: Roarke, Warren Young, P100 case 1a.CHAPTER 1-70 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-11:FIGURE 1-39. Cantilevered-Beam Variable Definitions:LW = MaBeam Thickness (b)Acceleration MassLL-aaCenter <strong>of</strong> SeismicMass[Beam Width (d)]Beam Resonant Frequency Calculations:In the case where the beam mass is insignificant or is a small fraction <strong>of</strong> the seismicloading mass, the resonant frequency <strong>of</strong> the beam is given by:1.732F n = ------------2pEb 3 dg-------------------12WL 3(EQ 1-36)Where: F n = Hertz<strong>and</strong> where L refers to the total beam length from the point <strong>of</strong> the load applicationto the clamp.Additionally a simple correction for the strain-gage backing <strong>and</strong> bond-line thickness(t) is made as follows: (Reference Figure 1-40)<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-71


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:eæb 2 -- + t öè øe i = -------------------b--2(EQ 1-37)Where: e i = <strong>The</strong> indicated strain which will be greater than the beam surfacestrain.<strong>The</strong> above correction is <strong>of</strong> particular importance when thin beams are beingconsidered.FIGURE 1-40. Adhesive Thickness <strong>Strain</strong> Correction:b / 2b / 2<strong>Strain</strong> Gage Backing /Adhesivee surfacee indicated (> e surface )Beam<strong>Strain</strong> GagesttApplications Note 1-12:Pressure References<strong>The</strong> diaphragm-based pressure sensor bends in proportion to the pressure differencethat exists across the diaphragm. <strong>The</strong> pressure that exists ÒinsideÓ thepressure sensor may be fixed at some known value or it may be variable, as inthe case <strong>of</strong> the differential pressure sensor. Several different types <strong>of</strong> pressurereferences are used <strong>and</strong> will be discussed in turn:CHAPTER 1-72 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-12:PSIA (Absolute Reference):<strong>The</strong> psia-referenced sensor may be created in one <strong>of</strong> two ways. <strong>The</strong> moststraightforward method is to create an internal high-quality vacuum <strong>and</strong> tothen seal the reference cavity hermetically by welding a fused glass-tometalÒheaderÓ lead-wire feed-through onto the back <strong>of</strong> the sensor. Normallysuch headers are electron-beam welded in place, which is convenientsince the weld process occurs in a vacuum environment. <strong>The</strong> end result isthe creation <strong>of</strong> a Òclose-to-zero psiaÓ internal reference volume where thediaphragm will be prestressed due to normal atmospheric pressure toapproximately 14.7 psia. An absolute-referenced pressure sensor that producesan output <strong>of</strong> 1mV/psia <strong>and</strong> having a range <strong>of</strong> 15 psia will show 14.7mV ± zero-bias level output while sitting on your desk. Reference Figure1-39.FIGURE 1-41. True Absolute Pressure:WeldedFused Glass-to-Metal HeaderOutput14.7 mV@ 1mV/psia14.7 PsiaVacuum reference (Approximately 0 Psia)0Pressure14.7 psia(Zeroed Sensor)<strong>The</strong> second method <strong>of</strong> creating a psia-referenced pressure sensor is commonlyemployed in the miniature sensor fabrication industry <strong>and</strong> is termedthe ÒElectrically-ReferencedÓ method. Figure 1-42. In the electrically-referencedmethod, the internal cavity <strong>of</strong> the sensor is simply sealed with noattempt made to create an internal vacuum environment. Since the sensoroutput is idealized as a Y = mx+ b linear line, the zero-bias level <strong>of</strong> the sensoris electrically <strong>of</strong>fset by means <strong>of</strong> the bridge-balance resistor to elevatethe output <strong>of</strong> the sensor to simulate the sea level output (nominally 14.7psia). Most miniature sensors are too small for the creation <strong>of</strong> a high-qual-<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-73


