Contacts for Flip Chip Wafer Level Probing - Semiconductor Wafer ...
Contacts for Flip Chip Wafer Level Probing - Semiconductor Wafer ...
Contacts for Flip Chip Wafer Level Probing - Semiconductor Wafer ...
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QUALIFICATION TEST FLOW: MtP vs. C-VPC<br />
Dallas Test Floor<br />
TEST FLOORS<br />
Production<br />
Test Floor<br />
MtP/FFI<br />
MtP<br />
TECH<br />
QUAL<br />
PASS<br />
MtP<br />
PROD<br />
QUAL<br />
IN<br />
PROCESS<br />
MtP<br />
RTP<br />
STEP 1 NO STEP 2<br />
NO<br />
C-VPC WST<br />
SET-UP<br />
C-VPC WST<br />
TI-BASELINE<br />
C-VPC<br />
RTP<br />
Comparative probe card analysis per<strong>for</strong>med in parallel to CVPC to<br />
minimize risk to production delivery, if MtP did not work.