First Solar - JMP
First Solar - JMP
First Solar - JMP
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Copyright © 2007, SAS Institute Inc. All rights reserved.
Innovative Improvement Methods at <strong>First</strong> <strong>Solar</strong><br />
2
Contents<br />
Company Overview<br />
Technology & Manufacturing<br />
Products & Performance<br />
Market Strategy<br />
Environmental Responsibility<br />
My first success story using <strong>JMP</strong><br />
Six Sigma – What works for <strong>First</strong> <strong>Solar</strong><br />
<strong>First</strong> <strong>Solar</strong> tools used for reducing variation<br />
Summary<br />
MD-5-921 US October 2007 3
Company Overview<br />
4
Company Overview<br />
Strategic Objective<br />
Reduce the cost of solar electricity to a level competitive with<br />
conventional energy, enabling solar to become a sustainable<br />
mainstream source of energy<br />
Reduce the cost of solar<br />
modules using thin film<br />
technology and automated,<br />
scalable production<br />
Migrate from subsidized<br />
markets to non-subsidized<br />
markets by leveraging<br />
economies of scale – become<br />
“subsidy independent”<br />
Reduce dependence on scarce<br />
natural resources and curtail<br />
greenhouse gas emissions to<br />
improve our environment<br />
MD-5-921 US October 2007 5
Company Overview<br />
Key Accomplishments<br />
Formed in 1999 and launched<br />
production of first commercial<br />
products in 2002<br />
Raised $450 million in November<br />
2006 IPO. Publicly traded on<br />
NASDAQ (FSLR)<br />
Largest thin-film module<br />
manufacturer in the world<br />
Lowest cost PV manufacturer in<br />
the world<br />
<strong>First</strong> pre-funded module collection<br />
and recycling program in the<br />
PV industry<br />
<strong>First</strong> <strong>Solar</strong> Manufacturing Plant, Frankfurt (Oder), Germany<br />
MD-5-921 US October 2007 6
Company Overview<br />
Module Production Capacity<br />
Scaled first 25MW module production line in the U.S. to steady state<br />
volume in 2005, added two 25MW production lines in 2006<br />
Annual Nameplate Capacity = 90MW* May 2007<br />
2006<br />
Four 30MW* production lines (120MW) built in Frankfurt (Oder),<br />
Germany<br />
2005<br />
Annual Nameplate Capacity = 210MW by Q4 2007<br />
Four 30MW production lines (120 MW) under construction in Kedah,<br />
Malaysia with full production targeted by second half of 2008<br />
Annual Nameplate Capacity = 330MW by 2H 2008<br />
2007<br />
A second Four 30MW production lines (120 MW) announced for<br />
Kedah, Malaysia with full production targeted by first half of 2009<br />
Annual Nameplate Capacity = 450MW by 1H 2009<br />
A third Four 30MW production lines (120 MW) announced for Kedah,<br />
Malaysia with full production targeted by first half of 2009<br />
2008 - 2009<br />
Annual Nameplate Capacity = 570MW by 1H 2009<br />
* In May 2007 we increased the nameplate capacity from 25MW to 30MW per line<br />
MD-5-921 US October 2007 7
Company Overview<br />
Worldwide Associates > 1,150<br />
United States<br />
Phoenix, Arizona<br />
Perrysburg, Ohio<br />
Germany<br />
Mainz<br />
Berlin<br />
Frankfurt (Oder)<br />
Corporate Headquarters<br />
Operations, R&D and Manufacturing Headquarters<br />
Sales, Marketing, Customer Support (EU)<br />
Government & Public Affairs<br />
Manufacturing plant<br />
Europe<br />
Brussels<br />
Madrid<br />
Amsterdam<br />
Government & Public Affairs (EU)<br />
Sales<br />
Business Development<br />
Malaysia<br />
Kedah<br />
Three Manufacturing Plants<br />
(groundbreaking of first plant April 2007)<br />
MD-5-921 US October 2007 8
Technology & Manufacturing<br />
9
Technology & Manufacturing<br />
Fully Integrated, Automated and Continuous Thin Film Process<br />
Glass in<br />
~2.5 hours<br />
Semiconductor<br />
Deposition<br />
Final Assembly<br />
& Test<br />
Cell Definition<br />
Module out<br />
<br />
<br />
99% reduction in high-cost<br />
semiconductor material<br />
Fully integrated, continuous<br />
process vs. batch processing<br />
Large (2’x4’) substrate vs. 6”<br />
wafers<br />
vs. Crystalline Silicon Batch Processing<br />
Feedstock Ingot Wafer <strong>Solar</strong> Cell<br />
<strong>Solar</strong> Module<br />
MD-5-921 US October 2007 10
Technology & Manufacturing<br />
Intellectual Property<br />
<br />
Over 90 U.S. & foreign<br />
patents granted and<br />
pending<br />
Substantial trade secrets /<br />
know-how surrounding<br />
process, device design and<br />
product packaging<br />
<br />
<br />
Proprietary equipment<br />
designs<br />
