Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
SHOW LESS
You also want an ePaper? Increase the reach of your titles
YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.
BackgroundExperimentalModelingSummaryMethodologySingle-bit<strong>Multiple</strong>-bitSingle-bit simul<strong>at</strong>ion in good agreementCircuit simul<strong>at</strong>ion suggest Q crit = 4 fCSimul<strong>at</strong>ion in agreement with experimental d<strong>at</strong>a <strong>at</strong> Q CritAlan Douglas TiptonNASA Review14
Change language