Fluorescence X-ray Spectrometer System ZSX Series - Rigaku
Fluorescence X-ray Spectrometer System ZSX Series - Rigaku
Fluorescence X-ray Spectrometer System ZSX Series - Rigaku
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<strong>ZSX</strong>100e <strong>ZSX</strong>101e <strong>ZSX</strong>100s <strong>ZSX</strong>101s<br />
Area limiting diaphragm<br />
Divergence slit<br />
30 mm N fixed (no attenuator) or 35, 30, 25, 20, 10,<br />
3, 1, 0.5 mm N and attenuator exchanger<br />
(For spinner or r-2 driving)<br />
Standard resolution, 1 kind, fixed or slit exchanger<br />
Select from standard resolution, high resolution and<br />
ultralight element use<br />
30 mm N fixed (no attenuator) or 35, 30, 25, 20, 10<br />
mm N (no attenuator exchanger)<br />
(spinner)<br />
Standard resolution, 1 kind, fixed or slit exchanger<br />
Selection from standard resolution and high<br />
resolution<br />
Receiving slit<br />
Goniometer<br />
Crystal exchanger<br />
Analyzing crystal<br />
Detector<br />
Vacuum system<br />
Temperature stabilizer<br />
Option<br />
High resolution for SC (standard) high sensitivity for SC (optional), for F-PC (select for <strong>ZSX</strong>101e/101s)<br />
2-22-22 3-axis independent drive system<br />
Scan range: SC -1~118E (22)<br />
F-PC 7~148E (22)<br />
Scan speed: Max 1400E/min<br />
Step angle: 1E/1000, 2E/1000, 5E/1000, 1E/100, 2E/100, 5E/100, 1E/100<br />
Continuous scan: 0.1~240E /min (optional)<br />
10-crystal exchanger or 4-crystal exchanger<br />
Select from LIF(200) PET, Ge, TAP, RX-4, RX-9, RX-35, LiF (220)<br />
Select from RX-40, RX-45, RX-60, RX-70, RX-80<br />
For Ti~U: Scintillation counter (SC)<br />
For Be~Zn: Gas-flow proportional counter (F-PC)<br />
With center wire cleaner and gas density stabilizer<br />
High-speed vacuum system (2 vacuum pumps), or general-purpose vacuum system (1 vacuum pump)<br />
Temperature for control: 36.5EC"0.1EC<br />
Powder sample attachment, automatic He substitution device, PR gas switching device, remote diagnosis,<br />
remote control, mapping device, sample observation mechanism<br />
Vol. 16 No. 2 1999 63