Exclusive relationships with<br />
key vendors<br />
MD-5-921 US October 2007 11
Technology & Manufacturing<br />
Disciplined Replication Process<br />
Proven replication at Base Plant<br />
Continuous improvement<br />
methodologies<br />
570 MW<br />
120<br />
“Copy Smart”<br />
replication<br />
330 MW<br />
120<br />
210 MW<br />
120 120<br />
120 120 120<br />
75 MW<br />
50 60 60 60<br />
25 MW<br />
25 25 30 30 30<br />
2005 2006 2007 2008 2009<br />
Ohio Base Plant Ohio Expansion German Facility Malaysia 1 Malaysia 2 Malaysia 3<br />
MD-5-921 US October 2007 12
Products & Performance<br />
13
Products & Performance<br />
<strong>First</strong> <strong>Solar</strong> Series 2 Module Features<br />
Frameless glass-glass laminate (60 x 120 cm, 27 lbs) is<br />
durable and recyclable<br />
Power increments of 2.5W (5% rating tolerance) with power<br />
per module of up to 72W<br />
High energy yield in real operating conditions (PR>80%):<br />
• Low temperature coefficient (-0.25%/ o C)<br />
• Excellent low light response<br />
Robust against shading in landscape orientation (perpendicular<br />
to cells)<br />
Certified for reliability and safety according to IEC 61646 and<br />
SK II @ 1000V<br />
Manufacturing certified to ISO9001:2000 quality and<br />
ISO14001:2004 environmental standards<br />
25 year Power Output Warranty for 80% of nominal power<br />
subject to warranty terms & conditions<br />
Pre-financed collection & recycling program<br />
MD-5-921 US October 2007 14
Products & Performance<br />
Proven Record of Increasing Module Conversion Efficiencies<br />
500,000<br />
11.0%<br />
450,000<br />
400,000<br />
10.0%<br />
350,000<br />
9.0%<br />
300,000<br />
250,000<br />
8.0%<br />
200,000<br />
150,000<br />
7.0%<br />
100,000<br />
50,000<br />
6.0%<br />
0<br />
Q3'01 Q4'01 Q1'02 Q2'02 Q3'02 Q4'02 Q1'03 Q2'03 Q3'03 Q4'03 Q1'04 Q2'04 Q3'04 Q4'04 Q1'05 Q2'05 Q3'05 Q4'05 Q1'06 Q2'06 Q3'06 Q4'06 Q1'07 Q2'07<br />
5.0%<br />
MD-5-921 US October 2007 15
Products & Performance<br />
Proven Field Performance<br />
Documented and approved designs define the module mounting,<br />
electrical design, and the system energy yield expected in order to<br />
ensure that systems are designed to perform optimally<br />
<strong>First</strong> <strong>Solar</strong> monitors the performance of > 20MW of installed modules<br />
in a wide range of systems to ensure modules perform as designed<br />
Predicted Energy Ratio (PER%)<br />
(Error Bars =Standard Deviation)<br />
120%<br />
115%<br />
110%<br />
105%<br />
100%<br />
95%<br />
90%<br />
85%<br />
80%<br />
Month<br />
MW Monitored<br />
Monitored MW PER% Expectation<br />
MD-5-921 US October 2007 16
Products & Performance<br />
Tom Hansen, VP & Technical Advisor of Tucson Electric Power<br />
kWh/kWp<br />
2,500<br />
2,000<br />
1,500<br />
1,000<br />
Springerville Generation Station<br />
Specific Energy Yield<br />
<strong>First</strong><br />
<strong>Solar</strong><br />
X-Si<br />
A-Si<br />
“One of the more fascinating things<br />
we’ve found by evaluating the <strong>First</strong><br />
<strong>Solar</strong> modules at Springerville, is<br />
that they turn on earlier in the<br />
morning and they actually put more<br />
voltage out earlier than either the<br />
crystalline or amorphous silicon<br />
modules.”<br />
500<br />
1.2<br />
Relative Efficiency vs. Irradiance,<br />
CdS/CdTe Thin-film and Polycrystalline Si Systems<br />
0<br />
All data m easured by Tucson Electric Pow er - Springe rville Generation Station<br />
Measured w ith Revenue Grade Meter Equipm ent from Septem ber 2003 - October 2004<br />
“The other thing that is fascinating…, is that<br />
they produce more power from a lower light<br />
level than either crystalline or amorphous<br />
silicon modules. On cloudy days, we see 10%,<br />
sometimes as much as 12% more energy<br />
production from the thin film <strong>First</strong> <strong>Solar</strong><br />
modules than from the crystalline modules.”<br />
Relative Efficiency<br />
1.1<br />
1<br />
0.9<br />
0.8<br />
0.7<br />
0.6<br />
0.5<br />
FS thin-film CdS/CdTe System<br />
Polycrystalline Si System<br />
6th order fit to FS CdS/CdTe data<br />
6th order fit to polycrystalline Si data<br />
0 200 400 600 800 1000<br />
Irradiance in Plane-of-Array [W/m 2 ]<br />
MD-5-921 US October 2007 17
Market Strategy<br />
18
Market Strategy<br />
Target Applications<br />
Ground Mounted Systems<br />
• Typically Multi-MW<br />
Commercial Roof Mounted Systems<br />
• Typically 30kW to 1MW+<br />
MD-5-921 US October 2007 19
Market Strategy<br />
Geographic Markets<br />
Canada<br />
