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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

MULTIMEDIA UNIVERSITY<br />

FACULTY OF ENGINEERING<br />

LAB SHEET<br />

MICROWAVE DEVICES<br />

EMG <strong>2026</strong><br />

MD 1 - Characteristics <strong>of</strong> Gunn Diode<br />

MD 2 - Characteristics <strong>of</strong> Reflex Klystron<br />

Note: Students are advised to read through this <strong>lab</strong> <strong>sheet</strong> before doing experiment<br />

GUIDELINE FOR LAB REPORT<br />

The <strong>lab</strong>oratory report should include the following:<br />

1. Objective <strong>of</strong> the experiment<br />

2. Procedure<br />

3. Measurement results<br />

4. Discussion <strong>of</strong> the findings<br />

5. Conclusion<br />

The report must be submitted to the Applied EM Lab within 2 weeks from the date <strong>of</strong> the experiment.<br />

Revision Sept 2010


Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

OBJECTIVE:<br />

EXPERIMENT 1<br />

CHARACTERISTICS OF GUNN DIODE<br />

1. To identify the principle <strong>of</strong> operation <strong>of</strong> Gunn oscillator.<br />

2. To estimate the voltage current characteristic <strong>of</strong> Gunn diode.<br />

3. To analyse the relationship between voltage across Gunn diode and frequency <strong>of</strong> the <strong>microwave</strong> signal<br />

generated.<br />

4. To analyse the relationship between voltage across Gunn diode and output power.<br />

APPARATUS:<br />

Gunn power supply/SWR meter (737021), Gunn oscillator, PIN modulator, Cavity wavemeter, Isolator,<br />

Slotted line probe, Variable attenuator.<br />

INTRODUCTION:<br />

Gunn diode is a type <strong>of</strong> Transferred Electron Device (TED). Material like GaAs exhibit negative differential<br />

mobility (i.e. decrease in carrier velocity with an increase in electric field) when bias voltage is above a<br />

threshold level. This gives rise to negative resistance characteristic <strong>of</strong> the Gunn device (i.e. decrease in<br />

current with an increase in voltage, see Figure 1). The shape <strong>of</strong> the V-I characteristic suggests that the device<br />

may be used as negative resistance amplifier or oscillator.<br />

Unlike other diodes, the Gunn device does not require the presence <strong>of</strong> a p-n junction. The Gunn diode is a<br />

GaAs material with ohmic contacts on the two ends.<br />

GaAs<br />

L<br />

I (mA)<br />

V th V 1<br />

V<br />

Figure 1: V-I characteristic <strong>of</strong> Gunn diode.<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

A detailed analysis shows that the transit time T = L/v (where L is length <strong>of</strong> sample and v is velocity <strong>of</strong><br />

charge carriers) <strong>of</strong> electron through the GaAs sample should be larger than the domain growth time, T D , to<br />

have the negative resistance characteristic.<br />

The domain growth time is given by T<br />

g<br />

= ε<br />

neµ<br />

. (1)<br />

e<br />

where n is charge carrier density, e the charge <strong>of</strong> an electron, µ e the mobility <strong>of</strong> electron in the negative slope<br />

region <strong>of</strong> the V-I characteristic, and ε the permittivity <strong>of</strong> the GaAs material.<br />

For L/v > T g , the length <strong>of</strong> sample should be<br />

εv<br />

L > .<br />

neµ<br />

e<br />

A more accurate analysis shows that the required criterion is nL > 10 12 cm -2 .<br />

The threshold electric field for GaAs is 3.2x10 5 V/m. The threshold voltage is therefore<br />

V th<br />

= 0 . 32× L<br />

(2)<br />

where L is in micro-meter. For a sample length <strong>of</strong> 30 µ m , the threshold voltage will be 9.6 volts.<br />

The frequency <strong>of</strong> oscillation is related to transit time and hence the length <strong>of</strong> the device. Shorter sample<br />

length will have a higher operating frequency. Since the threshold electric field is fixed, the operating bias<br />

voltage across the device decreases linearly as the design frequency is increased.<br />

