Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
Increased Rate of Multiple-Bit Upset at Large Angles of Incidence
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BackgroundExperimentalModelingSummary<strong>Multiple</strong>-bit upset probabilityMethodologySingle-bit<strong>Multiple</strong>-bitSimul<strong>at</strong>ion shows increased probability <strong>at</strong> grazing anglesMore calibr<strong>at</strong>ion needed <strong>at</strong> 90ºAlan Douglas TiptonNASA Review16
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