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:ity internal vacuum sealed by hermetic methods, with the exception <strong>of</strong>the Mallory bonded capsule. As a result, most miniature sensors arefabricated using various epoxy materials that would outgas <strong>and</strong> deterioratean internal vacuum, even if one were initially provided.FIGURE 1-42. <strong>The</strong> Electrically-Referenced Absolute Pressure Sensor:AppliedPressureSeal (usually epoxy)Lead wiresAtmospheric Pressure Sealed InsideOutput14.7 mV0@ 1mV/PsiaPressure14.7 Psia( 0 Psig)Sensor Zero BeforeTrimming<strong>The</strong> zero level <strong>of</strong> the Electrically-Referencedpressure sensor is trimmed in the positivedirection.<strong>The</strong> use <strong>of</strong> the electrically-referenced method implies that, if the sensoris pressure-cycled from a high vacuum to a greater than 14.7 psia pressure,the bending diaphragm will progress through the stress-strainÒinflection pointÓ where the membrane transitions from negative topositive bending. Due to the asymmetry <strong>of</strong> the flush-diaphragm supportingclamp structure, the sensitivity <strong>of</strong> the diaphragm can be mismatchedby as much as ± 3% between positive <strong>and</strong> negative bending.This characteristic will not create error provided that the sensor hasbeen calibrated from a close-to-zero psia pressure to the maximumrange <strong>of</strong> the device. Properly calibrated, the inflection error becomes anintegral component <strong>of</strong> the nonlinearity error <strong>of</strong> the sensor.Another consideration in the Òtrue-psiaÓ versus the Òelectrically-referencedÓissue is that if no pressure difference exists between the insidereference cavity <strong>of</strong> the sensor <strong>and</strong> the outside world, then no tendencyCHAPTER 1-74 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-12:for leakage exists either. If the transducer is destined for terrestrial use atsea level, the differences between the true-psia <strong>and</strong> electrically-referenceddevice become academic. If, on the other h<strong>and</strong>, one erroneously assumesthat all psia sensors are <strong>of</strong> the Òtrue-psiaÓ sealed type, <strong>and</strong> the device purchasedis actually electrically-referenced, in a high-vacuum space environmentthe internal reference cavity will eventually leak out to the vacuum <strong>of</strong>space <strong>and</strong> this would be perceived as zero drift.<strong>The</strong> classical argument against the use <strong>of</strong> the electrical reference method isthat the internal gas will exp<strong>and</strong> with increasing temperature, thus modifyingthe reference pressure. <strong>The</strong> statement is correct; the internal gas willthermally exp<strong>and</strong> with increasing temperature in accordance with the relationship:P 1 /T 1 = P 2 /T 2Where pressure P 1 <strong>and</strong> pressure P 2 occur at temperature T 1 <strong>and</strong> temperatureT 2 respectively.Provided that the sensor is sealed prior to the thermal compensation process,the internal gas expansion with increasing temperature becomes a neteffect combined with the TCR mismatch shown by the bridge <strong>and</strong> is compensatedout as a net effect during the process <strong>of</strong> thermal-zero compensation.<strong>The</strong> end result is that there exists no way <strong>of</strong> determining whether a deviceis electrically-referenced or true-psia-referenced from the output terminalpoint <strong>of</strong> view. However, the difference can become very apparent dependingupon the pressure existing at the sensor lead exit.PSIS (Sealed-Gage Reference):<strong>The</strong> sealed-gage reference pressure is identical to the electrically-referencedabsolute method described above where the internal cavity is sealedat one atmosphere (14.7 psia) <strong>and</strong> the sensor zero output is trimmed to providea nominal null-bias output at 14.7 psia. This method is basically iden-<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-75