When Gunn diode is placed in a resonant cavity, oscillation occurs at the frequency <strong>of</strong> the resonant circuit<br />

rather than at the intrinsic frequency (or transit time frequency). The resonant frequency <strong>of</strong> the resonant<br />

circuit can be several times the intrinsic frequency.<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

PROCEDURE:<br />

Caution: Please DO NOT apply a voltage exceeding 18V across the Gunn diode.<br />

Part A: To determine the V-I characteristic <strong>of</strong> Gunn diode<br />

Gunn power supply/<br />

SWR meter<br />

To INPUT <strong>of</strong><br />

GUNN PIN INPUT<br />

Gunn<br />

diode<br />

PIN<br />

Modulator<br />

Figure 2: Experimental set up.<br />

1. Set up the equipment as shown in Figure 2. The PIN modulator input shall be left open.<br />

2. Before switching on the power supply, adjust the voltage knob to zero (maximum anti-clockwise).<br />

3. Increase the voltage in steps <strong>of</strong> 0.5 volt by adjusting the voltage knob.<br />

a) Measure the voltage across the Gunn diode and record the reading in Table l.<br />

b) Measure the current (with the same meter by switching to "I" mode) and record it in Table l.<br />

4. When voltage applied to the Gunn diode V d is near the threshold voltage V Th (where the slope changes<br />

from positive to negative), it may be necessary to vary the voltage in steps <strong>of</strong> 0.25 V or less to accurately<br />

determine V Th .<br />

5. Plot the V-I characteristic on a graph paper.<br />

6. Determine the range <strong>of</strong> bias voltage over which the V-I characteristic has negative slope.<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

Part B: To study the variation <strong>of</strong> power output and frequency with respect to bias voltage<br />

1. Set up the equipment as in Figure 2. Additionally, connect the PIN modulation output <strong>of</strong> the Gunn<br />

power supply to the PIN modulator.<br />

2. Set the applied voltage to the Gunn diode somewhere near the middle <strong>of</strong> the negative slope region <strong>of</strong> the<br />

V-I characteristic.<br />

3. Set the slotted-line probe at about 2-mm protrusion depth and adjust the tuner stub/knob for proper<br />

matching <strong>of</strong> the detector.<br />

4. Set the variable attenuator at 5-mm micrometer setting. (The reading <strong>of</strong> the SWR meter should be<br />

constant when the probe carriage is moved along the slotted-line waveguide.)<br />

5. Adjust the Gunn diode supply voltage until the SWR meter reading is maximised.<br />

6. Select the appropriate V/dB setting. Adjust the zeroing knob <strong>of</strong> the SWR meter so that the needle points<br />

at 0 dB. After this, the zeroing knob should be fixed.<br />

7. Increase the Gunn diode voltage V d to 10V.<br />

8. Measure the frequency using the cavity wavemeter.<br />

(Starting with the cavity wavemeter dial set to maximum clockwise, unscrew the dial slowly. At first there<br />

will be little effect on the SWR meter reading until at one point the power will fall sharply. Read the<br />

frequency indicated on the scale.)<br />

You may also use the alternative method given in Appendix A for <strong>microwave</strong> frequency measurement.<br />

9. Record the applied voltage V d , <strong>microwave</strong> power output in dB, and oscillation frequency in Table 1.<br />

10. Decrease the applied voltage in steps <strong>of</strong> 0.5 V and record the corresponding values <strong>of</strong> power output and<br />

oscillation frequency.<br />

11. Repeat step 10 until V d is lower than the threshold voltage.<br />

12. Plot frequency versus bias voltage.<br />

13. Plot power output versus bias voltage.<br />

14. What is the frequency at which the Gunn oscillator gives maximum power output?<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

