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Dual-Core Intel® Xeon® Processor 5200 Series

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2.11 Mixing <strong>Processor</strong>s<br />

26<br />

<strong>Dual</strong>-<strong>Core</strong> <strong>Intel®</strong> <strong>Xeon®</strong> <strong>Processor</strong> <strong>5200</strong> <strong>Series</strong> Electrical Specifications<br />

Intel supports and validates dual processor configurations only in which both<br />

processors operate with the same FSB frequency, core frequency, power segments, and<br />

have the same internal cache sizes. Mixing components operating at different internal<br />

clock frequencies is not supported and will not be validated by Intel. Combining<br />

processors from different power segments is also not supported.<br />

Note: <strong>Processor</strong>s within a system must operate at the same frequency per bits [12:8] of the<br />

CLOCK_FLEX_MAX MSR; however this does not apply to frequency transitions initiated<br />

due to thermal events, Extended HALT, Enhanced Intel SpeedStep Technology<br />

transitions, or assertion of the FORCEPR# signal (See Chapter 6).<br />

Not all operating systems can support dual processors with mixed frequencies. Mixing<br />

processors of different steppings but the same model (as per CPUID instruction) is<br />

supported. Details regarding the CPUID instruction are provided in the AP-485 Intel ®<br />

<strong>Processor</strong> Identification and the CPUID Instruction application note.<br />

2.12 Absolute Maximum and Minimum Ratings<br />

Table 2-11 specifies absolute maximum and minimum ratings only, which lie outside<br />

the functional limits of the processor. Only within specified operation limits, can<br />

functionality and long-term reliability be expected.<br />

At conditions outside functional operation condition limits, but within absolute<br />

maximum and minimum ratings, neither functionality nor long-term reliability can be<br />

expected. If a device is returned to conditions within functional operation limits after<br />

having been subjected to conditions outside these limits, but within the absolute<br />

maximum and minimum ratings, the device may be functional, but with its lifetime<br />

degraded depending on exposure to conditions exceeding the functional operation<br />

condition limits.<br />

At conditions exceeding absolute maximum and minimum ratings, neither functionality<br />

nor long-term reliability can be expected. Moreover, if a device is subjected to these<br />

conditions for any length of time then, when returned to conditions within the<br />

functional operating condition limits, it will either not function or its reliability will be<br />

severely degraded.<br />

Although the processor contains protective circuitry to resist damage from static<br />

electric discharge, precautions should always be taken to avoid high static voltages or<br />

electric fields.

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