Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
BackgroundExperimentalModelingSummary<strong>Multiple</strong>-bit upsetNeutron-induced upsets<strong>Multiple</strong>-bit upset increases with scalingMaiz et al.Tosaka et al.Kawakami et al.Hubert et al.from Seifert, et al., IRPS, 2006.<strong>Multiple</strong>-bit upset (MBU) increases for smaller technologiesFe<strong>at</strong>ure size small rel<strong>at</strong>ive to radi<strong>at</strong>ion eventsMBU 2 or more physically adjacent bitsAlan Douglas TiptonNASA Review3
Change language