Table 1:<br />

Bias Voltage V d Bias Current Power level (dB) Frequency (GHz)<br />

1<br />

2<br />

3<br />

4<br />

5<br />

6<br />

7<br />

8<br />

9<br />

10<br />

11<br />

12<br />

13<br />

14<br />

15<br />

16<br />

17<br />

18<br />

19<br />

20<br />

21<br />

22<br />

23<br />

24<br />

25<br />

26<br />

27<br />

28<br />

29<br />

30<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

MARKING SCHEME MD1<br />

(Student can give a result as long as the result is valid)<br />

Part A: To determine the V-I characteristic <strong>of</strong> Gunn diode<br />

5. Plot the V-I characteristic on a graph paper.<br />

(10 marks)<br />

6. Determine the range <strong>of</strong> bias voltage over which the V-I characteristic has negative slope.<br />

(5 marks)<br />

Part B: To study the variation <strong>of</strong> power output and frequency with respect to bias voltage<br />

9. Record the applied voltage V d , <strong>microwave</strong> power output in dB, and oscillation frequency in Table 1.<br />

(10 marks)<br />

12. Plot frequency versus bias voltage. (10 marks)<br />

13. Plot power output versus bias voltage.<br />

(10 marks)<br />

14. What is the frequency at which the Gunn oscillator gives maximum power output?<br />

(5 marks)<br />

(Total: 50 marks)<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

OBJECTIVE:<br />

EXPERIMENT 2<br />

CHARACTERISTICS OF REFLEX KLYSTRON<br />

1. To identify the principle <strong>of</strong> operation <strong>of</strong> Reflex Klystron.<br />

2. To identify the relationship between repeller voltage and Power output <strong>of</strong> Reflex Klystron.<br />

3. To analyse the relationship between repeller voltage and frequency <strong>of</strong> the <strong>microwave</strong> signal generated by<br />

Reflex Klystron.<br />

4. To analyse the effect <strong>of</strong> cavity size on frequency <strong>of</strong> <strong>microwave</strong> signal generated by Reflex Klystron.<br />

APPARATUS:<br />

Klystron tube, Klystron power supply, Cavity wavemeter, Isolator, Slotted line probe, SWR meter, Matched<br />

load, variable attenuator, and digital multimeter.<br />

INTRODUCTION:<br />

A Reflex Klystron is a <strong>microwave</strong> oscillator with a single cavity (resonator). The construction <strong>of</strong> a reflex<br />

klystron is shown in Figure 1(a). The basic configuration in simplified form as shown in Fig 1(b) is<br />

considered here for understanding the operation <strong>of</strong> Reflex Klystron. The various parts in Figure 1(b) are<br />

(1) Electron Gun; (2) Resonator; (3) Repeller; and (4) Output coupling.<br />

A highly focused beam <strong>of</strong> electrons passing through the resonator gap will be accelerated or decelerated by<br />

the induced current on the resonator. The alternate action <strong>of</strong> increasing and decreasing the electron velocity<br />

will modulate the electron beam into varying dense and sparse <strong>of</strong> electrons referred to as electron bunches.<br />

This electron bunching mechanism is also called intensity modulation or velocity modulation.<br />

The repeller electrode is at a negative potential. It stops the movement <strong>of</strong> the electrons, turn them around,<br />

and send them back through the resonator gap. As the repelled electrons re-enter the resonator, they give up<br />

their kinetik energy. The field excited in the resonator add in phase with the initial modulating field such that<br />

it reinforce the next wave <strong>of</strong> electron bunching. As a result, this energy serves as a regenerative feedback to<br />

sustain the oscillation at the resonant frequency <strong>of</strong> the resonator. This is the case only if the repeller voltage<br />

is set such that the travel time, t o , for the electrons to complete their travel through the gap, turn around, and<br />

back through the gap satisfy the following condition:<br />

t o<br />

⎨<br />

⎧ 3 = n + T<br />

⎩ 4⎭ ⎬⎫<br />

n = 1,2,3,…. (1)<br />

where T is the period <strong>of</strong> the RF waveform.<br />

If the voltage between the resonator and the repeller is V r , and the distance is d, the deceleration or<br />

retardation experienced by the electron may be expressed as<br />

eVr d<br />

a = /<br />

(2)<br />

m<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

where e is charge <strong>of</strong> electron and m mass <strong>of</strong> electron. If an electron leaves the resonator with velocity v o , the<br />

displacement <strong>of</strong> the electron from the resonator, at any time t, is<br />

