c - IARIA Journals

More documents

Recommendations

Info

Daniela Dragomirescu, LAAS-CNRS / University of Toulouse, France Matthew Dunlop, Virginia Tech, USA Mohamed Eltoweissy, Pacific Northwest National Laboratory / Virginia Tech, USA Paulo Felisberto, LARSyS, University of Algarve, Portugal Miguel Franklin de Castro, Federal University of Ceará, Brazil Mounir Gaidi, Centre de Recherches et des Technologies de l'Energie (CRTEn), Tunisie Eva Gescheidtova, Brno University of Technology, Czech Republic Tejas R. Gandhi, Virtua Health-Marlton, USA Marco Genovese, Italian Metrological Institute (INRIM), Italy Teodor Ghetiu, University of York, UK Franca Giannini, IMATI - Consiglio Nazionale delle Ricerche - Genova, Italy Gonçalo Gomes, Nokia Siemens Networks, Portugal João V. Gomes, University of Beira Interior, Portugal Luis Gomes, Universidade Nova Lisboa, Portugal Antonio Luis Gomes Valente, University of Trás-os-Montes and Alto Douro, Portugal Diego Gonzalez Aguilera, University of Salamanca - Avila, Spain Genady Grabarnik,CUNY - New York, USA Craig Grimes, Nanjing University of Technology, PR China Stefanos Gritzalis, University of the Aegean, Greece Richard Gunstone, Bournemouth University, UK Jianlin Guo, Mitsubishi Electric Research Laboratories, USA Mohammad Hammoudeh, Manchester Metropolitan University, UK Petr Hanáček, Brno University of Technology, Czech Republic Go Hasegawa, Osaka University, Japan Henning Heuer, Fraunhofer Institut Zerstörungsfreie Prüfverfahren (FhG-IZFP-D), Germany Paloma R. Horche, Universidad Politécnica de Madrid, Spain Vincent Huang, Ericsson Research, Sweden Friedrich Hülsmann, Gottfried Wilhelm Leibniz Bibliothek - Hannover, Germany Travis Humble, Oak Ridge National Laboratory, USA Florentin Ipate, University of Pitesti, Romania Imad Jawhar, United Arab Emirates University, UAE Terje Jensen, Telenor Group Industrial Development, Norway Liudi Jiang, University of Southampton, UK Teemu Kanstrén, VTT Technical Research Centre of Finland, Finland Kenneth B. Kent, University of New Brunswick, Canada Fotis Kerasiotis, University of Patras, Greece Andrei Khrennikov, Linnaeus University, Sweden Alexander Klaus, Fraunhofer Institute for Experimental Software Engineering (IESE), Germany Andrew Kusiak, The University of Iowa, USA Vladimir Laukhin, Institució Catalana de Recerca i Estudis Avançats (ICREA) / Institut de Ciencia de Materials de Barcelona (ICMAB-CSIC), Spain Kevin Lee, Murdoch University, Australia Andreas Löf, University of Waikato, New Zealand Jerzy P. Lukaszewicz, Nicholas Copernicus University - Torun, Poland Zoubir Mammeri, IRIT - Paul Sabatier University - Toulouse, France Sathiamoorthy Manoharan, University of Auckland, New Zealand
Stefano Mariani, Politecnico di Milano, Italy Paulo Martins Pedro, Chaminade University, USA / Unicamp, Brazil Daisuke Mashima, Georgia Institute of Technology, USA Don McNickle, University of Canterbury, New Zealand Mahmoud Meribout, The Petroleum Institute - Abu Dhabi, UAE Luca Mesin, Politecnico di Torino, Italy Marco Mevius, HTWG Konstanz, Germany Marek Miskowicz, AGH University of Science and Technology, Poland Jean-Henry Morin, University of Geneva, Switzerland Fabrice Mourlin, Paris 12th University, France Adrian Muscat, University of Malta, Malta Mahmuda