SS 2005 - Kristallographisches Institut - Albert-Ludwigs-Universität ...
SS 2005 - Kristallographisches Institut - Albert-Ludwigs-Universität ...
SS 2005 - Kristallographisches Institut - Albert-Ludwigs-Universität ...
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<strong>Albert</strong>-<strong>Ludwigs</strong>-Universität Freiburg • Hebelstr. 25 • D-79104 Freiburg<br />
<strong>SS</strong> <strong>2005</strong><br />
<strong>Kristallographisches</strong> <strong>Institut</strong><br />
Prof. Dr. Arne Cröll<br />
Mai <strong>2005</strong><br />
Seminar<br />
"Aktuelle Fragen der Kristallzüchtung"<br />
Ort:<br />
Beginn:<br />
SR KI – Nr. 01 015, Hermann-Herder-Str. 5, (1.OG)<br />
jeweils Mittwoch, 12.15 h<br />
11.05.<br />
11.05.<br />
A. Cröll<br />
Study of the oxygen incorporation during growth of large CaF 2 -crystals<br />
A. Molchanov, J. Friedrich, G. Wehrhan and G. Müller - JCG 273, 3-4, 629<br />
O. Aniol<br />
Growth and properties of 40 mm diameter Hg 1-x Cd x Te using the two-stage<br />
Pressurised Bridgman Method<br />
Yue Wang, Quanbao Li, Qinglin Han, Qinghua Ma, Ronbin Ju, Bingwen<br />
Song, Wanqi Jie; Yaohe Zhou and Yuko Inatomi<br />
JCG 273, 1-2, 1<br />
25.05.<br />
E. Keller<br />
Das Bindungsvalenz-Konzept zur Vorhersage und Interpretation von<br />
Atomabständen in Kristallen<br />
25.05.<br />
R. Boger<br />
In situ monitoring of the stress evolution in growing group-III-nitride-layers<br />
A. Krost et al. JCG 275 (<strong>2005</strong>) 209-216<br />
Vorschau V. Babentsov<br />
In situ observation for semiconductor solution growth using a near-infrared<br />
micros Termine microscope<br />
folgen<br />
Y Y. Inatomi et al. JCG 275 (<strong>2005</strong>) 193
Fortsetzung Vorschau: Seminar “Aktuelle Fragen der Kristallzüchtung”<br />
2<br />
Vorschau<br />
Termine<br />
folgen<br />
A. Cröll<br />
The effect of nitrogen on void formation in Czochralski silicon crystals<br />
V. V. Voronkov and R. Falster – JCG 273, 3-4, 412<br />
M. Fiederle<br />
A new growth method for Cdte: a breakthrough towards large areas<br />
B. Pelliciari et al. JCG 275 (<strong>2005</strong>) 99-105<br />
N. Graf<br />
InN layers grown on silicon substrates: effect of substrate temperature and<br />
buffer layers<br />
J. Grandal et al. JCG 275 (<strong>2005</strong>) 373-377<br />
A. Danilewsky<br />
l<br />
Semiconductor Bridgman growth inside inertial flight mode orbiting systems of<br />
low orbital eccentricity and long orbital period<br />
X. Ruiz and M. Ermakov – JCG 273, 3-4, 629<br />
R. Boger<br />
Growth and characterization of single-crystalline gallium nitride using (100)<br />
LiAlO 2 subrates<br />
M. D. Reed, O. M. Kryliouk, M. A. Mastro and T. J. Anderson<br />
JCG 274, 1-2, 14