Slides explaining Boundary Scan test principles - goJTAG
Slides explaining Boundary Scan test principles - goJTAG
Slides explaining Boundary Scan test principles - goJTAG
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IEEE 1149.1 Summary<br />
<strong>Boundary</strong> <strong>Scan</strong> Standard has become absolutely<br />
essential:<br />
− No longer possible to <strong>test</strong> printed circuit<br />
boards with bed-of<br />
of-nails <strong>test</strong>er<br />
− Not possible to <strong>test</strong> multi-chip modules at all<br />
without it<br />
− Supports BIST, external <strong>test</strong>ing with<br />
Automatic Test Equipment, and boundary<br />
scan chain reconfiguration as BIST pattern<br />
generator and response compacter<br />
− Now getting widespread usage<br />
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