Greece<br />
Portugal<br />
US<br />
South<br />
Korea<br />
Spain<br />
France<br />
Italy<br />
Germany<br />
MD-5-921 US October 2007 20
Market Strategy<br />
Sales Channels<br />
<strong>First</strong> <strong>Solar</strong> sells modules to project developers and alternative energy<br />
power plant operators under multi-year framework agreements.<br />
Project Developers design and develop turnkey commercial grid<br />
connected solar power plants.<br />
MD-5-921 US October 2007 21
Environmental Responsibility<br />
22
Environmental Responsibility<br />
Our 3-Point Environmental Plan<br />
1<br />
Convert<br />
mining byproducts<br />
and waste to clean,<br />
renewable<br />
energy<br />
2<br />
Produce, use and<br />
renew solar modules<br />
in a perpetual,<br />
environmentally<br />
safe life cycle<br />
3<br />
Reduce<br />
toxic emissions by<br />
substituting solar<br />
energy for<br />
fossil fuels<br />
MD-5-921 US October 2007 23
Summary<br />
24
Summary<br />
<br />
<br />
<br />
<br />
<strong>First</strong> <strong>Solar</strong> has developed a<br />
breakthrough thin film module<br />
product and high volume<br />
production capability<br />
Continuous improvements and<br />
rapid scale-up of manufacturing<br />
capacity have resulted in the<br />
lowest production cost per watt in<br />
the PV industry<br />
An innovative pre-funded module<br />
collection and recycling program<br />
ensures products are life-cycle<br />
managed for optimal<br />
environmental benefits<br />
<strong>First</strong> <strong>Solar</strong> is enabling solar to<br />
become a sustainable, mainstream<br />
source of energy<br />
MD-5-921 US October 2007 25
Project Profiles<br />
Relative size of 6MW<br />
project in Rote Jahne<br />
40 MW<br />
Brandis, Germany<br />
Project Developer: juwi<br />
Under Construction<br />
8MW Commissioned/ 10MW Installed<br />
MD-5-921 US October 2007 26
Project Profiles<br />
1.25 MW<br />
Dimbach, Germany<br />
Project Developer: Blitzstrom<br />
6 MW<br />
Rote Jahne, Germany<br />
Project Developer: juwi<br />
MD-5-921 US October 2007 27
Project Profiles<br />
120 kW<br />
Meppen, Germany<br />
Project Developer: R+P Sun Energy<br />
1.4 MW<br />
Gescher, Germany<br />
Project Developer: R+P Sun Energy<br />
MD-5-921 US October 2007 28
Project Profiles<br />
1 MW<br />
Reussenköge, Germany<br />
Project Developer: Phoenix <strong>Solar</strong><br />
1.4 MW<br />
Deponie Sinzheim, Germany<br />
Project Developer: juwi<br />
MD-5-921 US October 2007 29
Six Sigma Strategies that work – for <strong>First</strong> <strong>Solar</strong><br />
Continuous Improvement is one of <strong>First</strong> <strong>Solar</strong>’s 5 core values<br />
30
5 Keys to Success<br />
Understand the needs of your company<br />
– For example, the need to drive costs, and the associated levers<br />
Customer Focus<br />
– Champions – Project Selection and tollgate reviews<br />
– Process Owners – enabling through mentorship<br />
Create a pull<br />
– Don’t push – create pull<br />
Deployment strategy<br />
– That fits the needs of your organization<br />
Provide the best tools available<br />
– <strong>JMP</strong> enables the practitioner with power, speed and<br />
visualization<br />
MD-5-921 US October 2007 31
Deployment Strategies<br />
Project Selection starts 2 months ahead of each cycle<br />
Training occurs in 17 weeks cycles – 3 times per year<br />
Weeks 1-5: Rapid Sigma – DMAIC Problem Solving Process<br />
Weeks 6-8: MSA<br />
Week 9: Project Selection/Champion training for next wave<br />
Weeks 9-12: ESDA<br />
Weeks 13-15: Robust DOE<br />
Weeks 16-17: SPC<br />
Other tips:<br />
Classes are 2 hours in length, 3X’s a week<br />
Use a “learn by doing” approach<br />
MD-5-921 US October 2007 32
My <strong>First</strong> Success Story using <strong>JMP</strong><br />
33
My <strong>First</strong> Success Story using <strong>JMP</strong><br />
Introduced to <strong>JMP</strong> in 1993 by Tom Little while at Read-Rite Corp in Milpitas CA<br />
Used <strong>JMP</strong> to visualize the interactions between OW, PW50, Amplitude and Resolution<br />
and their inter-relationships to Throat Height<br />
Throat Height, for an inductive write-read head, is one of the most critical design<br />
dimensions<br />
DEC RZ28L was “starved” for OW – Yields were 27% - breakeven yields 55%<br />
The common tribal knowledge suggested going short as possible<br />
After not more than 20 minutes of data analysis using <strong>JMP</strong> was able to establish that<br />
the TH was far too short (Multivariate tool with brushing)<br />
• But Kuhn Steve – we need more OW not less!<br />
