Contacts for Flip Chip Wafer Level Probing - Semiconductor Wafer ...
Contacts for Flip Chip Wafer Level Probing - Semiconductor Wafer ...
Contacts for Flip Chip Wafer Level Probing - Semiconductor Wafer ...
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TQ: MtP vs. CVPC CRes Characterization<br />
22.5<br />
Multi-pt contact<br />
21.5<br />
20.5<br />
C-VPC<br />
Multi-pt<br />
Contact<br />
Stdev:<br />
0.12 ohms<br />
Median:<br />
22.14 ohms<br />
Stdev:<br />
0.43 ohms<br />
Median:<br />
20.64 ohms<br />
C-VPC<br />
Although the CVPC shows a lower CRes median, the CRes stability or STD is much<br />
tighter than the CVPC. The higher MtP value is attributed to the way CRes is<br />
measured, which is defined by the total path resistance of the MLC/PCB/HW.
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