1 x<br />

o<br />

− at<br />

2<br />

v t<br />

2<br />

= (3)<br />

This equation can be used to calculate the travel time t o taken by the electron to return to the resonator.<br />

t<br />

r<br />

2v<br />

o<br />

= =<br />

x=<br />

0<br />

a<br />

2v<br />

o<br />

eV<br />

md<br />

r<br />

(4)<br />

Bunching phenomenon in Reflex Klystron<br />

Bunching phenomenon in a reflex Klystron can be visualised by studying the electron trajectories in the<br />

region between the resonator and the repeller. The parabolic trajectories given by equation (3) are shown in<br />

Figure 2.<br />

Let us consider an electron A which passes through the resonator gap with velocity v o when the RF voltage<br />

at the resonator is zero (changing from positive to negative). This electron returns to the resonator at a time t r<br />

later. Another electron B passes through the gap earlier. Because the RF voltage is positive at this instant, the<br />

initial velocity v b for electron B is higher than the initial velocity <strong>of</strong> electron A (v b > v o ). Thus electron B<br />

would travel further towards the repeller and take a longer time to return back to the resonator. It will then<br />

bunch with electron A. Similarly, an electron C that passes through the gap after A emerges with a lower<br />

initial velocity and therefore takes less time to return to the resonator. Electron C catches up with electron A<br />

and bunch with electrons A and B.<br />

The electron bunches formed as described above would deliver power to the resonator if they pass through<br />

the resonator at an instant when the field in the resonator retards the bunch. Referring to Figure 2, we note<br />

that this happens when t o = (3/4) T.<br />

In general, oscillation will occur when the condition in equation (1) is satisfied. Thus there are several values<br />

<strong>of</strong> repeller voltage V r that satisfy the oscillation condition. These values correspond to various modes <strong>of</strong><br />

operation. A particular mode <strong>of</strong> operation may be selected by a choice <strong>of</strong> repeller voltage. Figure 3 shows the<br />

power output versus repeller voltage for various modes <strong>of</strong> operation (called the reflex Klystron mode curves<br />

or mode characteristics). The mode corresponding to n = l occurs at maximum negative repeller voltage. For<br />

n = 0, the gain mechanism is usually not strong enough to overcome system losses. Higher order modes (n ><br />

1) may present at lower repeller voltages. Frequency versus repeller voltage variations is also shown in<br />

Figure 3.<br />

Revision Sept 2010


Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

1<br />

2<br />

d<br />

3<br />

4<br />

V a<br />

(b)<br />

V r<br />

(a)<br />

Figure 1: (a) Construction <strong>of</strong> Reflex Klystron and (b) the simplified diagram.<br />

x o<br />

Repeller<br />

d<br />

Resonator gap<br />

B A C<br />

t o<br />

t<br />

RF voltage<br />

t<br />

3T/4<br />

Figure 2: Bunching phenomenon in Reflex Klystron.<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

RF frequency<br />

V r<br />

n = 1<br />

Output power<br />

n = 3<br />

n = 2<br />

Repeller voltage<br />

V r<br />

Figure 3: Mode characteristics <strong>of</strong> Reflex Klystron.<br />

Cavity<br />

Wavemeter<br />

SWR meter<br />

Variable<br />

attenuator<br />

Klystron<br />

Source<br />

Isolator<br />

Slotted-line<br />

Probe<br />

short-circuit<br />

plane<br />

Figure 4: Schematic <strong>of</strong> the experiment set up.<br />

Revision Sept 2010


Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

PROCEDURE:<br />

CAUTION 1: The RF power levels in the following experiments are not harmful, but a human eye<br />

may be damaged by low level <strong>of</strong> radiation. Do not look into the waveguide at any time when the<br />

equipment are on.<br />

CAUTION 2: Klystron tube get extremely hot when it is operated and must not be handled by hand.<br />

Measurement <strong>of</strong> Frequency and power with variation in repeller voltage<br />