• Get a refund from Cal Poly<br />
Yields with the longer TH were greater than 73%!<br />
Standardized the method for a non destructive Throat Height optimization<br />
Pradip Thyamballi improved the magnetic models to include the interactions with<br />
media and spacing<br />
<strong>JMP</strong> became the undisputed program of choice – extends to many engineers in S.E.<br />
Asia including Western Digital today<br />
MD-5-921 US October 2007 34
Reducing Variation<br />
Why place effort on reducing variation?<br />
Cost savings<br />
Improved experimental results<br />
Traditional approaches<br />
OFAT experimentation<br />
Main effects experiments<br />
Beat on Suppliers<br />
ANOVA<br />
<br />
<br />
Focused on mean shifts<br />
Mean shifts represent only 20% of the overall variation<br />
MD-5-921 US October 2007 35
Variation Reduction Tools used at <strong>First</strong> <strong>Solar</strong><br />
Partition of Variation (POV)<br />
Includes the between and within components of variation<br />
Robust Design<br />
Early work was based on Taguchi methods<br />
Ideal function thinking<br />
Noise Strategy<br />
Orthogonal Arrays<br />
Optimizing SNR of the main effects<br />
Today FS enhances that same philosophy with Response Surface Methodology<br />
Capture interactions and curvature effects<br />
Design to fit the problem as opposed to fixed arrays<br />
The real world is messy!<br />
Optimization using partial derivatives with respect to the noise factors<br />
Root Cause of BOB’s and WOW’s (Hi/Lo Analysis)<br />
MD-5-921 US October 2007 36
Partition of Variation<br />
POV script developed by Dr. Thomas Little<br />
www.dr-tom.com<br />
The POV script provides a Pareto of the variance components<br />
Between<br />
Within<br />
Interactions (for crossed)<br />
Our exploration with this tool has proven useful in providing<br />
direction of where to focus vital engineering resources<br />
The individual components are not claimed to be 100%<br />
accurate, however the Pareto has been consistent with our<br />
internal findings<br />
MD-5-921 US October 2007 37
FS Macro Process Map<br />
Laser ID<br />
Front end<br />
operations<br />
Edges<br />
finishing<br />
Cleaning<br />
Semiconductor<br />
deposit<br />
CdCl 2<br />
Spray<br />
Activation<br />
Sunnyside<br />
etch<br />
Laser<br />
Scribe 1<br />
Submodule<br />
operations<br />
Post Metal<br />
Heat Treat<br />
Automatic<br />
edge<br />
delete<br />
Laser<br />
Scribe 3<br />
Metallization<br />
Wet Etch<br />
Laser Scribe<br />
2<br />
Photoresist<br />
application<br />
Assembly<br />
operations<br />
Lamination<br />
Lay up<br />
Lamination Cordplate Final IV<br />
Module<br />
Detail<br />
Box and Ship<br />
MD-5-921 US October 2007 38
POV Example One<br />
Process Steps<br />
1-4<br />
Production Lines<br />
A<br />
The Design is Crossed, not balanced, 2^4<br />
or 16 levels<br />
Day to day operations are run with this<br />
constant mixing<br />
MD-5-921 US October 2007 39<br />
B<br />
1<br />
2<br />
3<br />
4<br />
Frequencies<br />
Level<br />
AAAA<br />
AAAB<br />
AABA<br />
AABB<br />
ABAA<br />
ABAB<br />
ABBA<br />
ABBB<br />
BAAA<br />
BAAB<br />
BABA<br />
BABB<br />
BBAA<br />
BBAB<br />
BBBA<br />
BBBB<br />
Total<br />
Count<br />
58<br />
120<br />
86<br />
71<br />
132<br />
181<br />
186<br />
134<br />
49<br />
108<br />
82<br />
66<br />
152<br />
183<br />
189<br />
122<br />
1919
The Variability Chart<br />
Y 1<br />
Std Dev<br />
11.0<br />
10.5<br />
10.0<br />
9.5<br />
0.20<br />
0.15<br />
0.10<br />
0.05<br />
0.00<br />
The power of<br />
visualization –<br />
all the data<br />
broken down<br />
on one page<br />
A B A B A B A B A B A B A B A B Process 4<br />
A B A B A B A B Process 3<br />
A B A B Process 2<br />
A B Process 1<br />
MD-5-921 US October 2007 40
Residual Maximum Likelihood Model<br />
REML - Variance Components<br />
Component<br />
Total<br />
Within<br />
Process 3*Process 4<br />
Process 1<br />
Process 1*Process 2<br />
Process 2*Process 3<br />
Process 3<br />
Process 1*Process 2*Process 3*Process 4<br />
Process 1*Process 3*Process 4<br />
Process 2*Process 4<br />
Process 1*Process 2*Process 3<br />
Process 2<br />
Process 1*Process 3<br />
Process 4<br />
Process 1*Process 4<br />
Process 1*Process 2*Process 4<br />
Process 2*Process 3*Process 4<br />
Var<br />
Component<br />
0.04098051<br />
0.03236716<br />
0.00469185<br />
0.00115908<br />
0.00093237<br />
0.00079189<br />
0.00047601<br />
0.00022384<br />
0.00017669<br />
0.00009557<br />
0.00004709<br />
0.00001897<br />
0.00000000<br />
0.00000000<br />
0.00000000<br />
