Slides explaining Boundary Scan test principles - goJTAG
Slides explaining Boundary Scan test principles - goJTAG
Slides explaining Boundary Scan test principles - goJTAG
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Test Access: Past and Present<br />
• Past: <strong>test</strong> access was a problem<br />
• Present: good <strong>test</strong> access by <strong>Boundary</strong> <strong>Scan</strong> combined<br />
with AOI, Functional Test, Flying Probe, etc.<br />
Test access by<br />
typical <strong>test</strong> methods<br />
1980 1990 2000 2010<br />
2020<br />
<strong>Boundary</strong> <strong>Scan</strong><br />
AOI and AXI<br />
Functional Testing<br />
Flying Probe<br />
In-Circuit Testing<br />
Extended BS<br />
5
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