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:tical to the electrically-referenced absolute method except that the zerooutput <strong>of</strong> the sensor is not artificially elevated. <strong>The</strong> same lead exit pressureconsiderations apply in the case <strong>of</strong> the psis device as apply in thepsia-electrically-referenced sensor. Reference Figure 1-43.FIGURE 1-43. <strong>The</strong> Sealed-Gage Reference:OutputAppliedPressureSeal (usually epoxy)Lead wiresAtmospheric Pressure Sealed Inside0mV-14.7 mV@ 1mV/Psis14.7 PsiaPressurePSIG (Gage Pressure):<strong>The</strong> internal cavity <strong>of</strong> the psig-referenced device is deliberately ventedto atmosphere. Bending <strong>of</strong> the sensor diaphragm will be in proportionto the difference in pressure between the measur<strong>and</strong> <strong>and</strong> the nominalatmospheric pressure present at the reference port. Reference Figure 1-42.FIGURE 1-44. <strong>The</strong> Gage Pressure Reference:Output@ 1 mV/PsigApplied PressureAtmospheric Pressure0 mV-14.7 mVPressureAtmospheric(Approximately 14.7 Psia)CHAPTER 1-76 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-12:PSID (Differential Pressure):<strong>The</strong> differential pressure sensor spring member bends in direct proportionto the difference in pressure applied across the spring member. ReferenceFigure 1-45. In some highly-symmetrical designs (ie: variable reluctance)the bending member can show high-symmetry <strong>of</strong> response in positive-versus-negativebending where either port <strong>of</strong> the sensor can be at a higherpressure than the other port. In other designs, particularly the flush-diaphragmtypes, the internal cavity <strong>of</strong> the device is generally defined as thelow pressure port. <strong>The</strong> low- or high-pressure ports may well have maximumline pressure (P line = (P 1 + P 2 )/2) tolerances due to strength <strong>and</strong> seallimitations. Generally, if positive bending only is to be supported, the sensorshould then be calibrated for positive bending. If positive <strong>and</strong> negativebending are to be supported, the sensor should then be bi-directional calibratedin each bending direction.Line Pressure:Differential pressure sensor specifications require the definition <strong>of</strong> severalpressures; P 1 , P 2 , P line <strong>and</strong> P ambient . In designs intended for high line pressureuse, where the housing <strong>of</strong> the sensor will be maintained at close toambient pressure, large pressure differences will exist between the inside<strong>of</strong> the sensor <strong>and</strong> external ambient pressure environment. In high line-pressureapplications, the high internal pressure acts not only across the springmember, but on all internal areas producing potentially large housingstrains. Since these strains will produce tensile stresses within the springmember, the differential pressure sensitivity <strong>of</strong> the sensor may be significantlyreduced at high line pressures. It should also be noted that high linepressures with the external case <strong>of</strong> the sensor maintained at ambient pressureusually implies that the lead wires exiting the sensor structure have anincreased tendency for leakage. To reduce line pressure effects <strong>and</strong> thepotential for lead exit leakage, high line pressure designs are sometimesconfigured so that the pressure surrounding the sensor is maintained ateither P 1 or P 2 rather than ambient pressure. When specifying the performance<strong>of</strong> high line pressure differential sensors be careful to specify the<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-77


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:maximum influence on differential pressure sensitivity at the highestexpected line pressure.FIGURE 1-45. <strong>The</strong> Differential Pressure Reference:OutputP 2 > P 1P 1 > P 2P 1 P 20 mVPressureP line = (P 1 + P 2 ) / 2Wet/Dry:Most differential pressure sensor designs are configured to tolerate ahostile or ÒwetÓ environment on one side <strong>of</strong> the spring member only. Inthese discussions, ÒwetÓ may refer to moisture-laden air, water in a liquidform, corrosive fluids or gases <strong>and</strong> just about any other media thatthe sensor manufacturer specifies as being compatible with the sensormaterials but not necessarily compatible with the inner workings <strong>of</strong> thesensor. <strong>The</strong> other side <strong>of</strong> the spring member may be exposed to P 2 ,however, this media must generally be a dry nonconducting <strong>and</strong> noncorrosivegas or fluid. Flush diaphragm strain-gaged