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Catalysis : an Integrated Approach to Homogeneous ...

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380 10 - CATALYST CHARACTERIZATION WITH SPECTROSCOPIC TECHNIQUES<br />

region of the sample by a collisional cascade. Some of the energy will return <strong>to</strong><br />

the surface <strong>an</strong>d stimulate the ejection (desorption) of a<strong>to</strong>ms, ions, <strong>an</strong>d multi<br />

a<strong>to</strong>mic clusters. In SIMS, positive or negative secondary ions are detected directly<br />

with a quadrupole mass spectrometer. In the more recently developed SNMS, the<br />

secondary neutrals are ionized, for example by electron impact ionisation, before<br />

they enter the mass spectrometer.<br />

Figure 10.11 shows the positive SIMS spectrum of a silica-supported zirco-<br />

nium oxide catalyst precursor, freshly prepared by a condensation reaction<br />

between zirconium ethoxide <strong>an</strong>d the hydroxyl groups of the support [21]. Note<br />

the simult<strong>an</strong>eous occurrence of single ions (H', Sit, Zr') <strong>an</strong>d molecular ions (SiO',<br />

SiOH', ZrO', ZrOH', Zr02+). Also the iso<strong>to</strong>pe pattern of zirconium is clearly<br />

visible. Iso<strong>to</strong>pes are import<strong>an</strong>t in the identification of peaks, because all peak<br />

intensity ratios must agree with the natural abund<strong>an</strong>ces. In addition <strong>to</strong> the peaks<br />

expected from zirconia on silica mounted on <strong>an</strong> indium foil, the spectrum of<br />

Figure 10.11a also contains peaks from Na', K', <strong>an</strong>d Ca'. This is typical for SIMS:<br />

sensitivities vary over several orders of magnitude <strong>an</strong>d elements such as the<br />

alkalis are already detected when present in trace amounts.<br />

SIMS is strictly speaking a destructive technique. In the dynamic mode, used<br />

for making concentration depth profiles, several tens of monolayers are removed<br />

per minute. In static SIMS, however, the rate of removal corresponds <strong>to</strong> one<br />

? -<br />

m -<br />

\<br />

n<br />

I<br />

Si<br />

t SIHS of zirconium ethoxide on Si02<br />

I<br />

\<br />

J - . --.<br />

a.m.u. +<br />

SiO SiOH Zr ZrO<br />

driad<br />

at 40 C<br />

c) -<br />

? -<br />

m . -.<br />

ZrO<br />

15.0 45.0 75.0 105.<br />

i35.<br />

Zr ZrO<br />

1<br />

I In<br />

calcined<br />

at 400 C<br />

. . . . --<br />

0 100. i10. 120. 130. 90.0 . 100. 110. 120. 130.<br />

0.m.u. + 8.m.u. +<br />

Fig. 10.11. Positive SIMS spectra of a ZrO2/SiOz catalyst, (A,B) after preparation from Zr(OCzH5)<br />

<strong>an</strong>d (C) after calcination in air at 775 K (from Meijers et al. [21]).

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