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Contacts for Flip Chip Wafer Level Probing - Semiconductor Wafer ...

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QUALIFICATION TEST FLOW: MtP vs. C-VPC<br />

Dallas Test Floor<br />

TEST FLOORS<br />

Production<br />

Test Floor<br />

MtP/FFI<br />

MtP<br />

TECH<br />

QUAL<br />

PASS<br />

MtP<br />

PROD<br />

QUAL<br />

IN<br />

PROCESS<br />

MtP<br />

RTP<br />

STEP 1 NO STEP 2<br />

NO<br />

C-VPC WST<br />

SET-UP<br />

C-VPC WST<br />

TI-BASELINE<br />

C-VPC<br />

RTP<br />

Comparative probe card analysis per<strong>for</strong>med in parallel to CVPC to<br />

minimize risk to production delivery, if MtP did not work.

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