differential pressuresensors are <strong>of</strong>ten wet/dry rated. In special cases, wet/dry designscan be vacuum-filled with silicone oil where the oil is retained bymeniscus forces effectively isolating the sensitive internal strain gagesfrom moisture exposure. Internal coatings are <strong>of</strong>ten used to desensitizethe internal circuitry to short term moist air exposure but rarely arecoatings a good long term solution.CHAPTER 1-78 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-12:Wet/Wet:Wet/wet differential pressure sensor designs are usually configured withthin flexible metal isolation diaphragms, ref Figure 1-48, used with anessentially incompressible silicone oil fill to communicate both P 1 <strong>and</strong> P 2to the spring member. Wet/wet differential pressure sensors are sometimesreferred to as Òhostile/hostileÓ designs <strong>and</strong> tend to be more costly thanother differential designs.Dry/Dry:Dry/Dry differential pressure sensor designs are the least expensive differentialdesigns available <strong>and</strong> will tolerate only dry nonconducting <strong>and</strong> noncorrosivefluid or gas exposure on either side <strong>of</strong> the sensor spring member.Often coatings are used to render these designs tolerant <strong>of</strong> short term exposureto moisture or condensate accounting for the popularity <strong>of</strong> this designfor heating, ventilating <strong>and</strong> air conditioning (HVAC) use.High Side:ÒHigh-side onlyÓ differential pressure sensors are designed such that one <strong>of</strong>the two pressure ports must always be maintained at a pressure that isgreater than the other port. Generally, the internal geometry <strong>of</strong> such designsis such that the spring member is well-supported for bending in one direction<strong>and</strong> poorly supported for bending in the other direction. In some cases,the sensor manufacturer will specify that the low side may be some smallpercentage <strong>of</strong> rated pressure greater than the high side. Generally, if a highside only design is subjected to full pressure reversals or the ports are confusedon installation, irreparable damage results.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-79


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Applications Note 1-13:<strong>The</strong> Diaphragm <strong>Strain</strong>-Gaged Pressure Sensor<strong>The</strong> general reference to the strain-gaged diaphragm pressure sensor refers toany sensor where the strain gages are directly bonded to, or are an intrinsic part<strong>of</strong> the diaphragm spring member <strong>of</strong> the sensor, <strong>and</strong> where pressure-inducedbending <strong>of</strong> the diaphragm produces strains within the diaphragm to which thestrain gages respond producing output. <strong>The</strong> bending diaphragm sensor structurepossesses zones <strong>of</strong> both tension <strong>and</strong> compression strains that are straingagedto produce the sensor output. <strong>The</strong> derivation <strong>of</strong> both radial <strong>and</strong> tangentialstrain components for the flat, circular, uniform-thickness, <strong>and</strong> fixedperimeterdiaphragm are provided.General Discussion:Recessed DiaphragmsFIGURE 1-46. <strong>The</strong> Recessed Diaphragm:Diaphragm strain-gaged pressure sensors fall into two general categories.<strong>The</strong> first is the recessed-diaphragm design shown as Figure 1-46,where the sensing diaphragm is recessed within the mounting port <strong>of</strong>CHAPTER 1-80 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-13:the sensor. <strong>The</strong> significant dead volume produced by recessing <strong>of</strong> the sensordiaphragm severely limits the frequency response <strong>of</strong> such a sensor. <strong>The</strong>cavity over the diaphragm will act as a Helmholtz cavity or pneumatic filter,attenuating dynamic pressure inputs significantly. <strong>The</strong> recessed-diaphragmdesign provides superior mechanical protection <strong>of</strong> the sensingdiaphragm <strong>and</strong> generally superior zero stability as the cavity will also addsignificant thermal mass to the sensor, rendering the design less sensitive