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Annual Report 2007 - The Australian Nanotechnology Network

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Ru-Low Mol. Wt. PMAS Ru-High Mol. Wt. PMAS<br />

Figure 1: FLIM images of Ru in thin films containing either LMWT PMAS (right) or HMWT PMAS<br />

(left).<br />

Intensity (A.U.)<br />

1800<br />

1600<br />

1400<br />

1200<br />

1000<br />

800<br />

600<br />

400<br />

200<br />

Composite τ 1 ns τ 2 ns<br />

[Ru(bpy) 2 (PVP) 10 ] 2+ [Ru(bpy) 2 (PVP) 10 ] 240 -<br />

2+ [Ru(bpy) 2 (PVP) 10 ] 240 -<br />

2+<br />

[Ru(bpy) 2 (PVP) 10 ] 2+ 240 -<br />

Ru-LMWT PMAS 220 36<br />

Ru-HMWT PMAS 190<br />

Ru-Nafion 210 22<br />

0<br />

8<br />

7.5<br />

7<br />

6.5<br />

6<br />

5.5<br />

5<br />

4.5<br />

4<br />

3.5<br />

0 20 40 60 80 100<br />

Time ns<br />

0 500 1000 1500 2000 2500<br />

Time (ns)<br />

Figure 2: FLIM images of RuLMWT PMAS and subsequent emission decay profiles and τ values for data<br />

collected from Figure 1.<br />

For the RuPMAS films, the FLIM images of both the HMWT and LMWT PMAS fractions were as<br />

expected, with the LMWT PMAS composite showing greater luminescence as shown below. Depth<br />

profiling of these films was also obtained with information on the different emission profiles of the<br />

ruthenium at different distances from the electron surface. This may offer insights for determining the<br />

optimal film thickness required for subsequent sensor applications or solar cell devices. In addition to this<br />

Ln(Intensity)<br />

47

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