Slides explaining Boundary Scan test principles - goJTAG

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Blind Interrogation Default instruction: • IDCODE (but it is not mandatory) • BYPASS (if IDCODE is not implemented) Default capture bits: • 0 in BYPASS register • 1 – first bit in IDCODE register Example: 0...............................10 Core Logic Core Logic Core Logic TDI 0 ….…..…1 0 BYPASS IDCODE BYPASS TDO 42
TAP Controller State Diagram DR Branch IR Branch The TAP state diagram has two main branches and two idle states. Shift IR and Shift DR states are used to insert instructions and <strong>test</strong> data into the BS device. These are the most important states. The number of states is exactly 16 (to avoid some undefined states) TMS signal is used to move through the states 43
Page 1 and 2: Board-level testing and IEEE1149.x
Page 3 and 4: Industrial approach to board test
Page 5 and 6: Test Access: Past and Present • P
Page 7 and 8: Modeling of Interconnect Faults Net
Page 9 and 10: Open Faults Misplaced bond wire Mis
Page 11 and 12: Tri-state connections Chip 1 Chip 2
Page 13 and 14: Specific faults in tri-state nets D
Page 15 and 16: Consider a simple example… Test V
Page 17 and 18: The Counting Sequence 00 01 Open As
Page 19 and 20: The True/Complement Code True part
Page 21 and 22: Extended True/Complement Code True
Page 23 and 24: More complex case: branching nets e
Page 25 and 26: Outline • Board level testing cha
Page 27 and 28: Test Access Via Boundary Scan TDI T
Page 29 and 30: Test Access Via Boundary Scan Drive
Page 31 and 32: Boundary Scan basics Pin Pin Core L
Page 33 and 34: Typical Boundary Scan Cell (BC_1) B
Page 35 and 36: Boundary Scan Working Modes SAMPLE/
Page 37 and 38: Boundary Scan Working Modes EXTEST
Page 39 and 40: Typical BS Interconnect Test Flow B
Page 41: Boundary Scan Working Modes IDCODE
Page 45 and 46: Outline • Board level testing cha
Page 47 and 48: BScan Implementation Examples VCC +
Page 49 and 50: Board-level Test using Boundary Sca
Page 51 and 52: Cluster Logic Test (Manual) BScan I
Page 53 and 54: RAM Test Example Address 10bit walk
Page 55 and 56: RAM Test Example: detection of open
Page 57 and 58: Boundary Scan Test Development Typi
Page 59 and 60: Boundary Scan - Evolution 1149.4 -
Page 61 and 62: New and Emerging Standards Combined

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