Naznin, Bangladesh University of Engineering and Technology, Bangladesh George Oikonomou, University of Bristol, UK Arnaldo S. R. Oliveira, Universidade de Aveiro-DETI / Instituto de Telecomunicações, Portugal Aida Omerovic, SINTEF ICT, Norway Victor Ovchinnikov, Aalto University, Finland Telhat Özdoğan, Recep Tayyip Erdogan University, Turkey Gurkan Ozhan, Middle East Technical University, Turkey Constantin Paleologu, University Politehnica of Bucharest, Romania Matteo G A Paris, Universita` degli Studi di Milano,Italy Vittorio M.N. Passaro, Politecnico di Bari, Italy Giuseppe Patanè, CNR-IMATI, Italy Marek Penhaker, VSB- Technical University of Ostrava, Czech Republic Juho Perälä, VTT Technical Research Centre of Finland, Finland Florian Pinel, T.J.Watson Research Center, IBM, USA Ana-Catalina Plesa, German Aerospace Center, Germany Miodrag Potkonjak, University of California - Los Angeles, USA Alessandro Pozzebon, University of Siena, Italy Vladimir Privman, Clarkson University, USA Konandur Rajanna, Indian Institute of Science, India Stefan Rass, Universität Klagenfurt, Austria Candid Reig, University of Valencia, Spain Teresa Restivo, University of Porto, Portugal Leon Reznik, Rochester Institute of Technology, USA Gerasimos Rigatos, Harper-Adams University College, UK Luis Roa Oppliger, Universidad de Concepción, Chile Ivan Rodero, Rutgers University - Piscataway, USA Lorenzo Rubio Arjona, Universitat Politècnica de València, Spain Claus-Peter Rückemann, Leibniz Universität Hannover / Westfälische Wilhelms-Universität Münster / North- German Supercomputing Alliance, Germany Subhash Saini, NASA, USA Mikko Sallinen, University of Oulu, Finland Christian Schanes, Vienna University of Technology, Austria Rainer Schönbein, Fraunhofer Institute of Optronics, System Technologies and Image Exploitation (IOSB), Germany Guodong Shao, National Institute of Standards and Technology (NIST), USA Dongwan Shin, New Mexico Tech, USA
Page 2 and 3: The International Journal on Advanc
Page 6 and 7: Larisa Shwartz, T.J. Watson Researc
Page 8 and 9: pages: 178 - 187 Visual Customer Be
Page 10 and 11: International Journal on Advances i
Page 54 and 55:
International Journal on Advances i
Page 56 and 57:
Page 58 and 59:
Page 60 and 61:
Page 62 and 63:
Page 64 and 65:
Page 66 and 67:
Page 68 and 69:
Page 70 and 71:
Page 72 and 73:
Page 74 and 75:
Page 76 and 77:
Page 78 and 79:
Page 80 and 81:
Page 82 and 83:
Page 84 and 85:
Page 86 and 87:
Page 88 and 89:
Page 90 and 91:
Page 92 and 93:
Page 94 and 95:
Page 96 and 97:
Page 98 and 99:
Page 100 and 101:
Page 102 and 103:
Page 104 and 105:
Page 106 and 107:
Page 108 and 109:
Page 110 and 111:
Page 112 and 113:
Page 114 and 115:
Page 116 and 117:
Page 118 and 119:
Page 120 and 121:
Page 122 and 123:
Page 124 and 125:
Page 126 and 127:
Page 128 and 129:
Page 130 and 131:
Page 132 and 133:
Page 134 and 135:
Page 136 and 137:
Page 138 and 139:
Page 140 and 141:
Page 142 and 143:
Page 144 and 145:
Page 146 and 147:
Page 148 and 149:
Page 150 and 151:
Page 152 and 153:
Page 154 and 155:
Page 156 and 157:
Page 158 and 159:
Page 160 and 161:
Page 162 and 163:
Page 164:
www.iariajournals.org International
show all

c - IARIA Journals

You also want an ePaper? Increase the reach of your titles

Delete template?

Save as template?