tothermal-transient inputs. <strong>The</strong> added structural mass <strong>of</strong> this design also providesexcellent spring member support with the diaphragm removed fromthe generally high stresses found in threaded-mounting configurations. Inmeasurement environments where compacting particles could be present,the recessed-diaphragm design may not be the most suitable, as compaction<strong>of</strong> particles over the sensor diaphragm (Figure 1-47) will reduce thesensitivity <strong>of</strong> the sensor significantly. In cleaning <strong>of</strong> the pressure port <strong>and</strong>diaphragm, only fluid cleaning solvents <strong>and</strong> solutions compatible with thewetted materials <strong>of</strong> the sensor should be used. <strong>The</strong> use <strong>of</strong> any mechanicalcleaning tools will undoubtedly result in damage to the sensor.FIGURE 1-47. Particulate Compaction (Recessed-Diaphragm):Compacted ParticlesParticulate-Laden FlowMany other variations <strong>of</strong> the recessed diaphragm design are commonlyavailable with many process-type designs being <strong>of</strong> the filled variety wherethe active sensor is isolated from the measur<strong>and</strong> (medium) by a flexible<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-81


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:fluid-filled bellows arrangement on one or both sides <strong>of</strong> the bendingdiaphragm as shown in Figure 1-48. In biomedical uses, the low-costdiffused semiconductor sensors are isolated from the medium by usingsilicone-gel materials that provide medium isolation by occupying thevolume that the moisture-laden media would otherwise occupy. Thisisolation method is sometimes referred to as isolation by the exclusionmethod <strong>and</strong> is depicted in Figure 1-49.FIGURE 1-48. Medium-Isolated, Filled Sensor Designs:LowPressureHighPressurePressure-SensingDiaphragm ModuleHeader AssemblyFill Fluid(Usually Silicon Oil)LeadwiresMedium-Isolating Diaphragms(Very Flexible)CHAPTER 1-82 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-13:FIGURE 1-49. Medium Isolation By ÒExclusionÓ:Silicone Gel FillSensorFlush Diaphragms:<strong>The</strong> second common type <strong>of</strong> strain-gaged diaphragm pressure sensor (Figure1-50) is the flush-diaphragm design where the sensing diaphragm isflush with the end <strong>of</strong> the sensor, eliminating all dead-volume cavities. <strong>The</strong>advantage <strong>of</strong> this style <strong>of</strong> sensor is that the elimination <strong>of</strong> the Helmholtzcavity over the sensor diaphragm allows much-improved frequencyresponses to be realized. <strong>The</strong> minimum mass <strong>of</strong> the flush-diaphragm sensorresults in high insensitivity to vibration <strong>and</strong> shock inputs. Since the sensitivemember is exposed, with no mechanical protection, care in h<strong>and</strong>lingmust be exercised. <strong>The</strong> asymmetry <strong>of</strong> the structural diaphragm clamp <strong>and</strong>minimized excess structural material results in a sensor design that willshow different sensitivities for pressure-induced bending in the two bendingdirections. In the case <strong>of</strong> the differential sensor, it is highly recommendedthat the device be calibrated in both pressure directions assensitivity mismatches <strong>of</strong> as much as 3% are common in asymmetricallysupportedsensor structures such as the flush-diaphragm designs as shownin Figure 1-51.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-83


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:FIGURE 1-50. Flush-Diaphragm Discrete-Bonded <strong>and</strong> Diffused Gages:Media<strong>Strain</strong> GagesFlush Diaphragm (Discrete-Bonded Gages)Flush Diaphragm (Diffused Gages) Leads Diffused Silicon DieDiaphragm Support Structure<strong>The</strong> direct exposure <strong>of</strong> the diaphragm to the measur<strong>and</strong> results inincreased thermal-transient sensitivities as the heat-dissipating straingages are thermally well-coupled to the measur<strong>and</strong>. <strong>The</strong> high heat densities<strong>of</strong> the miniaturized discrete-bonded piezoresistive strain gagedevices results in