0.00000000<br />
0.00000000<br />
% of Total 20 40 60 80<br />
100.0<br />
79.0<br />
11.4<br />
2.8<br />
2.3<br />
1.9<br />
1.2<br />
0.5462<br />
0.4312<br />
0.2332<br />
0.1149<br />
0.0463<br />
0.0<br />
0.0<br />
0.0<br />
0.0<br />
0.0<br />
~80% of the variation is “within”, but not characterized further<br />
MD-5-921 US October 2007 41
Variability Chart – Example One<br />
Y 1<br />
11.0<br />
10.5<br />
Visual pattern for between<br />
variation common to<br />
Process3*Process4<br />
Std Dev<br />
10.0<br />
9.5<br />
0.20<br />
0.15<br />
0.10<br />
0.05<br />
0.00<br />
A B A B A B A B A B A B A B A B Process 4<br />
A B A B A B A B Process 3<br />
A B A B Process 2<br />
A B Process 1<br />
POV contributes 17%<br />
of Overall Variation<br />
to Between<br />
Between top 3 Pareto<br />
Process 3 6.4%<br />
P3*P4 3.8%<br />
Process 4 1.8%<br />
MD-5-921 US October 2007 42
Variability Chart – Example One<br />
Y 1<br />
11.0<br />
10.5<br />
Visual pattern for<br />
within component<br />
common to Process2<br />
Std Dev<br />
10.0<br />
9.5<br />
0.20<br />
0.15<br />
0.10<br />
0.05<br />
Within top 4 Pareto<br />
Common 43%<br />
Process 2 29%<br />
Process 1 7%<br />
P3*P4 2%<br />
0.00<br />
A B A B A B A B A B A B A B A B Process 4<br />
A B A B A B A B Process 3<br />
A B A B Process 2<br />
A B Process 1<br />
Entitlement: B-<br />
line of Process<br />
Step 2 should<br />
match A line<br />
MD-5-921 US October 2007 43
Text Book Example of POV<br />
11.5<br />
Y2 is Step 4 related<br />
11.0<br />
1.27<br />
1.26<br />
1.25<br />
1.24<br />
1.23<br />
1.22<br />
121<br />
Voc<br />
Isc<br />
10.5<br />
Y1<br />
EfficiencyTotal<br />
10.0<br />
Y2<br />
Avg=10.60722<br />
9.5<br />
Metal Line<br />
Step 4<br />
100<br />
99<br />
98<br />
Y3 97<br />
96<br />
95<br />
94<br />
93<br />
92<br />
Y3 is Step 2 related<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
FFO-1-2-A<br />
FFO-1-2-B<br />
NPR Line<br />
Step 3<br />
Step 2<br />
Step 1<br />
FFO-1-2-A FFO-1-2-B FFO-1-2-A FFO-1-2-BCdCl2 Line<br />
FFO-1-2-A FFO-1-2-B Coat Line<br />
MD-5-921 US October 2007 44
Another Text Book Example<br />
Process Step 2<br />
Line B<br />
High Variation (21%)<br />
Also evidence of<br />
step3*step 4<br />
interaction (7%)<br />
Step 4<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A<br />
PBG-1-2-B<br />
PBG-1-2-A PBG-1-2-B PBG-1-2-A PBG-1-2-B<br />
Step 3<br />
Step 2<br />
Step 1<br />
PBG-1-2-A PBG-1-2-B<br />
MD-5-921 US October 2007 45
POV Advantage<br />
Within variation typically represents 80% of the<br />
overall variation<br />
Mean shifts are often more gratifying to work on<br />
However, alone they don’t constitute the largest source of<br />
variation<br />
In the worse case, mean shifts may even be a distraction<br />
POV provides a quantification of the within variation<br />
entitlements<br />
The quantification is not absolute, however, experience<br />
suggests the Pareto scales properly<br />
MD-5-921 US October 2007 46
POV Injection Example<br />
Prefer n>40 for each sub group<br />
The following example represents ~24 hours of production<br />
for one pair of lines<br />
Process Steps<br />
1-4<br />
Production Lines<br />
A<br />
B<br />
Frequencies<br />
Level<br />
A-A-A-A<br />
A-A-A-B<br />
A-A-B-A<br />
A-A-B-B<br />
A-B-A-A<br />
A-B-A-B<br />
A-B-B-A<br />
A-B-B-B<br />
B-A-A-A<br />
B-A-A-B<br />
B-A-B-A<br />
B-A-B-B<br />
B-B-A-A<br />
B-B-A-B<br />
B-B-B-A<br />
B-B-B-B<br />
G-A-A-A<br />
G-A-A-B<br />
G-A-B-A<br />
G-A-B-B<br />
G-B-A-A<br />
G-B-A-B<br />
G-B-B-A<br />
G-B-B-B<br />
Total<br />
Count<br />
311<br />
301<br />
370<br />
375<br />
128<br />
128<br />
141<br />
149<br />
100<br />
100<br />
78<br />
100<br />
50<br />
34<br />
97<br />
99<br />
40<br />
37<br />
62<br />
42<br />
80<br />
68<br />
173<br />
174<br />
3237<br />
MD-5-921 US October 2007 47<br />
G<br />
Dev.<br />
Tool<br />
The Design is Crossed, not balanced with 24<br />
combinations (2^4 + 2^3 levels)<br />
1<br />
2<br />
3<br />
4
Variability Chart for Injection Example<br />
11.5<br />
11.0<br />
10.5<br />
10.0<br />
9.5<br />
9.0<br />
8.5<br />
8.0<br />
7.5 0.8<br />
0.7<br />
0.6<br />
0.5<br />
0.4<br />
0.3<br />
0.2<br />
0.1<br />
0.0<br />
-0.1<br />
A B A B A B A B A B A B A B A B A B A B A B A B Process 4<br />
A B A B A B A B A B A B Process 3<br />
A B A B A B Process 2<br />
A B G Process 1<br />
Visualization of<br />
Process Step 4<br />
interacting with<br />
process Step 1<br />
on Tool G<br />
This group is<br />
amongst the<br />
least<br />
variation<br />
seen to date<br />
MD-5-921 US October 2007 48
