Slides explaining Boundary Scan test principles - goJTAG
Slides explaining Boundary Scan test principles - goJTAG
Slides explaining Boundary Scan test principles - goJTAG
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RAM / Flash Test<br />
B<strong>Scan</strong><br />
IC 1<br />
Chip select lines<br />
B<strong>Scan</strong><br />
IC 2<br />
RAM 1<br />
RAM 2<br />
Flash<br />
To generate <strong>test</strong>:<br />
• Specify constraints that will select only one device<br />
• RAM/Flash model in special format that provides<br />
description of read/write protocol<br />
• Combination of walking and counting sequences is<br />
used<br />
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