1. Set up the equipment as shown in Figure 4. Switch on the power supply and RF output. Wait a few<br />

seconds for the Klystron tube to warm up.<br />

2. Select squarewave modulation. Set the modulation level to maximum. Adjust the repeller voltage to<br />

maximum and then decrease it slowly until the largest deflection (maximum power) is indicated on the SWR<br />

meter.<br />

3. Adjust the modulation frequency so that the SWR meter deflection is further maximised.<br />

4. Set the slotted-line probe at about 2-mm protrusion depth and adjust the tuner stub/knob for proper<br />

matching <strong>of</strong> the detector.<br />

5. Set the variable attenuator at 5-mm micrometer setting. (The reading <strong>of</strong> the SWR meter should be<br />

constant when the probe carriage is moved along the slotted-line waveguide.)<br />

6. Adjust the gain knob <strong>of</strong> the SWR meter so that the needle points at 0 dB. After this, the zeroing knob<br />

should be fixed.<br />

7. Measure the repeller voltage from the connector at the rear panel <strong>of</strong> the Klystron power supply using a<br />

multimeter and record the reading. The multimeter reading shall be multiplied by 10x to give the repeller<br />

voltage.<br />

8. Measure the frequency using the cavity wavemeter and record the result.<br />

(Starting with the cavity wavemeter dial set to maximum clockwise, unscrew the dial slowly. At first there<br />

will be little effect on the SWR meter reading until at one point the power will fall sharply. Read the<br />

frequency indicated on the scale.)<br />

You may also use the alternative method given in Appendix A for <strong>microwave</strong> frequency measurement.<br />

9. Vary the repeller voltage.<br />

10. Measure the repeller voltage and record the reading.<br />

11. Measure the frequency using the cavity wave meter and record the reading.<br />

12. Repeat steps 9-11 for the full range <strong>of</strong> repeller voltage.<br />

13. Plot relative power level in dB versus repeller voltage.<br />

14. Plot frequency versus repeller voltage.<br />

Revision Sept 2010


Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

Measurement data:<br />

1<br />

Repeller voltage (multimeter<br />

reading × 10V)<br />

Relative output power (dB)<br />

Frequency (GHz)<br />

2<br />

3<br />

4<br />

5<br />

6<br />

7<br />

8<br />

9<br />

10<br />

11<br />

12<br />

13<br />

14<br />

15<br />

16<br />

17<br />

18<br />

19<br />

20<br />

21<br />

22<br />

23<br />

24<br />

25<br />

26<br />

27<br />

28<br />

29<br />

30<br />

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Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

Appendix A<br />

Microwave Frequency Measurement Using Slotted-line Probe<br />

1. Adjust the variable attenuator to obtain an SWR greater than 3.<br />

2. Move the probe along the waveguide to find two successive minimum points. Record the positions <strong>of</strong><br />

these two points (x 1 and x 2 ) from the Vernier scale <strong>of</strong> the slotted-line waveguide. Determine the<br />

waveguide wavelength λ g .<br />

Power<br />

λ g = 2d<br />

x1<br />

d<br />

x2<br />

Distance<br />

Fig. A1: Standing wave pattern.<br />

3. Calculate the free-space wavelength λ o using equation A1. The inner dimensions <strong>of</strong> the waveguide is<br />

given as a=2.2870cm and b=1.0160cm. The cut<strong>of</strong>f waveleght for TE 10 mode is λ c = 2a.<br />

1 1 1<br />

2<br />

=<br />

2<br />

+<br />

2<br />

(A1)<br />

λ λ λ<br />

o g c<br />

4. Calculate the <strong>microwave</strong> frequency f o = c/λ o .<br />

Revision Sept 2010


Microwave Devices <strong>Faculty</strong> <strong>of</strong> <strong>Engineering</strong> EMG<strong>2026</strong><br />

MARKING SCHEME MD2<br />

(Student can give a result as long as the result is valid)<br />

Measurement <strong>of</strong> Frequency and power with variation in repeller voltage<br />

1. Measurement data Table. (10 marks)<br />

13. Plot relative power level in dB versus repeller voltage.<br />

(20 marks)<br />

14. Plot frequency versus repeller voltage.<br />

(20 marks)<br />

(Total: 50 marks)<br />

Revision Sept 2010

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