Calculating the Variance with REML<br />
Variance Components with REML<br />
Component<br />
Total<br />
Within<br />
Process 1*Process 4<br />
Process 3*Process 4<br />
Process 1*Process 2<br />
Process 2<br />
Process 1*Process 2*Process 3*Process 4<br />
Process 1*Process 3*Process 4<br />
Process 1*Process 3<br />
Process 1*Process 2*Process 3<br />
Process 1<br />
Process 3<br />
Process 2*Process 3<br />
Process 4<br />
Process 2*Process 4<br />
Process 1*Process 2*Process 4<br />
Process 2*Process 3*Process 4<br />
Var Component<br />
0.14658430<br />
0.11268850<br />
0.02173898<br />
0.00438000<br />
0.00309395<br />
0.00150594<br />
0.00094134<br />
0.00088741<br />
0.00081464<br />
0.00053354<br />
0.00000000<br />
0.00000000<br />
0.00000000<br />
0.00000000<br />
0.00000000<br />
0.00000000<br />
0.00000000<br />
% of Total 20 40 60 80<br />
100.0<br />
76.9<br />
14.8<br />
3.0<br />
2.1<br />
1.0<br />
0.6422<br />
0.6054<br />
0.5558<br />
0.364<br />
0.0<br />
0.0<br />
0.0<br />
0.0<br />
0.0<br />
0.0<br />
0.0<br />
REML again reveals nearly 80% of the variation is “Within”<br />
Process1*Process4 between interaction is 15% of overall<br />
MD-5-921 US October 2007 49
POV Summary Table<br />
Component<br />
Between Total<br />
Between Process 1<br />
Between Process 2<br />
Between Process 3<br />
Between Process 4<br />
Between Process 1*Process 2<br />
Between Process 1*Process 3<br />
Between Process 1*Process 4<br />
Between Process 2*Process 3<br />
Between Process 2*Process 4<br />
Between Process 3*Process 4<br />
Within Total<br />
Within Process 1<br />
Within Process 2<br />
Within Process 3<br />
Within Process 4<br />
Within Process 1*Process 2<br />
Within Process 1*Process 3<br />
Within Process 1*Process 4<br />
Within Process 2*Process 3<br />
Within Process 2*Process 4<br />
Within Process 3*Process 4<br />
Common<br />
Total<br />
Pop Variance<br />
0.0273<br />
0.0129<br />
0.0027<br />
0.0002<br />
0.0004<br />
0.0010<br />
0.0005<br />
0.0087<br />
0.0001<br />
0.0000<br />
0.0008<br />
0.1129<br />
0.0199<br />
0.0002<br />
0.0001<br />
0.0328<br />
0.0020<br />
0.0046<br />
0.0362<br />
0.0011<br />
0.0002<br />
0.0005<br />
0.0153<br />
0.1402<br />
.<br />
.<br />
.<br />
% of Total<br />
19.48<br />
9.16<br />
1.95<br />
0.16<br />
0.28<br />
0.73<br />
0.38<br />
6.18<br />
0.04<br />
0.01<br />
0.59<br />
80.52<br />
14.18<br />
0.12<br />
0.10<br />
23.41<br />
1.42<br />
3.26<br />
25.81<br />
0.77<br />
0.12<br />
0.39<br />
10.94<br />
100.00<br />
.<br />
.<br />
.<br />
Sig.<br />
*<br />
*<br />
*<br />
*<br />
*<br />
*<br />
*<br />
*<br />
*<br />
POV Method<br />
calculates within<br />
as 80% of Total<br />
Process<br />
1*Process 4<br />
Interaction as<br />
32% of total<br />
MD-5-921 US October 2007 50
Pareto of the Variance Components<br />
100<br />
75<br />
50<br />
N=100<br />
Combined effect of<br />
Process 1, 4 and<br />
P1*P4 = 68%<br />
Percent<br />
25<br />
0<br />
Within Process 1*Process 4<br />
Within Process 4<br />
Within Process 1<br />
Common<br />
Between Process 1<br />
Between Process 1*Process 4<br />
Within Process 1*Process 3<br />
Between Process 2<br />
Within Process 1*Process 2<br />
Within Process 2*Process 3<br />
Between Process 1*Process 2<br />
Between Process 3*Process 4<br />
Within Process 3*Process 4<br />
Between Process 1*Process 3<br />
Between Process 4<br />
Between Process 3<br />
Within Process 2<br />
Within Process 2*Process 4<br />
Within Process 3<br />
Between Process 2*Process 3<br />
Between Process 2*Process 4<br />
Variance Components<br />
MD-5-921 US October 2007 51
POV Injection – Process Step 2<br />
Standard<br />
Production Lines<br />
A B S<br />
Development<br />
Line<br />
Process Flow<br />
1<br />
2<br />
3<br />
4<br />
MD-5-921 US October 2007 52
POV Injection Example 2 – The “HOT” path<br />
Standard<br />
Production Lines<br />
A B C<br />
Development<br />
Line<br />
Process Flow<br />
A B S<br />
G<br />
1<br />
2<br />
3<br />
4<br />
MD-5-921 US October 2007 53
A method for Rapid Identification of Common Failure<br />
Modes<br />
54
Exploring Relationships for Failure Mode Patterns<br />
Y1<br />
Y2<br />
These 4 - Y’s are<br />
highly interactive<br />
performance<br />
characteristics<br />
Y3<br />
Sweet<br />
spot<br />
Failure<br />
Modes<br />
Failure Mode = f(Y1, Y2, Y3, Y4)<br />
Y4<br />
MD-5-921 US October 2007 55
Establishing the Link between Failure Modes and<br />
Process Lineage<br />
Step 1: Establish Failure Modes from the multivariate<br />
relationships (Y’s)<br />
Step 2: Contingency Analysis of Failure Mode (Y) vs. Lineage<br />
