Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
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Public<strong>at</strong>ions and talksBackgroundExperimentalModelingSummaryConclusionsPublic<strong>at</strong>ions and talksFuture workA. D. Tipton, J. A. Pellish, P. R. Fleming, R. D. Schrimpf, R.A. Reed, R. A. Weller, M. H. Mendenhall, and L. W.Massengill, "High-energy neutron multiple-bit upset,"presented <strong>at</strong> Intern<strong>at</strong>ional Conference on IC Design andTechnology, Austin, TX, 2007.A. D. Tipton, X. Zhu, H. Weng, J. A. Pellish, P. R. Fleming,R. D. Schrimpf, R. A. Reed, R. A. Weller, and M.Mendenhall, "<strong>Increased</strong> r<strong>at</strong>e <strong>of</strong> multiple-bit upset <strong>at</strong> largeangles <strong>of</strong> incidence," IEEE Trans. Dev. M<strong>at</strong>. and Rel.,submitted for review.Alan Douglas TiptonNASA Review18
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