the warming <strong>of</strong> the measur<strong>and</strong> that is in direct contactwith the device in no-flow situations. When flow commences, thiswarmed layer is swept away <strong>and</strong> replaced with cooler medium, introducingsignificant thermal shock, particularly in the low-pressure <strong>and</strong>therefore thin-diaphragm designs. <strong>The</strong> different coefficients <strong>of</strong> heatconduction between the sensor <strong>and</strong> the measur<strong>and</strong>, in the no-flow versusflow conditions, can cause deteriorated static data quality. In casessuch as this, the use <strong>of</strong> an essentially incompressible thermal barriermaterial, such as vacuum-degassed room-temperature-vulcanized rubber(RTV) or grease, will reach thermal equilibrium (equilibrate) withthe sensor diaphragm, reducing the thermal transient sensitivity <strong>of</strong> thesensor significantly (Figure 1-52). <strong>The</strong> vacuum-degassing <strong>of</strong> suchmaterials is essential in the removal <strong>of</strong> entrained gas bubbles that willCHAPTER 1-84 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-13:result in performance degradation due to the compressibility <strong>of</strong> theentrained gas within the pressure-communicating medium.FIGURE 1-51. Asymmetric Output Response:Outputm 1 m 2P ref > P measur<strong>and</strong>m 1P measur<strong>and</strong>m 2P measur<strong>and</strong> > P refP refFIGURE 1-52. Reduction <strong>of</strong> <strong>The</strong>rmal Transient Sensitivity:Vacuum-Degassed <strong>The</strong>rmal-Mitigating LayerMeasur<strong>and</strong> Diffused Silicon Diaphragms, Recessed <strong>and</strong> Flush Styles:Diffused silicon sensors are defined as single-crystal silicon structures intowhich piezoresistive strain gage elements are directly diffused as an integralpart <strong>of</strong> the spring member or diaphragm. Since the strain gages are anintegral part <strong>of</strong> the diaphragm, no strain gage bonding adhesive is presentor required. <strong>The</strong> diffused silicon piezoresistive sensor class are commonlyavailable in both the recessed- <strong>and</strong> flush-diaphragm styles. Silicon diaphragmsare commonly available in flat-plate <strong>and</strong> cup-diaphragm designs.<strong>The</strong> flat-plate design is as shown in Figure 1-50. <strong>The</strong> cup-diaphragmdevice <strong>of</strong> Figure 1-53 results in a superior mechanical clamp system where<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-85


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:the bending diaphragm is well-supported <strong>and</strong> no mechanical joints ordissimilar materials are present.FIGURE 1-53. <strong>The</strong> Cup Diaphragm Structure:Diffusion ZonesLeadsSilicon Substructure(N-Type typically)<strong>The</strong> silicon clamp <strong>and</strong> diaphragm must ultimately be sealed to an outerhousing, or made into a free-floating <strong>and</strong> hermetically-sealed pressurecapsule, to ensure that the internal pressure reference is maintained(Figure 1-54). <strong>The</strong> joining method commonly used to bond the sealingplate to the cup-diaphragm structure is known as the Mallory bond <strong>and</strong>is performed at elevated temperature by applying a high voltagebetween the two highly-polished surfaces. <strong>The</strong> electrostatic forces thatresult, due to the applied voltage potential between the two parts, producea high-quality nuclear-level seal between the two parts. Since thestrain gages are a diffused, <strong>and</strong> integral component <strong>of</strong> the bending diaphragmwith no adhesive bonding material required, the cup structure<strong>of</strong>fers a stable <strong>and</strong> low-hysteresis sensor design.FIGURE 1-54. <strong>The</strong> Cup-Diaphragm Mallory-Sealed Capsule:Diffusion ZonesLeadsP refMallory BondCHAPTER 1-86 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-13:<strong>The</strong> cup-diaphragm <strong>and</strong> capsule designs result in the active strain gagesgenerally being exposed to the pressure medium with the exception <strong>of</strong> thenew Sensonor isolated cup design. In water-laden environments or in thecase <strong>of</strong> blood pressure measurement, the silicon elements are either coatedwith parylene C or isolated from the medium by the principle <strong>of</strong> exclusionusing a silicone gel isolating material <strong>of</strong> Figure 1-49.