(X)<br />
Step 3: Calculate the % of cell Chi-Square/Sum Chi-Square<br />
Cell Chi Square is the Chi-square values computed for each cell as<br />
(O - E)2 / E<br />
Sum cell Chi Square is the sum of all cell ChiSquare for each given<br />
failure mode<br />
Step 4: Explore commonalities where the % Chi-Square is large<br />
and Deviation is positive<br />
MD-5-921 US October 2007 56
% Cell Chi-Square Example<br />
% Cell Chi-<br />
Square<br />
Heritage FF n FF<br />
GAAA 1% 188 -1<br />
GAAB 1% 144 -1<br />
GABA 1% 256 -2<br />
GABB 1% 300 -2<br />
GACC 0% 82 -1<br />
GBAA 1% 343 -2<br />
GBAB 1% 289 -2<br />
GBBA 1% 327 -2<br />
GBBB 1% 509 -3<br />
GBCC 0% 97 -1<br />
GCAA 0% 200 0<br />
GCAB 1% 185 -1<br />
GCBA 0% 294 -1<br />
GCBB 0% 182 0<br />
GCCC 3% 8756 17<br />
SAAA 0% 61 0<br />
SAAB 0% 51 0<br />
SABA 0% 62 0<br />
SABB 0% 63 0<br />
SBAA 0% 72 0<br />
SBAB 0% 81 -1<br />
SBBA 0% 112 -1<br />
SBBB 0% 130 -1<br />
SCAA 2% 211 3<br />
SCAB 0% 277 -1<br />
SCBA 1% 241 1<br />
SCBB 1% 205 -1<br />
SCCC 9% 7497 29<br />
n<br />
Deviation<br />
XCCC<br />
Sum of % Chi-square = 12%<br />
Deviation = 46<br />
% Deviation = 46/15,253 = .3%<br />
MD-5-921 US October 2007 57
% Chi-Square (Cont).<br />
% Cell Chi-<br />
Square<br />
Heritage FF n FF<br />
AAAA 2% 2284 8<br />
AAAB 0% 2227 -3<br />
AABA 6% 2926 -15<br />
AABB 11% 2859 -20<br />
AACC 0% 96 -1<br />
ABAA 0% 1897 3<br />
ABAB 2% 1919 8<br />
ABBA 5% 2302 -12<br />
ABBB 4% 2483 -11<br />
ABCC 0% 110 -1<br />
ACCC 0% 262 1<br />
BAAA 0% 2129 2<br />
BAAB 0% 2166 -3<br />
BABA 4% 2673 -11<br />
BABB 1% 2528 -4<br />
BACC 0% 94 -1<br />
BBAA 0% 1762 0<br />
BBAB 6% 1781 12<br />
BBBA 1% 2282 6<br />
BBBB 7% 2401 14<br />
BBCC 0% 98 -1<br />
BCBB 18% 85 4<br />
n<br />
Deviation<br />
AxAx<br />
Short Hand:<br />
Sum of %Chi-Square = 4%<br />
Deviation = 16<br />
% Deviation = 16/4203 = .38%<br />
AxAx (4%, 16, .38%)<br />
BxBx (26%, 24, .5%)<br />
BxxB (31%, 30, .7%)<br />
xCxx (30%, 50, .32%)<br />
MD-5-921 US October 2007 58
Robust Design<br />
A method for minimizing the effects of variation<br />
59
Robust Design applied to a new Gage<br />
Robust Design is often applied to process improvement<br />
A new gage presents the ideal opportunity for Robust<br />
Design<br />
Rather than selecting critical set up factors based on<br />
manufacturing preference or “Best Guess” a quick and<br />
practical Robust DOE can help design in excellent gage<br />
capability before it hits the shop floor<br />
This particular design was conceived, executed and<br />
analyzed in less than 4 days.<br />
MD-5-921 US October 2007 60
How the gage works<br />
Glass Plate Motion<br />
X Location<br />
1 2 3 4 5<br />
Laser ID<br />
1<br />
2<br />
3<br />
.<br />
.<br />
.<br />
10<br />
Y Location<br />
5 heads are held in place<br />
along a fixed bar as the<br />
plate is passed from the<br />
top of the plate to the<br />
bottom of the plate.<br />
Height is calibrated to a<br />
fixed position by laser<br />
positioning.<br />
Plate temperature is also<br />
measured with IR sensor<br />
built in to the test system<br />
MD-5-921 US October 2007 61
Experimental Objectives<br />
Can the measurement be performed reliably on incoming<br />
plates?<br />
Incoming plates are covered with parting medium which is<br />
used to facilitate glass on glass separation<br />
If the glass must be cleaned prior to measurement it is a<br />
major disadvantage to manufacturing<br />
Understand the relationship of temperature, sensor height,<br />
and plate speed vs. the gage output (Y2) nominal and<br />
variation<br />
Provide an operational guide for gage set up which helps<br />
ensure a reliable measurement<br />
MD-5-921 US October 2007 62
The Design<br />
<strong>JMP</strong> Custom Design for RSM<br />
Entered Factors as follows:<br />
One Categorical Variable: Condition, easy to change<br />
One uncontrolled variable: Temperature (Measured in-situ)<br />
Two continuous variable: Speed (Very Hard to change) and<br />
Height (hard to change, actual height measured in situ)<br />
Replicates:<br />
Replicates were unknown as we had given time window and<br />
wanted to run as many as possible in the given time<br />
MD-5-921 US October 2007 63
The Real World is messy!<br />
After running the experiment we found what was<br />
actually run was different from what was planned<br />
Gage owner made some executive decisions based on<br />
practicality<br />
What to do?<br />
Plugged data back into Custom DOE<br />
Entered all the factors as covariates<br />
Created a new model<br />
MD-5-921 US October 2007 64
The Analysis<br />
