Fluorescence X-ray Spectrometer System ZSX Series - Rigaku

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$The New Standard of X-ray Diffractometer: MultiFlex - Rigaku$

with CCD viewing and to specify the location of analysis simply by a click of the mouse. (3) A new r-2 stage is employed to allow microarea analysis with optimized conditions. In mapping and point analysis, there is no effect from the unevenness of radiation from the X-ray tube or from reflection with the analyzing crystal. (4) The ZSX produces wavelength dispersive X- ray fluorescence analysis with a measurable sample diameter down to 50 :m. (5) A variety of X-ray tubes are available including a 30 :m thin window X-ray tube featuring high sensitivity for light elements and an X-ray tube optimal for small diameter samples. (6) A tray system incorporated in the ASC (automatic sample changer) facilitates the control and conveyance of samples. (7) The revolutionary software package contains a full suite of analysis capabilities with a simple, straightforward user interface. (8) Windows NT Operating System. 3. Application Field Application fields and specific examples are listed below. Applications Examples Electronics and magnetic Chemical industry Ceramics Steel Nonferrous metals Mining Petroleum, coal Environmental analysis Other 4. Optical System LSI, memory disk, CRT parts, magnetic materials Catalyst, polymer, pharma ceuticals, fertilizer, pigment, paint, oil & fat, detergent, cosmetics Silicon nitride, alumina, glass, refractories, enamel, cement Special steel, surface treat ment steel plate, ferroalloy, cast iron, cast steel, iron ores, plating liquid Aluminum, shape memory alloy, copper alloy, precious metal, Ni alloy, solder, plating liquid Ore, rock, volcanic ash Grease, lubricant, cutting oil, kerosene, heavy oil Waste water, seawater, river water, airborne dust, in- dustrial wastes Soil , rock, plant, organisms, foodstuff Fig. 1 shows the optical system of the ZSX. When a sample is irradiated with the primary X-ray beam from an X-ray tube, fluorescent X-rays whose Fig. 1. New Optics of ZSX Vol. 16 No. 2 1999 59
wavelengths are characteristic of the elements in the sample will transpire. These secondary X-rays then undergo spectral processing with the analyzing crystal and are detected by the detector (SC, F-PC). The ZSX Fig. 2. Sensitivity Comparison Profiles in Offset Arrangement and Tandem Arrangement. is equipped with a 3-axis (2-22-22) independent driving goniometer. This allows for the selection of the offset arrangement for high-resolution analysis or for the tandem arrangement for high-sensitivity analysis (SC+F-PC arranged in series). The SC detector can be equipped with an optional high-sensitivity slit. This can be installed in addition to the standard high-resolution slit. This allows an optimal combination to meet the desired analytical requirement. Fig. 2 shows a sensitivity comparison chart for the tandem arrangement. The sample chamber employs a double vacuum system. A preliminary vacuum chamber is also provided to enable evacuation for a subsequent sample while measurement of the current sample is occurring. 5. r-2 Sample Stage and CCD Point Analysis Figure 3 depicts the X-ray intensity distribution that takes place with the primary X-rays. The conventional design enables the maximum X-ray intensity to be obtained with a standard diameter sample. However, for small diameter samples, the measurement will occur at a position deviating from the maximum X-ray intensity. With the ZSX, the use Fig. 3. Sensitivity Comparison by use of the r-2 stage. 60 The Rigaku Journal
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Page 5 and 6: Fig. 5. ZSX Software Configuration

Fluorescence X-ray Spectrometer System ZSX Series - Rigaku

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