<strong>The</strong> highly-miniaturized piezoresistive flush-membrane designs (Figure 1-50) provide extremely wide- <strong>and</strong> flat-frequency (± 5%) response ranges inexcess <strong>of</strong> 400 Kilohertz in higher pressure ranges. <strong>The</strong> combination <strong>of</strong> ahigh-stiffness, small-diameter, low-mass diaphragm <strong>and</strong> low operatingstrain requirements (due to the high gage factor shown by the piezoresistivestrain gage) all contribute to this extremely high-frequency capability.<strong>The</strong> small physical size <strong>of</strong> the diffused piezoresistive strain gage allows thefabrication <strong>of</strong> sensors as small as .030Ó in diameter, <strong>and</strong> the low mass <strong>of</strong> thediaphragm yields an exceptionally shock-tolerant sensor. It is not uncommonfor this style <strong>of</strong> sensor to survive exposure to 30,000-gravity (g) shockinputs.Diaphragm <strong>Strain</strong>s:<strong>The</strong> following relationships may be used to approximate the induced strain in apressure-loaded membrane that is peripherally fixed <strong>and</strong> subject to the followingassumptions:¥ Uniform diaphragm thickness¥ <strong>The</strong> material is homogeneous <strong>and</strong> isotropic¥ InÞnitely-rigid perimeter clamp (For highest performance, the side-wall thickness is at least 10times the plate thickness)¥ Small, perfectly-elastic deßections <strong>of</strong> not greater than 30% <strong>of</strong> the diaphragm thickness.¥ No diaphragm stiffening contribution due to the presence <strong>of</strong> the strain gages.¥ <strong>The</strong> diaphragm thickness is less than 20% <strong>of</strong> the diaphragm diameter.¥ <strong>The</strong> diaphragm deßection is due to bending where no tensile forces exist in the median plane <strong>of</strong>the diaphragm.<strong>The</strong> quality <strong>of</strong> the above assumptions is <strong>of</strong>ten the reason for differences betweenthe computed <strong>and</strong> actual strains present. For example, the perimeter clamp will not<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-87


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:be infinitely rigid <strong>and</strong> side-wall bending will occur especially in the case <strong>of</strong>high-pressure sensor designs. For this reason, the calculations given are bestused as an initial estimation <strong>of</strong> the strains that will result for a given diaphragmthickness, diameter, <strong>and</strong> pressure loading.DeÞnitions: With reference to Figure 1-55.W = Total load in pounds forcew = Pounds per square inch (psi) where: W = wpa 2m = 1/n where n is PoissonÕs ratiot = Diaphragm thicknessE = YoungÕs Modulusa = Diaphragm radiusr = <strong>The</strong> distance from the diaphragm centere = s/E (strain)y c = Center <strong>of</strong> diaphragm deflection at maximum loadFIGURE 1-55. Variable Definitions for the Circular Flat Plate UnderUniform Pressure Loading:(W = total load in lbf)w psitrRadius aCLCHAPTER 1-88 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-13:Radial Stress:s r=3W æ--------------- ( 3m + 1) r2 ö---- Ð ( m + 1)8pmt 2 ç ÷èøa 2(EQ 1-38)Tangential Stress:s t=3W æ--------------- ( m + 3) r2 ö---- Ð ( m + 1)8pmt 2 çè a 2 ÷ø(EQ 1-39)At the center <strong>of</strong> the diaphragm: r = 0 <strong>and</strong> therefore:3W( m+1)s r = s t = Ð --------------------------èæ 8pmt 2 øö(EQ 1-40)<strong>The</strong> maximum deflection at the center <strong>of</strong> the diaphragm is given by:3wa 4 ( 1 Ð u 2 )y c = Ð--------------------------------( 16t 3 E)(EQ 1-41)<strong>The</strong> radial stress at the clamp occurs when r = a <strong>and</strong> is given by:3wa 2s ra = ------------4t 2(EQ 1-42)<strong>The</strong> tangential stress at the clamp also occurs when r = a <strong>and</strong> is given by:s t=3wa 2 uÐ----------------4t 2(EQ 1-43)By setting equation (1-38) to equal zero, the equation may be solved to find thevalue <strong>of</strong> r at which the radial stress is equal to zero with the result being:r = 0.63aWhen PoissonÔs Ratio = .3(EQ 1-44)<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-89


