Slides explaining Boundary Scan test principles - goJTAG
Slides explaining Boundary Scan test principles - goJTAG
Slides explaining Boundary Scan test principles - goJTAG
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<strong>Boundary</strong> <strong>Scan</strong> basics<br />
Pin<br />
Pin<br />
Core<br />
Logic<br />
Core<br />
Logic<br />
B<strong>Scan</strong> Cell<br />
Non-B<strong>Scan</strong> Device<br />
TDI<br />
TCK<br />
TMS<br />
TAP<br />
controller<br />
B<strong>Scan</strong> Device<br />
TDO<br />
... some extra<br />
logic is needed<br />
for Test Access<br />
For describing <strong>Boundary</strong> <strong>Scan</strong> devices<br />
BSDL (<strong>Boundary</strong> <strong>Scan</strong> Description<br />
Language) models are used<br />
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