Multivariate Analysis (exclude gross outliers, double check<br />
the design range and values)<br />
Ran step wise regression with main effects, interactions and<br />
2nd level quadratics<br />
Selected model terms with p
Unrealistic Values (Gross Outliers)<br />
1 2 3 4 5 6 7 8 9 10<br />
1 2 3 4 5<br />
Y Location<br />
X Location<br />
Key Observation: Virtually<br />
all of the unrealistic values<br />
are located on the leading<br />
edge of the plate (Y
Multivariate of Design Factors<br />
Scatterplot Matrix - Condition = Clean<br />
Scatterplot Matrix - Condition = Dirty<br />
60<br />
50<br />
50<br />
40<br />
30<br />
Speed<br />
40<br />
30<br />
Speed<br />
20<br />
20<br />
10<br />
10<br />
85<br />
83<br />
81<br />
79<br />
Temp<br />
75<br />
74<br />
Temp<br />
77<br />
75<br />
73<br />
10<br />
9<br />
8<br />
Height<br />
73<br />
72<br />
11<br />
10<br />
9<br />
8<br />
Height<br />
7<br />
7<br />
6<br />
6<br />
10 20 30 40 50<br />
73 75 77 79 81 83 85<br />
6 7 8 9 10<br />
10 20 30 40 50 60<br />
72 73 74 75<br />
6 7 8 9 10 11<br />
MD-5-921 US October 2007 67
Interactions<br />
Interaction Profiles<br />
10<br />
Y1<br />
Y1<br />
Y1<br />
9.7<br />
9.5<br />
9.3<br />
9.7<br />
9.5<br />
9.3<br />
9.7<br />
9.5<br />
9.3<br />
Speed<br />
72<br />
85<br />
5.7<br />
11.3<br />
Temp<br />
60<br />
11.3<br />
5.7<br />
Height<br />
10<br />
60<br />
85<br />
72<br />
Speed Temp Height<br />
10<br />
30<br />
50<br />
70<br />
72<br />
75<br />
78<br />
81<br />
84<br />
87<br />
6<br />
8<br />
10<br />
12<br />
MD-5-921 US October 2007 68
Fit Model<br />
Actual by Predicted Plot<br />
Parameter Estimates<br />
Y1 Actual<br />
9.6<br />
9.5<br />
9.4<br />
9.40 9.50 9.60<br />
Condition<br />
Height Speed<br />
CleanHi10<br />
CleanHi60<br />
CleanLo10<br />
CleanLo35<br />
DirtyHi10<br />
DirtyHi60<br />
DirtyLo10<br />
DirtyLo60<br />
Term<br />
Intercept<br />
Condition[Clean]<br />
Speed(10,60)<br />
Temp(72,85)<br />
Height(5.7,11.3)<br />
Speed*Temp<br />
Speed*Height<br />
Temp*Height<br />
Speed*Speed<br />
Estimate<br />
9.4144147<br />
0.0659857<br />
-0.1329<br />
0.0086641<br />
-0.042314<br />
-0.175065<br />
0.0135683<br />
0.100659<br />
0.0779556<br />
Std Error<br />
0.007973<br />
0.00317<br />
0.002974<br />
0.007149<br />
0.005219<br />
0.005426<br />
0.003391<br />
0.008214<br />
0.00681<br />
t Ratio<br />
1180.8<br />
20.82<br />
-44.69<br />
1.21<br />
-8.11<br />
-32.26<br />
4.00<br />
12.25<br />
11.45<br />
Prob>|t|<br />
0.0000*<br />
The Prediction Profile<br />
9.5<br />
Y1<br />
9.434658<br />
±0.013339<br />
9.4<br />
0.04<br />
0.02<br />
0<br />
-0.02<br />
dY1/dtemp<br />
1.89e-10<br />
±0<br />
-0.04<br />
Clean<br />
Dirty<br />
10<br />
20<br />
30<br />
40<br />
50<br />
60<br />
72<br />
74<br />
76<br />
78<br />
80<br />
6<br />
7<br />
8<br />
0<br />
0.25<br />
0.5<br />
0.75<br />
1<br />
Desirability<br />
1<br />
0 0.25 0.75 1<br />
Dirty<br />
Condition<br />
26.47804<br />
Speed<br />
74.99654<br />
Temp<br />
6.599008<br />
Height<br />
Desirability<br />
MD-5-921 US October 2007 70
Capability Comparison<br />
Nominal Setting<br />
(Height 9mm, Speed 40cm/sec)<br />
Optimized Settings<br />
(Height 5.5mm, Speed 20cm/sec)<br />
LSL<br />
Target<br />
USL<br />
750<br />
500<br />
Count<br />
LSL<br />
Target<br />
USL<br />
4000<br />
3000<br />
2000<br />
Count<br />
250<br />
1000<br />
9.45 9.47 9.49 9.51 9.53 9.55<br />
9.45 9.47 9.49 9.51 9.53 9.55<br />
CpK = .412<br />
Sigma = .013<br />
CpK=2.865<br />
Sigma = .0023<br />
Before After Optimization<br />
Improvement<br />
Ratio<br />
Sigma 0.013 0.0023 5.7<br />
Sigma^2 0.000169 0.00000529 31.9<br />
Measurement Capability Spec 9.5+/-.02<br />
MD-5-921 US October 2007 71
<strong>Solar</strong> Fun Fact<br />
Using current solar technology, a surface area covering<br />
just 1/10 th of the state of Nevada would be enough to<br />
supply all the electricity needs for the entire US<br />
MD-5-921 US October 2007 72
In Summary<br />
<strong>First</strong> <strong>Solar</strong><br />
<strong>JMP</strong><br />
<br />
<br />
<br />
<br />
<br />
leading enabler of cost effective solar energy solutions<br />
committed to improving the global environment<br />
utilizes world class continuous improvement methodologies<br />
Enables the practitioner and provides a data analysis<br />
platform that greatly enhances <strong>First</strong> <strong>Solar</strong>’s continuous<br />
improvement efforts<br />
POV enables a quick daily determination of Six Sigma<br />
entitlements<br />
MD-5-921 US October 2007 73
MD-5-921 US October 2007 74