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:Similarly, setting equation (1-39) equal to zero, the equation may be solved t<strong>of</strong>ind the value <strong>of</strong> r at which the tangential stress is equal to zero with the resultbeing:r = 0.827aWhen PoissonÔs Ratio = .3(EQ 1-45)<strong>The</strong> radial <strong>and</strong> tangential stresses are shown graphically as Figure 1-54.FIGURE 1-56.Compression0r/ as rs t3wa 24t 23wa 2 n4t 2-3W(m+1)8p mt 2Tension1.001.0In the calculation <strong>of</strong> the first-order resonance frequency for the flat, circular,uniform section, plate 1 <strong>of</strong> thickness t, under uniformly-distributed loading conditions:¥ w = load per unit area including the intrinsic mass <strong>of</strong> the diaphragm.1. Roarke P716 case 10, 6th edition, Warren C. YoungCHAPTER 1-90 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999


Applications Note 1-13:¥ g = gravitational constant.¥ K 1 = Constant <strong>of</strong> 10.2 for the Þrst-order resonance (Higher-order resonances are given by constantsK 2 = 21.3, K 3 = 34.9 <strong>and</strong> K 4 = 39.8)¥ g = Plate density (Plate mass = pr 2 tg)K 1 Dgf n = ----- æ--------ö2pèwr 4 øWhere D =Et 3-------------------------12( 1 Ð u 2 )(EQ 1-46)Simplifies to:0.469t Egf n = -------------- æ----------------------ör 2 èg ( 1 Ð u 2 )ø(EQ 1-47)Other Considerations:1. As the diaphragm deflections become much larger than 30% <strong>of</strong> the diaphragm thickness, themedian-plane tensile stresses become dominant <strong>and</strong> diaphragm stretching will act to stiffen thediaphragm significantly. If nonlinearity performance <strong>of</strong> ±.2% is to be expected, the diaphragmmust not be deflected by more than 12% <strong>of</strong> the diaphragm thickness. If a nonlinearity performancelevel <strong>of</strong> 2% is acceptable, the diaphragm may deflect by as much as 30% <strong>of</strong> the diaphragmthickness. Additionally, with increasing diaphragm deflection <strong>and</strong> tensile loading, theinflection points on the diaphragm, for zero-radial <strong>and</strong> zero-tangential stress, will move outwardstoward the clamp, further deteriorating the nonlinearity performance <strong>of</strong> the sensor. Sincethe strain-gage class <strong>of</strong> sensors integrates the applied strain over a distance <strong>of</strong> the active diaphragm,the modification <strong>of</strong> the inflection points acts to distort the strain field that the straingages are positioned to measure.2. <strong>The</strong> ratio <strong>of</strong> the thickness-to-radius ratio <strong>of</strong> the diaphragm is an excellent indicator <strong>of</strong> diaphragmperformance. When this ratio is less than .15, the symmetrical bending theory,described, holds well. For values greater than .15, the loads normal to the plane <strong>of</strong> the diaphragm,<strong>and</strong> shear loads, must be taken into account. In the analysis <strong>of</strong> the performance <strong>of</strong> adiaphragm, both the deflection/diaphragm thickness ratio <strong>and</strong> the diaphragm thickness/radiusratio must be assessed for superior performance to result.<strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999 CHAPTER 1-91


<strong>Strain</strong>-<strong>Based</strong> Measurement Introduction:3. In cases where diaphragms are <strong>of</strong> the recessed design, pressure loading <strong>of</strong> the internal cavitycan produce distortion <strong>of</strong> the sensor housing, resulting in direct tensile loading in theplane <strong>of</strong> the sensor diaphragm which acts to desensitize the diaphragm to bending. Thiseffect is most <strong>of</strong>ten experienced in low-pressure-range differential pressure sensors thatmust support high-level line pressures.CHAPTER 1-92 <strong>The</strong> <strong>Art</strong> <strong>of</strong> <strong>Practical</strong> <strong>and</strong> <strong>Precise</strong> <strong>Strain</strong> <strong>Based</strong> Measurement 2nd Edition © 1999

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